diffraction

Industry

CPC
G01N2223/056

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/056diffraction

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring the diameter of filament diffraction fringes b...
- Patent number 12,196,540
- Issue date Jan 14, 2025
- Zhejiang University of Technology
- Qiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation device
- Patent number 12,188,885
- Issue date Jan 7, 2025
- Kioxia Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis apparatus, method and program and manufacturi...
- Patent number 12,174,131
- Issue date Dec 24, 2024
- Rigaku Corporation
- Takahiro Kuzumaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for analysis and determination of heavy metal occurrence key...
- Patent number 12,159,691
- Issue date Dec 3, 2024
- Central South University
- Zhang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Material species identification system using material spectral data
- Patent number 12,146,844
- Issue date Nov 19, 2024
- Toyota Jidosha Kabushiki Kaisha
- Masaki Adachi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Diffractometer-based global in situ diagnostic system for animals
- Patent number 12,094,609
- Issue date Sep 17, 2024
- Arion Diagnostics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffraction-based global in vitro diagnostic system
- Patent number 12,094,610
- Issue date Sep 17, 2024
- Bragg Analytics, Inc.
- Alexander Lazarev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining crystal structure and apparatus for carryin...
- Patent number 12,072,305
- Issue date Aug 27, 2024
- FYZIKALNI USTAV AV CR. V.V.I
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Grant
Mesh-based crystal sample holder for serial crystallography
- Patent number 12,031,926
- Issue date Jul 9, 2024
- Korea University Research and Business Foundation
- Ki Hyun Nam
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis of cause of degradation of lithium secondary battery
- Patent number 12,013,356
- Issue date Jun 18, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Crosslinked fluoropolymer resin and control method for same
- Patent number 11,946,924
- Issue date Apr 2, 2024
- PROTERIAL, LTD.
- Kazufumi Suenaga
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
- Patent number 11,921,062
- Issue date Mar 5, 2024
- UNIVERSITE DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
- Patent number 11,915,837
- Issue date Feb 27, 2024
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...
- Publication number 20250003896
- Publication date Jan 2, 2025
- Rigaku Corporation
- Akihito YAMANO
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Forming and Testing Inorganic Salts
- Publication number 20240009661
- Publication date Jan 11, 2024
- Saudi Arabian Oil Company
- Hamad Al Saiari
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION DEVICE
- Publication number 20230288351
- Publication date Sep 14, 2023
- KIOXIA Corporation
- Takehiro Nakai
- G01 - MEASURING TESTING
Information Patent Application
Advanced X-Ray Emission Spectrometers
- Publication number 20230288352
- Publication date Sep 14, 2023
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...
- Publication number 20230280290
- Publication date Sep 7, 2023
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTION-BASED GLOBAL IN VITRO DIAGNOSTIC SYSTEM
- Publication number 20230207074
- Publication date Jun 29, 2023
- Bragg Analytics, Inc.
- Pavel LAZAREV
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...
- Publication number 20230194443
- Publication date Jun 22, 2023
- Rigaku Corporation
- Akihiro HIMEDA
- G01 - MEASURING TESTING
Information Patent Application
SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...
- Publication number 20230124114
- Publication date Apr 20, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL SPECIES IDENTIFICATION SYSTEM USING MATERIAL SPECTRAL DATA
- Publication number 20230117375
- Publication date Apr 20, 2023
- Toyota Jidosha Kabushiki Kaisha
- Masaki ADACHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ANALYSIS AND DETERMINATION OF HEAVY METAL OCCURRENCE KEY...
- Publication number 20230117820
- Publication date Apr 20, 2023
- Central South University
- Zhang LIN
- G01 - MEASURING TESTING
Information Patent Application
Methods for determining crystal structure and apparatus for carryin...
- Publication number 20230065841
- Publication date Mar 2, 2023
- Fyzikální ústav AV CR, v.v.i.
- Lukas Palatinus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS
- Publication number 20230057900
- Publication date Feb 23, 2023
- The Regents of the University of California
- Hosea M. Nelson
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
- Publication number 20230031147
- Publication date Feb 2, 2023
- Merck Patent GmbH
- Carolina VON ESSEN
- G01 - MEASURING TESTING
Information Patent Application
Mineralogical Analysis System of Copper Concentrate
- Publication number 20230033441
- Publication date Feb 2, 2023
- CODELCOTEC SPA
- Leonel Contreras Rojas
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20230024986
- Publication date Jan 26, 2023
- KIOXIA Corporation
- Takaki HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
Diagnosis of Cause of Degradation of Lithium Secondary Battery
- Publication number 20220393257
- Publication date Dec 8, 2022
- LG ENERGY SOLUTION, LTD.
- Hyo Jung Yoon
- H01 - BASIC ELECTRIC ELEMENTS

diffraction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring the diameter of filament diffraction fringes b...

Evaluation device

Quantitative analysis apparatus, method and program and manufacturi...

Method for analysis and determination of heavy metal occurrence key...

Material species identification system using material spectral data

Component residual stress testing platform based on neutron diffrac...

Device and method for measuring short-wavelength characteristic X-r...

Methods and apparatus for electron backscatter diffraction sample c...

Diffractometer-based global in situ diagnostic system for animals

Diffraction-based global in vitro diagnostic system

Method for the detection and correction of lens distortions in an e...

Methods for determining crystal structure and apparatus for carryin...

Mesh-based crystal sample holder for serial crystallography

Diagnosis of cause of degradation of lithium secondary battery

X-ray beam shaping apparatus and method

Patterned x-ray emitting target

Method and system to determine crystal structure

Sample inspection system comprising a beam former to project a poly...

Crosslinked fluoropolymer resin and control method for same

Method for improving an EBSD/TKD map

System and method for in-situ X-ray diffraction-based real-time mon...

Device for hosting a probe solution of molecules in a plurality of...

Sample mounting system for an X-ray analysis apparatus

Anti-frosting and anti-dew device for spectroscopic measurements

Screening system

Structure for pressurization analysis, X-ray diffraction apparatus...

Electron diffraction intensity from single crystal silicon in a pho...

Electron diffraction holography

Controlling process parameters by means of radiographic online dete...

X-ray sequential array wavelength dispersive spectrometer

Patents Applicationslast 30 patents

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVIC...

PATTERNED X-RAY EMITTING TARGET

X-RAY ANALYZER

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

X-RAY ANALYZER

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

BIFOCAL ELECTRON MICROSCOPE

Apparatus for Forming and Testing Inorganic Salts

EVALUATION DEVICE

Advanced X-Ray Emission Spectrometers

DEVICE AND METHOD FOR ANALYZING DIFFRACTION PATTERN OF MIXTURE, AND...

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

DIFFRACTION-BASED GLOBAL IN VITRO DIAGNOSTIC SYSTEM

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NO...

SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...

MATERIAL SPECIES IDENTIFICATION SYSTEM USING MATERIAL SPECTRAL DATA

METHOD FOR ANALYSIS AND DETERMINATION OF HEAVY METAL OCCURRENCE KEY...

Methods for determining crystal structure and apparatus for carryin...

SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS

SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...

Mineralogical Analysis System of Copper Concentrate

MEASUREMENT DEVICE AND MEASUREMENT METHOD

ELECTRON DIFFRACTION HOLOGRAPHY

DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

Diagnosis of Cause of Degradation of Lithium Secondary Battery