Coordinate Measuring Apparatus And Method For Measuring An Object

Abstract
The invention relates to a coordinate measuring apparatus (110) for measuring an object (3), comprising an x-ray sensory mechanism as a first sensory mechanism that is provided with an x-ray source (10) and at least one x-ray sensor (7) which detects the x-rays, and a second sensory mechanism such as a tactile and/or an optical sensory mechanism (8, 11; 9) that can be placed in the x, y, and/or z direction of the coordinate measuring apparatus in relation to the object. In order to be able to easily measure also large-size test objects, the x-ray sensory mechanism (7, 10) can be positioned in the coordinate measuring apparatus (10) according to the second sensory mechanism (8, 11; 9).
Description

Additional details, advantages and features of the invention can be found not only in the claims and the features detailed therein, individually and/or in combination, but also from the following description of the preferred embodiment illustrated in the drawings.


Shown are:



FIG. 1 a schematic diagram of a multi-sensor coordinate measuring device



FIG. 2 a functional diagram of a 3D-computer tomograph



FIG. 3 an additional schematic diagram of a coordinate measuring device



FIG. 4 a schematic diagram of a first arrangement of x-ray source and assigned sensors



FIG. 5 a schematic diagram of a second arrangement of x-ray source and assigned sensors



FIG. 6 a schematic diagram for image evaluation



FIG. 7 a schematic diagram for illustrating a process for increasing the resolution of a tomogram



FIG. 8 a schematic diagram of a calibration body



FIG. 9 a schematic diagram of a rotating table with a calibration body



FIG. 10 a block diagram and



FIG. 11 a conceptual diagram to illustrate a correction process.






FIG. 1 is a schematic diagram of a coordinate measuring device for the combined use of an x-ray sensor system and an optical and tactile sensor system, even if the invention is essentially suited for features of a coordinate measuring device that comprises no additional sensor system beyond the computer-tomograph.


Arranged on an axis 18 running parallel to the X-axis is a rotating table 2. Present thereon is an object of measurement 3, which can thus be rotated on a rotation axis 18 and displaced by the axis 18 in the direction X (double arrow). Arranged on a slide 4 running parallel to the Y-axis are two axes 5, 6 running parallel to the Z-axis. Located on the mechanical axis 5 is a sensor 7 for x-rays and an image-processing sensor 8. Additionally located on the mechanical axis 6 is a tactile sensor 9. Arranged opposite the x-ray sensor 7 is an x-ray source 10, which can be mounted either movably in the direction of Y or fixedly as desired. Opposite the image-processing sensor system 8 is a transmitted light source 11. The mechanical axes and slide, which run along the X-, Y- and Z- axes of the coordinate measuring device, are designed so that sensors installed in or on the coordinate measuring device can each cover the entire measurement range on the rotating table 2.


The integration of computed-tomography (CT) into a multi-sensor coordinate measuring device creates entirely new possibilities. A quick, nondestructive complete measurement with tomography is combined with high-precision measurements of functional dimensions with tactile or optical sensor system. The invention provides that the x-ray sensor system (sensor, radiation source) corresponding to the second sensor system (e.g. image-processing sensor, transmitted light beam source or incident light beam source or tactile sensor, if necessary with attached image-processing sensor) can be positioned in the coordinate measuring device so that the x-ray sensor system is arranged equally with the second sensor system. The x-ray sensor system can be arranged with at least the tactile sensor system and/or the optical sensor system on a common mechanical axis or on a separate mechanic axis that functions analogously to the mechanical axes for the tactile and/or optical sensor system.


The functional principle of 3D-computed tomography is illustrated using FIG. 2. The reference numbers for the elements shown in FIG. 1 are retained.


The workpiece 3 is disposed on a rotating table 2 and transilluminated with x-rays. The sensor 7, shown here for example in the form of a surface detector, converts the x-ray image into a digital 2D-image for further processing. The object 3 is turned 360° and x-ray images are taken in multiple rotational positions. The 2D-images are then used for a 3D-reconstruction of measurement points that describes the entire workpiece geometry to be measured. Through the integration of one or more of the additional sensors 8, 9 the range of applications of the computer-tomograph can be expanded. The image-processing sensor 8 allows the fully automatic measurement of complicated, extremely low-contrast workpieces in transmitted light and incident light. Tactile sensing systems facilitate high-precision measurements of optically inaccessible features.


It is also possible to adjust the sensor 7 and the x-ray source 10 synchronously to the object, that is, with their distance to one another remaining the same. This allows an adaptation of measurement range, which, if necessary, can be automatic. Alternatively, the object 3 can be shifted in relation to the sensor 7 to facilitate an adaptation to the workpiece size and the precision requirements. If the object 3 is shifted toward the sensor 7, lower magnification is achieved, whereas if the object 3 is shifted toward the x-ray source 10, a greater magnification can be achieved. If a stationary x-ray source 10 is used, the sensor can also be shifted toward the object 3.


The invention offers the following particular advantages:

    • Complete detection of all fixed and free form geometries of a workpiece in a single measurement procedure,
    • Measuring interior geometries and inaccessible features (e.g. obscured edges, undercuts),
    • High precision measurement of functional dimensions with tactile or optical sensor system,
    • Recirculation of tomographic measurement results through multisensor technology,
    • Combine measuring with tomography and other sensors in a measurement cycle
    • 2D- and 3D- measurements of form, dimensions and position,
    • Comprehensive functions for 2D-measurement in x-ray images,
    • 3D-target-actual comparison as 3D- deviation display in comparison with 3D-CAD-model,
    • Generation of 3D-CAD-data from acquired CT-data.



FIG. 6 illustrates an additional method characterizing the invention that facilitates a compression of data without sacrificing resolution. In fact, the corresponding teachings even make it possible to surpass the original resolution. This is explained using a 2D-image.


In FIG. 6 the squares represent the pixels of a 2D-image. The present 2D-image is converted into a lower resolution image with less pixel information (pixels illustrated as crosses) through, for example, averaging the neighboring pixels. From corresponding 2D x-ray images of lower resolution a 3D-reconstruction for computing the three-dimensional image is then performed. After this voxel image has been defined, the voxel-image, which in the 2D-illustration shown in FIG. 6 is also simulated through crosses, is then computed back into an image of the original resolution through interpolation between multiple voxel images, so that an image with squares—also shown as a 2D-illustration—is yielded. Using the same approach, it is also possible to compute additional voxels to achieve a higher resolution of the voxel image. This is symbolized with circles.


In this way, computation can be performed faster, because a lower resolution can be used at first without requiring resolution to be sacrificed in the end. In fact, resolution can even be surpassed.


Using FIG. 7 for reference, a further inventive method is examined that allows the resolution in the tomogram to be increased. To achieve this end, multiple shots are taken, while during the intervals between shots, the sensor is shifted in relation to the object or the object is shifted in relation to the sensor by a distance that is smaller than the edge length of a sensitive element of the sensor. In FIG. 7 the resolution of the x-ray detector (sensor) employed is illustrated by pixels drawn as squares. During the process of tomography, for each rotational position, an image is taken in the position of the x-ray detector represented as a square along with an image taken in the position of the x-ray detector represented as a circle with an X, along with one in the position of the x-ray detector represented as a circle with a Y, along with one in the position of the x-ray detector represented as a circle with a Z. All images are assembled to form an image and are recognized as single entity during the tomography reconstruction process. A higher resolution is thereby achieved than is physically provided by the detector.


To determine the magnification for the tomography and/or the rotation center of the rotating table 2 in FIG. 1 in relation to the x-ray source 10 or the sensor 7, a standard can be used, which in the embodiment illustrated in FIG. 8, is labeled 50. In the schematic diagram, a bearing element 54 made of a material with low x-ray absorption extends from a stand 52. Arranged in the bearing element 54 are at least two spheres 56, 58 of a material with high x-ray absorption, such as steel. The standard 50 is then arranged on a tomograph rotating table 60, which corresponds to the rotating table 2 from FIG. 1. The rotating table 60 can be rotated on an axis 62, which overlaps the X-axis of the coordinate measuring device. The measurement procedure for determining the position of the rotation axis 62 of the tomograph within the coordinate measuring device is now determined through measuring the position of the spheres 56, 68 relative to the x-ray sensor in various rotational positions of the sphere standard 50.


If the magnification level is to be ascertained, then it is necessary to take measurements at two different distances from the sensor 7.


To facilitate a high degree of precision, the standard 50 can feature two additional spheres 64, 66.


Below it is described how the distance between the x-ray source 10 and the sensor 7 is determined by means of a standard, which in the embodiment consists of a four-sphere standard comprising four spheres arranged at the corners of a square.

    • The distances among the spheres are known (calibrated).
    • The four-sphere standard is arranged on the rotation axis.
    • The four-sphere standard is rotated so that the mounted plane is parallel to the detector.
    • Measurement of the four sphere positions in the image at position Z1
    • Calculation of the average magnification M1 from the four measured distances among the spheres,
    • the nominal distances among the spheres and the nominal pixel size of the detector
    • Driving the rotation axis in the direction of the source (or source and detector perpendicular to the rotation axis)
    • Measurement of the four sphere positions in the image at position Z2
    • Calculation of the average magnification M2 from the four measured distances among the spheres,
    • the nominal distances among the spheres and the nominal pixel size of the detector
    • Calculation of the distance between source and detector using the following equation:






AQD=dZ*M1*M2/(M2−M2)


where:

    • AQD: Distance source-detector
    • M1: Magnification at position Z1
    • M2: Magnification at position Z2
    • dZ: Distance between position Z1 and Z2
    • Calculation of the distance from source to Z1 using the following equation






D1=dZ*M2/(M1−M2)

    • Calculation of the distance from source to Z2 using the following equation






D2=D1+dZ=dZ*M1/(M1+M2)

    • Calculation of the position of the cone axis on the detector using the following equation






Pd=(Pkn1*D1−Pkn2*D2)/dZ

    • where:
    • Pd: Deviation vector of the cone axis-position from the center of the detector
    • Pkn1: Position vector of the sphere n on the detector at position Z1
    • Pkn2: Position vector of the sphere n on the detector at position Z2
    • Calculation of the average deviation vector from the four deviation vectors for each sphere position


A method for determining the Y-position of the rotation axis center, also while using a four-sphere standard comprising four spheres arranged at the corners of a square, proceeds as follows:

    • The distances among the spheres are known (calibrated).
    • The four-sphere standard is arranged on the rotation axis.
    • The four-sphere standard is rotated so that the clamped plane is parallel to the detector.
    • Measurement of the four sphere positions in the image
    • Calculation of the average magnification M1 from the four measured distances among the spheres,
    • the nominal distances among the spheres and the nominal pixel size of the detector
    • Rotating the rotation axis by 180°
    • Measurement of the four sphere positions in the image
    • Calculation of the average magnification M2 from the four measured distances among the spheres,
    • the nominal distances among the spheres and the nominal pixel size of the detector
    • Calculation of the Y position of the center of rotation from the four sphere positions prior to and following the rotation using the following equation:






Pdyn=(Pkyn1*M2+Pkyn2*M1)/(M1*M2)

    • where:
    • Pdyn: Y position of the rotation axis on the detector for sphere n
    • Pkyn1: Y position of the sphere n at rotation angle 0°
    • Pkyn2: Y position of the sphere n at rotation angle 180°
    • M1: Average magnification at rotation angle 0°
    • M2: Average magnification at rotation angle 180°


Further inventive features of the invention can be seen in FIG. 3 to 5. FIG. 3 represents a purely schematic diagram of a coordinate measuring device 110 with a housing 112, which comprises a base plate 114, a rear wall 116, side walls 118, 120 as well as a top wall 122, which can also be identified as a cover plate.


The x-axis, y-axis and z-axis of the coordinate measuring device are labeled in the drawing with the reference numbers 124, 126 and 128. On the inside 130 of the rear wall 116 of the housing 112 a guide runs in the direction X, adjustably mounted along which, hence running in the direction X 124, is a mounting 132 for a rotating table 134, on which the object 136 to be measured is arranged. In other words, the rotating table 134 is arranged on the x-axis 124.


Running along the y-axis 126 are guides, along which a housing 138 can be displaced. Projecting from the housing 138 is a mounting 140 that is displaceable along the z-axis 128.


Furthermore, projecting from the base plate 114 is an x-ray source 142, the x-rays of which penetrate the object 136 arranged on the rotating table 134. The x-rays are captured by suitable sensors such as CCD sensors that are sensitive to x-rays.


Furthermore, sensors 144 can project from the z-axis 128, specifically from the mounting 140 in the embodiment. The sensors here can be those that are conventional for coordinate measuring devices, hence, for example, tactile or optical sensors. Thus not only tomography can be performed, but tactile or optical measurements can also be made with image-processing sensors, laser distance sensors etc.


Due to the use of x-rays, it is required that the coordinate measurement device 110 be provided with sufficient shielding to prevent outward escape. In this regard the invention proposes that at least several of the weight-bearing components provide a shielding function. For example, the base plate 114 and/or the rear wall 116 can be dimensioned or designed to ensure the required shielding function.


At the same time, the corresponding walls 114, 116 thereby provide a function that is required for the measurement technology assembly, namely a guide for the x- and y-axes in the embodiment.


It is also possible to provide walls that do not feature a sufficient shielding effect with radiation absorbing layers 146 on the inside and/or the outside. In this particular case, lead sheeting is involved.


With regard to the weight-bearing walls, in particular those providing a shielding function, the use of hard stone such as granite or appropriate materials is preferred. Also conceivable for use is an artificial hard stone such as polymer concrete, which can be treated with x-ray-absorbing material such as magnetite or similar to the degree required.


According to the invention, the housing 112 of the coordinate measuring device or parts thereof perform a double function, namely that of the required shielding as well as that of serving as functional components of the measurement technology assembly. This results in a compact construction.


To allow high measurement density or to facilitate only short radiation exposure times at each measurement position without sacrificing measurement accuracy, it is provided according to FIG. 4 that multiple tomograms are taken simultaneously—thus in each measurement position of the object 136—at different irradiation angles. In FIG. 4 projecting from the base plate 114 is the rotating table 134 as is shown in FIG. 3, on which an object (not shown) to be measured is arranged, which is irradiated by x-radiation 150 emanating from a x-ray generator 148. In the embodiment, the radiation is captured by a total of three x-ray sensors 152, 154, 156, so that three tomograms for different irradiation directions in a single measurement position of the object are yielded. In each measurement position, hence each angular position of the rotating table 34, the sensors 152, 154, 156 are read out and projection images for the tomogram are acquired. The angular position of the sensors 152, 154, 156 is designed in such a way that each angle between the sensors 152, 154, 156 differs by a whole number multiple of the rotating table 136 angular step used in operating the computer tomograph, while the second and third sensor 154, 156 are arranged as rotated by one third of the angular step in relation to the first sensor 152 and the second sensor 154, respectively.


To take more tomograms of the object 136 to be measured, where the angle between the rotation axis 158 of the rotating table 154 and the x-radiation 150 is visibly changed, three sensors 160, 162164 are arranged, for example, at different angles to the main irradiation direction of the x-ray source 148 in the embodiment shown in FIG. 5, whereby the visible deviation of the x-rays source in relation to the rotation axis 158 is simulated.


The double arrow 166 drawn in FIG. 5 is intended to symbolize that the rotating table 134 can be adjusted along the rotation axis 158 parallel to the X-axis.



FIG. 9 schematically illustrates that, during the process of tomography, a calibration body, preferably in the form of spheres 300, 302, can, in principle, be tomographically imaged at the same time, thereby yielding the relative position of the rotation axis 158 of the rotating table 134 on which the object 136 to be measured is arranged. The spheres 300, 302 can be arranged in a housing 304 of low x-ray absorption, whereas the spheres 300, 302 are highly absorbent and are made of steel, for example. During the process of tomography, the position of the rotation axis 158 in relation to the coordinate measuring device or to the x-ray source 10 or to the sensor 7 can be determined without any problems before then being mathematically corrected.


According to the invention, measurement points on the object of measurement are gathered with a tactile and/or optical sensor system and used in the correction of the measurement points gathered with the x-ray sensor system. This is should become clear from FIG. 11, which illustrates the principle of a corresponding correction procedure. FIG. 11 shows an object of measurement 400 that is measured tactilely and optically at selected points. In this example, corresponding measurement points are labeled with the reference numbers 402, 404, 406. In the process of tomographic imaging, which is performed subsequently in the same coordinate measuring device, the form, as changed through typical errors of tomography, appears in the tomographic point cloud 408. This can be due to typical tomography artifacts, for example. The positions of the tomographic measurement points are corrected on the basis of the available measurement points measured more precisely with optical and/or tactile sensor system and illustrated once again in FIG. 11b. Interpolation can be performed between the tactilely and optically measured measurement points. The result obtained is then a geometrically corrected tomographically measured point cloud 410 that better corresponds to the form of the object of measurement 400 than does the original data of the tomogram. This point is illustrated through a comparison of 11b and 11c.


During the processes of performing the measurements and analyzing the measurement results, the image-processing sensor system for measuring the visible light in the transmitted light method—if necessary also in the incident light method—can be coupled to the same image processing evaluation unit or the same image processing board as the x-ray sensor system. Driven by software, it is then possible to switch between both of the sensors and digitalize and compute in the same hardware. This is conceptually illustrated in FIG. 10, in which an image-processing sensor system 500 and an x-ray sensor system 502 are connected to the same image processing board 502 so that they may function in the manner described above.

Claims
  • 1-105. (canceled)
  • 106. Coordinate measuring device (110) for measuring an object (3, 136) with an x-ray sensor system as a first sensor system comprising an x-ray source (10) and at least one x-ray sensor (7) capturing the x-rays as well as a second sensor system such as a tactile and/or optical sensor system (8,11; 9), which can be positioned relative to the object in x-, y- and/or z- direction, characterized by the fact that the x-ray sensor system (7,10) is adapted to be positioned in the coordinate measuring device (10) corresponding to the second sensor system (8,11; 9).
  • 107. A coordinate measuring device according to claim 106, wherein the x-ray sensor system (7,10) is arranged equally with the second sensor system (8,11; 9).
  • 108. A coordinate measuring device according to claim 106, wherein the x-ray sensor system (7,10) is arranged on a common mechanical axis (5,6) with at least the tactile sensor system and/or the optical sensor system (8,11).
  • 109. A coordinate measuring device according to claim 106, wherein the x-ray sensor system (7, 10) is arranged on a separate mechanical axis, which functions analogously as the mechanical axes (5, 6) do for the tactile and/or optical sensor system (8,11;9).
  • 110. A coordinate measuring device according to claim 106, wherein both the x-ray sensor system (7,10) and the second sensor system (8,11; 9) cover a common measurement volume of the object (3,136).
  • 111. A coordinate measuring device according to claim 106, wherein the coordinate measuring device (110) is equipped with at least a rotation axis (18; x-axis direction) perpendicular to the functional direction (y- and/or z-axis direction) of the x-ray sensor system (7,10) and/or the optical sensor system such as an image-processing sensor (8, 11) and/or the tactile sensor system (9).
  • 112. A coordinate measuring device according to claim 111, wherein the rotation axis (18, 158) rotates on a vertically running axis (x-axis).
  • 113. A coordinate measuring device according to claim 106, wherein the optical axis for the optical sensor (9) and/or the ray axis for the x-ray sensor (8) is horizontal and/or perpendicular to the rotation axis (18, 138; x-axis).
  • 114. A coordinate measuring device according to claim 106, wherein radiation or a light source (10, 11) for the x-ray sensor system and/or the image-processing sensor system can be moved synchronously with the assigned sensor (7, 8).
  • 115. A coordinate measuring device according to claim 106, wherein the radiation source (10) for the x-ray sensor system is fixedly arranged in the coordinate system of the coordinate measuring device (110).
  • 116. A coordinate measuring device according to claim 106, wherein both the x-ray sensor system (7, 10) and the second sensor system (8, 10; 9) can be positionally adjusted in relation to the object (3, 136) along at least one axis.
  • 117. A coordinate measuring device according to claim 106, wherein both the x-ray sensor system (7, 10) and the second sensor system (8, 10; 9) can be positionally adjusted in relation to the object (3, 136) along at least two axes.
  • 118. A coordinate measuring device according to claim 106, wherein both the x-ray sensor system (7, 10) and the second sensor system (8, 10; 9) can be positionally adjusted in relation to the workpiece (3, 136) along at least three axes.
  • 119. A coordinate measuring device according to claim 106, wherein at least one additional sensor (8) is arranged so that it can be adjusted synchronously with the x-ray sensor system (7, 10).
  • 120. A coordinate measuring device according to claim 106, wherein a measurement area adaptation is achieved preferably automatically by adjusting the distance between the x-ray sensor (7) and the radiation source (10) and/or by adjusting the x-ray sensor system (7, 10) relative to the object (3).
  • 121. A coordinate measuring device according to claim 106, wherein shielding (114, 116, 118) against x-rays, or at least a portion thereof, is designed as a functional component for the required measurement technology setup of the coordinate measuring device (110).
  • 122. A coordinate measuring device according to claim 121, wherein a base plate (114) and/or at least one side or rear wall (116, 118) of the coordinate measuring device is designed as shielding.
  • 123. A coordinate measuring device according to claim 121, wherein the components (114, 116) required for the shielding are designed to be made of stone such as granite.
  • 124. A coordinate measuring device according to claim 121, wherein the shielding or components forming this part, such as base plate (114) or rear or side walls (116, 118), are the mounting site for one or more functional components such as e.g. a mechanical axis of the coordinate measuring device (110).
  • 125. A coordinate measuring device according to claim 106, wherein the shielding (114, 116) is the mounting site or area for at least one mechanical axis or, as the case may be, a traveling axis and/or mounting and/or guide for an element such as a sensor (144) and/or a mounting or guide for a radiation or light source (142) as the functional component.
  • 126. A coordinate measuring device according to claim 106, wherein assigned to the x-ray source (142, 148) is a plurality of sensors (152, 154, 156), wherein the irradiation angles of the sensors penetrating the object deviate from one another.
  • 127. A coordinate measuring device according to claim 106, wherein for the measuring of the object, n-sensors (152, 154, 156) simultaneously struck by x-rays are assigned to the x-ray source (148), that the x-ray source can be adjusted between consecutively performed measurements relative to the object at a base angle α, and that sensors arranged one after the other each are aligned twisted or tilted relative to each other at an angle α/n.
  • 128. A coordinate measuring device according to claim 106, wherein the arrangement features a plurality of sensors (152, 154, 156, 160, 162, 164) detecting the x-rays (150), which are arranged so that for each sensor an x-ray image of the object (136) can be taken at a different irradiation angle.
  • 129. A coordinate measuring device according to claim 106, wherein tomograms of the object (136) can be obtained by employing different spectral ranges of the x-rays (150).
  • 130. A coordinate measuring device according to claim 106, wherein in the process of image taking or, as the case may be, image transmission or image evaluation, multiple pixel elements of the sensors can be combined in each case into one pixel and the original resolution in the volume image, which is computed from the images with correspondingly reduced pixel count, is achieved or surpassed through mathematical interpolation.
  • 131. A coordinate measuring device according to claim 106, wherein during measurement the object (136) can be continuously rotated and can be discontinuously exposed to x-rays.
  • 132. A coordinate measuring device according to claim 106, wherein a mechanical and/or electronic shutter is assigned to an outlet of the x-ray source (148).
  • 133. A coordinate measuring device according to claim 106, wherein the x-radiation (150) can be modulated high frequently.
  • 134. A coordinate measuring device according to claim 106, wherein several sensors (160, 162, 164) are arranged along a straight line running parallel to the rotation axis (58) of the object (36) and are arranged in relation to the projection axis of the x-ray source (48) at angles deviating from one another.
  • 135. A coordinate measuring device according to claim 106, wherein an object exhibiting low contrast relative to x-rays (150) is surrounded or encased by a material with an x-ray absorption greater than that of the object.
  • 136. A coordinate measuring device according to claim 106, wherein the arrangement features, in addition to the sensors (152, 154, 156, 160, 162, 164) capturing the x-radiation (150), further comprise sensors for measuring technical detection of the object (136), such as mechanical probe, laser probe, image-processing sensor.
  • 137. A coordinate measuring device according to claim 106, wherein some of the sensors are arranged on separate traveling or mechanical axes.
  • 138. A coordinate measuring device according to claim 106, wherein the rotation axis (18) of the object (3) is arranged on a traveling axis (1) for the purpose of expanding the measurement range along the rotation axis.
  • 139. A coordinate measuring device according to claim 106, wherein the object (136) is arranged on a rotating table rotatable around the rotating axis (158), that arranged in the rotating table or in an element immediately connected thereto, is a calibration body, preferably in the form of two calibration spheres (300, 302), which is arranged in a material that features lower x-ray absorption than the calibration body itself.
  • 140. A coordinate measuring device according to claim 106, wherein the image-processing sensor system (500) for the measuring with visible light is connected to the same image processing evaluation unit or the same image processing board (504) as the x-ray sensor system (502).
  • 141. A method for calibrating an x-ray sensor system in a coordinate measuring device as defined in claim 106, wherein marked points of the object to be measured are measured with a tactile or optical sensor system, and that geometrical features such as diameter or distances are thereby ascertained, which are then used for calibrating the x-ray sensor system after the same geometric features have been ascertained with the x-ray sensor system.
  • 142. A method according to claim 141, wherein the measurement results obtained through tactile and/or optic sensor systems for marked points are implemented in the correction of the measurement point cloud generated from the 3D-voxel-data by means of the thresholding, wherein said data is obtained through measurement performed with x-ray sensor systems (tomography).
  • 143. A method according to claim 141, wherein measurement results obtained for the marked points through tactile and/or optical sensor systems are used as early as the computation of the 3D-reconstruction of the x-ray (tomography) procedure.
  • 144. A method according to claim 141, wherein measurement points alternatively ascertained with tactile sensor systems, optical sensor systems or x-ray sensor systems are analyzed in a common coordinate system.
  • 145. A method according to claim 141, wherein the geometrical features such as diameter and spacing are calculated from points measured by a combination of x-ray sensor systems, optical sensor systems or tactile sensor systems.
  • 146. A method according to claim 141, wherein from the measurement points obtained with x-ray sensor technology and/or from the tactilely obtained measurement points and/or from the optically obtained measurement points a common point cloud for further analysis is generated.
  • 147. A method for measuring an object by means of a coordinate measuring device comprising an x-ray sensor system with an x-ray source, at least one x-ray sensor capturing x-rays as well as a shield against x-radiation as a first sensor system and a second sensor system such as a tactile and/or optical sensor system, which can be positioned relative to the object along the x-, y- and/or z-direction of the coordinate measuring device, characterized by the fact that the x-ray sensor system in the same manner as the second sensor system is positioned within the coordinate measuring device.
  • 148. A method according to claim 147, wherein the x-ray sensor system is arranged equally with the second sensor system.
  • 149. A method according to claim 147, wherein the x-ray sensor system or its sensor is arranged on a common mechanical axis with at least the tactile sensor system or its sensor and/or the optical sensor system or its sensor.
  • 150. A method according to claim 147, wherein the x-ray sensor system is arranged on a separate mechanical axis that functions analogously to the mechanical axes for the tactile sensor system and/or the optical sensor system.
  • 151. A method according to claim 147, wherein a common measurement volume is covered by the x-ray sensor system and the tactile sensor system and/or the optical sensor system.
  • 152. A method according to claim 147, wherein the coordinate measuring device is equipped with at least one axis (z-axis) perpendicular to the functional direction (x- and/or y-direction) of the x-ray sensor system and/or the optical sensor system such as an image-processing sensor and/or the tactile sensor system.
  • 153. A method according to claim 147, wherein the rotation axis rotates on a vertically running axis.
  • 154. A method according to claim 147, wherein the functional or mechanical axis for the optical sensor system or the sensor thereof and/or the x-ray sensor system or the sensor thereof is aligned horizontal and/or perpendicular to the rotation axis.
  • 155. A method according to claim 147, wherein the radiation source for the x-ray sensor system and/or the image processing sensor system are moved synchronously with the sensors assigned thereto.
  • 156. A method according to claim 147, wherein the radiation source for the x-ray sensor system is fixedly arranged in the coordinate system of the coordinate measuring device.
  • 157. A method according to claim 147, wherein both the x-ray sensor or the x-ray sensor system and the optical sensor or the optical sensor system and/or the tactile sensor or the tactile sensor system are arranged adjustably in relation to the object on at least one axis.
  • 158. A method according to claim 147, wherein both the x-ray sensor and the optical sensor and/or the tactile sensor are arranged adjustably in relation to the object on at least two axes.
  • 159. A method according to claim 147, wherein both the x-ray sensor and the optical sensor and/or the tactile sensor are arranged adjustably in relation to the object on at least three axes.
  • 160. A method according to claim 147, wherein at least one additional sensor is arranged adjustably together with the x-ray sensor system.
  • 161. A method according to claim 147, wherein a measurement area adaptation is achieved by adjusting the distance between the x-ray sensor system and the radiation source and/or by adjusting object and x-ray sensor system in relation to one another.
  • 162. A method for measuring structures and/or geometrical features of an object such as a workpiece by means of a coordinate measuring device while using an x-ray sensor system (computer-tomograph) comprising an x-ray source, at least one sensor capturing the x-rays as well as a shielding against x-rays, wherein during the process of measuring, the x-ray sensor system is rotated relative to the object, in particular the object to the x-ray sensor system, characterized by the fact that at least one functional component of the coordinate measuring device is designed as the shielding.
  • 163. A method according to claim 162, wherein the shielding is designed as a mounting site for functional components of the coordinate measuring device, such as a traveling axis and/or sensor and/or radiation or light source.
  • 164. A method according to claim 162, wherein a base plate of the coordinate measuring device and/or side wall and/or rear wall are designed as shielding.
  • 165. A method according to claim 162, wherein the functional components used for the shielding are of a thickness greater than that required for measurement technology or static use.
  • 166. A method according to claim 162, wherein multiple sensors are assigned to the x-ray source in such a way that an x-ray image is taken by each sensor, where irradiation angles deviate from one another.
  • 167. A method according to claim 162, wherein tomograms are taken of the object using different spectral ranges of the x-ray radiation.
  • 168. A method according to claim 162, wherein in the process of image taking or, as the case may be, image transmission or image evaluation, multiple pixel elements of the converter are in each case combined into one pixel and the original resolution in the volume image, which is computed from the images with correspondingly reduced pixel count, is achieved or surpassed through mathematical interpolation.
  • 169. A method according to claim 162, wherein the object is continuously rotated during the measurements (data recording), while the x-ray source is opened for only brief periods with the aid of a mechanical or electrical shutter.
  • 170. A method according to claim 162, wherein during measurement, the object is continuously rotated and discontinuously exposed to x-rays.
  • 171. A method according to claim 162, wherein multiple images (tomograms) of the object are simultaneously taken, where an angle between rotation axis of the object and x-rays is varied with the aid of mechanical swivel axes or the use of multiple detectors at different angles.
  • 172. A method according to claim 162, wherein for increasing the resolution of the tomogram, multiple images are taken, in the intervals between which the sensor or the object is shifted by a distance that is smaller than edge length of a sensitive element of the sensor.
  • 173. A method according to claim 162, wherein the x-rays are made parallel.
  • 174. A method according to claim 162, wherein with the aid of translatory relative movement between object and x-ray source or x-ray sensor, an area is taken that is larger than sensor surface area.
  • 175. A method according to claim 162, wherein the measurement of an object made of materials exhibiting low contrast to x-rays is performed in that the object is surrounded by a material the x-ray absorption of which being greater than that of the object.
  • 176. A method according to claim 162, wherein in addition to the sensor or sensors for capturing the x-radiation, additional sensors for measuring technical detection of the object such as e.g. a mechanical probe, a laser probe and an image processing sensor are employed.
  • 177. A method according to claim 162, wherein at least a few of the sensors are arranged on separate traveling axes.
  • 178. A method according to claim 162, wherein a rotation axis necessary for taking a tomogram and for rotating the object is arranged on a traveling axis for magnification of the measurement area in the direction of the rotation axis.
  • 179. A method for measuring an object with a coordinate measuring device containing at least one x-ray sensor system with x-ray source and x-ray detector, characterized by the fact that the positions for x-ray source and x-ray detector can be stored with the appropriate calibration data for specific magnification and measurement range arrangements following a single calibration, and data stored in this manner can be used during following measurements with the x-ray sensor systems without any further recalibration.
  • 180. A method according to claim 179, wherein previously calibrated magnification and measurement range settings are automatically called up by the measurement program of the coordinate measuring device, and the corresponding hardware components of the device are positioned.
  • 181. A method according to claim 179, wherein the x-ray source and the x-ray detector are synchronously driven in order to change only the magnification and/or measurement range.
  • 182. A method according to claim 179, wherein the x-ray source and the x-ray detector are driven independently of one another to change the magnification and/or measurement range.
  • 183. A method according to claim 179, wherein all settings necessary for x-ray measurement (tomography measurements) are calibrated and stored in advance so that for each x-ray measurement procedure, such as a tomography procedure, calibration procedures are no longer necessary.
  • 184. A method according to claim 179, wherein the adjustment for the rotation center of the object can be realized through a calibration procedure and/or a corresponding correction of the rotation center drift in the software.
  • 185. A method according to claim 179, wherein the magnification for the tomography and/or the position of the rotation center in relation to the x-ray source and x-ray detector is determined using a standard that consists of at least two spheres.
  • 186. A method according to claim 179, wherein the magnification for the x-ray measurement (tomography) and/or the position of the rotation center in relation to the x-ray source and x-ray detector is determined using a standard that consists of at least four spheres.
  • 187. A method according to claim 179, wherein the steps for determining the position of the rotation center in the coordinate measuring device comprise: a four-sphere standard consisting of four spheres arranged at the corners of a rectangle such as a square, wherein the spacing of the spheres in relation to one another is known or calibrated, is positioned on the rotation axis,the four-sphere standard is rotated so that the defined plane is parallel to the detector,measurement of the four-sphere position in the measuring field of the detector,calculation of the average magnification M1 from the four measured sphere distances, the nominal sphere distances and the nominal pixel size of the detector,rotation of the rotation axis by 180°,measurement of the four sphere positions in the image,calculation of the average magnification M2 from the four measured sphere distances, the nominal sphere distances and the nominal pixel size of the detector.
  • 188. A method according to claim 179, wherein the Y-position of the rotation center is calculated from the four sphere positions prior to and following the rotation using the following formula: Pdyn=(Pkyn1*M2+Pkyn2+M1)/(M1*M2) with Pdyn being the Y-position of the rotation axis on the detector for sphere n, Pkyn1 being the Y-position of the sphere n at a rotation angle 0°, Pkyn2 being the Y-position of the sphere n at a rotation angle 180°, M1 being the average magnification at a rotation angle 0° and M2 being the average magnification at a rotation angle 180°.
  • 189. A method according to claim 179, wherein in the coordinate measuring device measurement points measured by means of tactile and/or optical sensor systems are used for the correction of the measurement points obtained with the x-ray sensor system.
  • 190. A method according to claim 179, wherein the measurement point cloud of the object of measurement measured with the x-ray sensor system or tomography or the triangulated surface element calculated from this data is corrected through tactilely and/or optically obtained measurement points.
  • 191. A method according to claim 190, wherein values are interpolated between the tactilely and/or optically measured correction points.
  • 192. A method according to claim 191, wherein it is interpolated between correction points obtained with a tactile and/or optical sensor system while factoring in the functional course of the point cloud obtained through an x-ray measurement or, as the case may be, tomography and/or while taking into consideration the nominal CAD-model.
  • 193. A method according to claim 183, wherein at first a sample part of the type of object of measurement is scanned by x-rays (tomographically) as well as tactilely and/or optically, a correction network for the correction of the tomographic measurement values is calculated from the difference of both measurements and, when repetitive parts are measured, the tomographic measurements are corrected with the one-time defined correction values.
  • 194. A method according to claim 179, wherein a calibrated portion of an object of measurement undergoes tomography, that a correction network for the correction of tomographic measurement values is calculated from the measurement deviation occurring during measurement and, when repetitive parts are measured, the tomographic measurements are adjusted with the previously calibrated correction values.
  • 195. A method according to claim 193, wherein when repetitive parts are measured, individual optically and/or tactilely measured correction points are additionally factored in.
  • 196. A method according to claim 193, wherein for correction, the tactile and/or optical measurement points are graphically plotted by an operator on the point cloud generated by tomography and are then measured automatically by the coordinate measuring device.
  • 197. A method according to claim 193, wherein for correction, the tactile and/or optical measurement points are graphically plotted by an operator on the CAD-model of the part to be measured and are then automatically measured by the coordinate measuring device.
  • 198. A method according to claim 193, wherein the tactile and/or optical measurement points for correction are nearly evenly or evenly distributed on the surface of the CAD-model by an automatic algorithm and are automatically measured by the coordinate measuring device.
  • 199. A method according to claim 179, wherein the tactile and/or optical measurement points for correction are predefined on the CAD-model by an operator and, after the CAD-model has been loaded, are automatically measured by the coordinate measuring device.
  • 200. A method according to claim 179, wherein when a tomography procedure is performed, a calibration body, in particular, an arrangement of spheres, is also subjected to tomography, thereby allowing the relative position of the rotation axis in relation to the coordinate measuring device and/or to the x-ray source and/or to the x-ray sensor and/or the effective magnification is determined and then mathematically corrected.
  • 201. A method according to claim 200, wherein the calibration body, in particular the calibration spheres, is placed in a carrier with lower radiation absorption properties than that of the calibration body, while the object of measurement is positioned on a rotating table, with the calibration body being taken into consideration.
  • 202. A method according to claim 179, wherein the position of the calibration bodies on the rotation axis is determined with optical and/or tactile sensors and used for correction of the position of the rotation axis.
  • 203. A method according to claim 179, wherein the spatial location of the rotation axis in relation to the x-ray source and x-ray detector is measurement-technically ascertained with the x-ray sensor system and/or with the tactile sensor system and/or with the optical sensor system, and this deviation in position is mathematically corrected when objects of measurement undergo tomography.
  • 204. A method according to claim 179, wherein the position of the rotation axis deviating from the nominal position is corrected through rotation and/or translation and/or distortion of the 2D-single images.
  • 205. A method according to claim 179, wherein the position of the rotation axis deviating from the nominal position is factored into the reconstruction algorithm.
  • 206. A method according to claim 179, wherein the position of the object of measurement on the rotating table and thus in the machine coordinate system is ascertained using tactile and/or optical sensors and/or tomography and then measured in 2D x-ray mode at calibrated position of the x-ray sensor by scales using methods of image processing.
  • 207. A method according to claim 179, wherein the x-ray sensor or x-ray sensor system is automatically controlled via the device-software, while the x-ray sensor is positioned in the radiation cone of the x-ray source during the actual measurement (tomography procedure) and, at other times, is brought into parked position outside the radiation cone.
  • 208. A method according to claim 179, wherein the image-processing sensor system and x-ray sensor system of a multisensor coordinate measuring device are equipped with the same image-processing hardware and the same image-processing software or portions thereof.
  • 209. A method according to claim 179, wherein the image processing methods known from image-processing sensor technology can also be used for the x-ray sensor system.
  • 210. A method according to claim 179, wherein prior to reconstruction, the 2D x-ray images undergo a distortion correction and/or a bright signal correction and/or a dark signal correction and/or a mathematical translation and/or a mathematical rotation and/or a resampling process and/or a linearity characteristic line correction and/or an image processing filtering.
Priority Claims (3)
Number Date Country Kind
10 2004 026 357.4 May 2004 DE national
10 2004 050 257.9 Oct 2004 DE national
10 2005 018 447.2 Apr 2005 DE national
PCT Information
Filing Document Filing Date Country Kind 371c Date
PCT/EP05/05598 5/24/2005 WO 00 11/27/2006