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G01P15/0802

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GPHYSICS G01Measuring instruments G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT G01P15/00Measuring acceleration Measuring deceleration Measuring shock

Current Industry

G01P15/0802Details

Industries

Patents Grantslast 30 patents

Information Patent Grant
Physical quantity sensor, inertial measurement unit, and method for...
- Patent number 12,174,214
- Issue date Dec 24, 2024
- Seiko Epson Corporation
- Teruo Takizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal processing method, signal processing device, physical quanti...
- Patent number 12,163,975
- Issue date Dec 10, 2024
- Seiko Epson Corporation
- Masayoshi Todorokihara
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Acceleration transducer
- Patent number 12,163,976
- Issue date Dec 10, 2024
- Kistler Holding AG
- Marco Laffranchi
- G01 - MEASURING TESTING
Information Patent Grant
Weight estimation apparatus, weight estimation method, and computer...
- Patent number 12,163,823
- Issue date Dec 10, 2024
- NEC Corporation
- Yu Kiyokawa
- G01 - MEASURING TESTING
Information Patent Grant
Safe measurement of tire characteristics
- Patent number 12,140,607
- Issue date Nov 12, 2024
- Melexis Technologies SA
- Jeremie Chabloz
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inertial sensor module
- Patent number 12,130,304
- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Masayasu Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Mems device, electronic apparatus, and vehicle
- Patent number 12,130,303
- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Fumiya Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Inertial sensor module
- Patent number 12,130,302
- Issue date Oct 29, 2024
- Seiko Epson Corporation
- Ryohei Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Sensor having stress relieving support structure
- Patent number 12,123,893
- Issue date Oct 22, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, physical quantity sensor device, and meth...
- Patent number 12,123,891
- Issue date Oct 22, 2024
- Seiko Epson Corporation
- Kenta Sato
- G01 - MEASURING TESTING
Information Patent Grant
Fibre-optic accelerometer
- Patent number 12,105,113
- Issue date Oct 1, 2024
- Polytech Group ApS
- Sascha Kienitz
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
Acceleration transducer
- Patent number 12,105,112
- Issue date Oct 1, 2024
- Kistler Holding AG
- Marco Laffranchi
- G01 - MEASURING TESTING
Information Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
- Patent number 12,099,075
- Issue date Sep 24, 2024
- Seiko Epson Corporation
- Teruo Takizawa
- G01 - MEASURING TESTING
Information Patent Grant
Micromechanical sensor device and corresponding production method
- Patent number 12,077,429
- Issue date Sep 3, 2024
- Robert Bosch GmbH
- Lars Tebje
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of manufacturing low heat-resistant sensor
- Patent number 12,072,349
- Issue date Aug 27, 2024
- VALQUA, LTD.
- Hisataka Satoh
- G01 - MEASURING TESTING
Information Patent Grant
MEMS inertial sensor with high resilience to the phenomenon of stic...
- Patent number 12,038,454
- Issue date Jul 16, 2024
- STMicroelectronics S.r.l.
- Francesco Rizzini
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-axis, single mass accelerometer
- Patent number 12,019,197
- Issue date Jun 25, 2024
- TGS-NOPEC Geophysical Company
- Cornelis A. M. Faber
- G01 - MEASURING TESTING
Information Patent Grant
MEMS accelerometer
- Patent number 12,013,414
- Issue date Jun 18, 2024
- AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Grant
Inertial measurement unit
- Patent number 12,013,412
- Issue date Jun 18, 2024
- Seiko Epson Corporation
- Toru Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Sensor module having conductive bonding members with varying meltin...
- Patent number 12,000,857
- Issue date Jun 4, 2024
- Seiko Epson Corporation
- Masayasu Sakuma
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
System, method and apparatus of a motion sensing stack
- Patent number 11,994,530
- Issue date May 28, 2024
- MINDMAZE GROUP SA
- Tej Tadi
- G01 - MEASURING TESTING
Information Patent Grant
Seesaw accelerometer
- Patent number 11,977,094
- Issue date May 7, 2024
- Murata Manufacturing Co., Ltd.
- Matti Liukku
- G01 - MEASURING TESTING
Information Patent Grant
Guided cold atom inertial sensors with membrane integrated photonic...
- Patent number 11,971,256
- Issue date Apr 30, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jongmin Lee
- G01 - MEASURING TESTING
Information Patent Grant
Closed-loop microelectromechanical accelerometer with compensation...
- Patent number 11,965,906
- Issue date Apr 23, 2024
- STMicroelectronics S.r.l.
- Gabriele Gattere
- G01 - MEASURING TESTING
Information Patent Grant
Resonantly vibrating accelerometer driven in multiple vibrational m...
- Patent number 11,965,907
- Issue date Apr 23, 2024
- Emcore Corporation
- Sergey Alexandrovich Zotov
- G01 - MEASURING TESTING
Information Patent Grant
Combined corrugated piezoelectric microphone and corrugated piezoel...
- Patent number 11,962,973
- Issue date Apr 16, 2024
- Infineon Technologies AG
- Christian Bretthauer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Self-compensating resonantly vibrating accelerometer driven in mult...
- Patent number 11,953,514
- Issue date Apr 9, 2024
- Emcore Corporation
- Sergey Alexandrovich Zotov
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis resonant accelerometer with improved-performance detection s...
- Patent number 11,933,810
- Issue date Mar 19, 2024
- STMicroelectronics S.r.l.
- Valentina Zega
- G01 - MEASURING TESTING
Information Patent Grant
System and associated method for measuring a construction pit
- Patent number 11,927,681
- Issue date Mar 12, 2024
- Hydromapper GmbH
- Karsten Holste
- G01 - MEASURING TESTING
Information Patent Grant
Method for machining thin plates and elastic joints particularly fo...
- Patent number 11,919,096
- Issue date Mar 5, 2024
- Universita' Degli Studi di Salerno
- Fabrizio Barone
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20250012829
- Publication date Jan 9, 2025
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SENSOR ASSEMBLY AND PROCESS FOR MANUFACTURIN...
- Publication number 20240426652
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Gianluca LONGONI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MULTI-SENSOR FIELD UNIT
- Publication number 20240426866
- Publication date Dec 26, 2024
- UPTIME SOLUTIONS, LLC
- James W. Girardeau
- G01 - MEASURING TESTING
Information Patent Application
THREE SEISMIC MASS Z-AXIS ACCELEROMETER AND MANUFACTURING METHOD TH...
- Publication number 20240418743
- Publication date Dec 19, 2024
- MiraMEMS Sensing Technology Co., Ltd
- Li-Tien TSENG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TRANSLATIONAL MASS ACCELEROMETER
- Publication number 20240410914
- Publication date Dec 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
ACCELEROMETER INCLUDING PROOF MASS
- Publication number 20240410915
- Publication date Dec 12, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
VIBRATING BEAM ACCELEROMETER
- Publication number 20240402213
- Publication date Dec 5, 2024
- Honeywell International Inc.
- James Christopher Milne
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSOR, COMPOSITE SENSOR, INERTIAL MEASUREMENT UN...
- Publication number 20240402214
- Publication date Dec 5, 2024
- SEIKO EPSON CORPORATION
- Teruo TAKIZAWA
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE AND METHOD FOR MANUFACTURING MEMS DEVICE
- Publication number 20240400374
- Publication date Dec 5, 2024
- Rohm Co., Ltd.
- Toma FUJITA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL DISPLACEMENT SENSORS
- Publication number 20240329077
- Publication date Oct 3, 2024
- SensiBel AS
- Sigbjørn Kolberg
- G01 - MEASURING TESTING
Information Patent Application
IMPACT INDICATOR
- Publication number 20240330637
- Publication date Oct 3, 2024
- ShockWatch, Inc.
- Anthony N. Fonk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELEROMETER
- Publication number 20240310407
- Publication date Sep 19, 2024
- AAC Kaitai Technologies (Wuhan) CO., LTD
- Shitao Yan
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE MEMS DEVICE
- Publication number 20240295582
- Publication date Sep 5, 2024
- Murata Manufacturing Co., Ltd.
- Matti LIUKKU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MASS MEMS MOTION SENSOR
- Publication number 20240230332
- Publication date Jul 11, 2024
- Motion Engine, Inc.
- Robert Mark Boysel
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROMECHANICAL SENSOR HAVING INCREASED SENSITIVITY AND A MEMS COMP...
- Publication number 20240230705
- Publication date Jul 11, 2024
- ROBERT BOSCH GmbH
- Daniel Gyorgy Kalacska
- G01 - MEASURING TESTING
Information Patent Application
Inertial Measurement Device
- Publication number 20240210209
- Publication date Jun 27, 2024
- SEIKO EPSON CORPORATION
- Yasunori HIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING CALIBRATION EFFICIENCY OF ACCELEROMETER
- Publication number 20240192250
- Publication date Jun 13, 2024
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Xiaoxiao ZHANG
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR
- Publication number 20240162219
- Publication date May 16, 2024
- Rohm Co., Ltd.
- YOUICHIRO NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROMECHANICAL SENSOR HAVING INCREASED SENSITIVITY AND A MEMS COMP...
- Publication number 20240133913
- Publication date Apr 25, 2024
- ROBERT BOSCH GmbH
- Daniel Gyorgy Kalacska
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing Low Heat-Resistant Sensor
- Publication number 20240103034
- Publication date Mar 28, 2024
- VALQUA, LTD.
- Hisataka Satoh
- G01 - MEASURING TESTING
Information Patent Application
MEMS ACCELEROMETER SYSTEMS
- Publication number 20240094238
- Publication date Mar 21, 2024
- Simmonds Precision Products, Inc.
- Richard A. Hull
- G01 - MEASURING TESTING
Information Patent Application
MEMS Device, Electronic Apparatus, And Vehicle
- Publication number 20240094239
- Publication date Mar 21, 2024
- SEIKO EPSON CORPORATION
- Fumiya ITO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD FOR EVALUATING SENSOR DATA, PROCESSING UNIT FOR EVALUATING S...
- Publication number 20240085453
- Publication date Mar 14, 2024
- ROBERT BOSCH GmbH
- Timo Heikkilae
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEMS PACKAGE AND METHOD FOR MANUFACTURING...
- Publication number 20240083743
- Publication date Mar 14, 2024
- Vanguard International Semiconductor Corporation
- RAKESH CHAND
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SENSOR ASSEMBLY
- Publication number 20240077512
- Publication date Mar 7, 2024
- ROBERT BOSCH GmbH
- Cristian Nagel
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATION SENSOR
- Publication number 20240061011
- Publication date Feb 22, 2024
- Rohm Co., Ltd.
- Yo YAMASHIRO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR HAVING STRESS RELIEVING SUPPORT STRUCTURE
- Publication number 20240061012
- Publication date Feb 22, 2024
- Honeywell International Inc.
- Paul W. Dwyer
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR AND FORMATION METHOD THEREFOR
- Publication number 20240027488
- Publication date Jan 25, 2024
- SEMICONDUCTOR MANUFACTURING ELECTRONICS (SHAOXING) CORPORATION
- Zhaolin ZHANG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR, METHOD OF MANUFACTURING INERTIAL SENSOR, AND INERT...
- Publication number 20240003933
- Publication date Jan 4, 2024
- SEIKO EPSON CORPORATION
- Teruo Takizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR DETECTING PEAKS IN VIBRATIONAL ENERGY SPECTRA
- Publication number 20230417792
- Publication date Dec 28, 2023
- GPMS International, Inc.
- Eric R Bechhoefer
- G06 - COMPUTING CALCULATING COUNTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Physical quantity sensor, inertial measurement unit, and method for...

Signal processing method, signal processing device, physical quanti...

Acceleration transducer

Weight estimation apparatus, weight estimation method, and computer...

Safe measurement of tire characteristics

Inertial sensor module

Mems device, electronic apparatus, and vehicle

Inertial sensor module

Sensor having stress relieving support structure

Physical quantity sensor, physical quantity sensor device, and meth...

Fibre-optic accelerometer

Acceleration transducer

Physical quantity sensor, composite sensor, inertial measurement un...

Micromechanical sensor device and corresponding production method

Method of manufacturing low heat-resistant sensor

MEMS inertial sensor with high resilience to the phenomenon of stic...

Multi-axis, single mass accelerometer

MEMS accelerometer

Inertial measurement unit

Sensor module having conductive bonding members with varying meltin...

System, method and apparatus of a motion sensing stack

Seesaw accelerometer

Guided cold atom inertial sensors with membrane integrated photonic...

Closed-loop microelectromechanical accelerometer with compensation...

Resonantly vibrating accelerometer driven in multiple vibrational m...

Combined corrugated piezoelectric microphone and corrugated piezoel...

Self-compensating resonantly vibrating accelerometer driven in mult...

Z-axis resonant accelerometer with improved-performance detection s...

System and associated method for measuring a construction pit

Method for machining thin plates and elastic joints particularly fo...

Patents Applicationslast 30 patents

MEMS Device, Electronic Apparatus, And Vehicle

MICROELECTROMECHANICAL SENSOR ASSEMBLY AND PROCESS FOR MANUFACTURIN...

MULTI-SENSOR FIELD UNIT

THREE SEISMIC MASS Z-AXIS ACCELEROMETER AND MANUFACTURING METHOD TH...

TRANSLATIONAL MASS ACCELEROMETER

ACCELEROMETER INCLUDING PROOF MASS

VIBRATING BEAM ACCELEROMETER

PHYSICAL QUANTITY SENSOR, COMPOSITE SENSOR, INERTIAL MEASUREMENT UN...

MEMS DEVICE AND METHOD FOR MANUFACTURING MEMS DEVICE

OPTICAL DISPLACEMENT SENSORS

IMPACT INDICATOR

ACCELEROMETER

CAPACITIVE MEMS DEVICE

MULTI-MASS MEMS MOTION SENSOR

MICROMECHANICAL SENSOR HAVING INCREASED SENSITIVITY AND A MEMS COMP...

Inertial Measurement Device

METHOD FOR IMPROVING CALIBRATION EFFICIENCY OF ACCELEROMETER

ACCELERATION SENSOR

MICROMECHANICAL SENSOR HAVING INCREASED SENSITIVITY AND A MEMS COMP...

Method of Manufacturing Low Heat-Resistant Sensor

MEMS ACCELEROMETER SYSTEMS

MEMS Device, Electronic Apparatus, And Vehicle

METHOD FOR EVALUATING SENSOR DATA, PROCESSING UNIT FOR EVALUATING S...

MICROELECTROMECHANICAL SYSTEMS PACKAGE AND METHOD FOR MANUFACTURING...

SENSOR ASSEMBLY

ACCELERATION SENSOR

SENSOR HAVING STRESS RELIEVING SUPPORT STRUCTURE

INERTIAL SENSOR AND FORMATION METHOD THEREFOR

INERTIAL SENSOR, METHOD OF MANUFACTURING INERTIAL SENSOR, AND INERT...

SYSTEM FOR DETECTING PEAKS IN VIBRATIONAL ENERGY SPECTRA