different radiations

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CPC
G01N2223/1006

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/1006different radiations

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
X-ray photoemission system for 3-D laminography
- Patent number 11,619,596
- Issue date Apr 4, 2023
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Dual mode detection method, controller and system
- Patent number 11,474,051
- Issue date Oct 18, 2022
- Yigang Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining physical properties of a sample
- Patent number 11,415,530
- Issue date Aug 16, 2022
- DETECTION TECHNOLOGY SAS
- Elena Gaborieau Borissenko
- G01 - MEASURING TESTING
Information Patent Grant
X-ray photoemission apparatus for inspection of integrated devices
- Patent number 11,307,152
- Issue date Apr 19, 2022
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Simultaneous/single patient position X-ray and proton imaging appar...
- Patent number 10,638,988
- Issue date May 5, 2020
- Scott Penfold
- G01 - MEASURING TESTING
Information Patent Grant
Security inspection apparatus and method
- Patent number 10,571,598
- Issue date Feb 25, 2020
- Nuctech Company Limited
- Jianhong Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating image data relating to an object and particle...
- Patent number 9,857,318
- Issue date Jan 2, 2018
- Carl Zeiss Microscopy GmbH
- Fabian Pérez-Willard
- G02 - OPTICS
Information Patent Grant
Coordinate measuring apparatus and method for measuring an object
- Patent number 9,625,257
- Issue date Apr 18, 2017
- Werth Messtechnik GmbH
- Ralf Christoph
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for evaluating energy loss, chipping resistance and abrasion...
- Patent number 9,291,581
- Issue date Mar 22, 2016
- SUMITOMO RUBBER INDUSTRIES, LTD.
- Ryo Mashita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray photoemission microscope for integrated devices
- Patent number 9,291,578
- Issue date Mar 22, 2016
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring apparatus and method for measuring an object
- Patent number 8,804,905
- Issue date Aug 12, 2014
- Werth Messtechnik GmbH
- Ralf Christoph
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Combining X-ray and VUV analysis of thin film layers
- Patent number 8,565,379
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Single-point measurement of high-Z additives in sheets
- Patent number 7,399,971
- Issue date Jul 15, 2008
- Honeywell International Inc.
- Gertjan J. Hofman
- G01 - MEASURING TESTING
Information Patent Grant
Hidden explosives detector employing pulsed neutron and x-ray inter...
- Patent number 5,200,626
- Issue date Apr 6, 1993
- Martin Marietta Energy Systems, Inc.
- Frederick J. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer
- Patent number 4,280,049
- Issue date Jul 21, 1981
- U.S. Philips Corporation
- Helmut W. W. Werner
- G01 - MEASURING TESTING
Information Patent Grant
3417240
- Patent number 3,417,240
- Issue date Dec 17, 1968
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
Quantum-limited Extreme Ultraviolet Coherent Diffraction Imaging
- Publication number 20220100094
- Publication date Mar 31, 2022
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Application
DUAL MODE DETECTION METHOD, CONTROLLER AND SYSTEM
- Publication number 20210333224
- Publication date Oct 28, 2021
- Nuctech Company Limited
- Yigang YANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING PHYSICAL PROPERTIES OF A SAMPLE
- Publication number 20200096456
- Publication date Mar 26, 2020
- DETECTION TECHNOLOGY SAS
- Elena GABORIEAU BORISSENKO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES
- Publication number 20200090826
- Publication date Mar 19, 2020
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SECURITY INSPECTION APPARATUS AND METHOD
- Publication number 20180180761
- Publication date Jun 28, 2018
- Nuctech Company Limited
- Jianhong ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS / SINGLE PATIENT POSITION X-RAY AND PROTON IMAGING APP...
- Publication number 20170128029
- Publication date May 11, 2017
- Scott Penfold
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR GENERATING IMAGE DATA RELATING TO AN OBJECT AND PARTICLE...
- Publication number 20160274040
- Publication date Sep 22, 2016
- CARL ZEISS MICROSCOPY GMBH
- Fabian PÉREZ-WILLARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING ENERGY LOSS, CHIPPING RESISTANCE AND ABRASION...
- Publication number 20140140483
- Publication date May 22, 2014
- Sumitomo Rubber Industries, Ltd.
- Ryo MASHITA
- G01 - MEASURING TESTING
Information Patent Application
X-ray photoemission microscope for integrated devices
- Publication number 20140037052
- Publication date Feb 6, 2014
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Application
Combining X-ray and VUV Analysis of Thin Film Layers
- Publication number 20120275568
- Publication date Nov 1, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Coordinate Measuring Apparatus And Method For Measuring An Object
- Publication number 20080075227
- Publication date Mar 27, 2008
- Ralf Christoph
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Single-point measurement of high-Z additives in sheets
- Publication number 20070145286
- Publication date Jun 28, 2007
- Honeywell International, Inc.
- Gertjan J. Hofman
- G01 - MEASURING TESTING

different radiations

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantum-limited extreme ultraviolet coherent diffraction imaging

X-ray photoemission system for 3-D laminography

Dual mode detection method, controller and system

Method for determining physical properties of a sample

X-ray photoemission apparatus for inspection of integrated devices

Simultaneous/single patient position X-ray and proton imaging appar...

Security inspection apparatus and method

Method for generating image data relating to an object and particle...

Coordinate measuring apparatus and method for measuring an object

Method for evaluating energy loss, chipping resistance and abrasion...

X-ray photoemission microscope for integrated devices

Coordinate measuring apparatus and method for measuring an object

Combining X-ray and VUV analysis of thin film layers

Single-point measurement of high-Z additives in sheets

Hidden explosives detector employing pulsed neutron and x-ray inter...

X-ray spectrometer

3417240

Patents Applicationslast 30 patents

INSPECTION SYSTEM AND METHOD

Quantum-limited Extreme Ultraviolet Coherent Diffraction Imaging

DUAL MODE DETECTION METHOD, CONTROLLER AND SYSTEM

METHOD FOR DETERMINING PHYSICAL PROPERTIES OF A SAMPLE

X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES

SECURITY INSPECTION APPARATUS AND METHOD

SIMULTANEOUS / SINGLE PATIENT POSITION X-RAY AND PROTON IMAGING APP...

METHOD FOR GENERATING IMAGE DATA RELATING TO AN OBJECT AND PARTICLE...

METHOD FOR EVALUATING ENERGY LOSS, CHIPPING RESISTANCE AND ABRASION...

X-ray photoemission microscope for integrated devices

Combining X-ray and VUV Analysis of Thin Film Layers

Coordinate Measuring Apparatus And Method For Measuring An Object

Single-point measurement of high-Z additives in sheets