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G01R1/06783

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/06783containing liquids

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer evaluation apparatus and semiconductor wafer ma...
- Patent number 11,906,569
- Issue date Feb 20, 2024
- Showa Denko K.K.
- Koichi Murata
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Remote detection of electrical fault via electrically conductive fl...
- Patent number 11,867,722
- Issue date Jan 9, 2024
- Joseph Caba
- B63 - SHIPS OR OTHER WATERBORNE VESSELS RELATED EQUIPMENT
Information Patent Grant
Apparatus for inspecting illumination of lighting micro led
- Patent number 11,624,771
- Issue date Apr 11, 2023
- Microinspection, Inc.
- Tak Eun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Remote detection of electrical fault via electrically conductive fl...
- Patent number 11,549,967
- Issue date Jan 10, 2023
- Joseph Caba
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus with lateral movement of a probe suppo...
- Patent number 11,073,538
- Issue date Jul 27, 2021
- Intel Corporation
- Paul Diglio
- G01 - MEASURING TESTING
Information Patent Grant
Fluid deposition apparatus and method
- Patent number 11,027,310
- Issue date Jun 8, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun-Wen Cheng
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
System and method for measuring electrical properties of materials
- Patent number 11,009,525
- Issue date May 18, 2021
- GLOBALFOUNDRIES U.S. INC.
- Jay Mody
- G01 - MEASURING TESTING
Information Patent Grant
Contact system and contact module
- Patent number 10,658,780
- Issue date May 19, 2020
- Rosenberger Hochfrequenztechnik GmbH
- Frank Tatzel
- G01 - MEASURING TESTING
Information Patent Grant
Fluid deposition appartus and method
- Patent number 10,155,244
- Issue date Dec 18, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Wen Cheng
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Testing apparatus and its probe connector
- Patent number 10,132,835
- Issue date Nov 20, 2018
- GLOBAL UNICHIP CORPORATION
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test temperature control mechanism
- Patent number 9,869,714
- Issue date Jan 16, 2018
- Intel Corporation
- John C. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Liquid metal interconnects
- Patent number 9,835,648
- Issue date Dec 5, 2017
- Intel Corporation
- Rajashree Baskaran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control monitoring for biochips
- Patent number 9,625,493
- Issue date Apr 18, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Shao Liu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Interconnects including liquid metal
- Patent number 9,523,713
- Issue date Dec 20, 2016
- Intel Corporation
- Youngseok Oh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer evaluation method, semiconductor wafer evaluati...
- Patent number 9,431,307
- Issue date Aug 30, 2016
- Showa Denko K.K.
- Taichi Okano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods of measuring minority carrier lifetime using...
- Patent number 9,310,396
- Issue date Apr 12, 2016
- Alliance for Sustainable Energy, LLC
- Jian Li
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing electrical circuits using a photoelec...
- Patent number 8,941,390
- Issue date Jan 27, 2015
- NeuroNexus Technologies, Inc.
- John P. Seymour
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting circuit of substrate
- Patent number 8,624,618
- Issue date Jan 7, 2014
- Samsung Electro-Mechanics Co., Ltd.
- Seung Seoup Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing device and electrical testing method with contro...
- Patent number 8,183,878
- Issue date May 22, 2012
- Renesas Electronics Corporation
- Kentarou Sekino
- G01 - MEASURING TESTING
Information Patent Grant
Method for contacting semiconductor components with a test contact
- Patent number 7,642,104
- Issue date Jan 5, 2010
- Infineon Technologies AG
- Horst Groeninger
- G01 - MEASURING TESTING
Information Patent Grant
Cap at resistors of electrical test probe
- Patent number 7,525,328
- Issue date Apr 28, 2009
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for evaluating semiconductor wafer
- Patent number 7,525,327
- Issue date Apr 28, 2009
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- G01 - MEASURING TESTING
Information Patent Grant
Cap at resistors of electrical test probe
- Patent number 7,295,020
- Issue date Nov 13, 2007
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Automatic mercury probe for use with a semiconductor wafer
- Patent number 7,253,649
- Issue date Aug 7, 2007
- Four Dimensions, Inc,
- James T. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of electrical testing of an integrated circuit with an elect...
- Patent number 7,239,160
- Issue date Jul 3, 2007
- Agere Systems Inc.
- James Golden
- G01 - MEASURING TESTING
Information Patent Grant
Method of electrical testing
- Patent number 7,132,840
- Issue date Nov 7, 2006
- Agere Systems Inc.
- James Golden
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive contact test
- Patent number 7,084,652
- Issue date Aug 1, 2006
- Toppoly Optoelectronics Corp.
- Wen-Yuan Guo
- G01 - MEASURING TESTING
Information Patent Grant
Variable impedance test probe
- Patent number 6,970,001
- Issue date Nov 29, 2005
- Hewlett-Packard Development Company, L.P.
- Sachin Navin Chheda
- G01 - MEASURING TESTING
Information Patent Grant
Temporary, conformable contacts for microelectronic components
- Patent number 6,913,476
- Issue date Jul 5, 2005
- Micron Technology, Inc.
- Tay Wuu Yean
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing sensitive elements on an electronic chip
- Patent number 6,607,929
- Issue date Aug 19, 2003
- Commissariat a l'Energie Atomique
- Thierry Livache
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD SYSTEM, METHOD OF MANUFACTURING PROBE CARD SYSTEM, METHO...
- Publication number 20240027494
- Publication date Jan 25, 2024
- nD-HI Technologies Lab, Inc.
- HO-MING TONG
- G01 - MEASURING TESTING
Information Patent Application
FLUIDIC WAFER PROBE
- Publication number 20230194569
- Publication date Jun 22, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Sebastian Meier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for Inspecting Illumination of Lighting Micro LED
- Publication number 20220390503
- Publication date Dec 8, 2022
- MICROINSPECTION, INC.
- Tak EUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MA...
- Publication number 20220146564
- Publication date May 12, 2022
- SHOWA DENKO K.K.
- Koichi Murata
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL PROBING OF ELECTRICAL BIOSENSORS
- Publication number 20200292578
- Publication date Sep 17, 2020
- FemtoDx
- Pritiraj Mohanty
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TESTING APPARATUS WITH LATERAL MOVEMENT OF A PROBE SUPPO...
- Publication number 20190204358
- Publication date Jul 4, 2019
- Paul Diglio
- G01 - MEASURING TESTING
Information Patent Application
Probe Card System Having A Dielectric Fluid Dispenser
- Publication number 20190064216
- Publication date Feb 28, 2019
- KEITHLEY INSTRUMENTS, LLC
- Vladimir V. Genkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
CONTACT SYSTEM AND CONTACT MODULE
- Publication number 20190067857
- Publication date Feb 28, 2019
- Rosenberger Hochfrequenztechnik GmbH & Co. KG
- Frank TATZEL
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND ITS PROBE CONNECTOR
- Publication number 20180038892
- Publication date Feb 8, 2018
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
Fluid Deposition Apparatus and Method
- Publication number 20170065958
- Publication date Mar 9, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Chun-Wen Cheng
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
CONDUCTIVE TEST PROBE INCLUDING CONDUCTIVE, CONFORMABLE COMPONENTS
- Publication number 20150268273
- Publication date Sep 24, 2015
- Apple Inc.
- Anuranjini Pragada
- G01 - MEASURING TESTING
Information Patent Application
INTERCONNECTS INCLUDING LIQUID METAL
- Publication number 20140354318
- Publication date Dec 4, 2014
- Youngseok Oh
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Methods of Measuring Minority Carrier Lifetime Using...
- Publication number 20140253161
- Publication date Sep 11, 2014
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Jian Li
- G01 - MEASURING TESTING
Information Patent Application
PROCESS CONTROL MONITORING FOR BIOCHIPS
- Publication number 20140239986
- Publication date Aug 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Shao Liu
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHO...
- Publication number 20140070830
- Publication date Mar 13, 2014
- Sumitomo Electric Industries, Ltd.
- Mitsuhiko Sakai
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER EVALUATION METHOD, SEMICONDUCTOR WAFER EVALUATI...
- Publication number 20140017826
- Publication date Jan 16, 2014
- Taichi OKANO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING ELECTRICAL CIRCUITS USING A PHOTOELEC...
- Publication number 20130229188
- Publication date Sep 5, 2013
- NEURONEXUS TECHNOLOGIES, INC.
- John P. Seymour
- G01 - MEASURING TESTING
Information Patent Application
LIQUID METAL INTERCONNECTS
- Publication number 20130000117
- Publication date Jan 3, 2013
- Rajashree Baskaran
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INS...
- Publication number 20120169365
- Publication date Jul 5, 2012
- TOKYO ELECTRON LIMITED
- Haruo Iwatsu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING CIRCUIT OF SUBSTRATE
- Publication number 20110109339
- Publication date May 12, 2011
- Seung Seoup Lee
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TESTING DEVICE AND ELECTRICAL TESTING METHOD FOR ELECTRO...
- Publication number 20100182029
- Publication date Jul 22, 2010
- NEC ELECTRONICS CORPORATION
- Kentarou SEKINO
- G01 - MEASURING TESTING
Information Patent Application
Cap at resistors of electrical test probe
- Publication number 20070273360
- Publication date Nov 29, 2007
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Evaluating Semiconductor Wafer
- Publication number 20070273397
- Publication date Nov 29, 2007
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- G01 - MEASURING TESTING
Information Patent Application
Method of electrical testing
- Publication number 20070024303
- Publication date Feb 1, 2007
- James Golden
- G01 - MEASURING TESTING
Information Patent Application
Method for Contacting Semiconductor Components with a Test Contact
- Publication number 20070007514
- Publication date Jan 11, 2007
- Horst Groeninger
- G01 - MEASURING TESTING
Information Patent Application
Non-contact electrical probe utilizing charged fluid droplets
- Publication number 20060139040
- Publication date Jun 29, 2006
- Michael James Nystrom
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
System and method of testing and utilizing a fluid stream
- Publication number 20060139041
- Publication date Jun 29, 2006
- Michael James Nystrom
- G01 - MEASURING TESTING
Information Patent Application
Method of electrical testing
- Publication number 20060022689
- Publication date Feb 2, 2006
- James Golden
- G01 - MEASURING TESTING
Information Patent Application
Cap at resistors of electrical test probe
- Publication number 20050168230
- Publication date Aug 4, 2005
- LeCroy Corporation
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive contact test
- Publication number 20050077914
- Publication date Apr 14, 2005
- TOPPOLY OPTOELECTRONICS CORP.
- Wen-Yuan Guo
- G01 - MEASURING TESTING

containing liquids

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor wafer evaluation apparatus and semiconductor wafer ma...

Remote detection of electrical fault via electrically conductive fl...

Apparatus for inspecting illumination of lighting micro led

Remote detection of electrical fault via electrically conductive fl...

Electrical testing apparatus with lateral movement of a probe suppo...

Fluid deposition apparatus and method

System and method for measuring electrical properties of materials

Contact system and contact module

Fluid deposition appartus and method

Testing apparatus and its probe connector

Integrated circuit test temperature control mechanism

Liquid metal interconnects

Process control monitoring for biochips

Interconnects including liquid metal

Semiconductor wafer evaluation method, semiconductor wafer evaluati...

Apparatus and methods of measuring minority carrier lifetime using...

System and method for testing electrical circuits using a photoelec...

Apparatus and method for inspecting circuit of substrate

Electrical testing device and electrical testing method with contro...

Method for contacting semiconductor components with a test contact

Cap at resistors of electrical test probe

Apparatus for evaluating semiconductor wafer

Cap at resistors of electrical test probe

Automatic mercury probe for use with a semiconductor wafer

Method of electrical testing of an integrated circuit with an elect...

Method of electrical testing

Non-destructive contact test

Variable impedance test probe

Temporary, conformable contacts for microelectronic components

Device and method for testing sensitive elements on an electronic chip

Patents Applicationslast 30 patents

PROBE CARD SYSTEM, METHOD OF MANUFACTURING PROBE CARD SYSTEM, METHO...

FLUIDIC WAFER PROBE

Apparatus for Inspecting Illumination of Lighting Micro LED

SEMICONDUCTOR WAFER EVALUATION APPARATUS AND SEMICONDUCTOR WAFER MA...

WAFER LEVEL PROBING OF ELECTRICAL BIOSENSORS

ELECTRICAL TESTING APPARATUS WITH LATERAL MOVEMENT OF A PROBE SUPPO...

Probe Card System Having A Dielectric Fluid Dispenser

CONTACT SYSTEM AND CONTACT MODULE

TESTING APPARATUS AND ITS PROBE CONNECTOR

Fluid Deposition Apparatus and Method

CONDUCTIVE TEST PROBE INCLUDING CONDUCTIVE, CONFORMABLE COMPONENTS

INTERCONNECTS INCLUDING LIQUID METAL

Apparatus and Methods of Measuring Minority Carrier Lifetime Using...

PROCESS CONTROL MONITORING FOR BIOCHIPS

MEASURING DEVICE, MEASURING METHOD, AND ELEMENT MANUFACTURING METHO...

SEMICONDUCTOR WAFER EVALUATION METHOD, SEMICONDUCTOR WAFER EVALUATI...

SYSTEM AND METHOD FOR TESTING ELECTRICAL CIRCUITS USING A PHOTOELEC...

LIQUID METAL INTERCONNECTS

SUBSTRATE INSPECTING APPARATUS AND ALIGNING METHOD IN SUBSTRATE INS...

APPARATUS AND METHOD FOR INSPECTING CIRCUIT OF SUBSTRATE

ELECTRICAL TESTING DEVICE AND ELECTRICAL TESTING METHOD FOR ELECTRO...

Cap at resistors of electrical test probe

Apparatus for Evaluating Semiconductor Wafer

Method of electrical testing

Method for Contacting Semiconductor Components with a Test Contact

Non-contact electrical probe utilizing charged fluid droplets

System and method of testing and utilizing a fluid stream

Method of electrical testing

Cap at resistors of electrical test probe

Non-destructive contact test