CPC
G01N21/4788
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Patent Grant
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
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Patent Grant
ASML Netherlands B.V.
Fei Liu
G01 - MEASURING TESTING
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Patent Grant
GLOBALFOUNDRIES U.S. Inc.
Yusheng Bian
G01 - MEASURING TESTING
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Patent Grant
THE WAVE TALK, INC.
Young Dug Kim
G01 - MEASURING TESTING
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Teknologian tutkimuskeskus VTT Oy
Tapio Mäkelä
G01 - MEASURING TESTING
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Patent Grant
Electronics and Telecommunications Research Institute
Jin Tae Kim
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
THE WAVE TALK, INC.
YongKeun Park
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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National Tsing Hua University
Andrew Hing Cheong Kung
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
CELLSBIN, INC.
Ali Kabiri
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Horiba, Ltd.
Tetsuya Mori
G01 - MEASURING TESTING
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Patent Grant
ASML Netherlands B.V.
Teunis Willem Tukker
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
FICOSA ADAS, S.L.U.
Francisco Remiro Herrero
B60 - VEHICLES IN GENERAL
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Patent Grant
ASML Netherlands B.V.
Maurits Van Der Schaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Araz Yacoubian
B22 - CASTING POWDER METALLURGY
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Patent Grant
ASML Netherlands B.V.
Patricius Aloysius Jacobus Tinnemans
G01 - MEASURING TESTING
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Patent Grant
Samsung Electronics Co., Ltd.
Myungjun Lee
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
THE WAVE TALK, INC.
Young-Dug Kim
G01 - MEASURING TESTING
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Patent Grant
The General Hospital Corporation
Guillermo J. Tearney
G01 - MEASURING TESTING
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Patent Grant
HOFFMANN-LA ROCHE INC.
Christof Fattinger
G01 - MEASURING TESTING
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Regents of the Univ of Colorado, a body corporate
Christina Porter
G01 - MEASURING TESTING
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Patent Grant
Jilin University
Zhichao Ma
B22 - CASTING POWDER METALLURGY
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Patent Grant
Universitat Politecnica de Valencia
José Miguel Avellá Oliver
G01 - MEASURING TESTING
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Canon Kabushiki Kaisha
Hiroki Yoshida
G02 - OPTICS
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The General Hospital Corporation
Seemantini K. Nadkarni
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Grant
KLA Corporation
Inna Steely-Tarshish
G01 - MEASURING TESTING
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Patent Grant
Regents of the University of Colorado, a body corporate
Michael Tanksalvala
G01 - MEASURING TESTING
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Patent Grant
ASML Netherlands B.V.
Ioana Sorina Barbu
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
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Patent Grant
Araz Yacoubian
B22 - CASTING POWDER METALLURGY
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Patent Grant
ASML Netherlands B.V.
Maxim Pisarenco
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
CELLSBIN, INC.
Ali KABIRI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Miltenyi Biotec B.V. & Co. KG
Heinrich SPIECKER
G01 - MEASURING TESTING
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Patent Application
Miltenyi Biotech B.V. & Co. KG
Heinrich SPIECKER
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Millibatt, Inc.
Kyung Rak Jang
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
KEYENCE CORPORATION
Shota Nakano
G01 - MEASURING TESTING
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Patent Application
BOE TECHNOLOGY GROUP CO., LTD.
Bo WANG
G01 - MEASURING TESTING
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Patent Application
Teknologian Tutkimuskeskus VTT Oy
Tapio MÄKELÄ
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Hojun Lee
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
ASML NETHERLANDS B.V.
Diederik Jan MAAS
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Teunis Willem TUKKER
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
Araz Yacoubian
B22 - CASTING POWDER METALLURGY
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Patent Application
ASML NETHERLANDS B.V.
Patricius Aloysius Jacobus TINNEMANS
G01 - MEASURING TESTING
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Patent Application
The General Hospital Corporation
Guillermo J. Tearney
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
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Patent Application
GCP Applied Technologies Inc.
Elise Berodier
G01 - MEASURING TESTING
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Patent Application
CELLSBIN, INC.
Ali KABIRI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
KIOXIA Corporation
Yuki ABE
G01 - MEASURING TESTING
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Patent Application
Carnegie Mellon University
Rahul Panat
G01 - MEASURING TESTING
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Patent Application
KLA Corporation
Itay Gdor
G01 - MEASURING TESTING
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Patent Application
HOFFMANN-LA ROCHE INC.
Christof FATTINGER
G01 - MEASURING TESTING
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Patent Application
The Wave Talk, Inc.
Young Dug KIM
G01 - MEASURING TESTING
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Patent Application
SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGY
Fucai ZHANG
G01 - MEASURING TESTING
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Patent Application
TECHNOLOGIES GRB INC.
Raymond Boisvert
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Peter Michael KRAUS
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
The Wave Talk, Inc.
Young Dug KIM
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Lars LOETGERING
G01 - MEASURING TESTING
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Patent Application
Yuri Paskover
G01 - MEASURING TESTING
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Patent Application
Amnon Manassen
G01 - MEASURING TESTING
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Patent Application
ASML NETHERLANDS B.V.
Fei LIU
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
Meta Platforms Technologies, LLC
Jian XU
G01 - MEASURING TESTING
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Patent Application
Rensselaer Polytechnic Institute
Edwin Fohtung
G01 - MEASURING TESTING
