Diffraction [LEED]

Industry

CPC
H01J2237/2544

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2544Diffraction [LEED]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of performing electron diffraction pattern analysis upon a s...
- Patent number 10,663,414
- Issue date May 26, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Frank Willi Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image type electron spin polarimeter
- Patent number 9,741,533
- Issue date Aug 22, 2017
- Shanghai Institute of Microsystem and Information Technology, Chinese Academy...
- Shan Qiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy-filtering cathode lens microscopy instrument
- Patent number 7,453,062
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring the physical properties of micro...
- Patent number 7,385,198
- Issue date Jun 10, 2008
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Aberration-correcting cathode lens microscopy instrument
- Patent number 7,348,566
- Issue date Mar 25, 2008
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring physical properties of micro region
- Patent number 7,022,988
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Double tilt and rotate specimen holder for a transmission electron...
- Patent number 6,388,262
- Issue date May 14, 2002
- Gatan, Inc.
- Reza Alani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning reflection electron diffraction microscope
- Patent number 5,675,148
- Issue date Oct 7, 1997
- Shimadzu Corporation
- Takao Marui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for imaging of an atomic environment
- Patent number 5,227,630
- Issue date Jul 13, 1993
- Board of Regents of the University of Wisconsin System
- Dilano K. Saldin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer control of the electron microscope sample stage
- Patent number 5,179,280
- Issue date Jan 12, 1993
- Chi & Associated Inc.
- Liqin Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PERFORMING ELECTRON DIFFRACTION PATTERN ANALYSIS UPON A S...
- Publication number 20160356729
- Publication date Dec 8, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Frank Willi BAUER
- G01 - MEASURING TESTING
Information Patent Application
IMAGE TYPE ELECTRON SPIN POLARIMETER
- Publication number 20160172157
- Publication date Jun 16, 2016
- SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY...
- SHAN QIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration-correcting cathode lens microscopy instrument
- Publication number 20070200070
- Publication date Aug 30, 2007
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy-filtering cathode lens microscopy instrument
- Publication number 20070200062
- Publication date Aug 30, 2007
- International Business Machines Corporation
- Rudolf M. Tromp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring the physical properties of micro...
- Publication number 20060113473
- Publication date Jun 1, 2006
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring physical properties of micro region
- Publication number 20040061053
- Publication date Apr 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING

Diffraction [LEED]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of performing electron diffraction pattern analysis upon a s...

Image type electron spin polarimeter

Energy-filtering cathode lens microscopy instrument

Method and apparatus for measuring the physical properties of micro...

Aberration-correcting cathode lens microscopy instrument

Method and apparatus for measuring physical properties of micro region

Double tilt and rotate specimen holder for a transmission electron...

Scanning reflection electron diffraction microscope

Method and apparatus for imaging of an atomic environment

Computer control of the electron microscope sample stage

Patents Applicationslast 30 patents

METHOD OF PERFORMING ELECTRON DIFFRACTION PATTERN ANALYSIS UPON A S...

IMAGE TYPE ELECTRON SPIN POLARIMETER

Aberration-correcting cathode lens microscopy instrument

Energy-filtering cathode lens microscopy instrument

Method and apparatus for measuring the physical properties of micro...

Method and apparatus for measuring physical properties of micro region