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Details of time delay measurement
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G01S7/4865
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01S
RADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES
G01S7/00
Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
Current Industry
G01S7/4865
Details of time delay measurement
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Patents Grants
last 30 patents
Information
Patent Grant
High contrast grating for highly reflective mems surface for LiDAR
Patent number
12,174,316
Issue date
Dec 24, 2024
BEIJING VOYAGER TECHNOLOGY CO., LTD.
Yue Lu
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive coding for lidar systems
Patent number
12,169,254
Issue date
Dec 17, 2024
HESAI TECHNOLOGY CO., LTD.
Xuezhou Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Adaptive processing in time of flight imaging
Patent number
12,164,035
Issue date
Dec 10, 2024
Microsoft Technology Licensing, LLC
Sergio Ortiz Egea
G01 - MEASURING TESTING
Information
Patent Grant
Time of flight sensors with light directing elements
Patent number
12,164,062
Issue date
Dec 10, 2024
ams International AG
Miguel Bruno Vaello Paños
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Emitters behind display
Patent number
12,158,546
Issue date
Dec 3, 2024
Apple Inc.
Arnaud Laflaquiere
G01 - MEASURING TESTING
Information
Patent Grant
Light-receiving element, solid-state imaging device, and ranging de...
Patent number
12,159,888
Issue date
Dec 3, 2024
SONY SEMICONDCUTOR SOLUTIONS CORPORATION
Takeshi Yamazaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ranging systems of a dual optical frequency comb time-of-flight man...
Patent number
12,153,167
Issue date
Nov 26, 2024
University of Electronic Science and Technology of China
Teng Tan
G01 - MEASURING TESTING
Information
Patent Grant
Accurate photo detector measurements for LIDAR
Patent number
12,153,134
Issue date
Nov 26, 2024
Ouster, Inc.
Angus Pacala
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gated imaging apparatus, system and method
Patent number
12,146,960
Issue date
Nov 19, 2024
BRIGHTWAY VISION LTD.
Ezri Sonn
G01 - MEASURING TESTING
Information
Patent Grant
Space-based LiDAR system
Patent number
12,146,990
Issue date
Nov 19, 2024
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
Nathaniel Gill
G01 - MEASURING TESTING
Information
Patent Grant
Autonomous gating selection to reduce noise in direct time-of-fligh...
Patent number
12,146,965
Issue date
Nov 19, 2024
Meta Platforms Technologies, LLC
Augusto Ronchini Ximenes
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Distance measurement device and mobile apparatus
Patent number
12,146,984
Issue date
Nov 19, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Hideshi Abe
G01 - MEASURING TESTING
Information
Patent Grant
Ranging method and range finder
Patent number
12,146,764
Issue date
Nov 19, 2024
The Nippon Signal Co., Ltd.
Tomoyuki Ishikawa
G01 - MEASURING TESTING
Information
Patent Grant
Control of optical receiver based on environmental condition
Patent number
12,140,711
Issue date
Nov 12, 2024
Guangzhou Woya Laideling Technology Co., Ltd.
Yue Lu
G01 - MEASURING TESTING
Information
Patent Grant
Phase-sensitive compressed ultrafast photography systems and methods
Patent number
12,143,557
Issue date
Nov 12, 2024
California Institute of Technology
Lihong Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for identification of a noise point used for LiDAR, and LiDA...
Patent number
12,140,710
Issue date
Nov 12, 2024
HESAI TECHNOLOGY CO., LTD.
Xiaotong Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for fluorescence lifetime based sequencing
Patent number
12,140,541
Issue date
Nov 12, 2024
Illumina, Inc.
Hod Finkelstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for SPAD optimization
Patent number
12,140,709
Issue date
Nov 12, 2024
SHENZHEN ADAPS PHOTONICS TECHNOLOGY CO., LTD.
Letian Wang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Pseudo random number pulse control for distance measurement
Patent number
12,140,677
Issue date
Nov 12, 2024
National University Corporation Shizuoka University
Shoji Kawahito
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
LIDAR having wavelength discrimination
Patent number
12,140,702
Issue date
Nov 12, 2024
ALLEGRO MICROSYSTEMS, LLC
William P. Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Configurable array of single-photon detectors
Patent number
12,140,708
Issue date
Nov 12, 2024
Apple Inc.
Nadav Fine
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gating camera
Patent number
12,135,394
Issue date
Nov 5, 2024
Koito Manufacturing Co., Ltd.
Daiki Kato
G01 - MEASURING TESTING
Information
Patent Grant
Differential correlator filter for efficient ToF peak finding
Patent number
12,135,374
Issue date
Nov 5, 2024
STMicroelectronics (Research & Development) Limited
Andreas Aßmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Automatic electronic rangefinder
Patent number
12,130,154
Issue date
Oct 29, 2024
TOP MEASURE INSTRUMENT COMPANY
Yin-Wu Lai
G01 - MEASURING TESTING
Information
Patent Grant
Photon detecting 3D imaging sensor device
Patent number
12,130,387
Issue date
Oct 29, 2024
FASTREE3D SA
Augusto Ronchini Ximenes
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method for operating an optoelectronic detection device, and optoel...
Patent number
12,123,981
Issue date
Oct 22, 2024
Valeo Schalter und Sensoren GmbH
Jochen Schenk
G01 - MEASURING TESTING
Information
Patent Grant
Sychronization device, associated time of flight sensor and method
Patent number
12,123,982
Issue date
Oct 22, 2024
STMicroelectronics (Grenoble 2) SAS
Cedric Tubert
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid LADAR with co-planar scanning and imaging field-of-view
Patent number
12,123,950
Issue date
Oct 22, 2024
RED Creamery, LLC
Dmitriy Yavid
G01 - MEASURING TESTING
Information
Patent Grant
Imaging system with time-of-flight sensing
Patent number
12,123,952
Issue date
Oct 22, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Erez Tadmor
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Automotive radar with time-frequency-antenna domain threshold inter...
Patent number
12,123,966
Issue date
Oct 22, 2024
NXP B.V.
Ryan Haoyun Wu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING APPARATUS
Publication number
20240426982
Publication date
Dec 26, 2024
TOPPAN Holdings Inc.
Yu OOKUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CROSSTALK CALIBRATION FOR DIRECT TIME-OF-FLIGHT SENSOR
Publication number
20240426985
Publication date
Dec 26, 2024
STMicroelectronics International N.V.
Thomas Perotto
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING SYSTEM, AND DISTANCE...
Publication number
20240426983
Publication date
Dec 26, 2024
Sony Semiconductor Solutions Corporation
TAKESHI OYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
TIME OF FLIGHT SENSOR FOR CALIBRATING DETECTION DEVIATION
Publication number
20240426991
Publication date
Dec 26, 2024
PIXART IMAGING INC.
Tso-Sheng TSAI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE, METHOD FOR CONTROLLING THE SAME, AND DIS...
Publication number
20240427020
Publication date
Dec 26, 2024
SONY GROUP CORPORATION
TAKAYUKI SASAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
READOUT ARCHITECTURES FOR ERROR REDUCTION IN INDIRECT TIME-OF-FLIGH...
Publication number
20240418836
Publication date
Dec 19, 2024
OMNIVISION TECHNOLOGIES, INC.
Zheng Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RANGING DEVICE AND RANGING METHOD
Publication number
20240410994
Publication date
Dec 12, 2024
Canon Kabushiki Kaisha
AKIHIRO TAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE, AND DISTANCE MEASURING SYSTEM
Publication number
20240410991
Publication date
Dec 12, 2024
Sony Semiconductor Solutions Corporation
YASUNORI TSUKUDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LiDAR APPARATUS USING INTERRUPTED CONTINUOUS WAVE LIGHT
Publication number
20240411024
Publication date
Dec 12, 2024
Samsung Electronics Co., Ltd.
Dongjae SHIN
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS
Publication number
20240410990
Publication date
Dec 12, 2024
Canon Kabushiki Kaisha
SHUTO FUNAKOSHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DISTANCE-MEASUREMENT APPARATUS AND DISTANCE- MEASUREMENT METHOD
Publication number
20240410997
Publication date
Dec 12, 2024
NEC Corporation
Hidemi NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTING DEVICE AND SYSTEM
Publication number
20240413253
Publication date
Dec 12, 2024
Sony Semiconductor Solutions Corporation
Dan LUO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process, Voltage, Time Invariant Compensation Loop for High Precisi...
Publication number
20240410993
Publication date
Dec 12, 2024
STMicroelectronics International N.V.
Alessandro NICOLOSI
G01 - MEASURING TESTING
Information
Patent Application
LIGHT PROJECTING-AND-RECEIVING APPARATUS AND DISTANCE MEASUREMENT S...
Publication number
20240402343
Publication date
Dec 5, 2024
Hiroyoshi SEKIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING SYSTEM
Publication number
20240402308
Publication date
Dec 5, 2024
RICOH COMPANY, LTD.
Hiroyoshi Sekiguchi
G01 - MEASURING TESTING
Information
Patent Application
Light Detection and Ranging Apparatus and Event Detection Method Th...
Publication number
20240402309
Publication date
Dec 5, 2024
Compertum Microsystems Inc.
Francis Piu MAN
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND APPARATUS FOR OBJECT DETECTION AND IDENTIFICATION IN A...
Publication number
20240402310
Publication date
Dec 5, 2024
Big Sky Financial Corporation
James E. Retterath
G01 - MEASURING TESTING
Information
Patent Application
RANGING DEVICE FOR CALCULATING A FLIGHT TIME OF LIGHT EMITTED FROM...
Publication number
20240402312
Publication date
Dec 5, 2024
Canon Kabushiki Kaisha
SHINYA IGARASHI
G01 - MEASURING TESTING
Information
Patent Application
Detection of close-range specular targets
Publication number
20240406552
Publication date
Dec 5, 2024
Apple Inc.
Moshe Laifenfeld
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMPACT LIDAR DESIGN WITH HIGH RESOLUTION AND ULTRA-WIDE FIELD OF VIEW
Publication number
20240402307
Publication date
Dec 5, 2024
Seyond, Inc.
Haosen Wang
G01 - MEASURING TESTING
Information
Patent Application
CONTROL AND CONTROL METHOD
Publication number
20240393440
Publication date
Nov 28, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Renato FERRACINI ALVES
G01 - MEASURING TESTING
Information
Patent Application
AVALANCHE DIODE BASED DETECTION DEVICE FOR CALCULATING TIME-OF-FLIGHT
Publication number
20240385297
Publication date
Nov 21, 2024
PIXART IMAGING INC.
Tso-Sheng TSAI
G01 - MEASURING TESTING
Information
Patent Application
FLASH LIDAR SENSOR USING ZOOM HISTOGRAMMING TDC
Publication number
20240385326
Publication date
Nov 21, 2024
SOLIDVUE, INC.
Jun Hee CHO
G01 - MEASURING TESTING
Information
Patent Application
FIELD-SELECTABLE DYNAMIC GAIN CONTROL MODES OF OPTICAL SENSORS
Publication number
20240385299
Publication date
Nov 21, 2024
Banner Engineering Corp.
Ashley Wise
G01 - MEASURING TESTING
Information
Patent Application
SENSOR FOR AUTOMATIC DOORS OR AUTOMATIC GATES AND AUTOMATIC DOOR OR...
Publication number
20240384588
Publication date
Nov 21, 2024
BEA SA
Jean-François KLEIN
E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information
Patent Application
OPTICAL DETECTION DEVICE AND ELECTRONIC APPARATUS
Publication number
20240385294
Publication date
Nov 21, 2024
Sony Semiconductor Solutions Corporation
Yasunori Tsukuda
G01 - MEASURING TESTING
Information
Patent Application
OBJECT DETECTION APPARATUS AND OBJECT DETECTION METHOD
Publication number
20240385296
Publication date
Nov 21, 2024
DENSO CORPORATION
KEIKO AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, CONTROL METHOD, PROGRAM, AND STORAGE...
Publication number
20240385327
Publication date
Nov 21, 2024
PIONEER CORPORATION
Masami SUZUKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR ARRAY BASED LIDAR SYSTEMS WITH REDUCED IN...
Publication number
20240377512
Publication date
Nov 14, 2024
SOS Lab co., Ltd
Jamie E. Retterath
G01 - MEASURING TESTING
Information
Patent Application
IMAGING UNIT AND IMAGING METHOD
Publication number
20240377515
Publication date
Nov 14, 2024
Japan Display Inc.
Hirondo NAKATOGAWA
G01 - MEASURING TESTING