Details concerning the preparation of powder samples

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/2005Details concerning the preparation of powder samples

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Patents Grantslast 30 patents

Information Patent Grant
Method for the detection and correction of lens distortions in an e...
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Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
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Systems and methods for performing serial electron diffraction nano...
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- R. J. Dwayne Miller
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Crystal defect observation method for compound semiconductor
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- Hajime Sasaki
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Method for improving an EBSD/TKD map
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- G06 - COMPUTING CALCULATING COUNTING
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Mass spectrometer
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- Shimadzu Corporation
- Osamu Furuhashi
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Classification method and system for fine-grained mixed sedimentary...
- Patent number 11,879,884
- Issue date Jan 23, 2024
- CHENGDU UNIVERSITY OF TECHNOLOGY
- Yiquan Ma
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Information Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
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- Jeffery A. Aguiar
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Data-driven solutions for inverse elemental modeling
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Methods and systems for acquiring three-dimensional electron diffra...
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Information Patent Grant
Electron microscopy analysis method
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- Commissariat a l'Energie Atomique et Aux Energies Alternatives
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Information Patent Grant
Apparatus, method, and recording medium storing command for control...
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Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...
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Laser welding method between different kinds of metals for optimizi...
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Information Patent Grant
Methods and compositions for micro-electron diffraction
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Best solution calculation method and dominant solution calculation...
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Information Patent Grant
Method and system for automatic zone axis alignment
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Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
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Information Patent Grant
Crystal structure analysis system and crystal structure analysis me...
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Solid forms comprising 4-amino-2-(2,6- dioxopiperidine-3-yl)isoindo...
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Method for automatically aligning a scanning transmission electron...
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Inert crystal delivery medium for serial femtosecond crystallography
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- Arizona Board of Regents on behalf of Arizona State University
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Photocathode emitter system that generates multiple electron beams
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System and method of analyzing a crystal defect
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Method of performing electron diffraction pattern analysis upon a s...
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System and method for performing nano beam diffraction analysis
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Scanning transmission electron microscope
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Information Patent Grant
Method of determining the deflection of an electron beam resulting...
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3D printed microfluidic mixers and nozzles for crystallography
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Information Patent Grant
Methods for analyzing respirable particles in bulk materials
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Patents Applicationslast 30 patents

Information Patent Application
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HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
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ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...
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PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS
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LAMINATE FOR WIRING BOARD
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SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
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METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
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CLASSIFICATION METHOD AND SYSTEM FOR FINE-GRAINED MIXED SEDIMENTARY...
- Publication number 20240053322
- Publication date Feb 15, 2024
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METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
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SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
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APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...
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ELECTRON MICROSCOPE ANALYSIS SYSTEM
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HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
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- California Institute of Technology
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Information Patent Application
METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS
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- The Regents of the University of California
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AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...
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DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION
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- Saudi Arabian Oil Company
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- G01 - MEASURING TESTING
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Methods for determining crystal structure and apparatus for carryin...
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METHOD FOR DETERMINING STRUCTURE OF SUBSTANCE IN MULTICOMPONENT SAMPLE
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METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
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METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
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CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
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MASS SPECTROMETER
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METHOD FOR IMPROVING AN EBSD/TKD MAP
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SYSTEMS AND METHODS FOR PERFORMING SERIAL ELECTRON DIFFRACTION NANO...
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- R. J. Dwayne MILLER
- G01 - MEASURING TESTING
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DATA-DRIVEN SOLUTION FOR INVERSE ELEMENTAL MODELING
- Publication number 20220107279
- Publication date Apr 7, 2022
- Baker Hughes Oilfield Operations LLC
- Robert Krumm
- E21 - EARTH DRILLING MINING
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
- Publication number 20220076917
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- FEI Company
- John J. FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
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HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAM...
- Publication number 20210381992
- Publication date Dec 9, 2021
- Battelle Energy Alliance, LLC
- Jeffrey A. Aguiar
- G01 - MEASURING TESTING

Details concerning the preparation of powder samples

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for the detection and correction of lens distortions in an e...

Methods for determining crystal structure and apparatus for carryin...

Systems and methods for performing serial electron diffraction nano...

Crystal defect observation method for compound semiconductor

Method for improving an EBSD/TKD map

Mass spectrometer

Classification method and system for fine-grained mixed sedimentary...

Hyperdimensional scanning transmission electron microscopy and exam...

Data-driven solutions for inverse elemental modeling

Methods and systems for acquiring three-dimensional electron diffra...

Electron microscopy analysis method

Apparatus, method, and recording medium storing command for control...

Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...

Laser welding method between different kinds of metals for optimizi...

Methods and compositions for micro-electron diffraction

Best solution calculation method and dominant solution calculation...

Method and system for automatic zone axis alignment

Methods and systems for acquiring electron backscatter diffraction...

Crystal structure analysis system and crystal structure analysis me...

Solid forms comprising 4-amino-2-(2,6- dioxopiperidine-3-yl)isoindo...

Method for automatically aligning a scanning transmission electron...

Inert crystal delivery medium for serial femtosecond crystallography

Photocathode emitter system that generates multiple electron beams

System and method of analyzing a crystal defect

Method of performing electron diffraction pattern analysis upon a s...

System and method for performing nano beam diffraction analysis

Scanning transmission electron microscope

Method of determining the deflection of an electron beam resulting...

3D printed microfluidic mixers and nozzles for crystallography

Methods for analyzing respirable particles in bulk materials

Patents Applicationslast 30 patents

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

TEM Orientation Mapping via Dark-Field Vector Images

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...

PROXIMITY SENSOR FOR ELECTRON BACKSCATTER DIFFRACTION SYSTEMS

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

LAMINATE FOR WIRING BOARD

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL

CLASSIFICATION METHOD AND SYSTEM FOR FINE-GRAINED MIXED SEDIMENTARY...

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...

ELECTRON MICROSCOPE ANALYSIS SYSTEM

HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...

IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS

METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS

AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...

DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION

Methods for determining crystal structure and apparatus for carryin...

METHOD FOR DETERMINING STRUCTURE OF SUBSTANCE IN MULTICOMPONENT SAMPLE

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

MASS SPECTROMETER

METHOD FOR IMPROVING AN EBSD/TKD MAP

SYSTEMS AND METHODS FOR PERFORMING SERIAL ELECTRON DIFFRACTION NANO...

DATA-DRIVEN SOLUTION FOR INVERSE ELEMENTAL MODELING

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAM...