Detectors

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CPC
G01N2223/50

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/50Detectors

Industries

Patents Grantslast 30 patents

Information Patent Grant
Radiation detector unit with three-side buttable read-out integrate...
- Patent number 12,358,735
- Issue date Jul 15, 2025
- Redlen Technologies, Inc.
- Glenn Bindley
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Flexible digital detector array
- Patent number 12,352,709
- Issue date Jul 8, 2025
- Baker Hughes Holdings LLC
- Kwang Hyup An
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
X-ray fluorescence spectroscopy analysis
- Patent number 12,345,667
- Issue date Jul 1, 2025
- Schlumberger Technology Corporation
- Sergey Mikhailovich Makarychev-Mikhailov
- G01 - MEASURING TESTING
Information Patent Grant
Method for detection of soil heavy metal pollution using unmanned a...
- Patent number 12,339,240
- Issue date Jun 24, 2025
- University of Electronic Science and Technology of China
- Fang Huang
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Lithium detection techniques using neutrons and/or alpha particles
- Patent number 12,332,400
- Issue date Jun 17, 2025
- Schlumberger Technology Corporation
- Shikha Prasad
- E21 - EARTH DRILLING MINING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality control evaluation method of cyanate ester matrix resin mat...
- Patent number 12,320,765
- Issue date Jun 3, 2025
- THE AEROSPACE CORPORATION
- Rafael J. Zaldivar
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for defects detection and classification using...
- Patent number 12,307,668
- Issue date May 20, 2025
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter imaging device, control method and inspection system
- Patent number 12,298,261
- Issue date May 13, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Downhole lithium detection systems and methods
- Patent number 12,282,136
- Issue date Apr 22, 2025
- Schlumberger Technology Corporation
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sensor configuration
- Patent number 12,252,395
- Issue date Mar 18, 2025
- Vamshi Gangumalla
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-temperature perovskite scintillators and devices with low-tempe...
- Patent number 12,164,067
- Issue date Dec 10, 2024
- Michael Saliba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Radiation detector and method for manufacturing radiation detector
- Patent number 12,140,715
- Issue date Nov 12, 2024
- Kyoto University
- Keiji Abe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Systems and methods for determining the mineralogy of drill solids
- Patent number 12,111,273
- Issue date Oct 8, 2024
- Schlumberger Technology Corporation
- Jonathan Mitchell
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY
- Publication number 20250231126
- Publication date Jul 17, 2025
- Gold Standard Radiation Detection, Inc.
- Mark DERZON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
- Publication number 20250231124
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250172509
- Publication date May 29, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray System for Generating Multi-Spectrum Image Data
- Publication number 20250172512
- Publication date May 29, 2025
- Teledyne Dalsa B.V.
- Korthout Alouisius Wilhelmus Marinus
- G01 - MEASURING TESTING
Information Patent Application
Handheld X-ray fluorescence, XRF, analyzer and a method for element...
- Publication number 20250172513
- Publication date May 29, 2025
- BRUKER NANO GMBH
- Tim Heek
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-Ray Fluorescence Spectrometer and Power Supply Apparatus
- Publication number 20250172515
- Publication date May 29, 2025
- Shimadzu Corporation
- Yohei UKAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250172510
- Publication date May 29, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...
- Publication number 20250164651
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Eiji OYAIZU
- G01 - MEASURING TESTING
Information Patent Application
RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...
- Publication number 20250146956
- Publication date May 8, 2025
- Kabushiki Kaisha Toshiba
- Ryoutaro MASUDA
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIALS FOR X-RAY DEVICE
- Publication number 20250146959
- Publication date May 8, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MATERIAL
- Publication number 20250146957
- Publication date May 8, 2025
- Smiths Detection France S.A.S.
- Serge MAITREJEAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
Nanophotonic Scintillators for High-Energy Particles Detection, Ima...
- Publication number 20250137942
- Publication date May 1, 2025
- Massachusetts Institute of Technology
- Marin Soljacic
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF
- Publication number 20250137948
- Publication date May 1, 2025
- Hyundai Motor Company
- Jun Young Shin
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250123222
- Publication date Apr 17, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS
- Publication number 20250102451
- Publication date Mar 27, 2025
- FEI Company
- Vojtech MAHEL
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY
- Publication number 20250067687
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter Watson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW
- Publication number 20250052698
- Publication date Feb 13, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SHIELDING DEVICE
- Publication number 20250037891
- Publication date Jan 30, 2025
- Simon Edward Kozin
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...
- Publication number 20240418659
- Publication date Dec 19, 2024
- Politecnico Di Milano
- Carlo Ettore FIORINI
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detector unit with three-side buttable read-out integrate...

Flexible digital detector array

X-ray fluorescence spectroscopy analysis

Method for detection of soil heavy metal pollution using unmanned a...

Lithium detection techniques using neutrons and/or alpha particles

Charged particle beam device

Quality control evaluation method of cyanate ester matrix resin mat...

Methods and systems for defects detection and classification using...

Backscatter imaging device, control method and inspection system

Method and system for stress testing of materials using laser accel...

Downhole lithium detection systems and methods

Jet blades optical inspection

Method and system for sensor configuration

X-ray inspection apparatus

Imaging systems and methods of operating the same

Methods for growing crystals on QCM sensors

Method and system for inspecting a structure across a cover layer c...

Spent or decommissioned accumulator treatment plant and process

Secondary image removal using high resolution x-ray transmission so...

Method and apparatus of stationary-source nonplanar-trajectory narr...

X-ray system

Charged particle beam apparatus

System, method, and apparatus for x-ray backscatter inspection of p...

Low-temperature perovskite scintillators and devices with low-tempe...

Radiation detector and method for manufacturing radiation detector

Charged particle detection for spectroscopic techniques

Serial arrangement having multiple plies of asymmetric filter media...

Systems and methods for determining the mineralogy of drill solids

Method and apparatus for monitoring beam profile and power

Device and method for measuring short-wavelength characteristic X-r...

Patents Applicationslast 30 patents

COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

X-Ray System for Generating Multi-Spectrum Image Data

Handheld X-ray fluorescence, XRF, analyzer and a method for element...

X-Ray Fluorescence Spectrometer and Power Supply Apparatus

X-RAY INSPECTION APPARATUS

X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVI...

RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...

FIDUCIALS FOR X-RAY DEVICE

DETERMINATION OF MATERIAL

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

X-RAY INSPECTION APPARATUS

Nanophotonic Scintillators for High-Energy Particles Detection, Ima...

APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF

X-RAY INSPECTION APPARATUS

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

SECONDARY ELECTRON DETECTOR FOR ION BEAM SYSTEMS

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

METHOD AND SYSTEM FOR CALIBRATING DETECTORS IN A DETECTOR ARRAY

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

X-RAY DEVICE WITH FOLDED FIELD-OF-VIEW

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

X-RAY SHIELDING DEVICE

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...

AN X-RAY SYSTEM