Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industry

CPC
H01J37/265

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/265Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industries

Patents Grantslast 30 patents

Information Patent Grant
Charged particle assessment tool, inspection method
- Patent number 11,984,295
- Issue date May 14, 2024
- ASML Netherlands B.V.
- Marco Jan-Jaco Wieland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition
- Patent number 11,982,634
- Issue date May 14, 2024
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam system
- Patent number 11,961,704
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoki Akimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 11,955,310
- Issue date Apr 9, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for adjusting beam condition of charged par...
- Patent number 11,948,772
- Issue date Apr 2, 2024
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed charged-particle beam system
- Patent number 11,942,302
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Arno Jan Bleeker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 11,935,721
- Issue date Mar 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 11,929,232
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of aligning a charged particle beam apparatus
- Patent number 11,901,155
- Issue date Feb 13, 2024
- FEI Company
- Mykola Kaplenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
- Patent number 11,887,809
- Issue date Jan 30, 2024
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring a sample and microscope implementing the method
- Patent number 11,848,172
- Issue date Dec 19, 2023
- Carl Zeiss SMT GmbH
- Dmitry Klochkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Setting position of a particle beam device component
- Patent number 11,837,434
- Issue date Dec 5, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring relative rotational angle and scanning transmis...
- Patent number 11,837,433
- Issue date Dec 5, 2023
- Jeol Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for usable beam current and brightness in Scho...
- Patent number 11,823,862
- Issue date Nov 21, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, method of operating a charged particl...
- Patent number 11,810,749
- Issue date Nov 7, 2023
- Carl Zeiss SMT GmbH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle assessment tool, inspection method
- Patent number 11,798,783
- Issue date Oct 24, 2023
- ASML Netherlands B.V.
- Marco Jan-Jaco Wieland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for controlling charged...
- Patent number 11,791,131
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,776,787
- Issue date Oct 3, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method of controlling charged p...
- Patent number 11,756,764
- Issue date Sep 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protective shutter for charged particle microscope
- Patent number 11,749,496
- Issue date Sep 5, 2023
- FEI Company
- Philip Brundage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of adjusting optical sy...
- Patent number 11,742,176
- Issue date Aug 29, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
- Patent number 11,728,131
- Issue date Aug 15, 2023
- ASML Netherlands B.V.
- Ning Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection tool and method of determining a distortion of an inspec...
- Patent number 11,728,129
- Issue date Aug 15, 2023
- ASML Netherlands B.V.
- Peter Christianus Johannes Maria De Loijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 11,728,126
- Issue date Aug 15, 2023
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sparse sampling using a programmatically randomized signal modulati...
- Patent number 11,721,519
- Issue date Aug 8, 2023
- SYNCHROTRON RESEARCH, INC.
- Edward Principe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED...
- Publication number 20240153732
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Datong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...
- Publication number 20240128047
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Masahiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20240128049
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Katsura TAKAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Microscope and Stage
- Publication number 20240120169
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Kazuki ISHIZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20240094151
- Publication date Mar 21, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSMENT SYSTEM, METHOD OF ASSESSING
- Publication number 20240079205
- Publication date Mar 7, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Application Management For Charged Particle Microscope Devices
- Publication number 20240071717
- Publication date Feb 29, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20240055223
- Publication date Feb 15, 2024
- KIOXIA Corporation
- Chihiro IDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS
- Publication number 20240055222
- Publication date Feb 15, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...
- Publication number 20240047175
- Publication date Feb 8, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, METHOD OF OPERATING A CHARGED PARTICL...
- Publication number 20240038482
- Publication date Feb 1, 2024
- Carl Zeiss SMT GMBH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON-OPTICAL SYSTEM AND METHOD OF OPERATING AN ELECTRON-OPTICAL...
- Publication number 20240029995
- Publication date Jan 25, 2024
- ASML NETHERLANDS B.V.
- Stijn Wilem Herman Karel STEENBRINK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USABLE BEAM CURRENT AND BRIGHTNESS IN SCHO...
- Publication number 20230411114
- Publication date Dec 21, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230395350
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20230395351
- Publication date Dec 7, 2023
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...
- Publication number 20230395352
- Publication date Dec 7, 2023
- ASML NETHERLANDS B.V.
- Ning YE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230377837
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yohei NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device and Ion Milling Method
- Publication number 20230369010
- Publication date Nov 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Toru Iwaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Control Method Therefor
- Publication number 20230343550
- Publication date Oct 26, 2023
- JEOL Ltd.
- Takamitsu Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20230335370
- Publication date Oct 19, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM
- Publication number 20230335373
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...
- Publication number 20230335374
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for analyzing three-dimensional features
- Publication number 20230317410
- Publication date Oct 5, 2023
- FEI Company
- Bingxing Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
- Publication number 20230317408
- Publication date Oct 5, 2023
- Intel Corporation
- Xianghong Tong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230298853
- Publication date Sep 21, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DELAY TIME MEASUREMENT METHOD AND SYSTEM
- Publication number 20230298852
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Control Method for Charged Part...
- Publication number 20230290607
- Publication date Sep 14, 2023
- JEOL Ltd.
- Takeo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle assessment tool, inspection method

Adaptive specimen image acquisition

Charged particle beam system

Transmission charged particle microscope with an electron energy lo...

Methods and apparatuses for adjusting beam condition of charged par...

Pulsed charged-particle beam system

System comprising a multi-beam particle microscope and method for o...

Systems and methods for charged particle flooding to enhance voltag...

Method of aligning a charged particle beam apparatus

Auto-tuning stage settling time with feedback in charged particle m...

Charged particle beam device

Charged particle beam device and charged particle beam device calib...

Method for measuring a sample and microscope implementing the method

Estimation model generation method and electron microscope

Setting position of a particle beam device component

Method of measuring relative rotational angle and scanning transmis...

Method and apparatus for usable beam current and brightness in Scho...

Charged particle beam system, method of operating a charged particl...

Charged particle assessment tool, inspection method

Automated tomography field ion microscope

Charged particle beam apparatus and method for controlling charged...

Charged particle beam apparatus

Charged particle beam apparatus and method of controlling charged p...

Protective shutter for charged particle microscope

Defective pixel management in charged particle microscopy

Transmission electron microscope and method of adjusting optical sy...

Thermal-aided inspection by advanced charge controller module in a...

Inspection tool and method of determining a distortion of an inspec...

3D metrology from 3D datacube created from stack of registered imag...

Sparse sampling using a programmatically randomized signal modulati...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED...

INSPECTION SYSTEM

Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...

ELECTRON MICROSCOPE

Charged Particle Microscope and Stage

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

ASSESSMENT SYSTEM, METHOD OF ASSESSING

Application Management For Charged Particle Microscope Devices

INSPECTION DEVICE AND INSPECTION METHOD

SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...

CHARGED PARTICLE BEAM SYSTEM, METHOD OF OPERATING A CHARGED PARTICL...

ELECTRON-OPTICAL SYSTEM AND METHOD OF OPERATING AN ELECTRON-OPTICAL...

METHOD AND APPARATUS FOR USABLE BEAM CURRENT AND BRIGHTNESS IN SCHO...

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...

CHARGED PARTICLE BEAM APPARATUS

Ion Milling Device and Ion Milling Method

Charged Particle Beam System and Control Method Therefor

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM

SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...

Method and system for analyzing three-dimensional features

STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

DELAY TIME MEASUREMENT METHOD AND SYSTEM

Charged Particle Beam Apparatus and Control Method for Charged Part...