detecting deformation from original shape

Industry

CPC
G01B9/02095

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02095detecting deformation from original shape

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Displacement measurement device and defect detection device
- Patent number 11,977,032
- Issue date May 7, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Common lens transmitter for motion compensated illumination
- Patent number 11,650,042
- Issue date May 16, 2023
- BAE Systems Information and Electronic Systems Integration Inc.
- Christopher E. Saxer
- G02 - OPTICS
Information Patent Grant
Electronic speckle pattern interferometer (ESPI) for long-range mea...
- Patent number 11,525,667
- Issue date Dec 13, 2022
- United States of America as represented by the Secretary of the Air Force
- Jennie Burns
- G01 - MEASURING TESTING
Information Patent Grant
Vibration sensing system with wavelength encoding
- Patent number 10,989,517
- Issue date Apr 27, 2021
- CONTINUSE BIOMETRICS LTD.
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
Component heating sub-systems and methods for laser shearography te...
- Patent number 10,837,761
- Issue date Nov 17, 2020
- The Boeing Company
- Mahdi Ashrafi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for use in depth characterization of objects
- Patent number 10,724,846
- Issue date Jul 28, 2020
- CONTINUSE BIOMETRICS LTD.
- Zeev Zalevsky
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical interferometry
- Patent number 10,466,032
- Issue date Nov 5, 2019
- Optonor AS
- Eiolf Vikhagen
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection device
- Patent number 10,429,172
- Issue date Oct 1, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection method and defect detection apparatus
- Patent number 10,267,618
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Determining a propagation velocity for a surface wave
- Patent number 10,240,912
- Issue date Mar 26, 2019
- Koninklijke Philips N.V.
- Remco Theodorus Johannes Muijs
- G01 - MEASURING TESTING
Information Patent Grant
Laser speckle interferometric system and method for mobile devices
- Patent number 10,206,576
- Issue date Feb 19, 2019
- Samsung Electronics Co., Ltd.
- Alexander Viacheslavovich Shcherbakov
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for photoacoustic tomograpy
- Patent number 9,506,742
- Issue date Nov 29, 2016
- Medizinisches Laserzentrum Lubeck GmbH
- Jens Horstmann
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical phase extraction system having phase compensation function...
- Patent number 9,036,011
- Issue date May 19, 2015
- Electronics and Telecommunications Research Institute
- Hyoung Jun Park
- G01 - MEASURING TESTING
Information Patent Grant
Low coherence interferometric system for phase stepping shearograph...
- Patent number 8,873,068
- Issue date Oct 28, 2014
- Cockerill Maintenance & Ingenierie S.A.
- Pascal Blain
- G01 - MEASURING TESTING
Information Patent Grant
Deformation measuring apparatus and deformation measuring method
- Patent number 8,797,515
- Issue date Aug 5, 2014
- Canon Kabushiki Kaisha
- Takashi Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface deformation measuring system with a retro-reflective surfac...
- Patent number 8,269,982
- Issue date Sep 18, 2012
- Exelis, Inc.
- Gene Olczak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting the deformation of objects
- Patent number 7,860,297
- Issue date Dec 28, 2010
- Steinbichler Optotechnik GmbH
- Robert Wilhelm
- G01 - MEASURING TESTING
Information Patent Grant
Method for resolving phase in electronic speckle interferometry
- Patent number 7,280,187
- Issue date Oct 9, 2007
- Southeastern Louisiana University
- Sanichiro Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Speckle interferometer apparatus
- Patent number 7,092,104
- Issue date Aug 15, 2006
- Fujinon Corporation
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Grant
Deformation measuring method and apparatus using electronic speckle...
- Patent number 6,943,870
- Issue date Sep 13, 2005
- President of Saitama University
- Satoru Toyooka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring head holder
- Patent number 6,439,524
- Issue date Aug 27, 2002
- Andreas Ettemeyer
- G01 - MEASURING TESTING
Information Patent Grant
Method of improving the contrast of images obtained using the pulse...
- Patent number 6,362,873
- Issue date Mar 26, 2002
- European Community
- Massimo Facchini
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for electronic speckle pattern interferometry
- Patent number 6,188,482
- Issue date Feb 13, 2001
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING
Information Patent Grant
Technique and apparatus for performing electronic speckle pattern i...
- Patent number 6,128,082
- Issue date Oct 3, 2000
- Board of Trustees operating Michigan State University
- Gary L. Cloud
- G01 - MEASURING TESTING
Information Patent Grant
Compact fiber-optic electronic laser speckle pattern shearography
- Patent number 6,040,900
- Issue date Mar 21, 2000
- Cybernet Systems Corporation
- Xiaolu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting or testing a sample by optical...
- Patent number 6,031,602
- Issue date Feb 29, 2000
- British Aerospace Public Limited Company
- Steve C. J. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Thermal input control and enhancement for laser based residual stre...
- Patent number 5,920,017
- Issue date Jul 6, 1999
- Westinghouse Savannah River Company
- Martin J. Pechersky
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring residual stresses in materials by plastically...
- Patent number 5,432,595
- Issue date Jul 11, 1995
- Martin J. Pechersky
- G01 - MEASURING TESTING
Information Patent Grant
Dual-lens shearing interferometer
- Patent number 5,004,345
- Issue date Apr 2, 1991
- Yau Y. Hung
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection
- Patent number 4,832,494
- Issue date May 23, 1989
- National Research Development Corporation
- John R. Tyrer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
- Publication number 20240401928
- Publication date Dec 5, 2024
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
CYLINDRIC DECOMPOSITION FOR EFFICIENT MITIGATION OF SUBSTRATE DEFOR...
- Publication number 20240266231
- Publication date Aug 8, 2024
- Applied Materials, Inc.
- Wonjae Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20230304787
- Publication date Sep 28, 2023
- Shimadzu Corporation
- Tomotaka NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
- Publication number 20230296368
- Publication date Sep 21, 2023
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20230251204
- Publication date Aug 10, 2023
- Shimadzu Corporation
- Hiroshi HORIKAWA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20230062821
- Publication date Mar 2, 2023
- Shimadzu Corporation
- Koki YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF A TUBE PRESSURE BY MEANS OF LASER INTERFEROMETRY A...
- Publication number 20220299311
- Publication date Sep 22, 2022
- FRESENIUS MEDICAL CARE DEUTSCHLAND GMBH
- David HANNES
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
- Publication number 20220065617
- Publication date Mar 3, 2022
- Nikon Corporation
- Eric Peter Goodwin
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE
- Publication number 20220034822
- Publication date Feb 3, 2022
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
COMMON LENS TRANSMITTER FOR MOTION COMPENSATED ILLUMINATION
- Publication number 20200363185
- Publication date Nov 19, 2020
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Christopher E. Saxer
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT HEATING SUB-SYSTEMS AND METHODS FOR LASER SHEAROGRAPHY TE...
- Publication number 20200348126
- Publication date Nov 5, 2020
- The Boeing Company
- Mahdi Ashrafi
- G01 - MEASURING TESTING
Information Patent Application
VIBRATION SENSING SYSTEM WITH WAVELENGTH ENCODING
- Publication number 20200103217
- Publication date Apr 2, 2020
- ContinUse Biometrics Ltd.
- Zeev ZALEVSKY
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR USE IN DEPTH CHARACTERIZATION OF OBJECTS
- Publication number 20190212124
- Publication date Jul 11, 2019
- ContinUse Biometrics Ltd.
- Zeev ZALEVSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE
- Publication number 20180356205
- Publication date Dec 13, 2018
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETRY
- Publication number 20180328713
- Publication date Nov 15, 2018
- OPTONOR AS
- Eiolf VIKHAGEN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS
- Publication number 20170350690
- Publication date Dec 7, 2017
- Shimadzu Corporation
- Takahide HATAHORI
- G01 - MEASURING TESTING
Information Patent Application
LASER SPECKLE INTERFEROMETRIC SYSTEM AND METHOD FOR MOBILE DEVICES
- Publication number 20160066790
- Publication date Mar 10, 2016
- Samsung Electronics Co., Ltd.
- Alexander Viacheslavovich SHCHERBAKOV
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING A PROPAGATION VELOCITY FOR A SURFACE WAVE
- Publication number 20150323311
- Publication date Nov 12, 2015
- Koninklijke Philips N.V.
- REMCO THEODORUS JOHANNES MUIJS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PHOTOACOUSTIC TOMOGRAPY
- Publication number 20140247456
- Publication date Sep 4, 2014
- MEDIZINISCHES LASERZENTRUM LUBECK GMBH
- Jens HORSTMANN
- G01 - MEASURING TESTING
Information Patent Application
LOW COHERENCE INTERFEROMETRIC SYSTEM FOR PHASE STEPPING SHEAROGRAPH...
- Publication number 20130141712
- Publication date Jun 6, 2013
- Pascal Blain
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE EXTRACTION SYSTEM HAVING PHASE COMPENSATION FUNCTION...
- Publication number 20130033573
- Publication date Feb 7, 2013
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Hyoung Jun PARK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY-BASED STRESS ANALYSIS
- Publication number 20130003152
- Publication date Jan 3, 2013
- United Technologies Corporation
- Igor V. Belousov
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION MEASURING APPARATUS AND DEFORMATION MEASURING METHOD
- Publication number 20110299064
- Publication date Dec 8, 2011
- Canon Kabushiki Kaisha
- Takashi Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting the deformation of objects
- Publication number 20070121121
- Publication date May 31, 2007
- Robert Wilhelm
- G01 - MEASURING TESTING
Information Patent Application
Movement detection speckle interferometer
- Publication number 20040233459
- Publication date Nov 25, 2004
- Anthony G. Booth
- G01 - MEASURING TESTING
Information Patent Application
Speckle interferometer apparatus
- Publication number 20040179204
- Publication date Sep 16, 2004
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Application
Deformation measuring method and apparatus using electronic speckle...
- Publication number 20040059526
- Publication date Mar 25, 2004
- President of Saitama University
- Satoru Toyooka
- G01 - MEASURING TESTING
Information Patent Application
Deformation measuring method and apparatus using electronic speckle...
- Publication number 20040057054
- Publication date Mar 25, 2004
- President of Saitama University
- Satoru Toyooka
- G01 - MEASURING TESTING

detecting deformation from original shape

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Displacement measurement device and defect detection device

Common lens transmitter for motion compensated illumination

Electronic speckle pattern interferometer (ESPI) for long-range mea...

Vibration sensing system with wavelength encoding

Component heating sub-systems and methods for laser shearography te...

System and method for use in depth characterization of objects

Optical interferometry

Defect detection method and defect detection device

Defect detection method and defect detection apparatus

Determining a propagation velocity for a surface wave

Laser speckle interferometric system and method for mobile devices

Method for photoacoustic tomograpy

Optical phase extraction system having phase compensation function...

Low coherence interferometric system for phase stepping shearograph...

Deformation measuring apparatus and deformation measuring method

Surface deformation measuring system with a retro-reflective surfac...

Method and apparatus for detecting the deformation of objects

Method for resolving phase in electronic speckle interferometry

Speckle interferometer apparatus

Deformation measuring method and apparatus using electronic speckle...

Measuring head holder

Method of improving the contrast of images obtained using the pulse...

Apparatus for electronic speckle pattern interferometry

Technique and apparatus for performing electronic speckle pattern i...

Compact fiber-optic electronic laser speckle pattern shearography

Method and apparatus for inspecting or testing a sample by optical...

Thermal input control and enhancement for laser based residual stre...

Method for measuring residual stresses in materials by plastically...

Dual-lens shearing interferometer

Optical inspection

Patents Applicationslast 30 patents

DETERMINATION OF A CHANGE OF OBJECT'S SHAPE

CYLINDRIC DECOMPOSITION FOR EFFICIENT MITIGATION OF SUBSTRATE DEFOR...

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE

DEFECT INSPECTION APPARATUS

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

DETERMINATION OF A TUBE PRESSURE BY MEANS OF LASER INTERFEROMETRY A...

DETERMINATION OF A CHANGE OF OBJECT'S SHAPE

DISPLACEMENT MEASUREMENT DEVICE AND DEFECT DETECTION DEVICE

COMMON LENS TRANSMITTER FOR MOTION COMPENSATED ILLUMINATION

COMPONENT HEATING SUB-SYSTEMS AND METHODS FOR LASER SHEAROGRAPHY TE...

VIBRATION SENSING SYSTEM WITH WAVELENGTH ENCODING

SYSTEM AND METHOD FOR USE IN DEPTH CHARACTERIZATION OF OBJECTS

DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE

OPTICAL INTERFEROMETRY

DEFECT DETECTION METHOD AND DEFECT DETECTION APPARATUS

LASER SPECKLE INTERFEROMETRIC SYSTEM AND METHOD FOR MOBILE DEVICES

DETERMINING A PROPAGATION VELOCITY FOR A SURFACE WAVE

METHOD FOR PHOTOACOUSTIC TOMOGRAPY

LOW COHERENCE INTERFEROMETRIC SYSTEM FOR PHASE STEPPING SHEAROGRAPH...

OPTICAL PHASE EXTRACTION SYSTEM HAVING PHASE COMPENSATION FUNCTION...

INTERFEROMETRY-BASED STRESS ANALYSIS

DEFORMATION MEASURING APPARATUS AND DEFORMATION MEASURING METHOD

Method and apparatus for detecting the deformation of objects

Movement detection speckle interferometer

Speckle interferometer apparatus

Deformation measuring method and apparatus using electronic speckle...

Deformation measuring method and apparatus using electronic speckle...