Data compression

Industry

CPC
H01J2237/30422

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/30422Data compression

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Cross scan proximity correction with ebeam universal cutter
- Patent number 10,747,115
- Issue date Aug 18, 2020
- Intel Corporation
- Yan A. Borodovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ebeam universal cutter
- Patent number 10,578,970
- Issue date Mar 3, 2020
- Intel Corporation
- Yan A. Borodovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross scan proximity correction with ebeam universal cutter
- Patent number 10,191,376
- Issue date Jan 29, 2019
- Intel Corporation
- Yan A. Borodovsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ebeam three beam aperture array
- Patent number 10,067,416
- Issue date Sep 4, 2018
- Intel Corporation
- Yan A. Borodovsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Unidirectional metal on layer with ebeam
- Patent number 10,014,256
- Issue date Jul 3, 2018
- Intel Corporation
- Donald W. Nelson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ebeam three beam aperture array
- Patent number 9,897,908
- Issue date Feb 20, 2018
- Intel Corporation
- Yan A. Borodovsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shot data generation method and multi charged particle beam writing...
- Patent number 9,514,914
- Issue date Dec 6, 2016
- NuFlare Technology, Inc.
- Hideo Inoue
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic generation of one dimensional data compaction commands fo...
- Patent number 6,353,922
- Issue date Mar 5, 2002
- International Business Machines Corporation
- Gregory J. Dick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of generating electron-beam data for creating a mask
- Patent number 6,189,135
- Issue date Feb 13, 2001
- Mitsubishi Electric Semiconductor Software Co., Ltd.
- Kenichiro Chisaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron-beam data generating apparatus
- Patent number 6,056,785
- Issue date May 2, 2000
- Mitsubishi Electric Semiconductor Software Co., Ltd.
- Kenichiro Chisaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for automatically recognizing repeated shapes...
- Patent number 5,699,266
- Issue date Dec 16, 1997
- International Business Machines Corporation
- Virginia M. Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for automatically recognizing repeated shapes...
- Patent number 5,481,472
- Issue date Jan 2, 1996
- International Business Machines Corporation
- Virginia M. Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
E-beam control data compaction system and method
- Patent number 5,251,140
- Issue date Oct 5, 1993
- International Business Machines Corporation
- Virginia M. Chung
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam exposure system with increased efficiency of exposure...
- Patent number 5,175,435
- Issue date Dec 29, 1992
- Fujitsu Limited
- Kiichi Sakamoto
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CROSS SCAN PROXIMITY CORRECTION WITH EBEAM UNIVERSAL CUTTER
- Publication number 20190121236
- Publication date Apr 25, 2019
- Intel Corporation
- YAN A. BORODOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EBEAM THREE BEAM APERTURE ARRAY
- Publication number 20180143526
- Publication date May 24, 2018
- Intel Corporation
- Yan A. BORODOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA COMPRESSION FOR EBEAM THROUGHPUT
- Publication number 20170069509
- Publication date Mar 9, 2017
- Intel Corporation
- Donald W. NELSON
- H01 - BASIC ELECTRIC ELEMENTS

Data compression

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cross scan proximity correction with ebeam universal cutter

Ebeam universal cutter

Cross scan proximity correction with ebeam universal cutter

Ebeam three beam aperture array

Unidirectional metal on layer with ebeam

Ebeam three beam aperture array

Shot data generation method and multi charged particle beam writing...

Automatic generation of one dimensional data compaction commands fo...

Method of generating electron-beam data for creating a mask

Electron-beam data generating apparatus

Method and apparatus for automatically recognizing repeated shapes...

Method and apparatus for automatically recognizing repeated shapes...

E-beam control data compaction system and method

Electron beam exposure system with increased efficiency of exposure...

Patents Applicationslast 30 patents

CROSS SCAN PROXIMITY CORRECTION WITH EBEAM UNIVERSAL CUTTER

EBEAM THREE BEAM APERTURE ARRAY

DATA COMPRESSION FOR EBEAM THROUGHPUT