Devices with refractive scan

Industry

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G01J3/4537

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/4537Devices with refractive scan

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Patents Grantslast 30 patents

Information Patent Grant
Refractive scanning interferometer
- Patent number 11,668,603
- Issue date Jun 6, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-transform hyperspectral imaging system
- Patent number 11,346,719
- Issue date May 31, 2022
- Politecnico di Milano
- Cristian Angelo Manzoni
- G01 - MEASURING TESTING
Information Patent Grant
Standoff trace chemical detection with active infrared spectroscopy
- Patent number 11,041,754
- Issue date Jun 22, 2021
- Leidos, Inc.
- Augie Ifarraguerri
- G02 - OPTICS
Information Patent Grant
Liquid crystal fourier transform imaging spectrometer
- Patent number 10,760,967
- Issue date Sep 1, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transforming uniformly or non-uniformly sa...
- Patent number 10,663,346
- Issue date May 26, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Grant
Standoff trace chemical detection with active infrared spectroscopy
- Patent number 10,648,863
- Issue date May 12, 2020
- Leidos, Inc.
- Augie Ifarraguerri
- G02 - OPTICS
Information Patent Grant
Sagnac fourier spectrometer (SAFOS)
- Patent number 10,571,442
- Issue date Feb 25, 2020
- Matthias Lenzner
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer
- Patent number 10,156,432
- Issue date Dec 18, 2018
- Adam Alexander Schmieder
- G02 - OPTICS
Information Patent Grant
System and method for efficient detection of the phase and amplitud...
- Patent number 9,784,681
- Issue date Oct 10, 2017
- The General Hospital Corporation
- Johannes F. de Boer
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imaging
- Patent number 9,671,287
- Issue date Jun 6, 2017
- Lambda-X
- Didier Beghuin
- G01 - MEASURING TESTING
Information Patent Grant
Optical module and production method for same
- Patent number 9,557,555
- Issue date Jan 31, 2017
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G02 - OPTICS
Information Patent Grant
Fourier-transform interferometer with self-apodization compensation
- Patent number 9,239,225
- Issue date Jan 19, 2016
- AIRBUS DEFENCE AND SPACE SAS
- Frédéric Pasternak
- G01 - MEASURING TESTING
Information Patent Grant
Fourier-domain optical coherence tomography imager
- Patent number 7,480,058
- Issue date Jan 20, 2009
- Optovue, Inc.
- Yonghua Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Imaging spectrometer including a plurality of polarizing beam split...
- Patent number 7,440,108
- Issue date Oct 21, 2008
- Qinetiq Limited
- John Edward Perrigo Beale
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and method for Fourier transform spectroscopy
- Patent number 6,519,040
- Issue date Feb 11, 2003
- William Bradshaw Amos
- G01 - MEASURING TESTING
Information Patent Grant
Ultra fast fourier transform spectrometer with rotating scanning cube
- Patent number 5,883,713
- Issue date Mar 16, 1999
- Boeing North American, Inc.
- John E. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for refining chocolate mass
- Patent number 5,814,362
- Issue date Sep 29, 1998
- Richard Frisse GmbH
- Kurt Muntener
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Grant
Reduced complexity fourier transform spectrometer
- Patent number 5,774,215
- Issue date Jun 30, 1998
- Siemens plc
- Miles John Padgett
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer employing a Mach Zehnder interferometer created by etc...
- Patent number 5,644,125
- Issue date Jul 1, 1997
- Research Foundation of State University NY
- Darold Wobschall
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional refractively scanning interferometer having remov...
- Patent number 5,313,269
- Issue date May 17, 1994
- Research Cottrell Technologies, Inc.
- Fred H. Ponce
- G01 - MEASURING TESTING
Information Patent Grant
Obtaining a spectrogram from a single scanning of interference fringes
- Patent number 5,253,183
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Masaru Inoue
- G01 - MEASURING TESTING
Information Patent Grant
5227858
- Patent number 5,227,858
- Issue date Jul 13, 1993
- G01 - MEASURING TESTING
Information Patent Grant
Refractively scanned interferometer
- Patent number 5,173,744
- Issue date Dec 22, 1992
- Jens R. Dybwad
- G01 - MEASURING TESTING
Information Patent Grant
Polarization interferometer spectrometer
- Patent number 5,157,458
- Issue date Oct 20, 1992
- Buhler AG
- Heinz Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Laser referencing system for refractively scanning interferometer
- Patent number 5,155,551
- Issue date Oct 13, 1992
- Research Cottrell Technologies, Inc.
- D. Warren Vidrine
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic apparatus for extremely faint light
- Patent number 4,983,041
- Issue date Jan 8, 1991
- Fumio Inaba
- G01 - MEASURING TESTING
Information Patent Grant
Polarization interferometer
- Patent number 4,732,481
- Issue date Mar 22, 1988
- Hitachi, Ltd.
- Shigeru Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Refractively scanned interferometer
- Patent number 4,654,530
- Issue date Mar 31, 1987
- Jens P. Dybwad
- G01 - MEASURING TESTING
Information Patent Grant
Double beam interferometer using refractive scanning method
- Patent number 4,585,345
- Issue date Apr 29, 1986
- Hitachi, Ltd.
- Masaru Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Refractively scanned interferometer
- Patent number 4,286,877
- Issue date Sep 1, 1981
- Laser Precision Corporation
- William L. Clarke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE
- Publication number 20240044709
- Publication date Feb 8, 2024
- NANCHANG HANGKONG UNIVERSITY
- Jiulin SHI
- G01 - MEASURING TESTING
Information Patent Application
REFRACTIVE SCANNING INTERFEROMETER
- Publication number 20230375409
- Publication date Nov 23, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Application
REFRACTIVE SCANNING INTERFEROMETER
- Publication number 20210293624
- Publication date Sep 23, 2021
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Application
FOURIER-TRANSFORM HYPERSPECTRAL IMAGING SYSTEM
- Publication number 20210181022
- Publication date Jun 17, 2021
- Politecnico Di Milano
- Cristian Angelo MANZONI
- G01 - MEASURING TESTING
Information Patent Application
LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER
- Publication number 20200378831
- Publication date Dec 3, 2020
- Palo Alto Research Center Incorporated
- Alex Hegyi
- G01 - MEASURING TESTING
Information Patent Application
Standoff Trace Chemical Detection With Active Infrared Spectroscopy
- Publication number 20200249088
- Publication date Aug 6, 2020
- Leidos, Inc.
- Augie Ifarraguerri
- G01 - MEASURING TESTING
Information Patent Application
Standoff Trace Chemical Detection With Active Infrared Spectroscopy
- Publication number 20190353524
- Publication date Nov 21, 2019
- Leidos, Inc.
- Augie Ifarraguerri
- G01 - MEASURING TESTING
Information Patent Application
ROTARY FOURIER TRANSFORM INTERFEROMETER SPECTROMETER INCLUDING A MU...
- Publication number 20170160072
- Publication date Jun 8, 2017
- Finite Element Analyst, Inc.
- Eyad Ammari
- G01 - MEASURING TESTING
Information Patent Application
FOURIER-TRANSFORM INTERFEROMETER WITH SELF-APODIZATION COMPENSATION
- Publication number 20140368824
- Publication date Dec 18, 2014
- Frédéric Pasternak
- G01 - MEASURING TESTING
Information Patent Application
FOURIER-TRANSFORM SPECTROMETER AND METHOD
- Publication number 20140185052
- Publication date Jul 3, 2014
- Qiushui Chen
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND PRODUCTION METHOD FOR SAME
- Publication number 20140139924
- Publication date May 22, 2014
- Hamamatsu Photonics K.K.
- Yoshihisa Warashina
- G02 - OPTICS
Information Patent Application
Fourier-transform spectrometers
- Publication number 20080068612
- Publication date Mar 20, 2008
- Christopher J. Manning
- G01 - MEASURING TESTING
Information Patent Application
Fourier-domain optical coherence tomography imager
- Publication number 20070188765
- Publication date Aug 16, 2007
- Yonghua Zhao
- G01 - MEASURING TESTING
Information Patent Application
Imaging apparatus
- Publication number 20050237532
- Publication date Oct 27, 2005
- QinetiQ Limited.
- John Edward Perrigo Beale
- G01 - MEASURING TESTING

Devices with refractive scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Refractive scanning interferometer

Fourier-transform hyperspectral imaging system

Standoff trace chemical detection with active infrared spectroscopy

Liquid crystal fourier transform imaging spectrometer

Method and apparatus for transforming uniformly or non-uniformly sa...

Standoff trace chemical detection with active infrared spectroscopy

Sagnac fourier spectrometer (SAFOS)

Interferometer

System and method for efficient detection of the phase and amplitud...

Hyperspectral imaging

Optical module and production method for same

Fourier-transform interferometer with self-apodization compensation

Fourier-domain optical coherence tomography imager

Imaging spectrometer including a plurality of polarizing beam split...

Imaging system and method for Fourier transform spectroscopy

Ultra fast fourier transform spectrometer with rotating scanning cube

Method and apparatus for refining chocolate mass

Reduced complexity fourier transform spectrometer

Spectrometer employing a Mach Zehnder interferometer created by etc...

Three-dimensional refractively scanning interferometer having remov...

Obtaining a spectrogram from a single scanning of interference fringes

5227858

Refractively scanned interferometer

Polarization interferometer spectrometer

Laser referencing system for refractively scanning interferometer

Spectroscopic apparatus for extremely faint light

Polarization interferometer

Refractively scanned interferometer

Double beam interferometer using refractive scanning method

Refractively scanned interferometer

Patents Applicationslast 30 patents

LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE

REFRACTIVE SCANNING INTERFEROMETER

REFRACTIVE SCANNING INTERFEROMETER

FOURIER-TRANSFORM HYPERSPECTRAL IMAGING SYSTEM

LIQUID CRYSTAL FOURIER TRANSFORM IMAGING SPECTROMETER

Standoff Trace Chemical Detection With Active Infrared Spectroscopy

Standoff Trace Chemical Detection With Active Infrared Spectroscopy

ROTARY FOURIER TRANSFORM INTERFEROMETER SPECTROMETER INCLUDING A MU...

FOURIER-TRANSFORM INTERFEROMETER WITH SELF-APODIZATION COMPENSATION

FOURIER-TRANSFORM SPECTROMETER AND METHOD

OPTICAL MODULE AND PRODUCTION METHOD FOR SAME

Fourier-transform spectrometers

Fourier-domain optical coherence tomography imager

Imaging apparatus