Design for test; Design verification

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CPC
G01R31/31704

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31704Design for test; Design verification

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Error protection analysis of an integrated circuit
- Patent number 12,188,979
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Benjamin Neil Trombley
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling actions of testbench components w...
- Patent number 12,188,983
- Issue date Jan 7, 2025
- HCL America Inc.
- Manickam Muthiah
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking DFT circuit, test platform, storage medium and...
- Patent number 12,174,250
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Teng Shi
- G01 - MEASURING TESTING
Information Patent Grant
DFT architecture for analog circuits
- Patent number 12,135,351
- Issue date Nov 5, 2024
- STMicroelectronics S.r.l.
- Filippo Colombo
- G01 - MEASURING TESTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 12,099,092
- Issue date Sep 24, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Grant
System and method for device under test (DUT) validation reuse acro...
- Patent number 12,078,676
- Issue date Sep 3, 2024
- MARVELL ASIA PTE. LTD.
- Nimalan Siva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 12,072,377
- Issue date Aug 27, 2024
- Kabushiki Kaisha Toshiba
- Kiichi Goto
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for verifying integrated circuit stack having pho...
- Patent number 12,068,269
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Feng-Wei Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testbenches for electronic systems with automatic insertion of veri...
- Patent number 12,055,588
- Issue date Aug 6, 2024
- ARTERIS, INC.
- Benoit Lafage
- G01 - MEASURING TESTING
Information Patent Grant
Method, product, and system for protocol state graph neural network...
- Patent number 12,038,477
- Issue date Jul 16, 2024
- Cadence Design Systems, Inc.
- Shadi Saba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid solver for integrated circuit diagnostics and testing
- Patent number 12,038,478
- Issue date Jul 16, 2024
- Xerox Corporation
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for fault injection testing of an integrated ci...
- Patent number 12,019,119
- Issue date Jun 25, 2024
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for scan chain stitching
- Patent number 12,007,440
- Issue date Jun 11, 2024
- Cadence Design Systems, Inc.
- Puneet Arora
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 11,940,495
- Issue date Mar 26, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for debugging metastability in digital circuits
- Patent number 11,892,504
- Issue date Feb 6, 2024
- Cadence Design Systems, Inc.
- Alberto Arias Drake
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for managing transactions burstiness and generati...
- Patent number 11,797,409
- Issue date Oct 24, 2023
- HCL America Inc.
- Manickam Muthiah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
- Patent number 11,733,297
- Issue date Aug 22, 2023
- PseudolithIC, Inc.
- James Buckwaiter
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for identifying flaws and bugs in integrated ci...
- Patent number 11,733,295
- Issue date Aug 22, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for saving and restoring of initialization action...
- Patent number 11,719,749
- Issue date Aug 8, 2023
- Cadence Design Systems, Inc.
- Tirumala Surya Prasad Annepu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing artificial intelligence chip, devi...
- Patent number 11,714,128
- Issue date Aug 1, 2023
- KUNLUNXIN TECHNOLOGY (BEIJING) COMPANY LIMITED
- Ziyu Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reformatting scan patterns in presence of hold type pipelines
- Patent number 11,694,010
- Issue date Jul 4, 2023
- Synopsys, Inc.
- Amit Gopal M. Purohit
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Input data compression for machine learning-based chain diagnosis
- Patent number 11,681,843
- Issue date Jun 20, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for verifying integrated circuit stack having pho...
- Patent number 11,670,610
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Feng-Wei Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable scan architecture for multi-circuit block arrays
- Patent number 11,639,962
- Issue date May 2, 2023
- Xilinx, Inc.
- Niravkumar Patel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination and correction of physical circuit event related erro...
- Patent number 11,630,152
- Issue date Apr 18, 2023
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Core partition circuit and testing device
- Patent number 11,624,782
- Issue date Apr 11, 2023
- SHANGHAI ZHAOXIN SEMICONDUCTOR CO., LTD.
- Yunhao Xing
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and systems for fault injection testing of an integrated ci...
- Patent number 11,567,126
- Issue date Jan 31, 2023
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Grant
Hardware-software interaction testing using formal verification
- Patent number 11,544,436
- Issue date Jan 3, 2023
- Amazon Technologies, Inc.
- Uri Leder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling test networks of chips using integrated processors
- Patent number 11,526,644
- Issue date Dec 13, 2022
- NVIDIA Corporation
- Kaushik Narayanun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for signal observability rating
- Patent number 11,507,720
- Issue date Nov 22, 2022
- Cadence Design Systems, Inc.
- Matheus Nogueira Fonseca
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING A TEST PROGRAM
- Publication number 20240426906
- Publication date Dec 26, 2024
- Teradyne, Inc.
- Charles J. Carline
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...
- Publication number 20240418774
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT
- Publication number 20240402246
- Publication date Dec 5, 2024
- International Business Machines Corporation
- BENJAMIN NEIL TROMBLEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR VERIFYING INTEGRATED CIRCUIT STACK
- Publication number 20240355769
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Feng-Wei Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT IN SELF-TEST OF HETEROGENEOUS INTEGRATED RADIO FREQUENCY CHIP...
- Publication number 20240329136
- Publication date Oct 3, 2024
- PseudolithIC, Inc.
- James Buckwalter
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AND METHOD OF IMPROVING THE YIELD OF INTEGRATED CIRCUITS
- Publication number 20240264227
- Publication date Aug 8, 2024
- ZINITE CORPORATION
- Manoj SACHDEV
- G01 - MEASURING TESTING
Information Patent Application
Design For Test For Source Synchronous Interfaces
- Publication number 20240192271
- Publication date Jun 13, 2024
- NXP B.V.
- Akhil Garg
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS
- Publication number 20240125869
- Publication date Apr 18, 2024
- COILCRAFT, INCORPORATED
- Leonard Crane
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FA...
- Publication number 20240118339
- Publication date Apr 11, 2024
- SK HYNIX INC.
- YU-AN CHEN
- G01 - MEASURING TESTING
Information Patent Application
CHIP VERIFICATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STOR...
- Publication number 20240036111
- Publication date Feb 1, 2024
- HORIZON (SHANGHAI) ARTIFICIAL INTELLIGENCE TECHNOLOGY CO., LTD.
- Zhengyu LI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20240036110
- Publication date Feb 1, 2024
- Kabushiki Kaisha Toshiba
- Kiichi GOTO
- G01 - MEASURING TESTING
Information Patent Application
IP CORE TESTING APPARATUS
- Publication number 20240012048
- Publication date Jan 11, 2024
- INFINEON TECHNOLOGIES AG
- Rajendra Prasad Manchikalapati
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING
- Publication number 20240003970
- Publication date Jan 4, 2024
- Palo Alto Research Center Incorporated
- Aleksandar B. Feldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR VER...
- Publication number 20230384370
- Publication date Nov 30, 2023
- Fulian Precision Electronics (Tianjin) Co., LTD.
- SHUN-FU TUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHECKING DFT CIRCUIT, TEST PLATFORM, STORAGE MEDIUM AND...
- Publication number 20230358805
- Publication date Nov 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Teng SHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR VERIFYING INTEGRATED CIRCUIT STACK HAVING PHO...
- Publication number 20230268301
- Publication date Aug 24, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Feng-Wei Kuo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DFT ARCHITECTURE FOR ANALOG CIRCUITS
- Publication number 20230243886
- Publication date Aug 3, 2023
- STMicroelectronics S.r.l
- Filippo Colombo
- G01 - MEASURING TESTING
Information Patent Application
CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING
- Publication number 20230213579
- Publication date Jul 6, 2023
- MEDIATEK INC.
- Pin-Wen CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...
- Publication number 20230160957
- Publication date May 25, 2023
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Application
TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...
- Publication number 20230111938
- Publication date Apr 13, 2023
- Arteris, Inc
- Benoit LAFAGE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...
- Publication number 20230080463
- Publication date Mar 16, 2023
- International Business Machines Corporation
- Arun Joseph
- G01 - MEASURING TESTING
Information Patent Application
REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES
- Publication number 20220137126
- Publication date May 5, 2022
- Synopsys, Inc.
- Amit Gopal M. PUROHIT
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...
- Publication number 20220043059
- Publication date Feb 10, 2022
- Imagination Technologies Limited
- Reinald Cruz
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...
- Publication number 20210270897
- Publication date Sep 2, 2021
- International Business Machines Corporation
- Pradip Bose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD
- Publication number 20210156916
- Publication date May 27, 2021
- Global Unichip Corporation
- Yen-Chung CHEN
- G01 - MEASURING TESTING
Information Patent Application
SCAN FLIP-FLOP, FLIP-FLOP AND SCAN TEST CIRCUIT INCLUDING THE SAME
- Publication number 20210152162
- Publication date May 20, 2021
- Samsung Electronics Co., Ltd.
- Raheel Azmat
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING AN INFERENCE ASSOCIATED WITH DELAYS...
- Publication number 20210116502
- Publication date Apr 22, 2021
- HCL Technologies Limited
- Manickam MUTHIAH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIGITAL CIRCUIT ROBUSTNESS VERIFICATION METHOD AND SYSTEM
- Publication number 20210072314
- Publication date Mar 11, 2021
- REALTEK SEMICONDUCTOR CORPORATION
- Wen-Yi MAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING VERIFICATION IP FOR PRE-SILICON...
- Publication number 20200401754
- Publication date Dec 24, 2020
- SILICONCH SYSTEMS PVT LTD
- Kaustubh KUMAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ITERATIVE APPROACH TO DETERMINE FAILURE THRESHOLD ASSOCIATED WITH D...
- Publication number 20200379041
- Publication date Dec 3, 2020
- International Business Machines Corporation
- Tong Li
- G06 - COMPUTING CALCULATING COUNTING

Design for test; Design verification

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Error protection analysis of an integrated circuit

Method and system for controlling actions of testbench components w...

Method for checking DFT circuit, test platform, storage medium and...

DFT architecture for analog circuits

Built in self-test of heterogeneous integrated radio frequency chip...

System and method for device under test (DUT) validation reuse acro...

Information processing apparatus, information processing method, an...

Method and system for verifying integrated circuit stack having pho...

Testbenches for electronic systems with automatic insertion of veri...

Method, product, and system for protocol state graph neural network...

Hybrid solver for integrated circuit diagnostics and testing

Methods and systems for fault injection testing of an integrated ci...

Systems and methods for scan chain stitching

Built in self-test of heterogeneous integrated radio frequency chip...

Method and system for debugging metastability in digital circuits

Method and system for managing transactions burstiness and generati...

Built in self-test of heterogeneous integrated radio frequency chip...

Methods and systems for identifying flaws and bugs in integrated ci...

Method and system for saving and restoring of initialization action...

Method and apparatus for testing artificial intelligence chip, devi...

Reformatting scan patterns in presence of hold type pipelines

Input data compression for machine learning-based chain diagnosis

Method and system for verifying integrated circuit stack having pho...

Scalable scan architecture for multi-circuit block arrays

Determination and correction of physical circuit event related erro...

Core partition circuit and testing device

Methods and systems for fault injection testing of an integrated ci...

Hardware-software interaction testing using formal verification

Controlling test networks of chips using integrated processors

Systems and methods for signal observability rating

Patents Applicationslast 30 patents

GENERATING A TEST PROGRAM

METHOD AND SYSTEM FOR CONTROLLING ACTIONS OF TESTBENCH COMPONENTS W...

ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT

METHOD AND SYSTEM FOR VERIFYING INTEGRATED CIRCUIT STACK

BUILT IN SELF-TEST OF HETEROGENEOUS INTEGRATED RADIO FREQUENCY CHIP...

SYSTEM FOR AND METHOD OF IMPROVING THE YIELD OF INTEGRATED CIRCUITS

Design For Test For Source Synchronous Interfaces

ELECTRIC COMPONENT COMPARISON APPARATUS, SYSTEM, AND RELATED METHODS

SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FA...

CHIP VERIFICATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STOR...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

IP CORE TESTING APPARATUS

HYBRID SOLVER FOR INTEGRATED CIRCUIT DIAGNOSTICS AND TESTING

METHOD, SYSTEM, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR VER...

METHOD FOR CHECKING DFT CIRCUIT, TEST PLATFORM, STORAGE MEDIUM AND...

METHOD AND SYSTEM FOR VERIFYING INTEGRATED CIRCUIT STACK HAVING PHO...

DFT ARCHITECTURE FOR ANALOG CIRCUITS

CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING

METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...

TESTBENCHES FOR ELECTRONIC SYSTEMS WITH AUTOMATIC INSERTION OF VERI...

METHODS AND SYSTEMS FOR IDENTIFYING FLAWS AND BUGS IN INTEGRATED CI...

REFORMATTING SCAN PATTERNS IN PRESENCE OF HOLD TYPE PIPELINES

METHODS AND SYSTEMS FOR FAULT INJECTION TESTING OF AN INTEGRATED CI...

DETERMINATION AND CORRECTION OF PHYSICAL CIRCUIT EVENT RELATED ERRO...

TESTING DEVICE AND TESTING METHOD

SCAN FLIP-FLOP, FLIP-FLOP AND SCAN TEST CIRCUIT INCLUDING THE SAME

SYSTEM AND METHOD FOR PROVIDING AN INFERENCE ASSOCIATED WITH DELAYS...

DIGITAL CIRCUIT ROBUSTNESS VERIFICATION METHOD AND SYSTEM

SYSTEM AND METHOD FOR IMPLEMENTING VERIFICATION IP FOR PRE-SILICON...

ITERATIVE APPROACH TO DETERMINE FAILURE THRESHOLD ASSOCIATED WITH D...