Heinz, K. et al. "Measurement of Diffuse LEED Intensities" Surface Science 173 (1986) pp. 366-378. |
Barton, John J., "Photoelectron Holography" Physical Review Letters, vol. 61, No. 12, Sep. 19, 1988, pp. 1356-1359. |
"Electron Holography of Surfaces", J. B. Pendry, Physics World (Jul. 1990) pp. 21-22. |
"Holographic LEED," D. K. Saldin and P. L. de Andres, Phys. Rev. Lett. vol. 64, No. 11 (Mar., 1990) pp. 1270-1273. |
"Improvement of the Spherical Mirror Analyzer," H. Daimon and S. Ino, Rev. Sci. Instrum. 61 (1), Jan., 1990. |
"Reliability of Diffuse LEED Intensity Measurements," Starke, et al., Surface Science, 216 (1989) pp. 325-342. |
"New Display-Type Analyzer for the Energy and the Angular Distribution of Charged Particles," H. Daimon, Rev. Sci. Instrum. 59 (4), Apr. 1988 pp. 545-549. |
"SEXAFS Without X-Rays," J. B. Pendry and D. K. Saldin, Surface Science, 145 (1984) pp. 33-47. |
X-Ray And Electron Holography Using A Local Reference Beam, Szoke, Short Wavelength Coherent Radiation: Generation And Application: Monterey, Calif., 1986, Proceedings Of The Topical Meeting, On Short Wavelength Coherent Radiation: Generation And Applications, Edited By D. J. Atwood & Baker, AIP Conf. Proc. No. 147, pp. 361-367 [AIP N.Y.] (1986). |