Devices for sensing when probes are in contact, or in position to contact, with measured object

Industry

CPC
G01R1/06794

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06794Devices for sensing when probes are in contact, or in position to contact, with measured object

Industries

Patents Grantslast 30 patents

Information Patent Grant
Methods of establishing contact between a probe tip of a probe syst...
- Patent number 12,203,959
- Issue date Jan 21, 2025
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Grant
Method for accurate pad contact testing
- Patent number 12,188,961
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure for micro device inspection
- Patent number 12,188,978
- Issue date Jan 7, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus, analysis method, and recording medium having re...
- Patent number 12,146,896
- Issue date Nov 19, 2024
- Advantest Corporation
- Yuji Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Proximity detection for assessing sensing probe attachment state
- Patent number 12,135,337
- Issue date Nov 5, 2024
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Grant
Safety system for needle probe card for high-voltage and high-curre...
- Patent number 12,092,659
- Issue date Sep 17, 2024
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco Marcinno′
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probe card device and elastic probe thereof
- Patent number 12,092,661
- Issue date Sep 17, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing semiconductor device
- Patent number 12,066,460
- Issue date Aug 20, 2024
- Yangtze Memory Technologies Co., Ltd.
- Benfei Ye
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive test fixture for screening electrical continuity
- Patent number 12,050,253
- Issue date Jul 30, 2024
- Galvani Bioelectronics Limited
- Ellen Kaplan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for forming probe head structure
- Patent number 12,019,097
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wen-Yi Lin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
- Patent number 11,965,911
- Issue date Apr 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Probes that define retroreflectors, probe systems that include the...
- Patent number 11,927,603
- Issue date Mar 12, 2024
- FormFactor, Inc.
- Quan Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with contact check circuitry
- Patent number 11,892,521
- Issue date Feb 6, 2024
- ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC.
- Tse-Hua Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe, measuring system and method for applying a probe
- Patent number 11,789,038
- Issue date Oct 17, 2023
- Rohde & Schwarz GmbH & Co. KG
- Johannes Steffens
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electronic apparatus and inspection method
- Patent number 11,751,326
- Issue date Sep 5, 2023
- Sharp Kabushiki Kaisha
- Mitsuaki Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device and inspection method
- Patent number 11,709,182
- Issue date Jul 25, 2023
- Kabushiki Kaisha Nihon Micronics
- Shota Hetsugi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing an electrical property of a test sample
- Patent number 11,693,028
- Issue date Jul 4, 2023
- KLA Corporation
- Frederik Westergaard Østerberg
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for operating a measurement system
- Patent number 11,674,978
- Issue date Jun 13, 2023
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting forcer misalignment in a wafer pr...
- Patent number 11,662,365
- Issue date May 30, 2023
- Microchip Technology Incorporated
- Sherwin Penaflor
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems configured to test a device under test and methods of...
- Patent number 11,598,789
- Issue date Mar 7, 2023
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 11,543,432
- Issue date Jan 3, 2023
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Probe adapter for a blade outer air seal and method for using same
- Patent number 11,513,034
- Issue date Nov 29, 2022
- Raytheon Technologies Corporation
- Bryan J. Hackett
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Inspection system
- Patent number 11,499,992
- Issue date Nov 15, 2022
- Tokyo Electron Limited
- Shinjiro Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer probe integration with load pull tuner
- Patent number 11,480,589
- Issue date Oct 25, 2022
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Board including multiple conductive pads corresponding to one conta...
- Patent number 11,464,107
- Issue date Oct 4, 2022
- Samsung Electronics Co., Ltd.
- Chihwei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Positionable probe card and manufacturing method thereof
- Patent number 11,402,407
- Issue date Aug 2, 2022
- MPI CORPORATION
- Zhi-Wei Su
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method of controlling testing apparatus
- Patent number 11,391,758
- Issue date Jul 19, 2022
- Tokyo Electron Limited
- Tomoya Endo
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and temperature measuring method for inspection s...
- Patent number 11,378,610
- Issue date Jul 5, 2022
- Tokyo Electron Limited
- Jun Mochizuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slip-plane MEMs probe for high-density and fine pitch interconnects
- Patent number 11,372,023
- Issue date Jun 28, 2022
- Intel Corporation
- Joe Walczyk
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20240319229
- Publication date Sep 26, 2024
- Samsung Electronics Co., LTD
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION
- Publication number 20240310413
- Publication date Sep 19, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURE
- Publication number 20240302410
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
Probe Device
- Publication number 20240288472
- Publication date Aug 29, 2024
- Hitachi High-Tech Corporation
- Naoki SAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD
- Publication number 20240280610
- Publication date Aug 22, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Tatsunori SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE
- Publication number 20240241169
- Publication date Jul 18, 2024
- Mitsubishi Electric Corporation
- Tomohito TANIUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF ESTABLISHING CONTACT BETWEEN A PROBE TIP OF A PROBE SYST...
- Publication number 20240168058
- Publication date May 23, 2024
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
- Publication number 20240142495
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Kosuke FUJII
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240142522
- Publication date May 2, 2024
- Innolux Corporation
- Chih-Yung Hsieh
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACCURATE PAD CONTACT TESTING
- Publication number 20240036074
- Publication date Feb 1, 2024
- International Business Machines Corporation
- KUSHAGRA SINHA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING CONTACT OR CONNECTION STATE, AND INFORMATION...
- Publication number 20240012026
- Publication date Jan 11, 2024
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Ryo Sakamaki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20230375595
- Publication date Nov 23, 2023
- Yangtze Memory Technologies Co., Ltd.
- Benfei YE
- G01 - MEASURING TESTING
Information Patent Application
COUPLING PROBE FOR MICRO DEVICE INSPECTION
- Publication number 20230152349
- Publication date May 18, 2023
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
PROBES THAT DEFINE RETROREFLECTORS, PROBE SYSTEMS THAT INCLUDE THE...
- Publication number 20230117566
- Publication date Apr 20, 2023
- FormFactor, Inc.
- Quan Yuan
- G01 - MEASURING TESTING
Information Patent Application
SAFETY SYSTEM FOR NEEDLE PROBE CARD FOR HIGH-VOLTAGE AND HIGH-CURRE...
- Publication number 20230071495
- Publication date Mar 9, 2023
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco MARCINNO'
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230065443
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE WITH CONTACT CHECK CIRCUITRY
- Publication number 20230057897
- Publication date Feb 23, 2023
- Elite Semiconductor Microelectronics Technology Inc.
- TSE-HUA YAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...
- Publication number 20230003764
- Publication date Jan 5, 2023
- KABUSHIKI KAISHA NIHON MICRONICS
- SATOSHI NARITA
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS CONFIGURED TO TEST A DEVICE UNDER TEST AND METHODS OF...
- Publication number 20220236303
- Publication date Jul 28, 2022
- FormFactor, Inc.
- Martin Schindler
- G01 - MEASURING TESTING
Information Patent Application
PROBE, MEASURING SYSTEM AND METHOD FOR APPLYING A PROBE
- Publication number 20220214378
- Publication date Jul 7, 2022
- Rohde& Schwarz GmbH & Co. KG
- Johannes Steffens
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-DESTRUCTIVE TEST FIXTURE FOR SCREENING ELECTRICAL CONTINUITY
- Publication number 20220206083
- Publication date Jun 30, 2022
- Galvani Bioelectronics Limited
- Ellen KAPLAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD FOR ELECTRONIC DEVICE
- Publication number 20220196705
- Publication date Jun 23, 2022
- Sumitomo Electric Industries, Ltd.
- Mitsuharu HIRANO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FORCER MISALIGNMENT IN A WAFER PR...
- Publication number 20220082589
- Publication date Mar 17, 2022
- MICROCHIP TECHNOLOGY INCORPORATED
- Sherwin Peñaflor
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE FOR MICRO DEVICE INSPECTION
- Publication number 20220003815
- Publication date Jan 6, 2022
- VueReal Inc.
- Gholamreza CHAJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS AND INSPECTION METHOD
- Publication number 20210368617
- Publication date Nov 25, 2021
- Sharp Kabushiki Kaisha
- MITSUAKI MORIMOTO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR OPERATING A MEASUREMENT SYSTEM
- Publication number 20210341517
- Publication date Nov 4, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Bernhard STERZBACH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROXIMITY DETECTION FOR ASSESSING SENSING PROBE ATTACHMENT STATE
- Publication number 20210333308
- Publication date Oct 28, 2021
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING DEVICE AND INSPECTION METHOD
- Publication number 20210318354
- Publication date Oct 14, 2021
- Kabushiki Kaisha Nihon Micronics
- Shota HETSUGI
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD OF CONTROLLING TESTING APPARATUS
- Publication number 20210311094
- Publication date Oct 7, 2021
- TOKYO ELECTRON LIMITED
- Tomoya ENDO
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND PROBE CARD HAVING SAME
- Publication number 20210302471
- Publication date Sep 30, 2021
- Point Engineering Co., Ltd.
- Bum Mo Ahn
- G01 - MEASURING TESTING

Devices for sensing when probes are in contact, or in position to contact, with measured object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods of establishing contact between a probe tip of a probe syst...

Method for accurate pad contact testing

Probe structure for micro device inspection

Analysis apparatus, analysis method, and recording medium having re...

Proximity detection for assessing sensing probe attachment state

Safety system for needle probe card for high-voltage and high-curre...

Cantilever probe card device and elastic probe thereof

Method and apparatus for testing semiconductor device

Non-destructive test fixture for screening electrical continuity

Method for forming probe head structure

Inspection apparatus having a contactor for inspecting electrical c...

Probes that define retroreflectors, probe systems that include the...

Semiconductor device with contact check circuitry

Probe, measuring system and method for applying a probe

Electronic apparatus and inspection method

Electrical connecting device and inspection method

Probe for testing an electrical property of a test sample

Measurement system and method for operating a measurement system

Systems and methods for detecting forcer misalignment in a wafer pr...

Probe systems configured to test a device under test and methods of...

Probe head and probe card having same

Probe adapter for a blade outer air seal and method for using same

Inspection system

Wafer probe integration with load pull tuner

Board including multiple conductive pads corresponding to one conta...

Automatic probe ground connection checking techniques

Positionable probe card and manufacturing method thereof

Testing apparatus and method of controlling testing apparatus

Inspection system and temperature measuring method for inspection s...

Slip-plane MEMs probe for high-density and fine pitch interconnects

Patents Applicationslast 30 patents

WAFER TESTING APPARATUS AND CONTROL METHOD THEREOF

CURRENT SHUNT USING WIRE BUNDLE CONSTRUCTION

PROBE HEAD STRUCTURE

Probe Device

PROBE CARD

INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

METHODS OF ESTABLISHING CONTACT BETWEEN A PROBE TIP OF A PROBE SYST...

TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...

ELECTRONIC DEVICE

METHOD FOR ACCURATE PAD CONTACT TESTING

METHOD FOR DETERMINING CONTACT OR CONNECTION STATE, AND INFORMATION...

METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICE

COUPLING PROBE FOR MICRO DEVICE INSPECTION

PROBES THAT DEFINE RETROREFLECTORS, PROBE SYSTEMS THAT INCLUDE THE...

SAFETY SYSTEM FOR NEEDLE PROBE CARD FOR HIGH-VOLTAGE AND HIGH-CURRE...

PROBE HEAD STRUCTURE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR DEVICE WITH CONTACT CHECK CIRCUITRY

INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...

PROBE SYSTEMS CONFIGURED TO TEST A DEVICE UNDER TEST AND METHODS OF...

PROBE, MEASURING SYSTEM AND METHOD FOR APPLYING A PROBE

NON-DESTRUCTIVE TEST FIXTURE FOR SCREENING ELECTRICAL CONTINUITY

INSPECTION APPARATUS AND INSPECTION METHOD FOR ELECTRONIC DEVICE

SYSTEMS AND METHODS FOR DETECTING FORCER MISALIGNMENT IN A WAFER PR...

PROBE STRUCTURE FOR MICRO DEVICE INSPECTION

ELECTRONIC APPARATUS AND INSPECTION METHOD

MEASUREMENT SYSTEM AND METHOD FOR OPERATING A MEASUREMENT SYSTEM

PROXIMITY DETECTION FOR ASSESSING SENSING PROBE ATTACHMENT STATE

ELECTRICAL CONNECTING DEVICE AND INSPECTION METHOD

TESTING APPARATUS AND METHOD OF CONTROLLING TESTING APPARATUS

PROBE HEAD AND PROBE CARD HAVING SAME