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G01R1/0441

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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G01R1/0441Details

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spring contact and socket having spring contact embedded therein
- Patent number 12,061,212
- Issue date Aug 13, 2024
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Redistribution plate
- Patent number 11,997,789
- Issue date May 28, 2024
- Dominik Schmidt
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Handling integrated circuits in automated testing
- Patent number 11,961,220
- Issue date Apr 16, 2024
- Texas Instruments Incorporated
- Neeraj Bhardwaj
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system configuration adapter systems and methods
- Patent number 11,867,720
- Issue date Jan 9, 2024
- Advantest Corporation
- Eddy Wayne Chow
- G01 - MEASURING TESTING
Information Patent Grant
Test board and test apparatus including the same
- Patent number 11,828,791
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Kijae Song
- G01 - MEASURING TESTING
Information Patent Grant
Configurable test instrument for power equipment
- Patent number 11,614,465
- Issue date Mar 28, 2023
- DOBLE ENGINEERING COMPANY
- Scott Lee Short
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test apparatus
- Patent number 11,614,350
- Issue date Mar 28, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Pressure relief valve
- Patent number 11,592,465
- Issue date Feb 28, 2023
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing composite material for semiconductor test socke...
- Patent number 11,592,473
- Issue date Feb 28, 2023
- Pukyong National University Industry—University Cooperation Foundation
- Hansang Kwon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Test socket and test apparatus having the same
- Patent number 11,573,248
- Issue date Feb 7, 2023
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Kelvin contact for inspection, kelvin socket for inspection, and me...
- Patent number 11,536,743
- Issue date Dec 27, 2022
- Yamaichi Electronics Co., Ltd.
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Redistribution plate
- Patent number 11,510,318
- Issue date Nov 22, 2022
- Dominik Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
High voltage semiconductor test system with multiple sites for use...
- Patent number 11,460,501
- Issue date Oct 4, 2022
- Silicon Laboratories Inc.
- Wenshui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 11,428,711
- Issue date Aug 30, 2022
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket and test apparatus having the same, manufacturing metho...
- Patent number 11,199,577
- Issue date Dec 14, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Grant
Pressure relief valve
- Patent number 11,112,429
- Issue date Sep 7, 2021
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Circuit body structure, where planar conductors on different layers...
- Patent number 11,018,404
- Issue date May 25, 2021
- NEC Space Technologies, Ltd.
- Osamu Amano
- G01 - MEASURING TESTING
Information Patent Grant
Socket testing method and system
- Patent number 11,009,543
- Issue date May 18, 2021
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yan qing Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Socket
- Patent number 10,976,346
- Issue date Apr 13, 2021
- Yokowo Co., Ltd.
- Tsugio Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 10,802,047
- Issue date Oct 13, 2020
- Mitsubishi Electric Corporation
- Naoto Kaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric contact and socket for electric component
- Patent number 10,797,423
- Issue date Oct 6, 2020
- Enplas Corporation
- Osamu Hachuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket for a chip
- Patent number 10,598,693
- Issue date Mar 24, 2020
- Universal Scientific Industrial (Shanghai) Co., Ltd.
- Yu-Hsin Chen
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of test socket and test method for semiconduct...
- Patent number 10,470,315
- Issue date Nov 5, 2019
- Samsung Electronics Co., Ltd.
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Limiting translation for consistent substrate-to-substrate contact
- Patent number 10,401,385
- Issue date Sep 3, 2019
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for socket power calibration with flexible pri...
- Patent number 10,371,716
- Issue date Aug 6, 2019
- Advantest Corporation
- Donald Lee
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture and test device for IC
- Patent number 10,228,417
- Issue date Mar 12, 2019
- Shenzhen Sireda Technology Co., Ltd
- Guohua Wang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated waveguide structure and socket structure for millimeter...
- Patent number 10,114,067
- Issue date Oct 30, 2018
- Advantest Corporation
- Daniel Lam
- G01 - MEASURING TESTING
Information Patent Grant
Floating nest for a test socket
- Patent number 9,958,476
- Issue date May 1, 2018
- FormFactor, Inc.
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Grant
Test systems and methods of testing devices
- Patent number 9,880,195
- Issue date Jan 30, 2018
- Texas Instruments Incorporated
- Dale Vincent Ohmart
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250020687
- Publication date Jan 16, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF
- Publication number 20240410917
- Publication date Dec 12, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240329080
- Publication date Oct 3, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING PERFORMANCE OF DEVICE
- Publication number 20240248133
- Publication date Jul 25, 2024
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND TEST SOCKET FOR US...
- Publication number 20240201223
- Publication date Jun 20, 2024
- RENESAS ELECTRONICS CORPORATION
- Toshitsugu ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20240103037
- Publication date Mar 28, 2024
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
SOCKET AND INSPECTION SOCKET
- Publication number 20240094243
- Publication date Mar 21, 2024
- ENPLAS CORPORATION
- Hiroyuki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Repackaging IC Chip For Fault Identification
- Publication number 20240036108
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Yi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
- Publication number 20230408573
- Publication date Dec 21, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Tatyana ANTONENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST PROBES AND TEST SOCKET HAVING SAID TEST PROBES
- Publication number 20230341436
- Publication date Oct 26, 2023
- HIROSE ELECTRIC CO., LTD.
- Tatsuya ARAI
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
- Publication number 20230288474
- Publication date Sep 14, 2023
- STATS ChipPAC Pte Ltd.
- WonJung KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
- Publication number 20230168277
- Publication date Jun 1, 2023
- AEHR TEST SYSTEMS
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
PARALLEL TEST CELL WITH SELF ACTUATED SOCKETS
- Publication number 20230083634
- Publication date Mar 16, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- KARTHIK RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN AND SOCKET
- Publication number 20230058577
- Publication date Feb 23, 2023
- ENPLAS CORPORATION
- Yoshinobu HAGIWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDISTRIBUTION PLATE
- Publication number 20230054628
- Publication date Feb 23, 2023
- Translarity, Inc.
- Dominik Schmidt
- G01 - MEASURING TESTING
Information Patent Application
TEST BOARD AND TEST APPARATUS INCLUDING THE SAME
- Publication number 20220365132
- Publication date Nov 17, 2022
- Samsung Electronics Co., Ltd.
- Kijae SONG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD OF FABRICATING THE SAME
- Publication number 20220357361
- Publication date Nov 10, 2022
- LEENO INDUSTRIAL INC.
- Seungha BAEK
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE SEMICONDUCTOR TEST SYSTEM WITH MULTIPLE SITES FOR USE...
- Publication number 20220341989
- Publication date Oct 27, 2022
- Silicon Laboratories Inc.
- Wenshui Zhang
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE TEST INSTRUMENT FOR POWER EQUIPMENT
- Publication number 20220317150
- Publication date Oct 6, 2022
- Doble Engineering Company
- Scott Lee Short
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT AND SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN
- Publication number 20220206041
- Publication date Jun 30, 2022
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
- Publication number 20220155342
- Publication date May 19, 2022
- Advantest Corporation
- Eddy Wayne CHOW
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS
- Publication number 20220137120
- Publication date May 5, 2022
- MELLANOX TECHNOLOGIES, LTD.
- Tatyana ANTONENKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
KELVIN CONTACT FOR INSPECTION, KELVIN SOCKET FOR INSPECTION, AND ME...
- Publication number 20220074969
- Publication date Mar 10, 2022
- Katsumi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME
- Publication number 20220057433
- Publication date Feb 24, 2022
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE RELIEF VALVE
- Publication number 20210364549
- Publication date Nov 25, 2021
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING COMPOSITE MATERIAL FOR SEMICONDUCTOR TEST SOCKE...
- Publication number 20210325449
- Publication date Oct 21, 2021
- Pukyong National University Industry-University Cooperation Foundation
- Hansang Kwon
- B22 - CASTING POWDER METALLURGY
Information Patent Application
TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...
- Publication number 20210293880
- Publication date Sep 23, 2021
- TSE CO., LTD.
- Chang Su Oh
- G01 - MEASURING TESTING
Information Patent Application
REDISTRIBUTION PLATE
- Publication number 20210243896
- Publication date Aug 5, 2021
- TRANSLARITY, INC.
- Dominik Schmidt
- G01 - MEASURING TESTING
Information Patent Application
SOCKET
- Publication number 20210199689
- Publication date Jul 1, 2021
- YOKOWO CO., LTD
- Tsugio YAMAMOTO
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spring contact and socket having spring contact embedded therein

Redistribution plate

System for testing an integrated circuit of a device and its method...

Handling integrated circuits in automated testing

Test system configuration adapter systems and methods

Test board and test apparatus including the same

Configurable test instrument for power equipment

Sensor test apparatus

Pressure relief valve

Method of preparing composite material for semiconductor test socke...

Test socket and test apparatus having the same

Kelvin contact for inspection, kelvin socket for inspection, and me...

Redistribution plate

High voltage semiconductor test system with multiple sites for use...

Testing apparatus

Test socket and test apparatus having the same, manufacturing metho...

Pressure relief valve

Circuit body structure, where planar conductors on different layers...

Socket testing method and system

Socket

Inspection device and inspection method

Electric contact and socket for electric component

Test socket for a chip

Manufacturing method of test socket and test method for semiconduct...

Limiting translation for consistent substrate-to-substrate contact

Method and apparatus for socket power calibration with flexible pri...

Test fixture and test device for IC

Integrated waveguide structure and socket structure for millimeter...

Floating nest for a test socket

Test systems and methods of testing devices

Patents Applicationslast 30 patents

ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOF

ADAPTIVE FLEXIBLE CHIP TEST SOCKET AND FORMATION METHOD THEREOF

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

SYSTEM FOR TESTING PERFORMANCE OF DEVICE

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND TEST SOCKET FOR US...

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

SOCKET AND INSPECTION SOCKET

Repackaging IC Chip For Fault Identification

SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS

TEST PROBES AND TEST SOCKET HAVING SAID TEST PROBES

TEST SOCKET AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...

PARALLEL TEST CELL WITH SELF ACTUATED SOCKETS

CONTACT PIN AND SOCKET

REDISTRIBUTION PLATE

TEST BOARD AND TEST APPARATUS INCLUDING THE SAME

TEST SOCKET AND METHOD OF FABRICATING THE SAME

HIGH VOLTAGE SEMICONDUCTOR TEST SYSTEM WITH MULTIPLE SITES FOR USE...

CONFIGURABLE TEST INSTRUMENT FOR POWER EQUIPMENT

SPRING CONTACT AND SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN

TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS

SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS

KELVIN CONTACT FOR INSPECTION, KELVIN SOCKET FOR INSPECTION, AND ME...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME

PRESSURE RELIEF VALVE

METHOD OF PREPARING COMPOSITE MATERIAL FOR SEMICONDUCTOR TEST SOCKE...

TEST SOCKET AND TEST APPARATUS HAVING THE SAME, MANUFACTURING METHO...

REDISTRIBUTION PLATE

SOCKET