MULTI-MASS MEMS MOTION SENSOR

Abstract

A micro-electro-mechanical system (MEMS) motion sensor is provided that includes a MEMS wafer having a frame structure, a plurality of proof masses suspended to the frame structure, movable in three dimensions, and enclosed in one or more cavities. The MEMS sensor includes top and bottom cap wafers bonded to the MEMS wafer and top and bottom electrodes provided in the top and bottom cap wafers, forming capacitors with the plurality of proof masses, and being together configured to detect motions of the plurality of proof masses. The MEMS sensor further includes first electrical contacts provided on the top cap wafer and electrically connected to the top electrodes, and a second electrical contacts provided on the top cap wafer and electrically connected to the bottom electrodes by way of vertically extending insulated conducting pathways. A method for measuring acceleration and angular rate along three mutually orthogonal axes is also provided.

Description

TECHNICAL FIELD

The general technical field relates to micro-electro-mechanical systems (MEMS), and more particularly, to a multi-mass MEMS motion sensor, to a method of measuring linear acceleration and angular rate of rotation using such a MEMS motion sensor, and to a method of manufacturing such a MEMS motion sensor.

BACKGROUND

Micro-electro-mechanical systems (MEMS) are an increasingly important enabling technology. MEMS inertial sensors are used to sense changes in the state of motion of an object, including changes in position, velocity, acceleration or orientation, and encompass devices such as accelerometers, gyroscopes, vibrometers and inclinometers. Broadly described, MEMS devices are integrated circuits (ICs) containing tiny mechanical, optical, magnetic, electrical, chemical, biological, or other, transducers or actuators. MEMS devices can be manufactured using high-volume silicon wafer fabrication techniques developed over the past fifty years for the microelectronics industry. Their resulting small size and low cost make them attractive for use in an increasing number of applications in a broad variety of industries including consumer, automotive, medical, aerospace, defense, green energy, industrial, and other markets.

MEMS devices, in particular inertial sensors such as accelerometers and angular rate sensors or gyroscopes, are being used in a steadily growing number of applications. As the number of these applications grow, the greater the demand to add additional functionality and more types of MEMS into a system chip architecture. Due to the significant increase in consumer electronics applications for MEMS sensors such as optical image stabilization (OIS) for cameras embedded in smart phones and tablet PCs, virtual reality systems and wearable electronics, there has been a growing interest in utilizing such technology for more advanced applications which have been traditionally catered to by much larger, more expensive and higher grade non-MEMS sensors. Such applications include single- and multiple-axis devices for industrial applications, inertial measurement units (IMUs) for navigation systems and attitude heading reference systems (AHRS), control systems for unmanned air, ground and sea vehicles and for personal indoor GPS-denied navigation. These applications also may include healthcare/medical and sports performance monitoring and advanced motion capture systems for next generation virtual reality. These advanced applications often require lower bias drift and higher sensitivity specifications well beyond the capability of existing consumer-grade MEMS inertial sensors on the market. In order to expand these markets and to create new ones, it is desirable and necessary that higher performance specifications be developed. It is also necessary to produce a low cost and small size sensor and/or MEMS inertial sensor-enabled system(s).

Advanced applications generally require lower bias drift and higher sensitivity specifications beyond existing consumer-grade MEMS inertial sensors. However, given that MEMS motion sensors such as accelerometers and gyroscopes are typically much smaller than traditional mechanical gyroscopes, they tend to be subject to higher mechanical noise and drift. Also, since position and attitude are calculated by integrating the acceleration and angular rate data, respectively, noise and drift lead to growing errors in position. The mechanical noise spectrum F_noise of a resonator can be expressed as F_noise=(4 k_B Tmω₀/Q)^1/2, where k_BT is the thermal noise, m is the inertial mass, wo is the resonant frequency, and Q is the resonance quality factor. The noise equivalent acceleration a_noise for an accelerometer (F=ma) can therefore be expressed as a_noise=(4k_BTωd/mQ)^1/2, while the noise equivalent angular rate for a gyroscope (F=2mvΩ) is Ω_noise=(k_BTIQω₀A²)^1/2, where A is the gyroscope drive amplitude. It follows that increasing the mass m and quality factor Q can reduce mechanical noise. Because large Q values tend to make the design of sensing electronics more difficult and expensive, increasing the mass m is generally more desirable. Most modern commercial inertial sensors use thin film micromachining techniques to fabricate the MEMS, leading to thin masses with thickness ranging from about 1 to about 40 micrometers (μm). For these types of MEMS sensors, increasing the mass typically involves increasing the surface area of the mass perpendicular to its thickness. In turn, such an increase in the surface area of the mass can lead to larger chip footprints and higher cost. Accordingly, various challenges still exist for the design of low-noise MEMS motion sensors.

SUMMARY

In accordance with an aspect, there is provided a micro-electro-mechanical system (MEMS) motion sensor including:

• • a MEMS wafer having opposed top and bottom sides and including a frame structure, a plurality of proof masses, and a plurality of spring assemblies each suspending a corresponding one of the proof masses from the frame structure and enabling the corresponding one of the proof masses to move along mutually orthogonal first, second and third axes;
  • top and bottom cap wafers respectively bonded to the top and bottom sides of the MEMS wafer, the top cap, bottom cap and MEMS wafers being electrically conductive, the top cap wafer, bottom cap wafer and frame structure together defining one or more cavities each enclosing one or more of the plurality of proof masses, each proof mass being enclosed in one of the one or more cavities;
  • top and bottom electrodes respectively provided in the top and bottom cap wafers and forming capacitors with the plurality of proof masses, the top and bottom electrodes being together configured to detect motions of the plurality of proof masses;
  • first and second sets of electrical contacts provided on the top cap wafer, the first set of electrical contacts being electrically connected to the top electrodes, and the second set of electrical contacts being electrically connected to the bottom electrodes by way of insulated conducting pathways extending successively through the bottom cap wafer, the frame structure of the MEMS wafer and the top cap wafer.

In some embodiments, the MEMS motion sensor is configured as a six-degree-of-freedom (6-DOF) motion sensor enabling three-axis linear acceleration and angular rate measurements.

In some embodiments, top and bottom electrodes form a plurality of electrode assemblies each electrode assembly including at least one pair of the top and/or bottom electrodes. The plurality of electrode assemblies includes:

• • a first sensing electrode assembly associated with one or more of the plurality of proof masses and configured to detect a translational motion of the one or more proof masses associated with the first sensing electrode assembly along the first axis, the translational motion being indicative of a linear acceleration along the first axis;
  • a second sensing electrode assembly associated with one or more of the plurality of proof masses and configured to detect a rotation of the one or more proof masses associated with the second sensing electrode assembly about the third axis, the rotation about the third axis being indicative of a linear acceleration along the second axis;
  • a third sensing electrode assembly associated with one or more of the plurality of proof masses and configured to detect a rotation of the one or more proof masses associated with the third sensing electrode assembly about the second axis, the rotation about the second axis being indicative of a linear acceleration along the third axis;
  • a first driving electrode assembly associated with and configured to drive a motion of one or more associated ones of the plurality of proof masses along the first axis at an out-of-plane drive frequency;
  • a fourth sensing electrode assembly associated with the one or more proof masses associated with the first driving electrode assembly and configured to sense a Coriolis-induced, rocking motion of the one or more proof masses associated with the first driving electrode assembly along the third axis, the Coriolis-induced, rocking motion along the third axis being indicative of an angular rate about the second axis;
  • a fifth sensing electrode assembly associated with the one or more proof masses associated with the first driving electrode assembly and configured to sense a Coriolis-induced, rocking motion of the one or more proof masses associated with the first driving electrode assembly along the second axis, the Coriolis-induced, rocking motion along the second axis being indicative of an angular rate about the third axis;
  • a second driving electrode assembly associated with and configured to drive a rocking motion of one or more associated ones of the proof masses along one of the second and third axes at an in-plane drive frequency; and
  • a sixth sensing electrode assembly associated with the one or more proof masses associated with the second driving electrode assembly and configured to sense a Coriolis-induced, rocking motion of the one or more proof masses associated with the second driving electrode assembly along the other one of the second and third axes, the Coriolis-induced, rocking motion along the other one of the second and third axes being indicative of an angular rate about the first axis.

In some embodiments, the out-of-plane and in-plane drive frequencies each range from 1 to 100 kilohertz, and each of the first, second and third sensing electrode assemblies are configured to sense the motion of the one or more proof masses associated therewith at an acceleration sensing frequency that is less than between about 30 percent and 50 percent of both the out-of-plane and in-plane drive frequencies.

In some embodiments, the cavity of each mass associated with at least one of the first and second driving electrode assemblies is a hermetically sealed vacuum cavity.

In some embodiments, the plurality of proof masses consists of two proof masses configured as follows:

• • a first proof mass associated with the first driving electrode assembly and the first, second, third, fourth and fifth sensing electrode assemblies; and
  • a second proof mass associated with the second driving electrode assembly and the sixth sensing electrode assembly.

In some embodiments, the plurality of proof masses consists of three proof masses configured as follows:

• • a first proof mass associated with the first driving electrode assembly and the fourth and fifth sensing electrode assemblies;
  • a second proof mass associated with the second driving electrode assembly and the sixth sensing electrode assembly; and
  • a third proof mass associated with the first, second and third sensing electrode assemblies.

In some embodiments, the plurality of proof masses consists of four proof masses configured as follows:

• • first and second proof masses both associated with the first driving electrode assembly and the fourth and fifth sensing electrode assemblies; and
  • third and fourth proof masses both associated with the second driving electrode assembly and the sixth sensing electrode assembly, at least one of the four proof masses being further associated with the first, second and third sensing electrode assemblies.

In some embodiments, the plurality of proof masses consists of five proof masses configured as follows:

• • first and second proof masses both associated with the first driving electrode assembly and the fourth and fifth sensing electrode assemblies; and
  • third and fourth proof masses both associated with the second driving electrode assembly and the sixth sensing electrode assembly; and
  • a fifth proof mass associated with the first, second and third sensing electrode assemblies.

In some embodiments, the five proof masses are arranged in a common plane encompassing the second and third axes, the fifth proof mass being located centrally and surrounded by the first, second, third and fourth proof masses.

In some embodiments, the first driving electrode assembly is configured to drive the first proof mass 180 degrees out-of-phase relative to the second proof mass, and the second driving electrode assembly is configured to drive the third proof mass 180 degrees out-of-phase relative to the fourth proof mass.

In some embodiments of the MEMS motion sensor:

• • the fourth sensing electrode assembly is configured to form first and second capacitors with the first and second proof masses, respectively, and to measure a difference between a capacitance of the first capacitor and a capacitance of the second capacitor, the difference being indicative of an angular rate of the first and second proof masses about the second axis;
  • the fifth sensing electrode assembly is configured to form third and fourth capacitors with the first and second proof masses, respectively, and to measure a difference between a capacitance of the third capacitor and a capacitance of the fourth capacitor, the difference being indicative of an angular rate of the first and second proof masses about the third axis; and
  • the sixth sensing electrode assembly is configured to form fifth and sixth capacitors with the third and fourth proof masses, respectively, and to measure a difference between a capacitance of the fifth capacitor and a capacitance of the sixth capacitor, the difference being indicative of an angular rate of the third and fourth proof masses about the first axis.

In some embodiments of the MEMS motion sensor:

• • the first sensing electrode assembly comprises top and bottom sensing electrodes respectively located above and below a central region of the fifth proof mass;
  • the second sensing electrode assembly comprises a pair of top sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the top sensing electrode of the first sensing electrode assembly, and a pair of bottom sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the bottom sensing electrode of the first sensing electrode assembly; and
  • the third sensing electrode assembly comprises a pair of top sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the top sensing electrode of the first sensing electrode assembly, and a pair of bottom sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the bottom sensing electrode of the first sensing electrode assembly.

In some embodiments of the MEMS motion sensor:

• • the first driving electrode assembly includes:
    • a pair of top driving electrodes, one of which being located above a central region of the first proof mass and the other being located above a central region of the second proof mass; and
    • a pair of bottom driving electrodes, one of which being located below the central region of the first proof mass and the other being located below the central region of the second proof mass;
  • the fourth sensing electrode assembly includes:
    • a first pair of top sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the top driving electrode located above the central region of the first proof mass;
    • a second pair of top sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the top driving electrode located above the central region of the second proof mass;
    • a first pair of bottom sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the bottom driving electrode located below the central region of the first proof mass; and
    • a second pair of bottom sensing electrodes disposed along a line parallel to the third axis, on opposite sides of the bottom driving electrode located below the central region of the second proof mass; and
  • the fifth sensing electrode assembly includes:
    • a first pair of top sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the top driving electrode located above the central region of the first proof mass;
    • a second pair of top sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the top driving electrode located above the central region of the second proof mass;
    • a first pair of bottom sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the bottom driving electrode located below the central region of the first proof mass; and
    • a second pair of bottom sensing electrodes disposed along a line parallel to the second axis, on opposite sides of the bottom driving electrode located below the central region of the second proof mass.

In some embodiments of the MEMS motion sensor:

• • the second driving electrode assembly includes:
    • a first pair of top driving electrodes disposed along a line parallel to the one of the second and third axes, above and laterally offset with respect to a central region of the third proof mass;
    • a second pair of top driving electrodes disposed along a line parallel to the one of the second and third axes, above and laterally offset with respect to a central region of the fourth proof mass;
    • a first pair of bottom driving electrodes disposed along a line parallel to the one of the second and third axes, below and laterally offset with respect to the central region of the third proof mass; and
    • a second pair of bottom driving electrodes disposed along a line parallel to the one of the second and third axes, below and laterally offset with respect to the central region of the fourth proof mass; and
  • the sixth sensing electrode assembly includes:
    • a first pair of top sensing electrodes disposed along a line parallel to the other one of the second and third axes, above and laterally offset with respect to a central region of the third proof mass;
    • a second pair of top sensing electrodes disposed along a line parallel to the other one of the second and third axes, above and offset with respect to a central region of the fourth proof mass;
    • a first pair of bottom sensing electrodes disposed along a line parallel to the other one of the second and third axes, below and laterally offset with respect to a central region of the third proof mass; and
    • a second pair of bottom sensing electrodes disposed along a line parallel to the other one of the second and third axes, below and offset with respect to a central region of the fourth proof mass.

In some embodiments, each proof mass and corresponding spring assembly form a resonant structure configured to provide matched or near-matched resonance conditions for angular rate measurements.

In some embodiments, the top cap wafer, bottom cap wafer and MEMS wafer are each made of a silicon-based semiconductor.

In some embodiments, the MEMS wafer is a silicon-on-insulator (SOI) wafer including a device layer, a handle layer under and spaced from the device layer, and an insulating layer sandwiched between the device and handle layers.

In some embodiments, the proof masses each have a thickness and a polygonal cross-section respectively along and perpendicular to the first axis, and the spring assemblies each include flexible springs mechanically connecting the corresponding proof mass to the frame structure, the flexible springs each having a thickness along the first axis that is significantly less than the thickness of the corresponding proof mass.

In some embodiments, the thickness of each of the plurality of proof masses ranges from 10 to 1000 micrometers.

In accordance with another aspect, there is provided a MEMS motion sensor system architecture including:

• • a MEMS motion sensor as described herein; and
  • an integrated circuit (IC) wafer bonded to the top cap wafer of the MEMS motion sensor, the IC wafer having circuitry electrically connected to the MEMS motion sensor.

In some embodiments, the circuitry of the IC wafer is electrically connected to the first and second sets of electrical contacts of the MEMS motion sensor for routing signals to and from the top and bottom electrodes.

In accordance with another aspect, there is provided a method of measuring acceleration and angular rate along mutually orthogonal first, second and third axes. The method includes:

• • (a) providing a MEMS motion sensor including a MEMS wafer having opposed top and bottom sides and including a frame structure, a plurality of proof masses, and a plurality of spring assemblies each suspending a corresponding one of the proof masses from the frame structure and enabling the corresponding one of the proof masses to move along the first, second and third axes, and top and bottom cap wafers respectively bonded to the top and bottom sides of the MEMS wafer, the top cap, bottom cap and MEMS wafers being electrically conductive, the top cap wafer, bottom cap wafer and frame structure together defining one or more cavities each enclosing one or more of the plurality of proof masses, each proof mass being enclosed in one of the one or more cavities;
  • (b) vibrating one or more of the proof masses along the first axis at an out-of-plane drive frequency;
  • (c) sensing Coriolis-induced, rocking motions along the third and second axes of the one or more proof masses driven along the first axis, in response to an angular rate about the second and third axes, respectively;
  • (d) vibrating one or more of the proof masses in a rocking motion along one of the second and third axes at an in-plane drive frequency;
  • (e) sensing a Coriolis-induced, rocking motion along the other one of the second and third axes of the one or more proof masses driven along the one of the second and third axes, in response to an angular rate about the first axis; and
  • (f) sensing a translational motion along the first axis, a rotation about the second axis, and a rotation about the third axis of one of the proof masses, indicative of linear accelerations along the first, third and second axes, respectively.

In some embodiments, the plurality of proof masses consists of five proof masses, and:

• • step (b) includes vibrating first and second ones of the five proof masses along the first axis at the out-of-plane drive frequency;
  • step (c) includes sensing Coriolis-induced, rocking motions along the third and second axes of the first and second proof masses, in response to an angular rate of the first and second proof masses about the second and third axes, respectively;
  • step (d) includes vibrating third and fourth ones of the five proof masses in a rocking motion along the one of the second and third axes at the in-plane drive frequency;
  • step (e) includes sensing a Coriolis-induced, rocking motion along the other one of the second and third axes of the third and fourth proof masses, in response to an angular rate of the third and fourth proof masses about the first axis; and
  • step (f) includes sensing a translational motion along the first axis, a rotation about the second axis, and a rotation about the third axis of a fifth one of the five proof masses, indicative of linear accelerations along the first, third and second axes of the fifth proof mass, respectively.

In some embodiments, step (b) includes vibrating the first and second proof masses 180 degrees out-of-phase with each other

In some embodiments, step (c) includes:

• • forming first and third capacitors with the first proof mass, and second and fourth capacitors with the second proof mass;
  • measuring a difference between a capacitance of the first capacitor and a capacitance of the second capacitor, the difference being indicative of the angular rate of the first and second proof masses about the second axis; and
  • measuring a difference between a capacitance of the third capacitor and a capacitance of the fourth capacitor, the difference being indicative of the angular rate of the first and second proof masses about the third axis.

In some embodiments, step (d) includes vibrating the third and fourth proof masses 180 degrees out-of-phase with each other.

In some embodiments, step (e) includes:

• • forming fifth and sixth capacitors respectively with the third and fourth proof masses;
  • measuring a difference between a capacitance of the fifth capacitor and a capacitance of the sixth capacitor, the difference being indicative of the angular rate of the third and fourth proof masses about the first axis.

In some embodiments, step (f) includes sensing the translational motion along the first axis, the rotation about the second axis, and the rotation about the third axis of the fifth proof mass at respective acceleration sensing frequencies that are each less than between 30 percent and 50 percent of both the out-of-plane and in-plane drive frequencies.

In accordance with another aspect, there is provided a method for manufacturing a MEMS motion sensor. The method includes:

• • a) providing top and bottom cap wafers having respective inner and outer sides; forming insulated conducting cap wafer channels into the top and bottom cap wafers; patterning trenches and filling the trenches to form respective top and bottom electrodes on the inner sides of the top and bottom cap wafers, at least a plurality of the insulated conducting cap wafer channels being electrically connected to the top and bottom electrodes;
  • b) providing a MEMS wafer having opposed top and bottoms sides, and forming from one of the top and bottom sides, portions of a plurality of proof masses, of flexible springs, and of a frame structure with insulated conducting MEMS wafer channels;
  • c) bonding the one of the top and bottom sides of the MEMS wafer to the inner side of the corresponding one of the top and bottom cap wafers by aligning the insulated conducting cap wafer channels with the corresponding portions of the insulated conducting MEMS channels, and by aligning the electrodes with the portions of the plurality of proof masses;
  • d) forming, from the other one of the top and bottom sides of the MEMS wafer, remaining portions of the plurality of proof masses, of the flexible springs, of the frame structure with the insulated conducting MEMS wafer channels;
  • e) bonding the other one of the top and bottom sides of the MEMS wafer to the inner side of the corresponding other one of the top or bottom cap wafers by aligning the top electrodes with the bottom electrodes and by aligning the insulated conducting cap wafer channels of the corresponding other one of the top or bottom cap wafers with the remaining portions of the insulated conducting MEMS channels;
  • f) creating insulated conducting pathways, at least a plurality of the insulated conducting pathways extending from the bottom electrodes and successively through the frame structure of the MEMS wafer and the top cap wafer;
  • g) enclosing the plurality of proof masses within corresponding cavities defined by the top cap wafer, the bottom and bottom cap wafers and by the outer frame of the MEMS wafer; and
  • h) removing top and bottom cap wafer material from the outer sides of the top and bottom cap wafers, respectively to expose and isolate the insulated conducting pathways and the top and bottom electrodes.

Other features and advantages of the embodiments of the present invention will be better understood upon reading of preferred embodiments thereof with reference to the appended drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic, perspective view of a single-mass MEMS motion sensor.

FIG. 2 is a schematic, partially exploded perspective view of the MEMS motion sensor of FIG. 1.

FIG. 3 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 1, taken along section line III, depicting the position of the proof mass in the absence of acceleration and angular rate.

FIG. 4 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 1, taken along section line III, depicting a rotation of the proof mass about the y axis in response to an acceleration along the x axis.

FIG. 5 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 1, taken along section line III, depicting a translation of the proof mass about the z axis in response to an acceleration along the z axis.

FIG. 6 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 1, taken along section line III, depicting a Coriolis-induced, rocking motion of the proof mass along the x axis while being driven along the z axis, in response to the sensor being rotated around the y axis.

FIG. 7 is a schematic, partial perspective view of the MEMS motion sensor of FIG. 1, depicting a Coriolis-induced, rocking motion of the proof mass along the y axis while being driven along the x axis, in response to the sensor being rotated around the z axis.

FIG. 8 is a schematic, perspective view of a multi-mass MEMS motion sensor including five proof masses, in accordance with an exemplary embodiment.

FIG. 9 is a schematic, partially exploded perspective view of the MEMS motion sensor of FIG. 8.

FIG. 10 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 8, taken along section line X.

FIG. 11 is a schematic, partial cross-sectional view of the MEMS motion sensor of FIG. 8, taken along section line XI, depicting the proof mass used for linear acceleration measurements along the x, y and z axes.

FIG. 12 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 8, taken along section line X, depicting the pair of proof masses and the sensing electrodes involved in-plane angular rate measurements.

FIG. 13 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 8, taken along section line XIII, depicting the driving electrodes driving the pair of proof masses 180 degrees out-of-phase for out-of-plane angular rate measurements.

FIGS. 14A and 14B are schematic, partial cross-sectional views of the MEMS motion sensor of FIG. 8, respectively taken along section lines XIVA and XIVB, depicting the pair of proof masses and the sensing electrodes involved in out-of-plane angular rate measurements.

FIG. 15 is a schematic, cross-sectional view of the MEMS motion sensor of FIG. 8, taken along section line XV, depicting various insulated conducting pathways extending downwardly from electrical contacts on the top cap wafer.

FIGS. 16A to 16C are schematic, partially exploded perspective views of three other exemplary embodiments of a multi-mass MEMS motion sensor including two, three and four proof masses, respectively.

FIGS. 17A to 17P schematically illustrate steps of a method for manufacturing a multi-mass MEMS motion sensor, in accordance with an exemplary embodiment.

It should be noted that the appended drawings illustrate only exemplary embodiments of the invention, and are therefore not to be construed as limiting of its scope, for the invention may admit to other equally effective embodiments.

DETAILED DESCRIPTION

In the following description, similar features in the drawings have been given similar reference numerals, and, in order to preserve clarity in the drawings, some reference numerals may be omitted when they were already identified in a preceding figure. It should also be understood that the elements of the drawings are not necessarily depicted to scale, since emphasis is placed upon clearly illustrating the elements and structures of the present embodiments.

General Overview—Multi-Mass MEMS Motion Sensor

The present description generally relates to a MEMS device implemented as a motion sensor having a plurality of pendulous proof masses displaceable along three mutually orthogonal axes and enabling measurements of linear acceleration along and angular rate of rotation about the three mutually orthogonal axes. The present description also generally relates to a method of measuring acceleration and angular rate using such a MEMS motion sensor, as well as to a method of manufacturing such a MEMS motion sensor.

Throughout the present description, the term “motion sensor” refers to a device or system capable of sensing at least linear acceleration and angular rate of rotation, but also possibly any of a number of parameters indicative of a state of motion of an object, such as position, velocity or orientation. In some implementations, the MEMS motion sensor is configured as a six-degree-of-freedom (6-DOF) multi-mass motion sensor enabling three-axis linear acceleration and angular rate of rotation measurements.

Before describing exemplary embodiments of the multi-mass MEMS motion sensor, it is to be noted that 6-DOF capabilities can be achieved using a single-mass MEMS motion sensor.

Referring to FIGS. 1 and 2, there are shown perspective and partially exploded perspective views illustrating different components of a single-mass MEMS motion sensor 10′. The sensor 10′ includes a single proof mass 17′ suspended to a frame structure 50′ by a spring assembly 27′ that enables motion of the proof mass 17′ along mutually orthogonal first, second and third axes, designated as the z, x and y axes in FIG. 1. The proof mass 17′ and the spring assembly 27′ form a resonant structure 54′ and are part of a central MEMS wafer 16′ sandwiched between top and bottom cap wafers 12′, 14′. The MEMS wafer 16′ can be a silicon-on-insulator (SOI) wafer including a device layer 20′, a handle layer 22′, and an insulating layer 24′ (e.g., buried oxide) sandwiched between the device layer 20′ and the handle layer 22′. The motion sensor 10 includes top and bottom electrodes 13′, 15′ respectively provided in the top and bottom cap wafers 12′, 14′, and forming capacitors with the proof mass 17′. The top and bottom electrodes 13′, 15′ are configured for driving and sensing a motion of the proof mass 17. In FIGS. 1 and 2, the top and bottom electrodes 13′, 15′ each include five electrodes, namely a central electrode 13′a, 15a′, two electrodes 13b′, 13c′, 15b′, 15c′ disposed along the x axis on opposite sides of the central electrode, and two electrodes 13d′, 13e′, 15d′, 15e′ disposed along the y axis on opposite sides of the central electrode. An example of such a single-mass MEMS motion sensor is provided in co-assigned international PCT patent application N°PCT/CA2014/050730 filed Aug. 1, 2014 and entitled “MEMS motion sensor and method of manufacturing”.

Referring to FIGS. 3 to 7, the 6-DOF capabilities of the single-mass MEMS motion sensor 10′ of FIGS. 1 and 2 will be briefly described.

FIGS. 3 to 6 are cross-sectional views of the single-mass MEMS motion sensor 10′ of FIG. 1, taken along line 3. Broadly described, the motion of the singe-mass sensor 10′ can be sensed via differential capacitance measurements between the proof mass 17′ and one or more of the top electrodes 13′ in the top cap wafer 12′ and/or one or more of the bottom electrodes 15′ in the bottom cap wafer 14′. FIG. 3 illustrates that in absence of acceleration and angular rate, the proof mass 17′ is ideally positioned equidistant between the top and bottom electrodes 13′, 15′ such that the differential capacitance is zero.

In FIG. 4, the single-mass sensor 10′ is subjected to acceleration a_x along the x axis, which causes the proof mass 17′ to rotate around the center of the resonant structure 54′ with an axis of rotation parallel to the y axis. This rotation about the y axis leads to a change in differential capacitance proportional to the acceleration a_x along the x axis, for example by measuring the difference of the capacitance between the proof mass 17′ and the top electrode 13b′ and the capacitance between the proof mass 17′ and the top electrode 13c′. Likewise, an acceleration a_y of the proof mass 17′ along the y axis causes the proof mass 17′ to rotate around the x axis and can also be sense as a variation in differential capacitance by two or more of the electrodes 13d′, 13e′, 15d′, 15e′ disposed along the y axis (see FIG. 2).

In FIG. 5, the single-mass MEMS motion sensor 10′ is accelerated along the z axis, which causes the proof mass 17′ to move vertically along the z axis. The acceleration a_z can be measured by monitoring the difference of the capacitance between the proof mass 17′ and a top electrode (e.g., 13b′) and the capacitance between the proof mass 17′ and the electrode diagonally opposite (e.g., 15c′).

FIG. 6 illustrates the measurement of angular rate Ω_y about the y axis using a measurement configuration that relies on the Coriolis effect. The Coriolis effect arises when a mass M moves at velocity {right arrow over (v)} in a reference frame rotating with angular rate {right arrow over (Ω)}. An observer sitting in the reference rotating frame perceives the mass M to be deflected from its straight-line trajectory by a fictitious force, the Coriolis force, given by {right arrow over (F)}_Coriolis=2M{right arrow over (v)}×{right arrow over (Ω)}, where × denotes the vector cross-product. In FIG. 6, the proof mass 17′ is driven resonantly along the z axis. For example, the drive signal can be a time-periodic signal given by z=z₀ sin(ωt), which corresponds to a velocity given by v_z=v_z0 cos(ωt). If the single-mass sensor 10′ rotates around the y axis at an angular rate of Ω_y, the proof mass 17′ will oscillate, as a rocking motion along the x axis, in response to the Coriolis acceleration {right arrow over (α)}_Coriolis=2{right arrow over (v)}×{right arrow over (Ω)}=2v_z0Ω_y cos ωt{circumflex over (x)}=α_Coriolis cos ωt{circumflex over (x)}. This motion can be measured as an oscillating differential capacitance in a manner similar to the way the linear acceleration a_x is measured. The angular rate Ω_x about the x axis can be sensed similarly by detecting a variation in differential capacitance in the signal measured by two or more of the electrodes 13d′, 13e′, 15d′, 15e′ disposed along the y axis (see FIG. 2).

Finally, referring to FIG. 7, the angular rate ω_z about the z axis can be measured by driving the proof mass 17′ in a rocking motion along one of the x and y axes, and by sensing a Coriolis-induced, rocking motion of the proof mass 17′ along the other one of the x and y axes.

It is to be noted that although in some applications providing 6-DOF capabilities using single-mass motion sensors may be possible or desirable, compromises often have to be made in order to get an acceptable level of performance. For example, angular rate measurements tend to be more sensitive at a high resonant frequency (e.g., in the range from 10 to 20 kilohertz), less responsive to environmental mechanical noise. In contrast, although linear accelerometers can be used to measure high frequencies (e.g., as vibrometers), generally only low frequencies from direct current (DC) to a few hundred hertz (e.g., 100 to 200 Hz bandwidth around 0 Hz) are useful for navigation applications. Therefore, gyroscopes are typically operated in vacuum with a high Q factor, while accelerometers are typical operated under an ambient pressure to provide damping.

Another reason why multiple proof masses may, in some applications, be preferred over single-mass 6-DOF MEMS motion sensors is the sensitivity of angular rate measurement to linear acceleration. Referring to FIGS. 4 and 6, the measurement of the acceleration a_x along the x axis and the measurement of the angular rate Ω_y about the y axis are generally made using similar, if not identical, sensing electrodes. In most cases, the only characteristic that distinguishes the two measurements is angular rate is sensed at high (resonant) frequency, while linear acceleration is sensed at low frequency. Measuring the high-frequency angular rate signal, a high-pass filter may be used to remove the low-frequency acceleration signal. However, the low-frequency signal can be several orders of magnitude larger than the angular rate signal so that precision filters may be required to remove it.

A further reason why multiple proof masses may, in some applications, be preferred over single-mass 6-DOF MEMS motion sensors is that when the x and y rocking frequencies are identical (e.g., for a symmetrical proof mass), it can be difficult to separate the signal of the Coriolis-induced, rocking motion along the y axis caused by a resonant drive along the z axis and an angular rate about the x axis from the signal of the Coriolis-induced, rocking motion along the y axis caused by a resonant drive along the x axis and an angular rate about the z axis. Hence, for some applications, the sensor mechanics and electronics could be made simpler if the out-of-plane (i.e., about the z axis) and in-plane (i.e., about the x and y axes) angular rate measurements are carried out using different proof masses.

Therefore, there can be a number of mechanical and electronic reasons and advantages to distribute the DOFs of motion and their associated functions among multiple inertial proof masses, as will now be described.

The MEMS motion sensor according to embodiments of the invention includes multiple proof masses integrated into a single device or chip using a 3DTCV architecture that can enable wafer level integration of MEMS and IC wafers. Additionally, the MEMS motion sensor may be fabricated using a wafer-scale packaging scheme in which each of the proof masses is hermetically sealed in a cavity provided with a number of electrodes above, below and/or around the proof mass to sense, and in some cases drive, its motion.

Broadly described, the MEMS motion sensor according to embodiments of the invention forms a multi-wafer stack that includes a MEMS wafer having opposed top and bottom sides, and top and bottom cap wafers respectively bonded to the top and bottom sides of the MEMS wafer. The top cap, bottom cap and MEMS wafer are electrically conductive. The MEMS motion sensor also includes top and bottom electrodes respectively provided in the top and bottom cap wafers, and first and second sets of electrical contacts provided on the top cap wafer. The MEMS wafer includes a frame structure, a plurality of proof masses, and a plurality of spring assemblies each suspending a corresponding one of the proof masses from the frame structure and enabling the corresponding one of the proof masses to move along mutually orthogonal first, second and third axes. The top cap wafer, bottom cap wafer and frame structure together define one or more cavities. Each cavity encloses one or more of the proof masses, and each proof mass is enclosed in one cavity. The top and bottom electrodes form capacitors with and are together configured to detect motions of the proof masses. The first set of electrical contacts are electrically connected to the top electrodes, while the second set of electrical contacts are electrically connected to the bottom electrodes by way of electrically insulated conducting pathways extending successively through the bottom cap wafer, the frame structure of the MEMS wafer and the top cap wafer. The insulated conducting pathways can also be referred to as “three-dimensional through-chip vias” or “3DTCVs”.

The MEMS motion sensor according to embodiments of the invention can not only enable encapsulation of the proof masses, but also make efficient use of the protective top and bottom cap wafers by providing electrodes in the caps as well as insulated conducting pathways. These insulated conducting pathways can allow signals to be routed from the bottom to the top of the MEMS motion sensor where they can be accessed for signal processing, thus allowing for the electrical contacts to be provided only on one side of the sensor. Of course, if needed or desired, electrical contacts may also be placed on the bottom side of the sensor. In some embodiments, the architecture of the MEMS motion sensor may also enable wire-bond-free electrical connection to an IC which can be flip-chip bonded to the top of the MEMS either at the chip or wafer level, which can advantageously reduce complexity and cost of MEMS and IC integration and packaging.

In some embodiments, the MEMS motion sensor includes thick, bulk proof masses to provide higher sensitivity, lower noise, and a larger area for capacitive sensing than current two-dimensional MEMS gyroscope architecture fabricated with planar processes. Yet another advantage of some embodiments of the MEMS device resides in that the bulk proof masses are each suspended from the frame structure by flexible springs whose thickness is significantly less than that of the corresponding proof mass, which enables separate adjustment of the proof mass and spring properties. In particular, in some embodiments, the proof mass can be rather thick, for example up to the thickness of a common silicon wafer (e.g., typically in the 400-700 μm range), while enabling the springs to remain thin and flexible. In this particular example, those skilled in the art will recognize that a 400 μm thick spring could be quite stiff. Also, in such scenarios, the resonant frequencies can be tuned by adjusting the width and thickness of the springs without modifying the proof mass thickness.

First Exemplary Embodiment of a MEMS Motion Sensor: Five Proof Masses

Referring to FIGS. 8 to 10, there are depicted a perspective view, a partially exploded perspective view and a cross-sectional view of a multi-mass MEMS motion sensor 10, in accordance with an exemplary embodiment. In the illustrated embodiment, the MEMS motion sensor 10 is implemented as a 6-DOF motion sensor configured for three-axis linear acceleration and three-axis angular rate measurements. It is to be noted that throughout the present description, and unless stated otherwise, the terms “MEMS device” and “MEMS motion sensor” are used interchangeably.

MEMS, Top Cap and Bottom Cap Wafers

In FIGS. 8 to 10, the MEMS motion sensor 10 first includes a MEMS wafer 16 having opposed top and bottom sides 161, 162, and top and bottom cap wafers 12, 14 respectively bonded to the top and bottom sides 161, 162 of the MEMS wafer 16. The MEMS wafer 16 can be a SOI wafer including a device layer 20, a handle layer 22 under and spaced from the device layer 20, and an insulating layer 24 (e.g., buried oxide) sandwiched between the device and handle layers 20, 22. In the illustrated embodiment, the top cap wafer 12 is bonded to and in electrical contact with selected portions of the device layer 20, while the bottom cap wafer 14 is bonded to and in electrical contact with selected portions of the handle layer 22. The device layer 20 and the handle layer 22 of the MEMS wafer 16, as well as the top and bottom cap wafers 12, 14 are made of electrically conductive material such as, for example, a silicon-based semiconductor material. The insulating layer 24 acts to insulate the top half of the sensor 10 from the bottom half. In some implementations, electrical shunts 30 can be formed through the insulating layer 24 to allow electrical connections to be established between the device layer 20 and the handle layer 22 at desired places.

The MEMS wafer 16 includes a frame structure 50, a plurality of proof masses 17a to 17e, and a plurality of spring assemblies 27a to 27e. Each spring assembly 27a to 27e suspends a corresponding one of the proof masses 17a to 17e from the frame structure 50 and enables the corresponding one of the proof masses to move along mutually orthogonal first, second and third axes. As depicted in FIGS. 8, the first, second and third axes are designated for definiteness as the z, x and y axes, respectively, and will be so referred to herein. In particular, in the exemplary embodiment of FIGS. 8 to 10, the x and y axes may be referred to as “in-plane”, “lateral” or “horizontal” directions, while the z axis may be referred to as an “out-of-plane”, transverse” or “vertical” direction.

Also, throughout the present description, terms such as “top” and “bottom”, “above” and “below”, “over” and “under”, “upper” and “lower”, and other like terms indicating the position of one element with respect to another element are used herein for ease and clarity of description, as illustrated in the figures, and should not be considered limitative. It will be understood that such spatially relative terms are intended to encompass different orientations of the MEMS motion sensor in use or operation, in addition to the orientation exemplified in the figures. In particular, the terms “top” and “bottom” are used to facilitate reading of the description, and those skilled in the art of MEMS will readily recognize that, when in use, MEMS devices can be placed in different orientations such that, for example, the top and bottom cap wafers are positioned upside down. It will further be understood that the term “over” and “under” in specifying the spatial relationship of one element with respect to another element denotes that the two elements are either in direct contact with or separated by one or more intervening elements.

Frame Structure, Proof Masses and Spring Assemblies

The term “frame structure” is intended to refer broadly to any structure that holds and mechanically supports the proof masses such that the proof masses can move relative to the support assembly along the x, y and z axes. In FIGS. 8 to 10, the frame structure 50 is embodied by the portions of the MEMS wafer 16 spaced from and laterally enclosing the proof masses 17a to 17e. Also, the term “proof mass” is intended to refer broadly to any predetermined inertial mass used in a MEMS motion sensor whose motion can serve as a reference for a motion to be measured (e.g., linear acceleration, angular rate, and the like).

In the exemplary embodiment of FIGS. 8 to 10, the MEMS motion sensor 10 is provided with five proof masses 17a to 17e, where the first and second proof masses 17a, 17b can be used for in-plane angular rate measurements around the x and y axes, the third and fourth proof masses 17c, 17d can be used for out-of-plane angular rate measurements around the z axis, and the fifth proof mass 17e can be used for linear acceleration measurements along the x, y and z axes. In this configuration, in-plane and out-of-plane angular rate measurements are made using different pairs of proof masses. Also, by assigning the 3-DOF acceleration measurements to a separate proof mass, the sensitivity of angular rate measurement to linear acceleration can be reduced.

In the illustrated embodiment, the five proof masses 17a to 17e are arranged in a common plane encompassing the x and y axes. In this exemplary configuration, the fifth proof mass 17e is located centrally and surrounded by the other four proof masses 17a to 17d. Of course, various other symmetrical or non-symmetrical spatial arrangements of the proof masses can be used in other embodiments without departing from the scope of the present invention. Likewise, configurations with two, three, four or more than five proof masses could be employed in other embodiments, as will discussed further below.

Each proof mass may be described in terms of a thickness and a cross-section respectively along and perpendicular to the z axis. For example, in the illustrated embodiment, each proof mass consists of an octagonal central region provided with rectangular lobes extending outwardly from the central region along the x and y axes. Of course, in other embodiments, the proof masses may assume a variety of shapes, polygonal or not, and sizes which may but need not be the same for each proof mass. For example, in some embodiments, the first and second proof masses 17a, 17b used for x and y angular rate measurements may be identical to each other by different from the other proof masses 17c to 17e, and likewise for the third and fourth proof masses 17c, 17d used for z angular rate measurements.

As used herein, the term “spring assembly” is intended to refer to any suitable flexible structure configured to suspend a proof mass in spaced relationship from the frame structure and to enable motion of the proof mass relative to the frame structure along three mutually orthogonal axes in response to a motion experienced by the MEMS motion sensor. In FIGS. 8 to 10, the spring assembly 27a to 27e of each proof mass 17a to 17e includes four flexible springs 270, each of which mechanically connects and provides a restoring force between the frame structure 50 and the corresponding proof mass 17a to 17e. Of course, the type, number, position and arrangement of the flexible springs can be varied in other embodiments. Likewise, in a given embodiment of the MEMS motion sensor, the flexible springs associated with different proof masses may be different.

Each proof mass 17a to 17e and the corresponding spring assembly 27a to 27e may form a resonant structure 54 supporting a number of oscillation modes, each characterized by one or more resonant frequencies whose values can be set by adjusting the mechanical and geometrical properties of the resonant structure (e.g., the width and thickness of the springs and the size and shape of the proof mass). For example, in the embodiment of FIGS. 8 to 10, the relative sizes of the lobes and central region of each proof mass can be varied in tandem with the dimensions of the springs 270 to adjust the resonant frequencies of the resonant structure 54.

In FIGS. 8 to 10, the proof masses 17a to 17e are patterned in both the device and handle layers 20, 22, while the spring assemblies 27a to 27e are patterned only in the device layer 20. Accordingly, the thickness along the z axis of the flexible springs 270 of the spring assemblies 27a to 27e can be made significantly less than the thickness of the corresponding proof masses 17a to 17e. For example, in some embodiments, the thickness of the proof masses 17a to 17e can be greater than 10 μm up to as thick as the SOI MEMS wafer 16, which typically ranges from about 400 to 700 μm, and even up to 1000 μm, whereas the thickness of the flexible springs 270 can be of the order of 1 to 10 μm. Therefore, in some embodiments, the ratio of the thickness of one of the proof masses to the thickness of the corresponding flexible springs can be larger than 40. As mentioned above, providing a MEMS motion sensor in which the thickness of the proof masses significantly exceeds that of the flexible springs can prove advantageous. This is because the proof mass can consist of the entire thickness of the SOI MEMS wafer, while the springs can be kept thin and, thus, flexible enough to maintain the resonant frequencies at reasonably low values (e.g., of the order of tens of kilohertz).

Cavities Enclosing the Proof Masses

Referring still to FIGS. 8 to 10, the top cap wafer 12, bottom cap wafer 14 and frame structure 50 define, when bonded together, one or more cavities 31, or chambers, each of which encloses one or more of the proof masses 17a to 17e, such that each proof mass is enclosed within a cavity 31. In some embodiments, the pressure in each cavity 31 can be adjusted independently. In particular, in some embodiments, the proof masses used for angular rate measurement are advantageously enclosed in respective vacuum cavities. For example, in the illustrated embodiment, the cavities 31 enclosing the first, second, third and fourth proof masses 17a to 17d, which are used for angular rate measurements, can be hermetically sealed vacuum cavities, which may not be the case for the fifth proof mass 17e used for linear acceleration measurements. Also, although each proof mass is enclosed its own cavity in FIGS. 8 to 10, in other embodiments, the number of cavities may be less than the number of proof masses. In particular, the number and arrangement of the cavities may be dictated by environmental (e.g., high or low pressure) and/or mechanical (e.g., support integrity) considerations.

Top and Bottom Electrodes

Referring still to FIGS. 8 to 10, the MEMS motion sensor 10 also includes top and bottom electrodes 13, 15 respectively provided in the top and bottom cap wafers 12, 14 and forming capacitors with the plurality of proof masses 17a to 17e. The top and bottom electrodes 13, 15 are together configured to detect motions of the plurality of proof masses, namely linear accelerations along and angular rate about three mutually orthogonal axes. In some implementations, the top and bottom electrodes 13, 15 form eight electrode assemblies 181 to 188, where each of the electrode assemblies 181 to 188 includes at least one pair of electrodes. Each pair of electrodes is further composed of two of the top electrodes 13 or two of the bottom electrodes 15 or one each of the top and bottom electrodes 13, 15.

It will be understood that the subdivision of the top and bottom electrodes 13, 15 into such electrode assemblies 181 to 188 is made from a functional or conceptual standpoint and that, in practice, a given “physical” top or bottom electrode 13, 15 may be part of more than one electrode assembly 181 to 188, and that the functions performed by two or more electrode assemblies 181 to 188 may be performed by the same “physical” electrode 13, 15 without departing from the scope of the present invention.

Linear Acceleration Measurements

In order to provide three-axis linear acceleration sensing capabilities, the electrode assemblies 181 to 188 can include first, second and third sensing electrode assemblies 181 to 183, each associated with one or more proof masses 17. In the embodiment of FIGS. 8 to 10, the first, second and third sensing electrode assemblies 181 to 183 are each associated with the fifth proof mass 17e, which thus acts as a 3-DOF accelerometer. In particular, the fifth proof mass 17e is configured to move vertically along the z axis in response to a z-directed acceleration and to rotate about the x and x axes in response to y- and x-directed accelerations, respectively.

The first sensing electrode assembly 181 is configured to detect a translational motion of the fifth proof mass 17e along the z axis, the translational motion being indicative of a linear acceleration along the z axis. The second sensing electrode assembly 182 is configured to detect a rotation of the fifth proof mass 17e about the y axis, the rotation being indicative of a linear acceleration along the x axis. The third sensing electrode assembly 183 is configured to detect a rotation of the fifth proof mass 17e about the x axis, the rotation being indicative of a linear acceleration along the y axis.

Turning to FIGS. 9 and 11, in some embodiments, the first, second and third sensing electrode assemblies 181 to 183 consist of four top and four bottom sensing electrodes forming capacitors with the fifth proof mass 17e and including:

• • a first pair of top sensing electrodes 13a, 13b disposed along a line parallel to the x axis, above and laterally offset with respect to a central region 171 of the fifth proof mass 17e;
  • a first pair of top bottom sensing electrodes 15a, 15b disposed along a line parallel to the x axis, below and laterally offset with respect to a central region 171 of the fifth proof mass 17e;
  • a second pair of top sensing electrodes 13c, 13d disposed along a line parallel to the y axis, above and laterally offset with respect to a central region 171 of the fifth proof mass 17e; and
  • a second pair of top bottom sensing electrodes 15c, 15d disposed along a line parallel to the y axis, below and laterally offset with respect to a central region 171 of the fifth proof mass 17e.

Of course, the number and arrangement of electrodes can vary depending on the application in which the MEMS motion sensor is to be used.

For this electrode configuration, the acceleration a_x, a_y and a_z can be determined using differential capacitance measurements. For example, by measuring the difference of the capacitance between the fifth proof mass 17e and the electrode 13a (or 15a) and the capacitance between the fifth proof mass 17e and the electrode 13b (or 15b), the displacement of the fifth proof mass 17e along the z axis is subtracted out and a_x can be measured. The acceleration component a_y can be obtained in a similar manner from the difference between the capacitances measured by the electrode 13c (or 15c) and the electrode 13d (or 15d). Furthermore, by taking the difference between the capacitances measured by the electrode 13a (or 13b) and the electrode 15b (or 15a), the displacement of the fifth proof mass 17e along the x axis is subtracted out and a_z can be measured.

Angular Rate Measurements

Referring back to FIGS. 8 to 10, in order to provide three-axis angular rate sensing capabilities, the electrode assemblies 181 to 188 can include first and second driving electrode assemblies 187, 188, and fourth, fifth and sixth sensing electrode assemblies 184 to 186, each of these driving and sensing electrode assemblies 183 to 188 being associated with one or more proof masses 17. In the embodiment of FIGS. 8 to 10, the first driving and fourth and fifth sensing electrode assemblies 187, 184, 185 are each associated with the second and third proof masses 17a, 17b, and are therefore used to measure in-plane angular rates about the x and y axes. Meanwhile, the second driving and sixth sensing electrode assemblies 188, 186 are each associated with the third and fourth proof masses 17c, 17d, and are therefore used to measure out-of-plane angular rates about the z axis. In the illustrated embodiment, the electrodes associated with the first driving electrode assembly 187 are located in corresponding above and below central regions 171 of the first and second proof masses 17a, 17b, while the electrodes associated with the second driving and fourth, fifth and sixth electrode assemblies 188, 184 to 186 are located above and below but laterally from the central regions of the first, second, third and fourth proof masses 17a to 17b. Of course, various other electrode arrangements could be used in other embodiments.

Referring to FIG. 12, the first driving electrode assembly 187 is configured to drive a vertical motion of each of the first and second proof masses 17a, 17b along the first axis at an out-of-plane drive frequency. For example, the drive signal can be a time-periodic sinusoidal signal. Depending on the application, the out-of-plane drive frequency may or not correspond to a resonant frequency of the resonant structures 54 formed by each of the first and second proof masses 17a, 17b and their associated spring assemblies. In the illustrated embodiment, the first driving electrode 187 assembly is configured to drive the first proof mass 17a 180 degrees out-of-phase relative to the second proof mass 17b. For this purpose, the first driving electrode assembly 187 can include a pair of top driving electrodes 13e, 13f, one of which being located above a central region 171 of the first proof mass 17a and the other being located above a central region 171 of the second proof mass 17b, and a pair of bottom driving electrodes 15e, 15f, one of which being located below the central region 171 of the first proof mass 17a and the other being located below the central region 171 of the second proof mass 17b.

Referring still to FIG. 12, the fourth sensing electrode assembly 184 is configured to sense a Coriolis-induced, rocking motion of the first and second proof masses 17a, 17b along the y axis, which is indicative of an angular rate Ω_x about the x axis. In the illustrated embodiment, the fourth sensing electrode assembly 184 forms first and second capacitors with the first and second proof masses 17a, 17b and measures a difference between a capacitance of the first capacitor and a capacitance of the second capacitor. The capacitance difference is indicative of the angular rate Ω_x to be measured. To measure this capacitance difference, the fourth sensing electrode assembly 184 can include:

• • a first pair of top sensing electrodes 13g, 13h disposed along a line parallel to the y axis, on opposite sides of the top driving electrode 13e;
  • a second pair of top sensing electrodes 13i, 13j disposed along a line parallel to the y axis, on opposite sides of the top driving electrode 13f;
  • a first pair of bottom sensing electrodes 15g, 15h disposed along a line parallel to the y axis, on opposite sides of the bottom driving electrode 15e; and
  • a second pair of bottom sensing electrodes 15i, 15j disposed along a line parallel to the y axis, on opposite sides of the bottom driving electrode 15f;

Of course, the number and arrangement of electrodes can vary depending on the application in which the MEMS motion sensor is to be used.

As the first and second proof masses 17a, 17b are driven vertically 180 degrees out-of-phase by the first driving electrode assembly 187, their respective Coriolis-induced, rocking motions along the y axis when subjected to angular rate about the x axis will also be 180 degrees out-of phase. It will be appreciated that by using two proof masses driven 180 degrees out of phase, the induced Coriolis accelerations of the two proof masses will also be 180 degrees out of phase, whereas any linear acceleration component will have the same effect on each mass. Thus when the signals from corresponding electrodes on the two masses are subtracted, any linear acceleration signals will cancel out.

In this regard, FIG. 12 depicts a snapshot in time of the first and second proof masses 17a, 17b at their maximum amplitude displacement points. Therefore, by synchronously measuring the difference in capacitances of electrodes on similar sides of the two proof masses 17a, 17b (e.g., 13g and 13i, or 13h and 13j), the time-dependent capacitance change due to the angular rate around the x axis is obtained since the angular rate signals (C₀+/−ΔC_Coriolis) on these two electrodes are of opposite sign while the static or low-frequency responses due to y and z acceleration (C₀+ΔC_x+ΔC_z), being of the same sign, are subtracted out. Of course, other electrode configurations involving or not differential capacitance measurements can be used in other embodiments.

It is to be noted that by proper selection or adjustment of the mechanical and/or geometrical properties of the first and second proof masses 17a, 17b and their associated spring assemblies, the resonant frequencies of the oscillation modes involved in the measurement of the angular rate Ω_x about the x axis can be tailored to provide either matched or nearly matched resonance conditions between the driving and sensing modes, where the driving and sensing resonant frequencies of the driving and sensing modes are equal or close to each other, or unmatched resonance conditions between the driving and sensing modes, where driving and sensing resonant frequencies are substantially different from each other.

Referring back to FIGS. 8 to 10, the fifth sensing electrode assembly 185 is configured to sense a Coriolis-induced, rocking motion of the first and second proof masses 17a, 17b along the x axis, which is indicative of an angular rate Ω_y about the y axis. In the illustrated embodiment, the fifth sensing electrode assembly 185 forms third and fourth capacitors with the first and second proof masses 17a, 17b and measures a difference between a capacitance of the third capacitor and a capacitance of the fourth capacitor. The capacitance difference is indicative of the angular rate Ω_y to be measured. To measure this capacitance difference, the fifth sensing electrode assembly 185 can include:

• • a first pair of top sensing electrodes 13k, 13| disposed along a line parallel to the x axis, on opposite sides of the top driving electrode 13e;
  • a second pair of top sensing electrodes 13m, 13n disposed along a line parallel to the x axis, on opposite sides of the top driving electrode 13f;
  • a first pair of bottom sensing electrodes 15k, 15l disposed along a line parallel to the x axis, on opposite sides of the bottom driving electrode 15e; and
  • a second pair of bottom sensing electrodes 15m, 15n disposed along a line parallel to the x axis, on opposite sides of the bottom driving electrode 15f;

Of course, the number and arrangement of electrodes can vary depending on the application in which the MEMS motion sensor is to be used.

For this configuration of the fifth sensing electrode assembly 185, the angular rate Ω_y about the y axis can be determined using differential capacitance measurements involving the first and second proof masses 17a, 17b being driven 180 degrees out-of-phase from each other, as in FIG. 12 for Ω_x. Of course, other electrode configurations involving or not differential capacitance measurements can be used in other embodiments. Also, like in the measurement of Ω_x, the measurement of the angular rate Ω_y can be performed either with matched or nearly matched driving and sensing modes or with unmatched driving and sensing modes.

Referring now to FIGS. 13, 14A and 14B, it will be understood that for the illustrated embodiment of the MEMS motion sensor 10, the angular rate (z around the z axis is to be measured differently than around the x and y axes since the drive axis has to be perpendicular to the axis about which the angular rate is to be sensed. Accordingly, in FIG. 13, the second driving electrode assembly 188 is configured to drive a rocking motion of each of the third and fourth proof masses 17c, 17d along the y axis at an in-plane drive frequency. In this regard, FIG. 13 depicts a snapshot in time of the driven third and fourth proof masses 17c, 17d at their maximum driven amplitude displacement points along the y axis. Depending on the application, the in-plane drive frequency may or not correspond to a resonant frequency of the resonant structures 54 formed by each of the first and second proof masses 17c, 17d and their associated spring assemblies. In the illustrated embodiment, the second driving electrode assembly 188 is configured to drive the third proof mass 17c 180 degrees out-of-phase relative to the fourth proof mass 17d. For this purpose, the second driving electrode assembly 188 can include:

• • a first pair of top driving electrodes 130, 13p disposed along a line parallel to y axis, above and laterally offset with respect to a central region 171 of the third proof mass 17c;
  • a second pair of top driving electrodes 13q, 13r disposed along a line parallel to the y axis, above and laterally offset with respect to a central region 171 of the fourth proof mass 17d;
  • a first pair of bottom driving electrodes 150, 15p disposed along a line parallel to y axis, below and laterally offset with respect to the central region 171 of the third proof mass 17c; and
  • a second pair of bottom driving electrodes 15q, 15r disposed along a line parallel to the y axis, below and laterally offset with respect to the central region 171 of the fourth proof mass 17d.

Referring still to FIG. 13, in order to drive the third and fourth proof masses 17c, 17d 180 degrees out-of-phase with each other using the illustrated configuration illustrated for the second driving electrode assembly 188, the vertically aligned top and bottom driving electrodes located above and below one side of the third proof mass 17c (e.g., driving electrodes 130, 150) are driven 180 degrees out-of-phase relative to the vertically aligned top and bottom driving electrodes located above and below the other side of the third proof mass 17c (e.g., driving electrodes 13p, 15p) as well as 180 degrees out-of-phase relative to their counterparts on the fourth proof mass 17d (e.g., driving electrodes 13q, 15q). Likewise, the vertically aligned top and bottom driving electrodes located above and below one side of the fourth proof mass 17d (e.g., driving electrodes 13r, 15r) are driven 180 degrees out-of-phase relative to the vertically aligned top and bottom driving electrodes located above and below the other side of the fourth proof mass 17d (e.g., driving electrodes 13q, 15q) as well as 180 degrees out-of-phase relative to their counterparts on the third proof mass 17c (e.g., driving electrodes 13p, 15p).

Turning now to FIGS. 14A and 14B, the sixth sensing electrode assembly 186 is configured to sense a Coriolis-induced, rocking motion of the third and fourth proof masses 17c, 17d along the x axis, which is indicative of an angular rate Qz about the z axis. In the illustrated embodiment, the sixth sensing electrode assembly 186 forms fifth and sixth capacitors with the third and fourth proof masses 17c, 17d and measures a difference between a capacitance of the fifth capacitor and a capacitance of the sixth capacitor. The difference is indicative of the angular rate Ω_z to be measured. To measure this capacitance difference, the six sensing electrode assembly 186 can include:

• • a first pair of top sensing electrodes 13s, 13t disposed along a line parallel to the x axis, above and laterally offset with respect to a central region 171 of the third proof mass 17c;
  • a second pair of top sensing electrodes 13u, 13v disposed along a line parallel to the x axis, above and offset with respect to a central region 171 of the fourth proof mass 17d;
  • a first pair of bottom sensing electrodes 15s, 15t disposed along a line parallel to the x axis, below and laterally offset with respect to a central region 171 of the third proof mass 17c; and
  • a second pair of bottom sensing electrodes 15u, 15v disposed along a line parallel to the x axis, below and offset with respect to a central region 171 of the fourth proof mass 17d.

As the first and second proof masses 17a, 17b are driven vertically 180 degrees out-of-phase by the first driving electrode assembly 187, their respective Coriolis-induced, rocking motions along the x axis when subjected to angular rate about the z axis will also be 180 degrees out-of phase. In this regard, FIGS. 14A and 14B depict a snapshot in time of the third and fourth proof masses 17c, 17d, respectively at their maximum amplitude displacement points along the x axis. Therefore, by synchronously measuring the difference in capacitances of electrodes in similar positions on the two masses 17c, 17d (e.g., 13s and 13u, or 13t and 13v, or 15u and 15s, or 15t and 15v) the time-dependent capacitance change due to the angular rate around the z axis is obtained since the angular rate signals (C₀+/−ΔC_Coriolis) on the two electrodes are of opposite sign while the static or low-frequency responses due to y and z acceleration (C₀+ΔC_x+ΔC_z), being of the same sign, are subtracted out. Of course, other electrode configurations involving or not differential capacitance measurements can be used in other embodiments. Also, the measurement of the angular rate Ω_y can be performed either with matched or nearly matched driving and sensing modes or with unmatched driving and sensing modes.

In some embodiments of the MEMS motion sensor the out-of-plane and in-plane driving frequencies each range from 1 to 100 kilohertz, and wherein each of the first, second and third sensing electrode assemblies are configured to sense the motion of the one or more proof masses associated therewith at an acceleration sensing frequency that is less than between about 30 percent and 50 percent of both the out-of-plane and in-plane driving frequencies.

Electrical Contacts and Insulated Conducting Pathways

Referring back to FIGS. 8 to 10, the MEMS motion sensor 10 further includes first and second sets of electrical contacts 42a, 42b provided on the top cap wafer 12. The first set of electrical contacts 42a are electrically connected to the top electrodes 13, and the second set of electrical contacts 42b are electrically connected to the bottom electrodes 15 by way of insulated conducting pathways 33. The insulating conducting pathways 33 extend upwardly from the bottom electrodes 15 successively through the bottom cap wafer 14, the frame structure 50 of the MEMS wafer 16 and the top cap wafer 12 until they reach the electrical contacts 42b of the second set. Of course, other electrical contacts may be provided on the top cap wafer, such as, for example, connecting feedthroughs extending from the bottom cap wafer to the top cap wafer. Likewise, other insulated conducting pathways may be provided to connect electrodes of the top cap wafer 12, and also possibly of one or more of the proof masses 17a to 17e.

Referring now to FIG. 15, there are illustrated different insulated conducting pathways 33a to 33e provided in the MEMS motions sensor 10 using 3DTCV architecture. A first insulated conducting pathway 33a electrically connects the outer or peripheral regions of the bottom cap wafer 14, the handle layer 22, the device layer 20 and the top cap wafer 12 to provide a case ground. A second insulating conducting pathway 33b feeds signals from bottom electrodes 15, upwardly through electrically isolated feedthroughs in the MEMS wafer 16 and top cap wafer 12, to bond pads 42b on top of the MEMS device 10. This pathway 33b uses conducting vias 30 between the handle layer 22 and the device layer 20, through the insulating layer 24. The conducting vias 30 can also be used to electrically connect the flexible springs 270 to the proof masses 17a to 17e so that they are not floating electrically.

A third insulated conducting pathway 33c brings signals to and from the device layer 20 while isolating it from the handle layer 22 in the periphery of the MEMS device 10 by eliminating conducting vias along that path. This pathway 33c may be useful, for example, for making electrical connections to the flexible springs 270 without shorting the springs 270 to the handle layer 22. A fourth insulated conducting pathway 33d to connect top electrodes 13 in the top cap wafer 12 to electrical contacts 42a (e.g., bond pads) on top of the MEMS device 10, while electrically isolating the top electrodes 13 from the rest of the MEMS device 10. A fifth insulated conducting pathway 33 routes signals from top cap electrodes 13 to bottom cap electrodes to drive electrodes in parallel as illustrated in FIG. 13, or to pass signals through the MEMS device 10, for example, from an IC on top through the MEMS to an underlying IC or printed circuit board (PCB).

Driving and Sensing Means

In addition, depending of the intended implementation of the MEMS motion sensor some of the top and bottom electrodes can be connectable to driving means, while other ones of the top and bottom electrodes can be connectable to sensing means. Alternatively, the top and bottom electrodes can also be reconfigurably connectable to driving and sensing means, for switching between drive and sense modes. As used herein, the terms “driving means” and “sensing means” refer broadly to any electronic circuitry configured to deliver electrical signals to and receive electrical signals from the electrode assembly in order to drive and sense the motion of the proof mass of the MEMS motion sensor, respectively.

Other Exemplary Embodiments of a MEMS Motion Sensor

Referring now to FIGS. 16A to 16C, three other exemplary embodiments of a multi-mass MEMS motion sensor are illustrated. This embodiment shares many similarities with the embodiment described above and illustrated in FIGS. 8 to 15 in that they generally include a MEMS wafer provided with a frame structure, a plurality of proof masses and associated spring assemblies, top cap and bottom cap wafers sandwiching the MEMS wafer, top and bottom electrodes forming capacitors with and detecting the motions of the plurality of proof masses, and the top and bottom electrodes being together configured to detect motions of the plurality of proof masses. However, the number of proof masses and their functions in FIGS. 16A to 16C differ from those in FIGS. 8 to 15.

First, in FIG. 16A, the MEMS motion sensor 10 includes two proof masses 17a, 17b. In this embodiment, the first proof mass 17a is associated with the first driving electrode assembly 187 and the first, second, third, fourth and fifth sensing electrode assemblies 181 to 185, while the second proof mass 17b is associated with the second driving electrode assembly 188 and the sixth sensing electrode assembly 186. Accordingly, the first proof mass 17a is used for linear acceleration measurements along the x, y and z axes and in-plane angular rate measurements around the x and y axes, while the second proof mass 17b is used for out-of-plane angular rate measurements around the z axis.

Second, in FIG. 16B, the MEMS motion sensor 10 includes three proof masses 17a to 17c. In this embodiment, the first proof mass 17a is associated with the first driving electrode assembly 187 and the fourth and fifth sensing electrode assemblies 184, 185, the second proof mass 17b is associated with the second driving electrode assembly 188 and the sixth sensing electrode assembly 186, and the third proof mass 17c is associated with the first, second and third sensing electrode assemblies 181 to 183. Accordingly, the first proof mass 17a is used for in-plane angular rate measurements around the x and y axes, the second proof mass 17b is used for out-of-plane angular rate measurements around the z axis, and the third proof mass 17c is used for linear acceleration measurements along the x, y and z axes.

As in the embodiment described above with reference to FIGS. 8 to 15, the embodiment in FIG. 16B allows the in-plane angular rate measurements to be separated from the out-of-plane angular rate measurements, and isolates the three-axis linear acceleration measurements to a separate proof mass 17c to provide a different damping environment for the accelerometer. However, in contrast to the embodiment illustrated in FIGS. 8 to 15, the embodiment in FIG. 16B does not involve using pairs of proof masses driven in anti-phase for eliminating or reducing unwanted acceleration signals in angular rate measurements.

Third, in FIG. 16C, the MEMS motion sensor 10 includes four proof masses 17a to 17d. In this embodiment, the first and second proof masses 17a, 17b are associated with the first driving electrode assembly 187 and the fourth and fifth sensing electrode assemblies 184, 185, the third and fourth proof masses 17c, 17d are associated with the second driving electrode assembly 188 and the sixth sensing electrode assembly 186, and at least one of the four proof masses 17a to 17d is further associated with the first, second and third sensing electrode assemblies (e.g., the second proof mass 17b in FIG. 16C). Accordingly, the first and second proof masses 17a are used for in-plane angular rate measurements around the x and y axes, the third and fourth proof masses 17b are used for out-of-plane angular rate measurements around the z axis, and one of the four proof masses 17a to 17d is used for linear acceleration measurements along the x, y and z axes.

It is to be understood that while the embodiments illustrated in FIGS. 8 to 16C includes between two and five proof masses, it is also possible to provide, in other embodiments, a multiple-mass MEMS motion sensor including more than five proof masses, so as to increase accuracy and/or redundancy of the x, y or z acceleration and/or Ω_x, Ω_y or Ω_z angular rate measurements.

Method of Measuring Acceleration and Angular Rate

In accordance with another aspect, there is provided a method of measuring acceleration and angular rate along mutually orthogonal first, second and third axes. The method for acceleration and angular measurement will be described in conjunction with FIGS. 8 to 15, which illustrate a multi-mass MEMS motion sensor according to an exemplary embodiment. It will be understood, however, that there is no intent to limit the method to this embodiment, for the method may admit to other equally effective embodiments. In particular, it will be understood that while the measurement method can, by way of example, be performed with the multi-mass MEMS motion sensor like that described above with reference to FIGS. 8 to 15, it may also be performed with any other suitable MEMS motion sensor provided with a plurality of proof masses.

Referring to FIGS. 8 to 10, the method first includes a step of providing a multi-mass MEMS motion sensor 10. The MEMS motion sensor 10 forms a multi-wafer stack that includes a MEMS wafer 16 having opposed top and bottom sides 161, 162, and top and bottom cap wafers 12, 14 respectively bonded to the top and bottom sides 161, 162 of the MEMS wafer 16. The top cap, bottom cap and MEMS wafer 12, 14, 16 are electrically conductive. The MEMS motion sensor 10 may also include top and bottom electrodes respectively provided in the top and bottom cap wafers 12, 14. The MEMS wafer 16 includes a frame structure 50, a plurality of proof masses 17a to 17e, and a plurality of spring assemblies 27a to 27e each suspending a corresponding one of the proof masses 17a to 17e from the frame structure 50 and enabling the corresponding one of the proof masses 17a to 17e to move along mutually orthogonal first, second and third axes z, x and y. The top cap wafer 12, bottom cap wafer 14 and frame structure 50 together define one or more cavities 31 such that each cavity 31 encloses one or more of the proof masses 17a to 17e, and each proof mass 17a to 17e is enclosed in one cavity 31. The top and bottom electrodes 13, 15 can form capacitors with and are together configured to detect motions of the proof masses 17a to 17e.

In FIGS. 8 to 10, the MEMS motion sensor 10 is provided with five proof masses 17a to 17e, where the first and second proof masses 17a, 17b are used for in-plane angular rate measurements around the x and y axes, the third and fourth proof masses 17c, 17d are used for out-of-plane angular rate measurements around the z axis, and the fifth proof mass 17e is used for linear acceleration measurements along the x, y and z axes. Of course, configurations with two, three or four proof masses could be employed in other embodiments, as well as configuration including more than five proof masses, so as to increase accuracy and/or redundancy of the acceleration and/or angular rate measurements.

The method next includes a step of vibrating one or more of the proof masses along the z axis at an out-of-plane drive frequency. For the MEMS motion sensor 10 of FIGS. 8 to 10, this step involves vibrating the first and second proof masses 17a, 17b at the out-of-plane drive frequency. Additionally, in some embodiment, the first and second proof masses 17a, 17b may be vibrated 180 degrees out-of-phase with each other. As mentioned above, by driving two proof masses driven 180 degrees out of phase with each other, the induced Coriolis accelerations of the two proof masses will also be 180 degrees out of phase, whereas any linear acceleration undergone by the two masses will be in-phase so that the signals from corresponding electrodes on the two masses are subtracted, any linear acceleration signals will cancel out.

The method also includes sensing Coriolis-induced, rocking motions along the y and x of the one or more second proof masses 17a, 17b driven along the z axis, in response to an angular rate about the x and y axes, respectively. For the MEMS motion sensor 10 of FIGS. 8 to 10, this step involves sensing Coriolis-induced, rocking motions along the y and x axes of the first and second proof masses 17a, 17b. This step can further involve forming first and third capacitors with the first proof mass 17a and second and fourth capacitors with the second proof mass 17a, 17b. A difference between a capacitance of the first capacitor and a capacitance of the second capacitor can be measured, this difference being indicative of the angular rate about the x axis. Likewise, a difference between a capacitance of the third capacitor and a capacitance of the fourth capacitor can also be measured, this difference being indicative of the angular rate of the first and second proof masses 17a, 17b about the y axis.

The method further includes vibrating one or more of the proof masses in a rocking motion along the y axis at an in-plane drive frequency. For the MEMS motion sensor 10 of FIGS. 8 to 10, this step involves vibrating the third and fourth proof masses 17c, 17d in a rocking motion along the y axis. Additionally, and as for the first and second proof masses 17a, 17b, in some embodiment, the third and fourth proof masses 17c, 17d may be vibrated 180 degrees out-of-phase with each other.

The method also includes sensing a Coriolis-induced, rocking motion along the x axis of the one or more proof masses driven along the y axis, in response to an angular rate about the z axis. For the MEMS motion sensor 10, this step involves sensing a Coriolis-induced, rocking motion along the x axis of the third and fourth proof masses 17c, 17d. This step can further involve forming fifth and sixth capacitors respectively with the third and fourth proof masses 17c, 17d. A difference between a capacitance of the fifth capacitor and a capacitance of the sixth capacitor can be measured, this difference being indicative of the angular rate about the z axis.

The method also includes sensing a translational motion along the z axis, a rotation about the x axis, and a rotation about the y axis of one of the proof masses, indicative of linear accelerations along the z, x and y axes, respectively. For the MEMS motion sensor 10 of FIGS. 8 to 10, the linear acceleration measurements involve only the fifth proof mass 17e. In some embodiment, the step of sensing the translational motion along the z axis, the rotation about the x axis, and the rotation about the y axis of the fifth proof mass 17e is carried at respective acceleration sensing frequencies that are each less than between 30 percent and 50 percent of both the out-of-plane and in-plane drive frequencies.

Method for Manufacturing a Multi-Mass MEMS Motion Sensor

In accordance with another aspect, there is provided a method of manufacturing a MEMS motion sensor including a plurality of proof masses. The method for manufacturing the MEMS device will be described with reference to the diagrams of FIGS. 17A to 17P, which schematically illustrate steps of an exemplary embodiment. It will be understood, however, that there is no intent to limit the method to this embodiment, for the method may admit to other equally effective embodiments. It will also be understood that the manufacturing method can, by way of example, be performed to fabricate multi-mass MEMS motion sensors like those described above with reference to FIGS. 8 to 15 and 16A to 16C, or any other suitable MEMS motion sensor provided with a plurality of proof masses.

Referring to FIGS. 17A to 17P, there are schematically illustrated fabrication steps of an exemplary embodiment of the method for manufacturing a multi-mass MEMS motion sensor.

Referring to FIG. 17A, the manufacturing method includes a step of providing a top cap wafer 12. The top cap wafer 12 has opposed inner and outer sides 121, 122 and is made of an electrically conductive semiconductor material such as, for example, a silicon-based semiconductor. In some embodiments, the step of providing the top cap wafer 12 can include a step of forming recesses 51, or capacitor gaps, by removing top cap wafer material from a central region of the inner side 121 of the top cap wafer 12. The recesses 51 can be formed by any of several manufacturing methods including, but not limited to, photolithography and etch or patterned oxidation and etch. The recesses 51 may eventually form part of cavities whose role are to house proof masses once the top cap wafer 12 is bonded to a MEMS wafer 16, as described below. The manufacturing method also includes a step of forming top electrodes and insulated conducting cap wafer channels 123 from the inner side 121 into the top cap wafer 12, which can include patterning trenches 52 into the top cap wafer 12.

Turning to FIG. 17B, the trenches 52 may be filled with an insulating material 53. Alternatively, the trenches 52 may be lined with an insulating material 53 and then filled with a conducting material 55. For this purpose, trench and fill processes are available at different MEMS fabrication facilities, and the insulating and conducting materials may vary between them.

Referring to FIG. 17C, the steps of FIGS. 17A and 17B may be repeated on a bottom cap wafer 14 has opposed inner and outer sides 141, 142 to form a pattern of bottom cap electrodes, as well as recesses 51 or capacitor gaps, and insulated conducting cap wafer channels 143. As for the top cap wafer 12, the bottom cap wafer 14 is made of an electrically conductive semiconductor material such as, for example, a silicon-based semiconductor.

Referring now to FIG. 17D, the manufacturing method next includes providing a MEMS wafer 16 having opposed top and bottoms sides 161, 162. In FIG. 17D, the MEMS wafer is a SOI wafer including a device layer 20, a handle layer 22, and an insulating layer 24 (e.g., buried oxide) sandwiched between the device layer 20 and the handle layer 22. Conducting vias 30 are formed between the device layer 20 and the handle layer 22 through the insulating layer 24. The conducting vias 30 are patterned at desired spots on the device layer 20 and etched through the device layer 20 and insulating layer 24 to or slightly into the handle layer 22. In FIG. 17E, the conducting vias 30 may then be filled with a conducting material 55 which can be doped polycrystalline silicon (polysilicon), a metal, or another suitable conducting material. In this way an electrical path is formed vertically between the device layer 20 and the handle layers 22 of the MEMS wafer 16.

Referring to FIG. 17F, MEMS patterns including leads 62 and feedthroughs 63 may be patterned, delimited by trenches 64 in the device layer 20.

Referring to FIG. 17G, the manufacturing method includes a step of aligning and bonding the top side 161 of the MEMS wafer 16 to the inner side 121 of the top cap wafer 12. This step can involve aligning the feedthroughs 63 in the device layer 20 to corresponding pads on the top cap wafer 12, aligning the electrodes 13 in the top cap wafer 12 to corresponding electrodes 65 on the MEMS wafer 16, aligning the insulated conducting cap wafer channels 123 in the top cap wafer 12 with corresponding portions of the insulated conducting MEMS channels 163. Advantageously, the wafer bonding process used can provide a conductive bond such as, for example, fusion bonding, gold thermocompression bonding, or gold-silicon eutectic bonding.

Referring to FIG. 17H, the manufacturing method next includes patterning the handle layer 22 of the MEMS wafer 16 with MEMS structures such as a plurality of proof masses 17a, 17b and feedthroughs 67, which are aligned with similar structures on the device layer 20, such as the electrodes 65 and flexible springs (not shown). Trenches 69 can be etched around each feedthrough 67 to isolate the feedthrough 67 from the rest of the handle layer 22. In some embodiments, if the feedthrough 67 is attached to a SOI via on the device layer 20, then the feedthrough 67 becomes an isolated electrical feedthrough. However, if the feedthrough 67 is not attached to a SOI via, the feedthrough 67 then acts merely as a mechanical support.

Referring to FIG. 17I, the bottom cap wafer 14 may next be bonded to the backside of the handle layer 22. Again, a wafer bonding method such as fusion bonding, gold thermocompression bonding, or gold-silicon eutectic bonding can be used to provide electrical contacts between the feedthroughs 67 in the MEMS wafer 16 and pads 70 in the bottom cap wafer 14, which are connected electrically to the bottom electrodes 15. In this manner, a conductive path can be provided from the bottom electrodes 15 through the bottom cap pads 70, handle feedthroughs 67, SOI vias 30, and SOI device layer pads 63 to the top cap pads.

Referring to FIG. 17J, at this stage of the manufacturing method, the MEMS motion sensor 10 is hermetically sealed between the top and bottom cap wafers 12, 14 and the proof masses 17a, 17b are aligned with the top cap and bottom cap electrodes 13, 15. Because the insulating conducting pathways 33 do not yet fully penetrate the caps, the electrodes on each cap are shorted together through the remaining silicon (see, e.g., FIG. 17I). Both cap wafers 12, 14 may then be thinned, for example by grinding and polishing, to expose the insulating conducting channels 64. The electrodes are thus electrically isolated except for connections to top cap pads through the feedthroughs 67 and conducting vias 30. Both outer surfaces of the top and bottom cap wafers 12, 14 can be passivated with an insulating oxide layer 71 for protection purposes.

Referring to FIG. 17K, contacts 42a can be opened over the pads in the top cap wafer 12, bond pad metal 73 can be deposited and patterned, and passivating oxide 74 can be applied and patterned to expose the bond pads. These or similar steps may be performed on the bottom cap wafer 14. In this way, electrical connections from the top, sides, and/or bottom of the MEMS motion sensor can become accessible from the top or bottom for wire bonding, flip chip bonding, or wafer bonding. After completion of the step depicted in FIG. 17K, the wafer level fabrication of a hermetically sealed MEMS motion sensor wafer 72 is obtained.

At this point, if desired, the MEMS motion sensor wafer 72 can be diced into individual MEMS chips. Alternatively, the 3DTCV architecture described herein may allow a wafer containing ICs for sensing and data processing to be bonded directly to the MEMS motion sensor wafer 72. The wafer-level integration of the 3D system (3DS) can involve bonding of an application-specific IC (ASIC) wafer designed with the appropriate system electronics for the application and with a physical bond pad layout commensurate with the MEMS motion sensor wafer 72.

Referring to FIG. 17L, bump-bonds 75 can be applied to one side of the MEMS motion sensor wafer 72. Numerous approaches and materials used in the semiconductor industry can provide wafer bumps. In one embodiment, a thick photoresist underfill 76 is applied to one side (e.g., the top cap wafer 12 in FIG. 17L) of the MEMS motion sensor wafer 72 and patterned to produce an electroplating mask with openings over the bond pad metal 73. Thick solder can be electroplated into the openings. The solder can be left as a column or reflowed into balls, depending upon the bonding method. The photoresist can be stripped leaving the balls isolated, or can be left in place as an underfill to protect the wafer surface. If the photoresist is removed, a separate polymeric underfill layer 76 can be coated and patterned around the solder balls. The purpose of the underfill is to protect the wafer or chip surface and to mitigate bump shearing due to the thermal stress of heating during bonding.

Referring to FIG. 17M, an ASIC wafer 77 can then be flipped and aligned to the MEMS motion sensor wafer 72 (e.g., to the top cap wafer 12 in FIG. 17M) such that ASIC bond pads 78 are aligned to the top cap solder bumps 75. The ASIC wafer has circuitry electrically connected to the MEMS motion sensor wafer 72, and in particular, to the first and second sets of electrical contacts (42a, 42b) described above for routing signals to and from the top and bottom electrodes 13, 15. The ASIC wafer may be bonded to the MEMS motion sensor wafer 72 using temperature and pressure to produce a 3DS wafer 82. At this point the ASIC wafer 77 (e.g., a CMOS wafer) can be thinned, if desired, and passivated with a PECVD oxide 79.

Referring to FIG. 17N, an underfill 80 and bottom cap solder bumps 81 may next be applied to the bottom cap 14 of the 3DS wafer 82. The process is similar to that illustrated in FIG. 17L, except that in the case of solder bumps, a lower eutectic point solder than that used for the top bump-bonds is generally used to avoid releasing the top solder joints. The top of the ASIC wafer 77 may be protected with an ASIC oxide passivation 79 layer and the MEMS/ASIC interface may be protected by the underfill 76. The bonded 3DS wafer 82 can finally be diced into individual 3DS components.

Referring to FIG. 17O, in some embodiments, the 3DS wafer 82 can be diced into self-packaged MEMS IMUs without requiring additional wire bonding or external packaging to.

Referring to FIG. 17P, the MEMS IMU 82 diced into self-packaged MEMS IMUs can then be directly solder bumped to leads 83 on a PCB 84.

Of course, numerous modifications could be made to the embodiments described above without departing from the scope of the present invention.

Claims

1. A Micro-Electro-Mechanical System (MEMS) sensor chip for measuring sensor data, the sensor chip comprising: an electrically conductive MEMS wafer having first and second sides and an outer frame, the MEMS wafer comprising a silicon-on-insulator (SOI) MEMS wafer having a device layer over an insulating layer that is over a silicon substrate;an electrically conductive silicon cap wafer having an inner top cap side and an outer cap side, the inner cap side being fusion bonded to the first side of the device layer of the SOI MEMS wafer wherein the outer cap side includes electrical connections;at least two distinct sensors, each patterned in the electrically conductive MEMS wafer and the cap wafer, said sensors being operative to sense at least two distinct parameters, respectively, along at least one of mutually orthogonal X, Y and Z axes;a first sensing electrode patterned with the electrically conductive cap wafer to sense movement of a proof mass of a first sensor of the at least two distinct sensors; andinsulated conducting pathways extending from said electrical connections, through the electrically conductive silicon cap wafer, and electrically connected with the electrically conductive SOI MEMS wafer for conducting electrical signals between said sensors and the electrical connections, said sensors being enclosed by at least the electrically conductive cap wafer and by the outer frame of the electrically conductive MEMS wafer.

2. The MEMS sensor chip of claim 1 further comprising wherein at least one of said sensors is hermetically sealed between said electrically conductive cap wafer and by the silicon substrate of the SOI MEMS wafer.

3. The MEMS sensor chip of claim 1, wherein one of said sensors is a transducer.

4. The MEMS sensor chip of claim 1, wherein one of said sensors is a resonator.

5. The MEMS sensor chip of claim 1, wherein one of said sensors is an inertial sensor, the structure including at least one proof mass suspended in a cavity by flexible springs patterned in the electrically conductive MEMS wafer, the flexible springs enabling the at least one proof mass to move relative to the outer frame along one or more of the X, Y and Z axes, the cavity being located between the inner cap side and by the SOI MEMS wafer, and by sidewalls patterned in the electrically conductive MEMS wafer.

6. The MEMS sensor chip of claim 5, wherein said inertial sensor comprises a 3-DOF accelerometer and one of said at least two distinct parameters is an acceleration of the MEMS sensor chip, wherein the at least one proof mass comprises an accelerometer proof mass, the 3-DOF accelerometer comprising accelerometer electrodes patterned in the electrically conductive cap wafer, the accelerometer electrodes being operable to detect a translational motion of the accelerometer proof mass that is indicative of an acceleration of the MEMS sensor chip along one or more of the X, Y and Z axes.

7. The MEMS sensor chip of claim 5, wherein said inertial sensor comprises an angular rate sensor and one of said at least two distinct parameters is an angular rate of the MEMS sensor chip; wherein the at least one proof mass comprises at least one angular rate sensor proof mass, suspended in a corresponding angular ra cavity; the angular rate sensor comprising angular rate sensor electrodes patterned to measure at least one of an in plane motion and of an out of plane motion, and angular rate drive electrodes being operable to drive the angular movement of the proof mass and thereby detect a motion of the angular rate sensor proof mass, indicative of the angular rate of the MEMS sensor chip about at least one of the X, Y and Z axes.

8. The MEMS sensor chip of claim 1, wherein one of said sensors is a transducer and one of said parameters is a displacement, said transducer comprising: a moveable mass patterned in the SOI MEMS wafer and suspended over at least one sensor cavity, andone or more transducer electrode(s) patterned in the electrically conductive cap wafer and coupled to the moveable mass, the transducer electrode(s) being operable to detect a deflection of the moveable mass.

9. The MEMS sensor chip of claim 1, wherein the electrically conductive MEMS and cap wafer are made of an electrically conductive silicon semiconductor material.

10. The MEMS sensor chip according to any one of claim 1, wherein the insulating layer of the SOI wafer is sandwiched between the device layer and the silicon substrate, the structure of the first sensor being patterned in the device layer of the SOI wafer.

11. The MEMS sensor chip of claim 5, wherein said cavity of the inertial sensor is under vacuum.

12. The single MEMS sensor chip according to claim 34, wherein the at least one angular rate sensor proof mass comprises four different angular rate proof masses, each suspended in corresponding angular rate sensor cavities.

13. The MEMS sensor chip of claim 1, wherein at least some of the insulated conducting pathways extend through the thickness of the MEMS wafer, forming through silicon vias.

14. The MEMS sensor chip of claim 1, wherein each of said at least two distinct sensors comprises electrodes, including the first sensing electrode, the electrodes being delineated by trenches filled with an insulating material.

15. The MEMS sensor chip of claim 1, wherein at least one of said electrodes is an out-of-plane electrode connected to one of said electrical connections.

16. The MEMS sensor chip of claim 1, wherein at least a subset of the electrical connections comprises metal pads for signal routing.

17. The MEMS sensor chip of claim 1, further comprising a second cap wafer wherein an inner second cap side is fusion bonded to the silicon substrate on the second side of the SOI MEMS wafer.

18. A Micro-Electro-Mechanical System (MEMS) inertial sensor chip comprising: an electrically conductive MEMS wafer having an outer frame, the MEMS wafer being fusion bonded to a first silicon wafer to form a wafer stack, wherein at least one of the wafers in the wafer stack comprises a silicon-on-insulator (SOI) MEMS wafer having a device layer over an insulating layer that is over a silicon substrate;wherein at least one of the wafers in the wafer stack is an electrically conductive silicon cap wafer comprising electrical connections;at least one resonant element patterned in at least a portion of the electrically conductive SOI MEMS wafer, said at least one resonant element being positioned relative to a plurality of drive electrodes and a plurality of sensing electrodes in the wafer stack to drive and sense a resonant motion of the at least one resonant element; andinsulated conducting pathways extending from said electrical connections, through the electrically conductive silicon cap wafer, and electrically connected with the electrically conductive MEMS wafer for conducting electrical signals between said plurality of sensing electrodes and the electrical connections, said at least one resonant element being enclosed by at least the electrically conductive silicon cap wafer and by the outer frame of the electrically conductive MEMS wafer.

19. The MEMS sensor chip of claim 18, wherein at least one of said resonant devices comprises a proof mass that is hermetically sealed in the wafer stack.

20. The MEMS sensor chip of claim 18, wherein one of said at least one resonant device comprises a gyroscope.

21. The MEMS sensor chip of claim 18, wherein said sensor chip comprises a 3-DOF magnetometer.

22. The MEMS sensor chip of claim 19, wherein one of said proof mass is an inertial sensor, said proof mass being suspended in a cavity by flexible springs patterned in the electrically conductive MEMS wafer, the flexible springs enabling the proof mass to move relative to the outer frame along X, Y and Z axes, the cavity being located between at least two wafers of the wafer stack.

23. The MEMS sensor chip of claim 18, wherein said inertial sensor further comprises a 3-DOF accelerometer wherein the inertial sensor measures at least two distinct parameters including an acceleration of the MEMS sensor chip, wherein at least one proof mass comprises an accelerometer proof mass, the 3-DOF accelerometer comprising accelerometer electrodes patterned in the electrically conductive cap wafer, the accelerometer electrodes being operable to detect a translational motion of the accelerometer proof mass, indicative of the acceleration of the MEMS sensor chip along the X, Y and Z axes.

24. The MEMS sensor chip 18, wherein said inertial sensor comprises a 3 DOF angular rate sensor wherein the inertial sensor measures at least two distinct parameters including an angular rate of the MEMS sensor chip; wherein at least one proof mass comprises at least one angular rate sensor proof mass, suspended in a corresponding angular rate cavity; the 3-DOF angular rate sensor comprising angular rate sensor electrodes patterned in the electrically conductive cap wafer, the angular rate sensor electrodes being operable to drive the angular rate proof mass and to detect a motion of the angular rate sensor proof mass, indicative of the angular rate of the MEMS sensor chip about the X, Y and Z axes.

25. The MEMS sensor chip of claim 18, wherein the electrically conductive cap is an SOI wafer or wherein the first silicon wafer and the second silicon wafer comprise additional SOI wafers.

26. A MEMS sensor chip comprising: an electrically conductive MEMS wafer having an outer frame, the MEMS wafer being attached to at least one electrically conductive silicon cap wafer to form a wafer stack, wherein at least one of the wafers in the wafer stack comprises a silicon-on-insulator (SOI) wafer having a device layer over an insulating layer that is over a silicon substrate, the electrically conductive silicon cap wafer having electrical contacts;a gyroscope proof mass patterned in the electrically conductive MEMS wafer, said proof mass being positioned relative to at least one sensing electrode to sense movement of the proof mass;a driving electrode to drive a motion of the proof mass; andinsulated conducting pathways extending from said electrical contacts through at least a portion of the electrically conductive silicon cap wafer, at least one insulating conducting pathway electrically connected with the electrically conductive MEMS wafer for conducting electrical signals between the proof mass and at least one of the electrical contacts, said proof mass being enclosed by at least the electrically conductive silicon cap wafer and by the outer frame of the electrically conductive MEMS wafer.

27. The MEMS sensor chip of claim 26, wherein at least one of said moving structures comprises a proof mass that is hermetically sealed in the wafer stack.

28. The single MEMS sensor chip of claim 26, wherein the sensing electrode is patterned with the electrically conductive silicon cap wafer.

29. The single MEMS sensor chip of claim 26, wherein said sensor chip further comprises a 3-DOF magnetometer.