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H01J37/261

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/261Details

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscopy grid
- Patent number 12,125,668
- Issue date Oct 22, 2024
- Universiteit Antwerpen
- Wouter Van Putte
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Vibration-free cryogenic cooling
- Patent number 12,123,816
- Issue date Oct 22, 2024
- FEI Company
- Ronald Lamers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detector
- Patent number 12,106,932
- Issue date Oct 1, 2024
- DECTRIS AG
- Radosav Pantelic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for tilting characterization by microscopy
- Patent number 12,078,791
- Issue date Sep 3, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tilt-column multi-beam electron microscopy system and method
- Patent number 12,068,129
- Issue date Aug 20, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ventilated semiconductor processing apparatus
- Patent number 12,014,897
- Issue date Jun 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Nishioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image generation for examination of a semiconductor specimen
- Patent number 11,995,848
- Issue date May 28, 2024
- Applied Materials Israel Ltd.
- David Uliel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...
- Patent number 11,961,702
- Issue date Apr 16, 2024
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,935,722
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stage apparatus suitable for a particle beam apparatus
- Patent number 11,908,656
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Han Willem Hendrik Severt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas delivery system for environmental transmission electron microscope
- Patent number 11,837,432
- Issue date Dec 5, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- John Joseph Nogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing data related to charged particles to predict an anomaly in...
- Patent number 11,688,599
- Issue date Jun 27, 2023
- Government of the United States of America as represented by the Secretary of...
- Chadwick Lindstrom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Super-resolution microscopy
- Patent number 11,676,794
- Issue date Jun 13, 2023
- United Kingdom Research and Innovation
- Lin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern matching device and computer program for pattern matching
- Patent number 11,669,953
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam system
- Patent number 11,631,569
- Issue date Apr 18, 2023
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,569,059
- Issue date Jan 31, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- B08 - CLEANING
Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vacuum connection mechanism and electron optical device
- Patent number 11,545,335
- Issue date Jan 3, 2023
- Ebara Corporation
- Takashi Ohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for remote deep learning for microscopic...
- Patent number 11,482,400
- Issue date Oct 25, 2022
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stress measurement method, stress measurement device, and stress me...
- Patent number 11,467,046
- Issue date Oct 11, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yousuke Irie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image generation method, non-transitory computer-readable medium, a...
- Patent number 11,443,917
- Issue date Sep 13, 2022
- HITACHI HIGH-TECH CORPORATION
- Chikako Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for preparing a sample for transmission electron microscopy
- Patent number 11,437,217
- Issue date Sep 6, 2022
- Imec VZW
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lossless cryo-grid preparation stage for high-resolution electron m...
- Patent number 11,422,074
- Issue date Aug 23, 2022
- Universitat Basel
- Stefan Alexander Arnold
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,424,101
- Issue date Aug 23, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging device capturing images of a sample including a plurality o...
- Patent number 11,417,499
- Issue date Aug 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Maasa Yano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam position monitor for charged particles passing through a chamber
- Patent number 11,410,831
- Issue date Aug 9, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Rémi Nicolas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D mapping of samples in charged particle microscopy
- Patent number 11,355,307
- Issue date Jun 7, 2022
- FEI Company
- Jaroslav Kamenec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grid sample production apparatus for electron microscope
- Patent number 11,322,334
- Issue date May 3, 2022
- XTEM BIOLAB CO., LTD.
- Nam Chul Ha
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VIBRATION-FREE CRYOGENIC COOLING
- Publication number 20250003845
- Publication date Jan 2, 2025
- FEI Company
- Ronald Lamers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...
- Publication number 20240249905
- Publication date Jul 25, 2024
- FEI Company
- Alexander HENSTRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS
- Publication number 20240222068
- Publication date Jul 4, 2024
- FEI Company
- Jing Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...
- Publication number 20240203685
- Publication date Jun 20, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Analysis Method
- Publication number 20240170250
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Masayoshi YOSHIOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
- Publication number 20240153737
- Publication date May 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLO...
- Publication number 20240128048
- Publication date Apr 18, 2024
- Carl Zeiss MultiSEM GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...
- Publication number 20240105417
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Yeoseon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF
- Publication number 20240038487
- Publication date Feb 1, 2024
- DAEGU GYEONGBUK INSTITUTE OF SCIENCE & TECHNOLOGY
- Jiwoong YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...
- Publication number 20240038488
- Publication date Feb 1, 2024
- Health Technology Innovations, Inc.
- Narasimha KUMAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT...
- Publication number 20230402251
- Publication date Dec 14, 2023
- Carl Zeiss SMT GmbH
- Louise Barris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
- Publication number 20230238213
- Publication date Jul 27, 2023
- Carl Zeiss SMT GMBH
- Ottmar Hoinkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Tomographic Microscopy Imaging
- Publication number 20230215687
- Publication date Jul 6, 2023
- FEI Company
- Andreas Voigt
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...
- Publication number 20230187170
- Publication date Jun 15, 2023
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230135601
- Publication date May 4, 2023
- JEOL Ltd.
- Yuka Otake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD GENERATION DEVICE, AND TRANSMISSION ELECTRON MICROSC...
- Publication number 20230089136
- Publication date Mar 23, 2023
- Ningbo Institute of Materials Technology and Engineering, Chinese Academy of...
- Weixing XIA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TILTING CHARACTERIZATION BY MICROSCOPY
- Publication number 20230073472
- Publication date Mar 9, 2023
- Yangtze Memory Technologies Co., Ltd.
- Jun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...
- Publication number 20230072075
- Publication date Mar 9, 2023
- Xiamen Chip-Nova Technology Co., Ltd.
- Honggang Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...
- Publication number 20230076908
- Publication date Mar 9, 2023
- Xiamen Chip-Nova Technology Co., Ltd.
- Honggang Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING MEASUREMENT ERROR OF SEM EQUIPMENT AND METHOD O...
- Publication number 20230043003
- Publication date Feb 9, 2023
- Samsung Electronics Co., Ltd.
- Nohong KWAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device and Vibration-Suppressing Mechanism
- Publication number 20230035686
- Publication date Feb 2, 2023
- Hitachi High-Tech Corporation
- Hiroki TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20230028903
- Publication date Jan 26, 2023
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20220415609
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Takumi UEZONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIBRATION-FREE CRYOGENIC COOLING
- Publication number 20220404247
- Publication date Dec 22, 2022
- FEI Company
- Ronald Lamers
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
MACHINE LEARNING ON WAFER DEFECT REVIEW
- Publication number 20220359154
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Pin CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220301196
- Publication date Sep 22, 2022
- APPLIED MATERIALS ISRAEL LTD.
- David ULIEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM IRRADIATION DEVICE
- Publication number 20220254596
- Publication date Aug 11, 2022
- NuFlare Technology, Inc.
- Atsushi ANDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DETECTOR
- Publication number 20220238301
- Publication date Jul 28, 2022
- DECTRIS AG
- Radosav PANTELIC
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron microscopy grid

Vibration-free cryogenic cooling

Electron detector

Image contrast enhancement in sample inspection

Method for tilting characterization by microscopy

Tilt-column multi-beam electron microscopy system and method

Ventilated semiconductor processing apparatus

Image generation for examination of a semiconductor specimen

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...

Machine learning on wafer defect review

Stage apparatus suitable for a particle beam apparatus

Gas delivery system for environmental transmission electron microscope

Sensing data related to charged particles to predict an anomaly in...

Super-resolution microscopy

Pattern matching device and computer program for pattern matching

Charged particle beam system

Apparatus of charged-particle beam such as electron microscope comp...

Loosely-coupled inspection and metrology system for high-volume pro...

Vacuum connection mechanism and electron optical device

Method, device and system for remote deep learning for microscopic...

Stress measurement method, stress measurement device, and stress me...

Methods and systems for acquiring 3D diffraction data

Image generation method, non-transitory computer-readable medium, a...

Method for preparing a sample for transmission electron microscopy

Lossless cryo-grid preparation stage for high-resolution electron m...

Machine learning on wafer defect review

Imaging device capturing images of a sample including a plurality o...

Beam position monitor for charged particles passing through a chamber

3D mapping of samples in charged particle microscopy

Grid sample production apparatus for electron microscope

Patents Applicationslast 30 patents

VIBRATION-FREE CRYOGENIC COOLING

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED P...

CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS

POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST...

Charged Particle Beam Device and Sample Analysis Method

TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD

METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLO...

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...

LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF

CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...

GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT...

APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...

Methods And Systems For Tomographic Microscopy Imaging

FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...

Phase Analyzer, Sample Analyzer, and Analysis Method

MAGNETIC FIELD GENERATION DEVICE, AND TRANSMISSION ELECTRON MICROSC...

METHOD FOR TILTING CHARACTERIZATION BY MICROSCOPY

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHO...

METHOD OF DETECTING MEASUREMENT ERROR OF SEM EQUIPMENT AND METHOD O...

Charged Particle Beam Device and Vibration-Suppressing Mechanism

ELECTRON MICROSCOPE

Scanning Electron Microscope

VIBRATION-FREE CRYOGENIC COOLING

MACHINE LEARNING ON WAFER DEFECT REVIEW

IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN

ELECTRON GUN AND ELECTRON BEAM IRRADIATION DEVICE

ELECTRON DETECTOR