detecting a contour or curvature

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CPC
G01B9/02096

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02096detecting a contour or curvature

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Surface sensing probe and methods of use
- Patent number 11,781,855
- Issue date Oct 10, 2023
- Lyle G. Shirley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for remote sensing of objects utilizing radiat...
- Patent number 10,935,364
- Issue date Mar 2, 2021
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Measuring surface roughness
- Patent number 10,571,244
- Issue date Feb 25, 2020
- Rolls-Royce PLC
- Murukeshan Vadakke Matham
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 10,317,190
- Issue date Jun 11, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for remote sensing of objects utilizing radiat...
- Patent number 10,281,257
- Issue date May 7, 2019
- Lyle G. Shirley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection method and defect detection apparatus
- Patent number 10,267,618
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Shearogram generation algorithm for moving platform based shearogra...
- Patent number 9,818,181
- Issue date Nov 14, 2017
- BAE Systems Information and Electronic Systems Integration Inc.
- Andrew N. Acker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for remote sensing and comparing utilizing rad...
- Patent number 9,582,883
- Issue date Feb 28, 2017
- Lyle G. Shirley
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measuring apparatus including multi-wavelength interferometer
- Patent number 9,372,068
- Issue date Jun 21, 2016
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Grant
Shearographic inspection system using a laser matrix
- Patent number 9,234,740
- Issue date Jan 12, 2016
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and method using partial-coherence speckle interfere...
- Patent number 8,780,182
- Issue date Jul 15, 2014
- Raytheon Company
- Robert W. Byren
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for remote sensing of objects utilizing radiat...
- Patent number 8,761,494
- Issue date Jun 24, 2014
- Lyle Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for remote sensing of objects utilizing radiat...
- Patent number 8,265,375
- Issue date Sep 11, 2012
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Grant
Speckle interferometer apparatus
- Patent number 7,092,104
- Issue date Aug 15, 2006
- Fujinon Corporation
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam optical interferometer
- Patent number 6,525,824
- Issue date Feb 25, 2003
- California Institute of Technology
- Roman C. Gutierrez
- G01 - MEASURING TESTING
Information Patent Grant
Measuring head holder
- Patent number 6,439,524
- Issue date Aug 27, 2002
- Andreas Ettemeyer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for electronic speckle pattern interferometry
- Patent number 6,188,482
- Issue date Feb 13, 2001
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING
Information Patent Grant
Technique and apparatus for performing electronic speckle pattern i...
- Patent number 6,128,082
- Issue date Oct 3, 2000
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING
Information Patent Grant
Optical three-dimensional profilometry method based on processing S...
- Patent number 5,870,196
- Issue date Feb 9, 1999
- European Community
- Alfredo Lulli
- G01 - MEASURING TESTING
Information Patent Grant
Optical depth gauge for optically rough surfaces
- Patent number 5,426,504
- Issue date Jun 20, 1995
- United Technologies Corporation
- Alan B. Callender
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for determining surface contour of diffusel...
- Patent number 5,418,612
- Issue date May 23, 1995
- Renishaw, plc
- Vladimir V. Khopov
- G01 - MEASURING TESTING
Information Patent Grant
Aperture sampling coherence sensor and method
- Patent number 4,934,815
- Issue date Jun 19, 1990
- Environmental Research Institute of Michigan
- Anthony M. Tai
- G01 - MEASURING TESTING
Information Patent Grant
Optically phased-locked speckle pattern interferometer
- Patent number 4,913,547
- Issue date Apr 3, 1990
- Steven E. Moran
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE SENSING PROBE AND METHODS OF USE
- Publication number 20210356250
- Publication date Nov 18, 2021
- Lyle G. Shirley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...
- Publication number 20200025552
- Publication date Jan 23, 2020
- Lyle G. Shirley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING SURFACE ROUGHNESS
- Publication number 20190145755
- Publication date May 16, 2019
- Rolls-Royce plc
- Murukeshan VADAKKE MATHAM
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION MEASUREMENT DEVICE
- Publication number 20180283847
- Publication date Oct 4, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...
- Publication number 20140321734
- Publication date Oct 30, 2014
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...
- Publication number 20130202196
- Publication date Aug 8, 2013
- Lyle G. Shirley
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS INCLUDING MULTI-WAVELENGTH INTERFEROMETER
- Publication number 20130155414
- Publication date Jun 20, 2013
- Canon Kabushiki Kaisha
- Akihiro Hatada
- G01 - MEASURING TESTING
Information Patent Application
High resolution 3-D holographic camera
- Publication number 20120044320
- Publication date Feb 23, 2012
- TREX ENTERPRISES CORP
- Brett Spivey
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION MEASURING APPARATUS AND DEFORMATION MEASURING METHOD
- Publication number 20110299064
- Publication date Dec 8, 2011
- Canon Kabushiki Kaisha
- Takashi Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND METHOD USING PARTIAL-COHERENCE SPECKLE INTERFERE...
- Publication number 20110242285
- Publication date Oct 6, 2011
- Raytheon Company
- Robert W. BYREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...
- Publication number 20080154524
- Publication date Jun 26, 2008
- Lyle G. Shirley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Speckle interferometer apparatus
- Publication number 20040179204
- Publication date Sep 16, 2004
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING

detecting a contour or curvature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Surface sensing probe and methods of use

Method and apparatus for remote sensing of objects utilizing radiat...

Measuring surface roughness

Vibration measurement device

Method and apparatus for remote sensing of objects utilizing radiat...

Defect detection method and defect detection apparatus

Shearogram generation algorithm for moving platform based shearogra...

Method and apparatus for remote sensing and comparing utilizing rad...

Measuring apparatus including multi-wavelength interferometer

Shearographic inspection system using a laser matrix

Imaging system and method using partial-coherence speckle interfere...

Method and apparatus for remote sensing of objects utilizing radiat...

Method and apparatus for remote sensing of objects utilizing radiat...

Speckle interferometer apparatus

Dual beam optical interferometer

Measuring head holder

Apparatus for electronic speckle pattern interferometry

Technique and apparatus for performing electronic speckle pattern i...

Optical three-dimensional profilometry method based on processing S...

Optical depth gauge for optically rough surfaces

Method of and apparatus for determining surface contour of diffusel...

Aperture sampling coherence sensor and method

Optically phased-locked speckle pattern interferometer

Patents Applicationslast 30 patents

SURFACE SENSING PROBE AND METHODS OF USE

METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...

MEASURING SURFACE ROUGHNESS

VIBRATION MEASUREMENT DEVICE

METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...

METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...

MEASURING APPARATUS INCLUDING MULTI-WAVELENGTH INTERFEROMETER

High resolution 3-D holographic camera

DEFORMATION MEASURING APPARATUS AND DEFORMATION MEASURING METHOD

IMAGING SYSTEM AND METHOD USING PARTIAL-COHERENCE SPECKLE INTERFERE...

METHOD AND APPARATUS FOR REMOTE SENSING OF OBJECTS UTILIZING RADIAT...

Speckle interferometer apparatus