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G01N2223/307
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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/307
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Patents Grants
last 30 patents
Information
Patent Grant
Component residual stress testing platform based on neutron diffrac...
Patent number
12,146,845
Issue date
Nov 19, 2024
NCS TESTING TECHNOLOGY CO., LTD
Lixia Yang
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
Patent number
12,104,997
Issue date
Oct 1, 2024
FAXITRON BIOPTICS, LLC
Donogh O'Driscoll
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
System and method for multi-axis imaging of specimens
Patent number
12,030,058
Issue date
Jul 9, 2024
FAXITRON BIOPTICS, LLC
Ciaran Purdy
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample holder, system and method
Patent number
12,007,339
Issue date
Jun 11, 2024
Carl Zeiss SMT Inc.
Thomas Anthony Case
G01 - MEASURING TESTING
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Information
Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
Patent number
11,913,891
Issue date
Feb 27, 2024
Rigaku Corporation
Koichiro Ito
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
Single-crystal X-ray structure analysis system
Patent number
11,879,857
Issue date
Jan 23, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and methods for use
Patent number
11,796,490
Issue date
Oct 24, 2023
University of Washington
Gerald Todd Seidler
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Flex plate with removable inserts and cover
Patent number
11,795,567
Issue date
Oct 24, 2023
Brookhaven Science Associates, LLC
Alexei S. Soares
C30 - CRYSTAL GROWTH
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Part inspection method using computed tomography
Patent number
11,719,651
Issue date
Aug 8, 2023
Faro Technologies, Inc.
Ariane Stiebeiner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray seed imaging system, cabinet x-ray device, and methods of eva...
Patent number
11,630,095
Issue date
Apr 18, 2023
Monsanto Technology LLC
Eric Borrowman
G01 - MEASURING TESTING
Information
Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
Patent number
11,566,981
Issue date
Jan 31, 2023
FAXITRON BIOPTICS, LLC
Donogh O'Driscoll
G01 - MEASURING TESTING
Information
Patent Grant
System and method for multi-axis imaging of specimens
Patent number
11,358,149
Issue date
Jun 14, 2022
FAXITRON BIOPTICS, LLC
Ciaran Purdy
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Material testing machine and radiation CT device
Patent number
11,353,410
Issue date
Jun 7, 2022
SHIMADZU TECHNO-RESEARCH, INC.
Takashi Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder
Patent number
11,293,882
Issue date
Apr 5, 2022
Orexplore AB
Alexander Hansson
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for X-ray fluorescence (XRF) analysis of explorat...
Patent number
11,175,246
Issue date
Nov 16, 2021
COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
Melvyn Lintern
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and methods for use
Patent number
11,054,375
Issue date
Jul 6, 2021
University of Washington
Gerald Todd Seidler
G02 - OPTICS
Information
Patent Grant
Flex plate with removable inserts and cover
Patent number
10,883,189
Issue date
Jan 5, 2021
Brookhaven Science Associates, LLC
Alexei S. Soares
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Multi-axis specimen imaging device with embedded orientation markers
Patent number
10,753,836
Issue date
Aug 25, 2020
Faxitron Bioptics, LLC
Donogh O'Driscoll
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Flex plate with removable inserts and cover
Patent number
10,753,834
Issue date
Aug 25, 2020
Brookhaven Science Associates, LLC
Alexei Soares
C30 - CRYSTAL GROWTH
Information
Patent Grant
Vacuum compatible fluid sampler
Patent number
10,639,634
Issue date
May 5, 2020
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
J. Alexander Liddle
G01 - MEASURING TESTING
Information
Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
Patent number
10,481,109
Issue date
Nov 19, 2019
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Agnieszka Priebe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Carrier for the examination of workpieces by computed tomography
Patent number
10,430,626
Issue date
Oct 1, 2019
CARL ZEISS 3D AUTOMATION GMBH
Frank Richter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Double-tilt in-situ nanoindentation platform for transmission elect...
Patent number
10,410,822
Issue date
Sep 10, 2019
Beijing University of Technology
Xiaodong Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for multi-axis imaging of specimens
Patent number
10,322,412
Issue date
Jun 18, 2019
Faxitron Bioptics, LLC
Ciaran Purdy
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Vacuum compatible fluid sampler
Patent number
10,265,699
Issue date
Apr 23, 2019
The United States of America, as represented by the Secretary of Commerce
J. Alexander Liddle
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Integral cap sample cup
Patent number
10,179,333
Issue date
Jan 15, 2019
Donato Pompa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
System and method for multi-axis imaging of specimens
Patent number
10,105,709
Issue date
Oct 23, 2018
Hologic, Inc.
Ciaran Purdy
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
Publication number
20240359187
Publication date
Oct 31, 2024
Faxitron Bioptics, LLC
Ciaran Purdy
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SYSTEM AND METHOD FOR A SPECIMEN CONTAINER FOR USE IN CABINET X-RAY...
Publication number
20240085284
Publication date
Mar 14, 2024
KUB Technologies Inc.
Vikram Butani
G01 - MEASURING TESTING
Information
Patent Application
LIQUID SAMPLE DELIVERY DEVICE
Publication number
20230234043
Publication date
Jul 27, 2023
SERIAL X AB
Richard NEUTZE
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
MULTI-AXIS SPECIMEN IMAGING DEVICE WITH EMBEDDED ORIENTATION MARKERS
Publication number
20230204473
Publication date
Jun 29, 2023
Faxitron Bioptics, LLC
Donogh O'Driscoll
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Improved Systems and Visualization Methods for Intraoperative Volum...
Publication number
20230025370
Publication date
Jan 26, 2023
CLARIX IMAGING CORPORATION
Xiao HAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
Publication number
20220331808
Publication date
Oct 20, 2022
Faxitron Bioptics, LLC
Ciaran Purdy
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS SYSTEM
Publication number
20220128494
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER, SYSTEM AND METHOD
Publication number
20210404977
Publication date
Dec 30, 2021
Carl Zeiss SMT Inc.
Thomas Anthony Case
G01 - MEASURING TESTING
Information
Patent Application
Flex Plate with Removable Inserts and Cover
Publication number
20210207284
Publication date
Jul 8, 2021
Brookhaven Science Associates, LLC
Alexei S. Soares
C07 - ORGANIC CHEMISTRY
Information
Patent Application
MULTI-AXIS SPECIMEN IMAGING DEVICE WITH EMBEDDED ORIENTATION MARKERS
Publication number
20200386657
Publication date
Dec 10, 2020
FAXITRON BIOPTICS, LLC
Donogh O'Driscoll
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Flex Plate with Removable Inserts and Cover
Publication number
20200340136
Publication date
Oct 29, 2020
Brookhaven Science Associates, LLC
Alexei S. Soares
C30 - CRYSTAL GROWTH
Information
Patent Application
SAMPLE HOLDER
Publication number
20200096460
Publication date
Mar 26, 2020
OREXPLORE AB
Alexander Hansson
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL TESTING MACHINE AND RADIATION CT DEVICE
Publication number
20200088655
Publication date
Mar 19, 2020
SHIMADZU TECHNO-RESEARCH, INC.
Takashi NAKAYAMA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-AXIS IMAGING OF SPECIMENS
Publication number
20200061622
Publication date
Feb 27, 2020
FAXITRON BIOPTICS, LLC
Ciaran Purdy
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR X-RAY FLUORESCENCE (XRF) ANALYSIS OF EXPLORAT...
Publication number
20190234890
Publication date
Aug 1, 2019
COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
Melvyn LINTERN
G01 - MEASURING TESTING
Information
Patent Application
MULTI-AXIS SPECIMEN IMAGING DEVICE WITH EMBEDDED ORIENTATION MARKERS
Publication number
20190072463
Publication date
Mar 7, 2019
FAXITRON BIOPTICS, LLC
Donogh O'Driscoll
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
ANALYSIS APPARATUS
Publication number
20180128726
Publication date
May 10, 2018
Industrial Technology Research Institute
Yen-Liang Lin
G01 - MEASURING TESTING
Information
Patent Application
FLEX PLATE WITH REMOVABLE INSERTS AND COVER
Publication number
20180003599
Publication date
Jan 4, 2018
Brookhaven Science Associates, LLC
Alexei Soares
C30 - CRYSTAL GROWTH
Information
Patent Application
CARRIER FOR THE EXAMINATION OF WORKPIECES BY COMPUTED TOMOGRAPHY
Publication number
20170372099
Publication date
Dec 28, 2017
Carl ZEISS 3D Automation GmbH
Frank Richter
G01 - MEASURING TESTING
Information
Patent Application
VACUUM COMPATIBLE FLUID SAMPLER
Publication number
20170348686
Publication date
Dec 7, 2017
Government of the United States of America, as Represented by the Secretary o...
J. ALEXANDER LIDDLE
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR THE STOICHIOMETRIC ANALYSIS OF SAMPLES
Publication number
20170205363
Publication date
Jul 20, 2017
LEIBNIZ-INSTITUT FUER NEUE MATERIALIEN GEMEINNUETZIGE GESELLSCHAFT MIT BESCHRAE
Niels DE JONGE
G01 - MEASURING TESTING
Information
Patent Application
Sample Cup Inner Member with Integral Venting Cap
Publication number
20170146470
Publication date
May 25, 2017
Premier Lab Supply Inc.
Donato Pompa
G01 - MEASURING TESTING
Information
Patent Application
FRONT-LOADING SAMPLE PREPARATION APPARATUS
Publication number
20160290938
Publication date
Oct 6, 2016
FLSMIDTH A/S
Lukas Bruzenak
G01 - MEASURING TESTING
Information
Patent Application
Sample Block Holder
Publication number
20140191125
Publication date
Jul 10, 2014
FEI Company
Matthew Barrett
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION-GEOMETRY ELECTROCHEMICAL CELL FOR IN-SITU SCATTERING...
Publication number
20140093052
Publication date
Apr 3, 2014
UChicago Argonne, LLC
Peter J. Chupas
G01 - MEASURING TESTING
Information
Patent Application
Sample Block Holder
Publication number
20130105677
Publication date
May 2, 2013
FEI Company
Matthew Barrett
G01 - MEASURING TESTING
Information
Patent Application
Double Tilt Transmission Electron Microscope Sample Holder for In-S...
Publication number
20130105706
Publication date
May 2, 2013
BEIJING UNIVERSITY OF TECHNOLOGY
Xiaodong Han
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE SYSTEM FOR RETICLE / WAFER DEFECTS INSPECTION AND...
Publication number
20120280125
Publication date
Nov 8, 2012
HERMES MICROVISION INC.
CHIYAN KUAN
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE COOLING APPARATUS FOR X-RAY DIFFRACTOMETER AND X-RAY DIFFRAC...
Publication number
20120275567
Publication date
Nov 1, 2012
Rigaku Corporation
Tomokazu Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
TRANSPORT BIN IN AN X-RAY INSPECTION SYSTEM
Publication number
20120189097
Publication date
Jul 26, 2012
Harald BLOESL
G01 - MEASURING TESTING