Details concerning the preparation of powder samples

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G01N23/2005

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2005Details concerning the preparation of powder samples

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for improving an EBSD/TKD map
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- Issue date Mar 26, 2024
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- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometer
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- Issue date Feb 20, 2024
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
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Classification method and system for fine-grained mixed sedimentary...
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- Issue date Jan 23, 2024
- CHENGDU UNIVERSITY OF TECHNOLOGY
- Yiquan Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
- Patent number 11,852,598
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- Battelle Energy Alliance, LLC
- Jeffery A. Aguiar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data-driven solutions for inverse elemental modeling
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- Issue date Nov 21, 2023
- Baker Hughes Oilfield Operations LLC
- Robert Krumm
- E21 - EARTH DRILLING MINING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy analysis method
- Patent number 11,686,693
- Issue date Jun 27, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Nicolas Bernier
- G01 - MEASURING TESTING
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Apparatus, method, and recording medium storing command for control...
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- Young Kyun Noh
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Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...
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- Issue date Aug 9, 2022
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- G. Patrick Stahly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Laser welding method between different kinds of metals for optimizi...
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- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and compositions for micro-electron diffraction
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- Issue date Apr 5, 2022
- Howard Hughes Medical Institute
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Best solution calculation method and dominant solution calculation...
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- PHYSONIT INC.
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- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatic zone axis alignment
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- Issue date Dec 28, 2021
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
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- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Crystal structure analysis system and crystal structure analysis me...
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- Jeol Ltd.
- Koji Yonekura
- G01 - MEASURING TESTING
Information Patent Grant
Solid forms comprising 4-amino-2-(2,6- dioxopiperidine-3-yl)isoindo...
- Patent number 10,835,522
- Issue date Nov 17, 2020
- Celgene Corporation
- G. Patrick Stahly
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically aligning a scanning transmission electron...
- Patent number 10,811,216
- Issue date Oct 20, 2020
- TESCAN BRNO s.r.o
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inert crystal delivery medium for serial femtosecond crystallography
- Patent number 10,775,322
- Issue date Sep 15, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Chelsie Conrad
- G01 - MEASURING TESTING
Information Patent Grant
Photocathode emitter system that generates multiple electron beams
- Patent number 10,741,354
- Issue date Aug 11, 2020
- KLA-Tencor Corporation
- Gildardo R. Delgado
- G01 - MEASURING TESTING
Information Patent Grant
System and method of analyzing a crystal defect
- Patent number 10,727,025
- Issue date Jul 28, 2020
- Samsung Electronics Co., Ltd.
- Sung-Bo Shim
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing electron diffraction pattern analysis upon a s...
- Patent number 10,663,414
- Issue date May 26, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Frank Willi Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission electron microscope
- Patent number 10,636,622
- Issue date Apr 28, 2020
- Tescan Orsay Holding, A.S.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining the deflection of an electron beam resulting...
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- Commissariat a l'Energie Atomique et Aux Energies Alternatives
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- G01 - MEASURING TESTING
Information Patent Grant
3D printed microfluidic mixers and nozzles for crystallography
- Patent number 10,557,807
- Issue date Feb 11, 2020
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Methods for analyzing respirable particles in bulk materials
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- Issue date Dec 10, 2019
- United States Gypsum Company
- James W. Barber
- G01 - MEASURING TESTING
Information Patent Grant
Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...
- Patent number 10,376,503
- Issue date Aug 13, 2019
- Celgene Corporation
- G. Patrick Stahly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning transmission electron microscope with an objective electro...
- Patent number 10,381,193
- Issue date Aug 13, 2019
- TESCAN Brno, s.r.o.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Detector for X-rays with high spatial and high spectral resolution
- Patent number 10,295,486
- Issue date May 21, 2019
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

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- GATAN, INC.
- Colin Geoffrey TREVOR
- G01 - MEASURING TESTING
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LAMINATE FOR WIRING BOARD
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- G01 - MEASURING TESTING
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SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
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- Silanna UV Technologies Pte Ltd
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METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
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- FEI Company
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- G01 - MEASURING TESTING
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CLASSIFICATION METHOD AND SYSTEM FOR FINE-GRAINED MIXED SEDIMENTARY...
- Publication number 20240053322
- Publication date Feb 15, 2024
- Chengdu University of Technology
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- G06 - COMPUTING CALCULATING COUNTING
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METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230393083
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
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- G06 - COMPUTING CALCULATING COUNTING
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SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
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APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...
- Publication number 20230279538
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- IVWorks Co., Ltd.
- Young Kyun NOH
- G01 - MEASURING TESTING
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ELECTRON MICROSCOPE ANALYSIS SYSTEM
- Publication number 20230223232
- Publication date Jul 13, 2023
- Riken
- Daisuke SHINDO
- H01 - BASIC ELECTRIC ELEMENTS
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HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
- Publication number 20230213463
- Publication date Jul 6, 2023
- California Institute of Technology
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IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS
- Publication number 20230175991
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- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
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- G01 - MEASURING TESTING
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METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230145297
- Publication date May 11, 2023
- The Regents of the University of California
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AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...
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- Samsung Electronics Co., Ltd.
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DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION
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- Saudi Arabian Oil Company
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METHOD FOR DETERMINING STRUCTURE OF SUBSTANCE IN MULTICOMPONENT SAMPLE
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- KIRIN HOLDINGS KABUSHIK KAISHA
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METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
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METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
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CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
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MASS SPECTROMETER
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METHOD FOR IMPROVING AN EBSD/TKD MAP
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DATA-DRIVEN SOLUTION FOR INVERSE ELEMENTAL MODELING
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- Baker Hughes Oilfield Operations LLC
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- E21 - EARTH DRILLING MINING
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METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT
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Information Patent Application
SOLID FORMS COMPRISING 4-AMINO-2-(2,6-DIOXOPIPERIDINE-3-YL)ISOINDOL...
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BEST SOLUTION CALCULATION METHOD AND DOMINANT SOLUTION CALCULATION...
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ELECTRON MICROSCOPY ANALYSIS METHOD
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- Commissariat a I'Energie Atomique et aux Energies Alternatives
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METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
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- Publication date Jan 7, 2021
- FEI Company
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- H01 - BASIC ELECTRIC ELEMENTS

Details concerning the preparation of powder samples

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for improving an EBSD/TKD map

Mass spectrometer

Classification method and system for fine-grained mixed sedimentary...

Hyperdimensional scanning transmission electron microscopy and exam...

Data-driven solutions for inverse elemental modeling

Methods and systems for acquiring three-dimensional electron diffra...

Electron microscopy analysis method

Apparatus, method, and recording medium storing command for control...

Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...

Laser welding method between different kinds of metals for optimizi...

Methods and compositions for micro-electron diffraction

Best solution calculation method and dominant solution calculation...

Method and system for automatic zone axis alignment

Methods and systems for acquiring electron backscatter diffraction...

Crystal structure analysis system and crystal structure analysis me...

Solid forms comprising 4-amino-2-(2,6- dioxopiperidine-3-yl)isoindo...

Method for automatically aligning a scanning transmission electron...

Inert crystal delivery medium for serial femtosecond crystallography

Photocathode emitter system that generates multiple electron beams

System and method of analyzing a crystal defect

Method of performing electron diffraction pattern analysis upon a s...

System and method for performing nano beam diffraction analysis

Scanning transmission electron microscope

Method of determining the deflection of an electron beam resulting...

3D printed microfluidic mixers and nozzles for crystallography

Methods for analyzing respirable particles in bulk materials

Solid forms comprising 4-amino-2-(2,6-dioxopiperidine-3-yl)isoindol...

Scanning transmission electron microscope with an objective electro...

Scanning transmission electron microscope and method of image gener...

Detector for X-rays with high spatial and high spectral resolution

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

LAMINATE FOR WIRING BOARD

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL

CLASSIFICATION METHOD AND SYSTEM FOR FINE-GRAINED MIXED SEDIMENTARY...

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

APPARATUS, METHOD, AND RECORDING MEDIUM STORING COMMAND FOR CONTROL...

ELECTRON MICROSCOPE ANALYSIS SYSTEM

HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...

IMPROVED CAMERA FOR ELECTRON DIFFRACTION PATTERN ANALYSIS

METHODS FOR COLLECTING ELECTRON DIFFRACTION PATTERNS

AUTOMATED MAPPING METHOD OF CRYSTALLINE STRUCTURE AND ORIENTATION O...

DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION

Methods for determining crystal structure and apparatus for carryin...

METHOD FOR DETERMINING STRUCTURE OF SUBSTANCE IN MULTICOMPONENT SAMPLE

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

MASS SPECTROMETER

METHOD FOR IMPROVING AN EBSD/TKD MAP

SYSTEMS AND METHODS FOR PERFORMING SERIAL ELECTRON DIFFRACTION NANO...

DATA-DRIVEN SOLUTION FOR INVERSE ELEMENTAL MODELING

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

HYPERDIMENSIONAL SCANNING TRANSMISSION ELECTRON MICROSCOPY AND EXAM...

METHOD AND SYSTEM FOR AUTOMATIC ZONE AXIS ALIGNMENT

SOLID FORMS COMPRISING 4-AMINO-2-(2,6-DIOXOPIPERIDINE-3-YL)ISOINDOL...

BEST SOLUTION CALCULATION METHOD AND DOMINANT SOLUTION CALCULATION...

ELECTRON MICROSCOPY ANALYSIS METHOD

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...