Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industry

CPC
H01J37/265

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/265Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Device for observing permeation and diffusion path of observation t...
- Patent number 12,315,696
- Issue date May 27, 2025
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron beam inspection apparatus, multipole array control m...
- Patent number 12,308,202
- Issue date May 20, 2025
- NuFlare Technology, Inc.
- Yuichi Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 12,300,462
- Issue date May 13, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, method of operating a charged particl...
- Patent number 12,293,895
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,283,458
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Mai Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 12,272,518
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for area-wise inspecting a sample via a multi-beam particle...
- Patent number 12,272,519
- Issue date Apr 8, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle gun and charged particle beam device
- Patent number 12,266,500
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Tomoyo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 12,255,045
- Issue date Mar 18, 2025
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,205,790
- Issue date Jan 21, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for defect inspection using voltage contrast in a...
- Patent number 12,191,112
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and overlay misalignment measurement m...
- Patent number 12,183,541
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated operational control of micro-tooling devices
- Patent number 12,176,182
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning a sample using multi-beam inspection...
- Patent number 12,165,837
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stroboscopic illumination synchronized electron detection and imaging
- Patent number 12,165,835
- Issue date Dec 10, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of profiling charged-particle beams
- Patent number 12,165,836
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for usable beam current and brightness in Scho...
- Patent number 12,131,883
- Issue date Oct 29, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
- Patent number 12,125,669
- Issue date Oct 22, 2024
- ASML Netherlands B.V.
- Ning Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 12,068,128
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automating cryo-electron microscopy data collection
- Patent number 12,057,289
- Issue date Aug 6, 2024
- New York Structural Biology Center
- Paul T. Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 12,009,176
- Issue date Jun 11, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS
- Publication number 20250183002
- Publication date Jun 5, 2025
- FEI Company
- Gert-Jan de Vos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEGMENTED ENDPOINTING FOR SAMPLE PREPARATION
- Publication number 20250174428
- Publication date May 29, 2025
- FEI Company
- Tomáš Onderlicka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...
- Publication number 20250166962
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Dmitry KLOCHKOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20250157786
- Publication date May 15, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...
- Publication number 20250157782
- Publication date May 15, 2025
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recipe Creating System, Length Measurement System, and Recipe Creat...
- Publication number 20250140516
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Hiromi FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM SYSTEM AND MULTI-BEAM FORMING UNIT WITH REDUCED SENSITIV...
- Publication number 20250125115
- Publication date Apr 17, 2025
- Carl Zeiss MultiSEM GmbH
- Christian Veit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE POWER SUPPLIES FOR FAST VOLTAGE CHANGES
- Publication number 20250125117
- Publication date Apr 17, 2025
- Advanced Energy Industries, Inc.
- Arthur Flatt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20250118528
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH IMPROVED IMAGING OF...
- Publication number 20250104966
- Publication date Mar 27, 2025
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE, COMPUTER PRO...
- Publication number 20250104961
- Publication date Mar 27, 2025
- Carl Zeiss MultiSEM GmbH
- Michael Behnke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION
- Publication number 20250076038
- Publication date Mar 6, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...
- Publication number 20250069958
- Publication date Feb 27, 2025
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTRO...
- Publication number 20250069847
- Publication date Feb 27, 2025
- FEI Company
- Stefano Vespucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT
- Publication number 20250069849
- Publication date Feb 27, 2025
- Technische Universitat Berlin
- Tolga WAGNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...
- Publication number 20250069845
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20250069848
- Publication date Feb 27, 2025
- KIOXIA Corporation
- Kazuya HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20250046565
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Tomonori NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS
- Publication number 20250022681
- Publication date Jan 16, 2025
- INFINEON TECHNOLOGIES AG
- Maximilian Alexander MOSER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Correction Method and Correction Device
- Publication number 20250014858
- Publication date Jan 9, 2025
- Hitachi High-Tech Corporation
- Tomoaki YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE ABERRATION CORRECTION
- Publication number 20250006457
- Publication date Jan 2, 2025
- FEI Company
- Maurits Diephuis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240420915
- Publication date Dec 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Mihiro TAKASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGING A REGION OF A SAMPLE
- Publication number 20240420917
- Publication date Dec 19, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Roey Levy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240412943
- Publication date Dec 12, 2024
- Samsung Electronics Co., LTD
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automating cryo-electron microscopy data collection
- Publication number 20240395497
- Publication date Nov 28, 2024
- New York Structural Biology Center
- Paul T. Kim
- G06 - COMPUTING CALCULATING COUNTING

Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device for observing permeation and diffusion path of observation t...

Multi-electron beam inspection apparatus, multipole array control m...

System comprising a multi-beam particle microscope and method for o...

Charged particle beam system, method of operating a charged particl...

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

Charged particle beam device

3D metrology from 3D datacube created from stack of registered imag...

Method for area-wise inspecting a sample via a multi-beam particle...

Charged particle gun and charged particle beam device

Transmission charged particle microscope with an electron energy lo...

Charged particle beam device

System and method for defect inspection using voltage contrast in a...

Charged particle beam system and overlay misalignment measurement m...

Automated operational control of micro-tooling devices

Transmission electron microscope and inspection method using transm...

System and method for scanning a sample using multi-beam inspection...

Stroboscopic illumination synchronized electron detection and imaging

Systems and methods of profiling charged-particle beams

Electron gun and electron beam application apparatus

Automated ion-beam alignment for dual-beam instrument

Observation method by means of scanning transmission electron micro...

Self-differential confocal tilt sensor for measuring level variatio...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Method and apparatus for usable beam current and brightness in Scho...

Thermal-aided inspection by advanced charge controller module in a...

Adaptive specimen image acquisition using an artificial neural network

Charged particle beam system

Automating cryo-electron microscopy data collection

Method and system for generating a diffraction image

Patents Applicationslast 30 patents

SCANNING PATTERNS FOR SCIENTIFIC INSTRUMENTS

SEGMENTED ENDPOINTING FOR SAMPLE PREPARATION

METHOD FOR DISTORTION MEASUREMENT AND PARAMETER SETTING FOR CHARGED...

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

Charged Particle Beam Apparatus

METHOD FOR OPERATING A PARTICLE BEAM APPARATUS, COMPUTER PROGRAM PR...

Recipe Creating System, Length Measurement System, and Recipe Creat...

MULTI-BEAM SYSTEM AND MULTI-BEAM FORMING UNIT WITH REDUCED SENSITIV...

HIGH VOLTAGE POWER SUPPLIES FOR FAST VOLTAGE CHANGES

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

MULTI-BEAM CHARGED PARTICLE IMAGING SYSTEM WITH IMPROVED IMAGING OF...

METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE, COMPUTER PRO...

AUTOMATED REGION SELECTION FOR AUTO SWEEP

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

FAST AND ACCURATE STRAIN MAPPING USING ELECTRON DIFFRACTION

DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...

DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTRO...

DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT

TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

Charged Particle Beam Device

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS

Correction Method and Correction Device

CHARGED PARTICLE BEAM DEVICE

MICROSCOPE ABERRATION CORRECTION

CHARGED PARTICLE BEAM DEVICE

DISCHARGING A REGION OF A SAMPLE

SUBSTRATE INSPECTION METHOD

Automating cryo-electron microscopy data collection