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G01B21/045
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B21/00
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
Current Industry
G01B21/045
Correction of measurements
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and computer program product for OCT measurement beam adjust...
Patent number
11,951,564
Issue date
Apr 9, 2024
TRUMPF Laser- und Systemtechnik Gm H
Martin Stambke
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Extended stylus for a coordinate measuring machine
Patent number
11,940,270
Issue date
Mar 26, 2024
Carl Zeiss Industrielle Messtechnik GmbH
Otto Ruck
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement system, optical measurement method, and non-tra...
Patent number
11,892,281
Issue date
Feb 6, 2024
Otsuka Electronics Co., Ltd.
Shiro Kawaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Manual calibration of imaging system
Patent number
11,892,289
Issue date
Feb 6, 2024
PHILIPS IMAGE GUIDED THERAPY CORPORATION
Andreas Johansson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system with heat measurement
Patent number
11,835,335
Issue date
Dec 5, 2023
OY MAPVISION LTD.
Janne Juslin
G01 - MEASURING TESTING
Information
Patent Grant
Validation of a measurement machine
Patent number
11,821,758
Issue date
Nov 21, 2023
Pratt & Whitney Canada Corp.
Julien Guay
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method for a surface-measuring measuring machine
Patent number
11,796,314
Issue date
Oct 24, 2023
Leica Geosystems AG
Heinz Lippuner
G01 - MEASURING TESTING
Information
Patent Grant
Scanning path segmentation of workpiece
Patent number
11,774,226
Issue date
Oct 3, 2023
Hexagon Metrology, Inc.
Sean Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Probe unit correction method
Patent number
11,761,759
Issue date
Sep 19, 2023
Mitutoyo Corporation
Kohju Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Generating efficient measurement protocol using segment grouping an...
Patent number
11,754,383
Issue date
Sep 12, 2023
Hexagon Metrology, Inc.
Sean Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Post-processing of measurement data collected with optical probe
Patent number
11,740,063
Issue date
Aug 29, 2023
Hexagon Metrology, Inc.
Sean Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Position measurement method using a calibration plate to correct a...
Patent number
11,709,050
Issue date
Jul 25, 2023
Omron Corporation
Shingo Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Error determination apparatus, error determination method, and stor...
Patent number
11,698,252
Issue date
Jul 11, 2023
Mitutoyo Corporation
Yuto Inoue
G01 - MEASURING TESTING
Information
Patent Grant
3D measurement model and spatial calibration method based on 1D dis...
Patent number
11,654,568
Issue date
May 23, 2023
Dalian University of Technology
Wei Liu
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
System and method for analysis of measurement data acquired from mu...
Patent number
11,609,089
Issue date
Mar 21, 2023
Carl Zeiss Industrielle Messtechnik GmbH
Oliver Rüger
G01 - MEASURING TESTING
Information
Patent Grant
Reference-standard device for calibration of measurements of length...
Patent number
11,592,289
Issue date
Feb 28, 2023
Istituto Nazionale di Ricerca Metrologica
Luca Boarino
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Portable measuring device with autocalibration and autoconfiguration
Patent number
11,566,889
Issue date
Jan 31, 2023
TESA SARL
Dikran Antreasyan
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method for a surface-measuring measuring machine
Patent number
11,454,499
Issue date
Sep 27, 2022
Leica Geosystems AG
Heinz Lippuner
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
Patent number
11,435,175
Issue date
Sep 6, 2022
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device for a spindle or a rotary table
Patent number
11,435,717
Issue date
Sep 6, 2022
Dr. Johannes Heidenhain GmbH
Johann Mitterreiter
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for compensating a magnetic locator, locator and computer pr...
Patent number
11,428,840
Issue date
Aug 30, 2022
MINMAXMEDICAL
Loic Huguel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
Patent number
11,397,073
Issue date
Jul 26, 2022
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the straightness error of slende...
Patent number
11,378,393
Issue date
Jul 5, 2022
Q-TECH S.R.L
Luca Fumagalli
G01 - MEASURING TESTING
Information
Patent Grant
Filtering device, sensor device, filtering method and program
Patent number
11,365,962
Issue date
Jun 21, 2022
Mitsubishi Electric Corporation
Daiki Ata
G01 - MEASURING TESTING
Information
Patent Grant
Spatial accuracy correction method and apparatus
Patent number
11,366,447
Issue date
Jun 21, 2022
Mitutoyo Corporation
Shinichiro Yanaka
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method of evaluating flatness of a two-dimensional surface area
Patent number
11,300,407
Issue date
Apr 12, 2022
Boris Novakovic
G01 - MEASURING TESTING
Information
Patent Grant
Coordinate positioning machine
Patent number
11,300,408
Issue date
Apr 12, 2022
Renishaw plc
David Roberts McMurtry
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Surface texture measuring device, surface texture measuring system,...
Patent number
11,262,179
Issue date
Mar 1, 2022
Mitutoyo Corporation
Shinsaku Abe
G01 - MEASURING TESTING
Information
Patent Grant
Reducing measurement sensor error
Patent number
11,241,203
Issue date
Feb 8, 2022
Auris Health, Inc.
Sean P. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement and method for contactless determination of a dimension...
Patent number
11,243,174
Issue date
Feb 8, 2022
IMS Messsysteme GmbH
Horst Krauthäuser
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE COMPENSATION FOR MACHINE TOOL
Publication number
20240125584
Publication date
Apr 18, 2024
HEXAGON TECHNOLOGY CENTER GMBH
Claudio ISELI
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION OF A COORDINATE-MEASURING DEVICE
Publication number
20240093987
Publication date
Mar 21, 2024
TESA SARL
Beat AEBISCHER
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ESTIMATING UNCERTAINTY OF COORDINATE MEASUREMENT
Publication number
20230127538
Publication date
Apr 27, 2023
MITUTOYO CORPORATION
Takeshi HAGINO
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD
Publication number
20230050256
Publication date
Feb 16, 2023
RENISHAW PLC
John Charles OULD
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD FOR A SURFACE-MEASURING MEASURING MACHINE
Publication number
20220390228
Publication date
Dec 8, 2022
Leica Geosystems AG
Heinz Lippuner
G01 - MEASURING TESTING
Information
Patent Application
PROBE UNIT CORRECTION METHOD
Publication number
20220390227
Publication date
Dec 8, 2022
Mitutoyo Corporation
Kohju KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
POST-PROCESSING OF MEASUREMENT DATA COLLECTED WITH OPTICAL PROBE
Publication number
20220381552
Publication date
Dec 1, 2022
Hexagon Metrology, Inc.
Sean Taylor
G01 - MEASURING TESTING
Information
Patent Application
Scanning Path Segmentation of Workpiece
Publication number
20220381559
Publication date
Dec 1, 2022
Hexagon Metrology, Inc.
Sean Taylor
G01 - MEASURING TESTING
Information
Patent Application
MEASURING SYSTEM AND CONTROLLER
Publication number
20220364338
Publication date
Nov 17, 2022
MOBA Mobile Automation AG
Alfons HORN
E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information
Patent Application
REDUCING MEASUREMENT SENSOR ERROR
Publication number
20220249037
Publication date
Aug 11, 2022
Auris Health, Inc.
Sean P. Walker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
THREE-DIMENSIONAL IMAGING WITH ENHANCED RESOLUTION
Publication number
20220252512
Publication date
Aug 11, 2022
Xiumei Liu
G01 - MEASURING TESTING
Information
Patent Application
Determining Effective Trailer Wheelbase Length
Publication number
20220212732
Publication date
Jul 7, 2022
iSee, Inc.
Zachary Peters
B60 - VEHICLES IN GENERAL
Information
Patent Application
ERROR DETERMINATION APPARATUS, ERROR DETERMINATION METHOD, AND STOR...
Publication number
20220107177
Publication date
Apr 7, 2022
MITUTOYO CORPORATION
Yuto Inoue
G01 - MEASURING TESTING
Information
Patent Application
ROTARY TABLE COMPENSATION
Publication number
20220050436
Publication date
Feb 17, 2022
HEXAGON TECHNOLOGY CENTER GMBH
Markus SPRECHER
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND COMPUTER PROGRAM PRODUCT FOR OCT MEASUREMENT BEAM ADJUST...
Publication number
20220016730
Publication date
Jan 20, 2022
TRUMPF Laser - und Systemtechnik GmbH
Martin Stambke
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...
Publication number
20210285751
Publication date
Sep 16, 2021
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
MANUAL CALIBRATION OF IMAGING SYSTEM
Publication number
20210190476
Publication date
Jun 24, 2021
PHILIPS IMAGE GUIDED THERAPY CORPORATION
Andreas JOHANSSON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Arrangement and Method for Contactless Determination of a Dimension...
Publication number
20210164913
Publication date
Jun 3, 2021
IMS Messsysteme GmbH
Horst Krauthäuser
G01 - MEASURING TESTING
Information
Patent Application
FILTERING DEVICE, SENSOR DEVICE, FILTERING METHOD AND PROGRAM
Publication number
20210148693
Publication date
May 20, 2021
Mitsubishi Electric Corporation
Daiki ATA
G01 - MEASURING TESTING
Information
Patent Application
3D measurement model and spatial calibration method based on 1D dis...
Publication number
20210095959
Publication date
Apr 1, 2021
DALIAN UNIVERSITY OF TECHNOLOGY
Wei LIU
G01 - MEASURING TESTING
Information
Patent Application
COORDINATE POSITIONING MACHINE
Publication number
20210010808
Publication date
Jan 14, 2021
RENISHAW PLC
David Roberts MCMURTRY
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD FOR COMPENSATING A MAGNETIC LOCATOR, LOCATOR AND COMPUTER PR...
Publication number
20200363555
Publication date
Nov 19, 2020
MINMAXMEDICAL
Loic HUGUEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING THE STRAIGHTNESS ERROR OF SLENDE...
Publication number
20200340805
Publication date
Oct 29, 2020
Q-TECH S.R.L.
Luca FUMAGALLI
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE-STANDARD DEVICE FOR CALIBRATION OF MEASUREMENTS OF LENGTH...
Publication number
20200318957
Publication date
Oct 8, 2020
Istituto Nazionale di Ricerca Metrologica
Luca BOARINO
B82 - NANO-TECHNOLOGY
Information
Patent Application
MEASUREMENT SYSTEM WITH HEAT MEASUREMENT
Publication number
20200318958
Publication date
Oct 8, 2020
OY MAPVISION LTD
Janne JUSLIN
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Analysis of Measurement Data Acquired from Mu...
Publication number
20200292309
Publication date
Sep 17, 2020
Carl Zeiss Industrielle Messtechnik GmbH
Oliver MÜLLER
G01 - MEASURING TESTING
Information
Patent Application
ARTICULATED ARM COORDINATE MEASURING MACHINE HAVING THERMAL COMPENS...
Publication number
20200230802
Publication date
Jul 23, 2020
FARO TECHNOLOGIES, INC.
James P. Phipps
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE DAMPING OF A MEASURING DEVICE
Publication number
20200217654
Publication date
Jul 9, 2020
HEXAGON TECHNOLOGY CENTER GMBH
Bernhard SPRENGER
G05 - CONTROLLING REGULATING
Information
Patent Application
ABSOLUTE ROTARY ENCODER AND APPARATUS
Publication number
20200173774
Publication date
Jun 4, 2020
CANON PRECISION INC.
Kousuke KUDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REDUCING INCREMENTAL MEASUREMENT SENSOR ERROR
Publication number
20200155084
Publication date
May 21, 2020
Auris Health, Inc.
Sean P. Walker
G01 - MEASURING TESTING