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Details of detection or image processing, including general computer control
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PHYSICS
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Optics
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OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
G02B21/00
Microscopes
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G02B21/008
Details of detection or image processing, including general computer control
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Patents Grants
last 30 patents
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Patent Grant
Method and microscope for determining the thickness of a cover slip...
Patent number
11,971,531
Issue date
Apr 30, 2024
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Light microscope and microscopy method
Patent number
11,966,036
Issue date
Apr 23, 2024
Carl Zeiss Microscopy GmbH
Tiemo Anhut
G01 - MEASURING TESTING
Information
Patent Grant
Light sheet microscope and sample observation method
Patent number
11,966,035
Issue date
Apr 23, 2024
Hamamatsu Photonics K.K.
Yuu Takiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Impulse rescan system
Patent number
11,943,537
Issue date
Mar 26, 2024
Leica Biosystems Imaging, Inc.
Nicholas Newberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for evaluating quality of graphene
Patent number
11,933,955
Issue date
Mar 19, 2024
Seoul National University R&DB Foundation
Byung Hee Hong
G02 - OPTICS
Information
Patent Grant
Method for detecting emission light, detection device and laser sca...
Patent number
11,921,274
Issue date
Mar 5, 2024
Carl Zeiss Microscopy GmbH
Daniel Schwedt
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring device and process
Patent number
11,921,042
Issue date
Mar 5, 2024
BioAxial SAS
Gabriel Y Sirat
G01 - MEASURING TESTING
Information
Patent Grant
Multifocal macroscope for large field of view imaging of dynamic sp...
Patent number
11,921,271
Issue date
Mar 5, 2024
The Board of Trustees of the Leland Stanford Junior Univeristy
Gordon Wetzstein
G02 - OPTICS
Information
Patent Grant
Auto-focus methods and systems for multi-spectral imaging
Patent number
11,914,130
Issue date
Feb 27, 2024
Ventana Medical Systems, Inc.
Joerg Bredno
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Background-suppressed STED nanoscope
Patent number
11,914,129
Issue date
Feb 27, 2024
The Johns Hopkins University
Taekjip Ha
G01 - MEASURING TESTING
Information
Patent Grant
High-throughput optical sectioning three-dimensional imaging system
Patent number
11,906,723
Issue date
Feb 20, 2024
HUST-SUZHOU INSTITUTE FOR BRAINSMATICS
Qingming Luo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image processing system and image processing method
Patent number
11,900,574
Issue date
Feb 13, 2024
EVIDENT CORPORATION
Kanako Isono
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for generating an image
Patent number
11,892,613
Issue date
Feb 6, 2024
Yeda Research and Development Co. Ltd.
Dan Oron
G01 - MEASURING TESTING
Information
Patent Grant
Observation device
Patent number
11,892,706
Issue date
Feb 6, 2024
HITACHI HIGH-TECH CORPORATION
Akira Masuya
G01 - MEASURING TESTING
Information
Patent Grant
Automated real-time particle characterization and three-dimensional...
Patent number
11,892,390
Issue date
Feb 6, 2024
New York University
David G. Grier
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for scanning of a transparent plate during earth...
Patent number
11,892,468
Issue date
Feb 6, 2024
DRS Network & Imaging Systems, LLC
Mark Muzilla
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for multi-direction digital scanned light s...
Patent number
11,885,946
Issue date
Jan 30, 2024
University of Washington
Adam K. Glaser
G01 - MEASURING TESTING
Information
Patent Grant
System for viewing cell cultures under a microscope whilst applying
Patent number
11,879,886
Issue date
Jan 23, 2024
Novocure GmbH
Moshe Giladi
G02 - OPTICS
Information
Patent Grant
Coherent anti-Stokes Raman scattering microscope imaging apparatus
Patent number
11,879,780
Issue date
Jan 23, 2024
WEIPENG (SUZHOU) MEDICAL DEVICES CO., LTD.
Yan Xia
G02 - OPTICS
Information
Patent Grant
Microscope system
Patent number
11,861,921
Issue date
Jan 2, 2024
EVIDENT CORPORATION
Yuta Ohara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample observation device
Patent number
11,852,792
Issue date
Dec 26, 2023
Hamamatsu Photonics K.K.
Masanori Kobayashi
G02 - OPTICS
Information
Patent Grant
Infrared imaging microscope using tunable laser radiation
Patent number
11,852,793
Issue date
Dec 26, 2023
Daylight Solutions, Inc.
Miles James Weida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High-throughput optical sectioning imaging method and imaging system
Patent number
11,852,794
Issue date
Dec 26, 2023
HUST-SUZHOU INSTITUTE FOR BRAINSMATICS
Qingming Luo
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for in-operating-theatre imaging of fresh tissu...
Patent number
11,828,710
Issue date
Nov 28, 2023
SamanTree Medical SA
Bastien Rachet
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for structured illumination microscopy
Patent number
11,828,924
Issue date
Nov 28, 2023
Illumina, Inc.
Bo Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Accelerating digital microscopy scans using empty/dirty area detection
Patent number
11,828,927
Issue date
Nov 28, 2023
Scopio Labs Ltd.
Ittai Madar
G02 - OPTICS
Information
Patent Grant
Sample observation device and sample observation method
Patent number
11,822,066
Issue date
Nov 21, 2023
Hamamatsu Photonics K.K.
Satoshi Yamamoto
G02 - OPTICS
Information
Patent Grant
Observation device
Patent number
11,815,672
Issue date
Nov 14, 2023
EVIDENT CORPORATION
Tadashi Hirata
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Microscope stand and module and housing therefor
Patent number
11,808,932
Issue date
Nov 7, 2023
Leica Instruments (Singapore) Pte. Ltd.
Patrick Szabo
G02 - OPTICS
Information
Patent Grant
System and apparatus for dynamically shaped focal surface with a sc...
Patent number
11,803,043
Issue date
Oct 31, 2023
University of Washington
Jonathan T. C. Liu
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...
Publication number
20240134177
Publication date
Apr 25, 2024
Hamamatsu Photonics K.K.
Takashi MIHOYA
G02 - OPTICS
Information
Patent Application
METHODS AND APPARATUS FOR HIGH-RESOLUTION MICROSCOPY
Publication number
20240126058
Publication date
Apr 18, 2024
Arizona Board of Regents on behalf of The University of Arizona
Dongkyun Kang
G01 - MEASURING TESTING
Information
Patent Application
Optical Sources
Publication number
20240118585
Publication date
Apr 11, 2024
NKT PHOTONICS A/S
Anatoly Borisovich GRUDININ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTONIC RESONATOR INTERFEROMETRIC SCATTERING MICROSCOPY
Publication number
20240094517
Publication date
Mar 21, 2024
THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Brian T. CUNNINGHAM
G02 - OPTICS
Information
Patent Application
SYSTEM AND METHODS OF MULTIPLE FLUOROPHORE VISUALIZATION
Publication number
20240085682
Publication date
Mar 14, 2024
SYNAPTIVE MEDICAL INC.
Michael Frank Gunter WOOD
G02 - OPTICS
Information
Patent Application
METHOD AND LIGHT MICROSCOPE FOR A HIGH-RESOLUTION EXAMINATION OF A...
Publication number
20240085680
Publication date
Mar 14, 2024
Abberior Instruments GmbH
Roman SCHMIDT
G02 - OPTICS
Information
Patent Application
ACCELERATING DIGITAL MICROSCOPY SCANS USING EMPTY/DIRTY AREA DETECTION
Publication number
20240085688
Publication date
Mar 14, 2024
Scopio Labs Ltd.
Ittai MADAR
G02 - OPTICS
Information
Patent Application
Optically Computed Phase Microscopy
Publication number
20240068803
Publication date
Feb 29, 2024
NEW JERSEY INSTITUTE OF TECHNOLOGY
Xuan Liu
G01 - MEASURING TESTING
Information
Patent Application
Microscopy method, especially for fluorescence correlation spectros...
Publication number
20240061227
Publication date
Feb 22, 2024
CARL ZEISS MICROSCOPY GMBH
Dieter Huhse
G02 - OPTICS
Information
Patent Application
Method and Device for Microscopy
Publication number
20240053594
Publication date
Feb 15, 2024
CARL ZEISS MICROSCOPY GMBH
Joerg Steinert
G02 - OPTICS
Information
Patent Application
SYSTEMS AND METHODS FOR IN-OPERATING-THEATRE IMAGING OF FRESH TISSU...
Publication number
20240044805
Publication date
Feb 8, 2024
SamanTree Medical SA
Bastien Rachet
G01 - MEASURING TESTING
Information
Patent Application
CONFOCAL MICROSCOPE WITH PHOTON RE-ALLOCATION
Publication number
20240045188
Publication date
Feb 8, 2024
Centre National de la Recherche Scientifique
Alberto AGUILAR
G02 - OPTICS
Information
Patent Application
MICROSCOPE, OBSERVATION METHOD, AND PROGRAM
Publication number
20240019677
Publication date
Jan 18, 2024
Nikon Corporation
Yamato NIITANI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CELL STATISTICS BASED ON IMAGE RECOGNITION
Publication number
20240020994
Publication date
Jan 18, 2024
V5 TECHNOLOGIES CO., LTD.
LINDA SIANA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE MANIPULATION DEVICE AND METHOD
Publication number
20240004179
Publication date
Jan 4, 2024
Leica Microsystems CMS GmbH
Falk SCHLAUDRAFF
G02 - OPTICS
Information
Patent Application
CONFOCAL RAMAN ANALYSING APPARATUS AND METHOD
Publication number
20230400675
Publication date
Dec 14, 2023
Andor Technology Limited
Andrew Colm Dennis
G01 - MEASURING TESTING
Information
Patent Application
LASER SCANNING MICROSCOPE, IMAGE PROCESSING APPARATUS, AND METHOD O...
Publication number
20230400674
Publication date
Dec 14, 2023
Evident Corporation
Shingo SUZUKI
G02 - OPTICS
Information
Patent Application
DEVICE FOR DETERMINING THE POSITION OF TRAPPED OBJECTS IN OPTICAL T...
Publication number
20230400402
Publication date
Dec 14, 2023
SORBONNE UNIVERSITE
Sinan HALIYO
G01 - MEASURING TESTING
Information
Patent Application
ANALYZING AND USING MOTILITY KINEMATICS OF MICROORGANISMS
Publication number
20230392184
Publication date
Dec 7, 2023
PhAST Corp.
Kwangmin Son
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHODS AND APPARATUS FOR LIGHT-MICROSCOPIC MULTICSCALE RECORDING O...
Publication number
20230384224
Publication date
Nov 30, 2023
Gerald DONNERT
G01 - MEASURING TESTING
Information
Patent Application
FULL FIELD MORPHOLOGY - PRECISE QUANTIFICATION OF CELLULAR AND SUB-...
Publication number
20230384205
Publication date
Nov 30, 2023
Scopio Labs Ltd.
Shahar KARNY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFEROMETRIC SCATTERING MICROSCOPY
Publication number
20230359009
Publication date
Nov 9, 2023
Oxford University Innovation Limited
Philipp KUKURA
G01 - MEASURING TESTING
Information
Patent Application
Scatter Melt Detection Systems and Methods of Using the Same
Publication number
20230360937
Publication date
Nov 9, 2023
VEECO INSTRUMENTS INC.
Matthew Earl Wallace Reed
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
A MINIATURIZED, LOW-COST, MULTI-CONTRAST LABEL-FREE MICROSCOPE IMAG...
Publication number
20230359010
Publication date
Nov 9, 2023
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
Qian CHEN
G02 - OPTICS
Information
Patent Application
IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SP...
Publication number
20230359007
Publication date
Nov 9, 2023
SamanTree Medical SA
Etienne Shaffer
G01 - MEASURING TESTING
Information
Patent Application
SLIT LAMP MICROSCOPE
Publication number
20230359008
Publication date
Nov 9, 2023
TOPCON CORPORATION
Hitoshi SHIMIZU
G02 - OPTICS
Information
Patent Application
METHOD AND APPARATUS FOR HIGH-RESOLUTION LOCALIZATION OF A SINGLE E...
Publication number
20230350179
Publication date
Nov 2, 2023
Abberior Instruments GmbH
Roman Schmidt
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR MULTIDIMENSIONAL IMAGING
Publication number
20230333361
Publication date
Oct 19, 2023
Singular Genomics Systems, Inc.
Hu Cang
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR LIGHT SHEET IMAGING WITH OPTICAL COHERENCE...
Publication number
20230324166
Publication date
Oct 12, 2023
University of Kent at Canterbury
Adrian Podoleanu
G02 - OPTICS
Information
Patent Application
METHOD FOR ADJUSTING THE ILLUMINATION IN A FLUORESCENCE MICROSCOPE,...
Publication number
20230324662
Publication date
Oct 12, 2023
Leica Microsystems CMS GmbH
Christian SCHUMANN
G02 - OPTICS