Degradation or life time measurements

Industry

CPC
H01S5/0021

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01SDEVICES USING STIMULATED EMISSION H01S5/00Semiconductor lasers

Current Industry

H01S5/0021Degradation or life time measurements

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor laser element, testing method, and testing device
- Patent number 12,107,393
- Issue date Oct 1, 2024
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced eye-safe laser based lighting
- Patent number 12,100,932
- Issue date Sep 24, 2024
- Jabil Inc.
- Tony Gijbels
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser device and method of determining a malfunction of a laser diode
- Patent number 12,015,240
- Issue date Jun 18, 2024
- TRUMPF PHOTONIC COMPONENTS GMBH
- Philipp Henning Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-emitting laser device
- Patent number 11,973,307
- Issue date Apr 30, 2024
- SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
- Se Yeon Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical transmission system and filter penalty reduction method
- Patent number 11,942,755
- Issue date Mar 26, 2024
- Nippon Telegraph and Telephone Corporation
- Kohei Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified emitter array
- Patent number 11,916,356
- Issue date Feb 27, 2024
- Lumentum Operations LLC
- Vincent V. Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability high power high brightness blue laser diode system...
- Patent number 11,862,927
- Issue date Jan 2, 2024
- Nuburu, Inc.
- Jean-Philippe Feve
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser element, testing method, and testing device
- Patent number 11,824,326
- Issue date Nov 21, 2023
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser module, laser oscillator and laser processing system
- Patent number 11,769,984
- Issue date Sep 26, 2023
- Panasonic Holdings Corporation
- Hiroshi Ohno
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Non-contact wafer-level burn-in comprising a wireless power transfe...
- Patent number 11,721,949
- Issue date Aug 8, 2023
- Lumentum Operations LLC
- Chien-Yao Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor lasers and processes for the planarization of semicon...
- Patent number 11,605,933
- Issue date Mar 14, 2023
- MACOM Technology Solutions Holdings, Inc.
- Ali Badar Alamin Dow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Gallium and nitrogen containing laser module configured for phospho...
- Patent number 11,573,374
- Issue date Feb 7, 2023
- KYOCERA SLD Laser, Inc.
- Eric Goutain
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical module having multiple laser diode devices and a support me...
- Patent number 11,543,590
- Issue date Jan 3, 2023
- KYOCERA SLD Laser, Inc.
- Eric Goutain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System-level optical amplifier efficiency performance metric
- Patent number 11,411,365
- Issue date Aug 9, 2022
- Ciena Corporation
- David W. Boertjes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser device, and method for estimating degree of deterioration of...
- Patent number 11,404,842
- Issue date Aug 2, 2022
- Fujikura Ltd.
- Shinichi Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ bias voltage measurement of VCSELs
- Patent number 11,349,277
- Issue date May 31, 2022
- Lumentum Operations LLC
- Kevin M. Kupcho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser module and laser apparatus
- Patent number 11,309,683
- Issue date Apr 19, 2022
- Fujikura Ltd.
- Yohei Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser failure early warning indicator
- Patent number 11,177,620
- Issue date Nov 16, 2021
- Intel Corporation
- Mahan Movassaghi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam projector module for performing eye-safety function using temp...
- Patent number 11,056,855
- Issue date Jul 6, 2021
- NAMUGA, CO., LTD.
- Jun Youb Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser package having multiple emitters configured on a support member
- Patent number 10,655,800
- Issue date May 19, 2020
- Soraa Laser Diode, Inc.
- Eric Goutain
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Machine learning apparatus for learning condition for starting lase...
- Patent number 10,643,127
- Issue date May 5, 2020
- FANUC CORPORATION
- Hiroshi Takigawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor light-emitting device
- Patent number 10,511,144
- Issue date Dec 17, 2019
- Shimadzu Corporation
- Shingo Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical transmission device
- Patent number 10,484,087
- Issue date Nov 19, 2019
- Fuji Xerox Co., Ltd.
- Akemi Murakami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor light-emitting device
- Patent number 10,476,228
- Issue date Nov 12, 2019
- Shimadzu Corporation
- Shingo Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser fault tolerance and self-calibration system
- Patent number 10,447,004
- Issue date Oct 15, 2019
- nLIGHT, Inc.
- Robert Joseph Foley
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of fabricating surface-emitting laser
- Patent number 10,416,227
- Issue date Sep 17, 2019
- Sumitomo Electric Industries, Ltd.
- Ryosuke Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser fault tolerance and self-calibration system
- Patent number 10,396,525
- Issue date Aug 27, 2019
- nLIGHT, Inc.
- Robert Joseph Foley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light emitting semiconductor devices with getter layer
- Patent number 10,361,531
- Issue date Jul 23, 2019
- PHILIPS PHOTONICS GMBH
- Ulrich Weichmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser package having multiple emitters configured on a support member
- Patent number 10,247,366
- Issue date Apr 2, 2019
- Soraa Laser Diode, Inc.
- Eric Goutain
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Machine learning apparatus, laser apparatus and machine learning me...
- Patent number 10,242,325
- Issue date Mar 26, 2019
- FANUC CORPORATION
- Hiroshi Takigawa
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SPACE COMMUNICATION DEVICE AND OPTICAL SPACE COMMUNICATION...
- Publication number 20240372614
- Publication date Nov 7, 2024
- Nippon Telegraph and Telephone Corporation
- Takeshi IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE
- Publication number 20240055830
- Publication date Feb 15, 2024
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
- Publication number 20230408573
- Publication date Dec 21, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Tatyana ANTONENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED HETEROSTRUCTURE SEMICONDUCTOR LASER AND METHOD OF MANUFACTURE
- Publication number 20230352912
- Publication date Nov 2, 2023
- National Research Council of Canada
- Omid Salehzadeh EINABAD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...
- Publication number 20230246421
- Publication date Aug 3, 2023
- MACOM Technology Solutions Holdings, Inc.
- Ali Badar Alamin DOW
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HIGH RELIABILITY HIGH POWER HIGH BRIGHTNESS BLUE LASER DIODE SYSTEM...
- Publication number 20230208097
- Publication date Jun 29, 2023
- NUBURU, INC.
- Jean-Philippe Feve
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING TEMPERATURE OF A TIME OF FLIGHT (TOF) SYSTEM LASER
- Publication number 20230117191
- Publication date Apr 20, 2023
- Analog Devices International Unlimited Company
- Erik D. Barnes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER MODULE, LASER OSCILLATOR AND LASER PROCESSING SYSTEM
- Publication number 20230035398
- Publication date Feb 2, 2023
- Panasonic Holdings Corporation
- Hiroshi OHNO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ILLUMINATION DIAGNOSIS FOR LIDAR DRIVER
- Publication number 20220320817
- Publication date Oct 6, 2022
- Semiconductor Components Industries, LLC
- Jean-Paul Anna Joseph EGGERMONT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
- Publication number 20220137120
- Publication date May 5, 2022
- MELLANOX TECHNOLOGIES, LTD.
- Tatyana ANTONENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT SOURCE DEVICE
- Publication number 20210384697
- Publication date Dec 9, 2021
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Katsuya SAMONJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERIORATION DIAGNOSIS DEVICE AND METHOD FOR DIAGNOSING DETERIORAT...
- Publication number 20210367397
- Publication date Nov 25, 2021
- Mitsubishi Electric Corporation
- Satoshi SHIRAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM PROJECTOR MODULE FOR PERFORMING EYE-SAFETY FUNCTION USING TEMP...
- Publication number 20210288467
- Publication date Sep 16, 2021
- Namuga Co., Ltd.
- Jun Youb LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER DEVICE AND METHOD OF DETERMINING A MALFUNCTION OF A LASER DIODE
- Publication number 20210273399
- Publication date Sep 2, 2021
- TRUMPF Photonic Components GmbH
- Philipp Henning Gerlach
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE
- Publication number 20210151954
- Publication date May 20, 2021
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER MODULE AND LASER APPARATUS
- Publication number 20210013698
- Publication date Jan 14, 2021
- FUJIKURA LTD.
- Yohei Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM AND NITROGEN CONTAINING LASER MODULE CONFIGURED FOR PHOSPHO...
- Publication number 20200224831
- Publication date Jul 16, 2020
- Soraa Laser Diode, Inc.
- Eric Goutain
- B82 - NANO-TECHNOLOGY
Information Patent Application
LASER DEVICE, AND METHOD FOR ESTIMATING DEGREE OF DETERIORATION OF...
- Publication number 20200153196
- Publication date May 14, 2020
- FUJIKURA LTD.
- Shinichi Sakamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...
- Publication number 20200076164
- Publication date Mar 5, 2020
- MACOM Technology Solutions Holdings, Inc.
- Ali Badar Alamin DOW
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR LIGHT-EMITTING DEVICE
- Publication number 20190097395
- Publication date Mar 28, 2019
- SHIMADZU CORPORATION
- Shingo UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SURFACE-EMITTING LASER
- Publication number 20180356459
- Publication date Dec 13, 2018
- Sumitomo Electric Industries, Ltd.
- Ryosuke KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
LASER PACKAGE HAVING MULTIPLE EMITTERS CONFIGURED ON A SUPPORT MEMBER
- Publication number 20180058640
- Publication date Mar 1, 2018
- Soraa Laser Diode, Inc.
- Eric Goutain
- B82 - NANO-TECHNOLOGY
Information Patent Application
LASER APPARATUS ENABLING CALCULATION OF EFFECTIVE DRIVING TIME AND...
- Publication number 20180013259
- Publication date Jan 11, 2018
- FANUC CORPORATION
- Hiroshi Takigawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...
- Publication number 20170338625
- Publication date Nov 23, 2017
- MACOM Technology Solutions Holdings, Inc.
- Ali Badar Alamin DOW
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DIRECT DIODE LASER PROCESSING APPARATUS AND OUTPUT MONITORING METHO...
- Publication number 20170304942
- Publication date Oct 26, 2017
- AMADA HOLDINGS CO., LTD.
- Minoru OGATA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER APPARATUS FOR CALCULATING EFFECTIVE DRIVING TIME
- Publication number 20170310074
- Publication date Oct 26, 2017
- FANUC CORPORATION
- Satoshi Kagiwada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MACHINE LEARNING APPARATUS, LASER APPARATUS AND MACHINE LEARNING ME...
- Publication number 20170262772
- Publication date Sep 14, 2017
- FANUC CORPORATION
- Hiroshi Takigawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING APPARATUS FOR LEARNING CONDITION FOR STARTING LASE...
- Publication number 20170220927
- Publication date Aug 3, 2017
- FANUC CORPORATION
- Hiroshi Takigawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER FAULT TOLERANCE AND SELF-CALIBRATION SYSTEM
- Publication number 20170149203
- Publication date May 25, 2017
- nLIGHT, Inc.
- Robert Joseph Foley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER SYSTEM HAVING FAULT DIAGNOSIS FUNCTION
- Publication number 20170133819
- Publication date May 11, 2017
- FANUC CORPORATION
- Hiroshi Takigawa
- H01 - BASIC ELECTRIC ELEMENTS

Degradation or life time measurements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor laser element, testing method, and testing device

Enhanced eye-safe laser based lighting

Laser device and method of determining a malfunction of a laser diode

Surface-emitting laser device

Optical transmission system and filter penalty reduction method

Modified emitter array

High reliability high power high brightness blue laser diode system...

Semiconductor laser element, testing method, and testing device

Laser module, laser oscillator and laser processing system

Non-contact wafer-level burn-in comprising a wireless power transfe...

Semiconductor lasers and processes for the planarization of semicon...

Gallium and nitrogen containing laser module configured for phospho...

Optical module having multiple laser diode devices and a support me...

System-level optical amplifier efficiency performance metric

Laser device, and method for estimating degree of deterioration of...

In-situ bias voltage measurement of VCSELs

Laser module and laser apparatus

Laser failure early warning indicator

Beam projector module for performing eye-safety function using temp...

Laser package having multiple emitters configured on a support member

Machine learning apparatus for learning condition for starting lase...

Semiconductor light-emitting device

Optical transmission device

Semiconductor light-emitting device

Laser fault tolerance and self-calibration system

Method of fabricating surface-emitting laser

Laser fault tolerance and self-calibration system

Light emitting semiconductor devices with getter layer

Laser package having multiple emitters configured on a support member

Machine learning apparatus, laser apparatus and machine learning me...

Patents Applicationslast 30 patents

OPTICAL SPACE COMMUNICATION DEVICE AND OPTICAL SPACE COMMUNICATION...

SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE

SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS

BURIED HETEROSTRUCTURE SEMICONDUCTOR LASER AND METHOD OF MANUFACTURE

SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...

HIGH RELIABILITY HIGH POWER HIGH BRIGHTNESS BLUE LASER DIODE SYSTEM...

DETECTING TEMPERATURE OF A TIME OF FLIGHT (TOF) SYSTEM LASER

LASER MODULE, LASER OSCILLATOR AND LASER PROCESSING SYSTEM

ILLUMINATION DIAGNOSIS FOR LIDAR DRIVER

SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS

LIGHT SOURCE DEVICE

DETERIORATION DIAGNOSIS DEVICE AND METHOD FOR DIAGNOSING DETERIORAT...

BEAM PROJECTOR MODULE FOR PERFORMING EYE-SAFETY FUNCTION USING TEMP...

LASER DEVICE AND METHOD OF DETERMINING A MALFUNCTION OF A LASER DIODE

SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE

LASER MODULE AND LASER APPARATUS

GALLIUM AND NITROGEN CONTAINING LASER MODULE CONFIGURED FOR PHOSPHO...

LASER DEVICE, AND METHOD FOR ESTIMATING DEGREE OF DETERIORATION OF...

SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...

SEMICONDUCTOR LIGHT-EMITTING DEVICE

METHOD OF FABRICATING SURFACE-EMITTING LASER

LASER PACKAGE HAVING MULTIPLE EMITTERS CONFIGURED ON A SUPPORT MEMBER

LASER APPARATUS ENABLING CALCULATION OF EFFECTIVE DRIVING TIME AND...

SEMICONDUCTOR LASERS AND PROCESSES FOR THE PLANARIZATION OF SEMICON...

DIRECT DIODE LASER PROCESSING APPARATUS AND OUTPUT MONITORING METHO...

LASER APPARATUS FOR CALCULATING EFFECTIVE DRIVING TIME

MACHINE LEARNING APPARATUS, LASER APPARATUS AND MACHINE LEARNING ME...

MACHINE LEARNING APPARATUS FOR LEARNING CONDITION FOR STARTING LASE...

LASER FAULT TOLERANCE AND SELF-CALIBRATION SYSTEM

LASER SYSTEM HAVING FAULT DIAGNOSIS FUNCTION