Diffraction

Industry

CPC
G01N21/4788

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/4788Diffraction

Industries

Patents Grantslast 30 patents

Information Patent Grant
Particle size distribution measurement device, particle analysis un...
- Patent number 12,140,519
- Issue date Nov 12, 2024
- Horiba, Ltd.
- Tetsuya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus for simultaneous acquisition of multiple divers...
- Patent number 12,086,973
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Teunis Willem Tukker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Speckle detection systems, image capturing devices and methods
- Patent number 12,055,488
- Issue date Aug 6, 2024
- FICOSA ADAS, S.L.U.
- Francisco Remiro Herrero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Target for measuring a parameter of a lithographic process
- Patent number 12,019,377
- Issue date Jun 25, 2024
- ASML Netherlands B.V.
- Maurits Van Der Schaar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 12,017,278
- Issue date Jun 25, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 12,007,700
- Issue date Jun 11, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method based on diffraction using oblique i...
- Patent number 12,002,698
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for water examination
- Patent number 12,000,818
- Issue date Jun 4, 2024
- THE WAVE TALK, INC.
- Young-Dug Kim
- G01 - MEASURING TESTING
Information Patent Grant
Speckle-based image distortion correction for laser scanning micros...
- Patent number 11,986,266
- Issue date May 21, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- G01 - MEASURING TESTING
Information Patent Grant
Device for use in the detection of binding affinities
- Patent number 11,946,930
- Issue date Apr 2, 2024
- HOFFMANN-LA ROCHE INC.
- Christof Fattinger
- G01 - MEASURING TESTING
Information Patent Grant
Complex spatially-resolved reflectometry/refractometry
- Patent number 11,867,626
- Issue date Jan 9, 2024
- Regents of the Univ of Colorado, a body corporate
- Christina Porter
- G01 - MEASURING TESTING
Information Patent Grant
Metal additive manufacturing extrusion mechanism for monitoring and...
- Patent number 11,845,126
- Issue date Dec 19, 2023
- Jilin University
- Zhichao Ma
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Diffractive device for chemical and biological analysis
- Patent number 11,815,455
- Issue date Nov 14, 2023
- Universitat Politecnica de Valencia
- José Miguel Avellá Oliver
- G01 - MEASURING TESTING
Information Patent Grant
Optical system, imaging apparatus including optical system, and ima...
- Patent number 11,788,958
- Issue date Oct 17, 2023
- Canon Kabushiki Kaisha
- Hiroki Yoshida
- G02 - OPTICS
Information Patent Grant
Apparatus, devices and methods for obtaining omnidirectional viewin...
- Patent number 11,766,176
- Issue date Sep 26, 2023
- The General Hospital Corporation
- Seemantini K. Nadkarni
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Overlay design for electron beam and scatterometry overlay measurem...
- Patent number 11,720,031
- Issue date Aug 8, 2023
- KLA Corporation
- Inna Steely-Tarshish
- G01 - MEASURING TESTING
Information Patent Grant
Modulus-enforced probe
- Patent number 11,709,132
- Issue date Jul 25, 2023
- Regents of the University of Colorado, a body corporate
- Michael Tanksalvala
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for monitoring a manufacturing process, inspe...
- Patent number 11,698,346
- Issue date Jul 11, 2023
- ASML Netherlands B.V.
- Ioana Sorina Barbu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology apparatus and photonic crystal fiber
- Patent number 11,675,276
- Issue date Jun 13, 2023
- ASML Netherlands B.V.
- Nitesh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of additive man...
- Patent number 11,668,658
- Issue date Jun 6, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Scatterometer and method of scatterometry using acoustic radiation
- Patent number 11,536,654
- Issue date Dec 27, 2022
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Imaging systems with angled sensors and related methods
- Patent number 11,536,655
- Issue date Dec 27, 2022
- Path AI, Inc.
- Justin Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable diffraction-based imaging and diagnostic systems and methods
- Patent number 11,525,778
- Issue date Dec 13, 2022
- The General Hospital Corporation
- Ralph Weissleder
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
System and method for determining audio characteristics from within...
- Patent number 11,523,737
- Issue date Dec 13, 2022
- ELBIT SYSTEMS LAND AND C4I LTD.
- Ilya Leizerson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensing device for detecting analyte containing non-metallic elemen...
- Patent number 11,513,071
- Issue date Nov 29, 2022
- 2WITECH SOLUTIONS LLC
- Qingwu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Plasma dispersion effect based super-resolved imaging
- Patent number 11,506,604
- Issue date Nov 22, 2022
- Bar Ilan University
- Zeev Zalevsky
- G01 - MEASURING TESTING
Information Patent Grant
Speckle detection systems, image capturing devices and methods
- Patent number 11,493,440
- Issue date Nov 8, 2022
- FICOSA ADAS, S.L.U.
- Francisco Remiro Herrero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Particle size distribution measuring device and program for particl...
- Patent number 11,448,579
- Issue date Sep 20, 2022
- Horiba, Ltd.
- Tetsuya Mori
- G01 - MEASURING TESTING
Information Patent Grant
Acoustic-optical imaging system
- Patent number 11,448,585
- Issue date Sep 20, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Arnaud Verdant
- G02 - OPTICS
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 11,415,900
- Issue date Aug 16, 2022
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
- Publication number 20240410827
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Diederik Jan MAAS
- G01 - MEASURING TESTING
Information Patent Application
DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...
- Publication number 20240404036
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Teunis Willem TUKKER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...
- Publication number 20240319620
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
SPECKLE-BASED IMAGE DISTORTION CORRECTION FOR LASER SCANNING MICROS...
- Publication number 20240268672
- Publication date Aug 15, 2024
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CEMENT PRODUCTION
- Publication number 20240239707
- Publication date Jul 18, 2024
- GCP Applied Technologies Inc.
- Elise Berodier
- G01 - MEASURING TESTING
Information Patent Application
DEVICES FOR BIOLOGICAL ANALYSIS
- Publication number 20240210317
- Publication date Jun 27, 2024
- CELLSBIN, INC.
- Ali KABIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240210334
- Publication date Jun 27, 2024
- KIOXIA Corporation
- Yuki ABE
- G01 - MEASURING TESTING
Information Patent Application
Laser-Based Fast Micromanufacturing of Test Device for Rapid Detect...
- Publication number 20240183785
- Publication date Jun 6, 2024
- Carnegie Mellon University
- Rahul Panat
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SUPPRESSION OF TOOL INDUCED SHIFT IN SCANNING...
- Publication number 20240167813
- Publication date May 23, 2024
- KLA Corporation
- Itay Gdor
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTOMETRIC SENSOR FOR THE DETECTION OF BINDING AFFINITIES
- Publication number 20240125707
- Publication date Apr 18, 2024
- HOFFMANN-LA ROCHE INC.
- Christof FATTINGER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR WATER EXAMINATION
- Publication number 20240110868
- Publication date Apr 4, 2024
- The Wave Talk, Inc.
- Young Dug KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CHARACTERISING AN OBJECT
- Publication number 20240094123
- Publication date Mar 21, 2024
- SOUTHERN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Fucai ZHANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTICAL SYSTEM FOR DETECTION OF A BUTTON SANITARY CONDITI...
- Publication number 20240017961
- Publication date Jan 18, 2024
- TECHNOLOGIES GRB INC.
- Raymond Boisvert
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
- Publication number 20240003809
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Peter Michael KRAUS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TURBIDIMETER
- Publication number 20230366816
- Publication date Nov 16, 2023
- The Wave Talk, Inc.
- Young Dug KIM
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
- Publication number 20230341325
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Lars LOETGERING
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...
- Publication number 20230314344
- Publication date Oct 5, 2023
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SCATTEROMETRY OVERLAY METROLOGY
- Publication number 20230314319
- Publication date Oct 5, 2023
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND PATTERNING DEVICES AND APPARATUSES FOR MEASURING FOCUS...
- Publication number 20230305407
- Publication date Sep 28, 2023
- ASML NETHERLANDS B.V.
- Fei LIU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR SEPARATING VOLUMETRIC AND SURFACE SCATTERING...
- Publication number 20230296510
- Publication date Sep 21, 2023
- Meta Platforms Technologies, LLC
- Jian XU
- G01 - MEASURING TESTING
Information Patent Application
PARALLAX METHOD FOR A SINGLE-CELL DIFFRACTION BASED MEASUREMENT OF...
- Publication number 20230259041
- Publication date Aug 17, 2023
- KLA Corporation
- Mordechy Kot
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POLARIMETRIC COHERENT DIFFRACTION IMAGING
- Publication number 20230258560
- Publication date Aug 17, 2023
- Rensselaer Polytechnic Institute
- Edwin Fohtung
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20230258578
- Publication date Aug 17, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
TUNABLE SHRINKAGE AND TRIM PROCESS FOR FABRICATING GRATINGS
- Publication number 20230160820
- Publication date May 25, 2023
- Meta Platforms Technologies, LLC
- Austin LANE
- G01 - MEASURING TESTING
Information Patent Application
Method, Apparatus and System for Label-free Testing Whole Blood Spe...
- Publication number 20230160900
- Publication date May 25, 2023
- NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Chien-Kuang CHEN
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTOMETRIC SENSING DEVICE
- Publication number 20230141082
- Publication date May 11, 2023
- ETH Zuerich
- Janos VÖRÖS
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE GENERATION APPARATUS, LIGHT SOURCE GENERATING METHOD,...
- Publication number 20230136618
- Publication date May 4, 2023
- Andrew Hing Cheong KUNG
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE SPECKLE IMAGING SYSTEM AND METHOD FOR AUTOMATED SPECKLE AC...
- Publication number 20230130329
- Publication date Apr 27, 2023
- TATA CONSULTANCY SERVICES LIMITED
- Renju PARAPPILLIL BABY
- G06 - COMPUTING CALCULATING COUNTING

Diffraction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Particle size distribution measurement device, particle analysis un...

Detection apparatus for simultaneous acquisition of multiple divers...

Speckle detection systems, image capturing devices and methods

Target for measuring a parameter of a lithographic process

Multi-parameter inspection apparatus for monitoring of manufacturin...

Metrology system and method for determining a characteristic of one...

Metrology apparatus and method based on diffraction using oblique i...

Device for water examination

Speckle-based image distortion correction for laser scanning micros...

Device for use in the detection of binding affinities

Complex spatially-resolved reflectometry/refractometry

Metal additive manufacturing extrusion mechanism for monitoring and...

Diffractive device for chemical and biological analysis

Optical system, imaging apparatus including optical system, and ima...

Apparatus, devices and methods for obtaining omnidirectional viewin...

Overlay design for electron beam and scatterometry overlay measurem...

Modulus-enforced probe

Methods and apparatus for monitoring a manufacturing process, inspe...

Metrology apparatus and photonic crystal fiber

Multi-parameter inspection apparatus for monitoring of additive man...

Scatterometer and method of scatterometry using acoustic radiation

Imaging systems with angled sensors and related methods

Portable diffraction-based imaging and diagnostic systems and methods

System and method for determining audio characteristics from within...

Sensing device for detecting analyte containing non-metallic elemen...

Plasma dispersion effect based super-resolved imaging

Speckle detection systems, image capturing devices and methods

Particle size distribution measuring device and program for particl...

Acoustic-optical imaging system

Metrology system and method for determining a characteristic of one...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS

METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...

DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERS...

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...

SPECKLE-BASED IMAGE DISTORTION CORRECTION FOR LASER SCANNING MICROS...

CEMENT PRODUCTION

DEVICES FOR BIOLOGICAL ANALYSIS

MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

Laser-Based Fast Micromanufacturing of Test Device for Rapid Detect...

SYSTEM AND METHOD FOR SUPPRESSION OF TOOL INDUCED SHIFT IN SCANNING...

DIFFRACTOMETRIC SENSOR FOR THE DETECTION OF BINDING AFFINITIES

DEVICE FOR WATER EXAMINATION

METHOD AND APPARATUS FOR CHARACTERISING AN OBJECT

AUTOMATED OPTICAL SYSTEM FOR DETECTION OF A BUTTON SANITARY CONDITI...

METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...

TURBIDIMETER

WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...

SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...

SCANNING SCATTEROMETRY OVERLAY METROLOGY

METHODS AND PATTERNING DEVICES AND APPARATUSES FOR MEASURING FOCUS...

SYSTEM AND METHOD FOR SEPARATING VOLUMETRIC AND SURFACE SCATTERING...

PARALLAX METHOD FOR A SINGLE-CELL DIFFRACTION BASED MEASUREMENT OF...

POLARIMETRIC COHERENT DIFFRACTION IMAGING

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

TUNABLE SHRINKAGE AND TRIM PROCESS FOR FABRICATING GRATINGS

Method, Apparatus and System for Label-free Testing Whole Blood Spe...

DIFFRACTOMETRIC SENSING DEVICE

LIGHT SOURCE GENERATION APPARATUS, LIGHT SOURCE GENERATING METHOD,...

PORTABLE SPECKLE IMAGING SYSTEM AND METHOD FOR AUTOMATED SPECKLE AC...