Continuous plural angles

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G01N2021/4714

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/4714Continuous plural angles

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for detection and/or morphologic analysis of indi...
- Patent number 11,002,654
- Issue date May 11, 2021
- PLAIR SA
- Denis Kiselev
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing angle-resolved Fourier-domain op...
- Patent number RE46412
- Issue date May 23, 2017
- The General Hospital Corporation
- Adrien Desjardins
Information Patent Grant
Bioassays using plasmonic scattering from noble metal nanostructures
- Patent number 9,217,746
- Issue date Dec 22, 2015
- University of Maryland Baltimore County
- Chris D. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 8,982,345
- Issue date Mar 17, 2015
- National Institute of Advanced Industrial Science and Technology
- Etsuo Kawate
- G01 - MEASURING TESTING
Information Patent Grant
Variable angle, fiber optic coupled, light scattering apparatus
- Patent number 8,467,056
- Issue date Jun 18, 2013
- The United States of America as represented by the Secretary of the Navy
- James Joseph Haycraft
- G01 - MEASURING TESTING
Information Patent Grant
Method to determine the satin-effect on metal plated substrates
- Patent number 8,405,833
- Issue date Mar 26, 2013
- Atotech Deutschland GmbH
- Stefan Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Catadioptric optical system for scatterometry
- Patent number 8,107,173
- Issue date Jan 31, 2012
- ASML Holding N.V.
- Yevgeniy Konstanitinovich Shmarev
- G01 - MEASURING TESTING
Information Patent Grant
Bioassays using plasmonic scattering from noble metal nanostructures
- Patent number 8,101,424
- Issue date Jan 24, 2012
- University of Maryland, Baltimore County
- Chris D. Geddes
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing angle-resolved fourier-domain op...
- Patent number 7,982,879
- Issue date Jul 19, 2011
- The General Hospital Corporation
- Adrien E. Desjardins
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Catadioptric optical system for scatterometry
- Patent number 7,633,689
- Issue date Dec 15, 2009
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam set-up for parousiameter
- Patent number 7,554,665
- Issue date Jun 30, 2009
- Koninklijke Philips Electronics N.V.
- Sipke Wadman
- G01 - MEASURING TESTING
Information Patent Grant
Lithographic system, sensor, and method of measuring properties of...
- Patent number 7,480,050
- Issue date Jan 20, 2009
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Grant
Highly sensitive defect detection method
- Patent number 7,362,428
- Issue date Apr 22, 2008
- ProMos Technologies Inc.
- Chung-I Chang
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting a grating biochip
- Patent number 7,355,713
- Issue date Apr 8, 2008
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring thickness of an opaque coating using near-infra...
- Patent number 7,223,977
- Issue date May 29, 2007
- The Boeing Company
- Paul H. Shelley
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring thickness of an opaque coating using infrared a...
- Patent number 6,903,339
- Issue date Jun 7, 2005
- The Boeing Company
- Paul H. Shelley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for the analysis of particle characteristics u...
- Patent number 5,471,299
- Issue date Nov 28, 1995
- The Secretary of State for Defence in Her Britannic Majesty's Government of t...
- Paul H. Kaye
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a random medium
- Patent number 5,137,355
- Issue date Aug 11, 1992
- The Research Foundation of State University of New York
- Randall L. Barbour
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method for detecting flaws on a diffractiv...
- Patent number 4,943,734
- Issue date Jul 24, 1990
- QC Optics, Inc.
- Carl E. A. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Optical granulometry process and devices for broad measuring ranges
- Patent number 4,929,079
- Issue date May 29, 1990
- Office Natioanl D'Etudes Et De Recherches Aerospatiales styled O.N.E.R.A
- Andre Delfour
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140002825
- Publication date Jan 2, 2014
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Etsuo Kawate
- G02 - OPTICS
Information Patent Application
BIOASSAYS USING PLASMONIC SCATTERING FROM NOBLE METAL NANOSTRUCTURES
- Publication number 20120122240
- Publication date May 17, 2012
- CHRIS D. GEDDES
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO DETERMINE THE SATIN-EFFECT ON METAL PLATED SUBSTRATES
- Publication number 20120081710
- Publication date Apr 5, 2012
- Stefan Neumann
- G01 - MEASURING TESTING
Information Patent Application
BIOASSAYS USING PLASMONIC SCATTERING FROM NOBLE METAL NANOSTRUCTURES
- Publication number 20100062545
- Publication date Mar 11, 2010
- University of Maryland Biotechnology Institute
- Chris D. Geddes
- G01 - MEASURING TESTING
Information Patent Application
Catadioptric Optical System for Scatterometry
- Publication number 20100046092
- Publication date Feb 25, 2010
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G02 - OPTICS
Information Patent Application
Catadioptric Optical System for Scatterometry
- Publication number 20090021845
- Publication date Jan 22, 2009
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G02 - OPTICS
Information Patent Application
Dual Beam Set-Up for Parousiameter
- Publication number 20080192258
- Publication date Aug 14, 2008
- Koninklijke Philips Electronics, N.V.
- Sipke Wadman
- G01 - MEASURING TESTING
Information Patent Application
Water contamination measurement apparatus
- Publication number 20080030730
- Publication date Feb 7, 2008
- The United States of America as represented by the United States Environmenta...
- Robert Clark
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING ANGLE-RESOLVED FOURIER-DOMAIN OP...
- Publication number 20070201033
- Publication date Aug 30, 2007
- The General Hospital Corporation
- Adrien E. Desjardins
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Lithographic system, sensor, and method of measuring properties of...
- Publication number 20070182964
- Publication date Aug 9, 2007
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Application
Method for Inspecting a Grating Biochip
- Publication number 20070156349
- Publication date Jul 5, 2007
- Industrial Technology Research Institute
- Deh Ming Shyu
- G01 - MEASURING TESTING
Information Patent Application
Highly sensitive defect detection method
- Publication number 20060187446
- Publication date Aug 24, 2006
- Chung-I Chang
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring thickness of an opaque coating using near-infra...
- Publication number 20050263704
- Publication date Dec 1, 2005
- The Boeing Company
- Paul H. Shelley
- G01 - MEASURING TESTING
Information Patent Application
Measuring array
- Publication number 20040145744
- Publication date Jul 29, 2004
- Hans-Jurgen Dobschal
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring thickness of an opaque coating using infrared a...
- Publication number 20040099807
- Publication date May 27, 2004
- Paul H. Shelley
- G01 - MEASURING TESTING

Continuous plural angles

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for detection and/or morphologic analysis of indi...

Methods and systems for performing angle-resolved Fourier-domain op...

Bioassays using plasmonic scattering from noble metal nanostructures

Optical characteristic measuring apparatus

Variable angle, fiber optic coupled, light scattering apparatus

Method to determine the satin-effect on metal plated substrates

Catadioptric optical system for scatterometry

Bioassays using plasmonic scattering from noble metal nanostructures

Methods and systems for performing angle-resolved fourier-domain op...

Catadioptric optical system for scatterometry

Dual beam set-up for parousiameter

Lithographic system, sensor, and method of measuring properties of...

Highly sensitive defect detection method

Method for inspecting a grating biochip

Method of measuring thickness of an opaque coating using near-infra...

Method of measuring thickness of an opaque coating using infrared a...

Apparatus and method for the analysis of particle characteristics u...

Method of imaging a random medium

Inspection apparatus and method for detecting flaws on a diffractiv...

Optical granulometry process and devices for broad measuring ranges

Patents Applicationslast 30 patents

OPTICAL CHARACTERISTIC MEASURING APPARATUS

BIOASSAYS USING PLASMONIC SCATTERING FROM NOBLE METAL NANOSTRUCTURES

METHOD TO DETERMINE THE SATIN-EFFECT ON METAL PLATED SUBSTRATES

BIOASSAYS USING PLASMONIC SCATTERING FROM NOBLE METAL NANOSTRUCTURES

Catadioptric Optical System for Scatterometry

Catadioptric Optical System for Scatterometry

Dual Beam Set-Up for Parousiameter

Water contamination measurement apparatus

METHODS AND SYSTEMS FOR PERFORMING ANGLE-RESOLVED FOURIER-DOMAIN OP...

Lithographic system, sensor, and method of measuring properties of...

Method for Inspecting a Grating Biochip

Highly sensitive defect detection method

Method of measuring thickness of an opaque coating using near-infra...

Measuring array

Method of measuring thickness of an opaque coating using infrared a...