Diffusers

Industry

CPC
G01J5/0878

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

Current Industry

G01J5/0878Diffusers

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for direct calibration
- Patent number 12,055,641
- Issue date Aug 6, 2024
- Woods Hole Oceanographic Institution
- Paul Dominic Fucile
- G01 - MEASURING TESTING
Information Patent Grant
Optical detector
- Patent number 11,060,922
- Issue date Jul 13, 2021
- trinamiX GmbH
- Timo Altenbeck
- G01 - MEASURING TESTING
Information Patent Grant
Determining thermal profiles of semiconductor structures
- Patent number 9,638,581
- Issue date May 2, 2017
- GLOBALFOUNDRIES Inc.
- Nicholas G. Clore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for dual-mode optical sensing
- Patent number 9,194,751
- Issue date Nov 24, 2015
- The Boeing Company
- Daniel Yap
- F41 - WEAPONS
Information Patent Grant
Diffusing measurement window for near and mid IR multichannel sensor
- Patent number 8,975,586
- Issue date Mar 10, 2015
- Honeywell ASCA Inc.
- Adam Krolak
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive diffuser with a layer of polytetrafluoroethylene on th...
- Patent number 7,482,572
- Issue date Jan 27, 2009
- ITT Manufacturing Enterprises, Inc.
- Roy P. Galvin
- G01 - MEASURING TESTING
Information Patent Grant
System and process for calibrating pyrometers in thermal processing...
- Patent number 6,293,696
- Issue date Sep 25, 2001
- Steag RTP Systems, Inc.
- Julio L. Guardado
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for performing scene based uniformity correct...
- Patent number 6,184,529
- Issue date Feb 6, 2001
- Lockheed Martin Corporation
- Casey L. Contini
- G02 - OPTICS
Information Patent Grant
Method and apparatus for characterizing a combustion flame
- Patent number 6,071,114
- Issue date Jun 6, 2000
- Meggitt Avionics, Inc.
- Deidre E. Cusack
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Cosine corrected optical pathway of a spectral radiometer
- Patent number 6,005,249
- Issue date Dec 21, 1999
- Smithsonian Environmental Research Center
- Douglass R. Hayes
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,490,728
- Issue date Feb 13, 1996
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Pyrometer including an emissivity meter
- Patent number 5,460,451
- Issue date Oct 24, 1995
- U.S. Philips Corporation
- Sipke Wadman
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor processing technique, including pyrometric measuremen...
- Patent number 5,442,727
- Issue date Aug 15, 1995
- AT&T Corp.
- Anthony T. Fiory
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact optical techniques for measuring surface conditions
- Patent number 5,310,260
- Issue date May 10, 1994
- Luxtron Corporation
- Charles W. Schietinger
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor processing technique, including pyrometric measuremen...
- Patent number 5,305,416
- Issue date Apr 19, 1994
- AT&T Bell Laboratories
- Anthony T. Fiory
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance probe
- Patent number 5,282,017
- Issue date Jan 25, 1994
- Quantum Logic Corporation
- Ira Kasindorf
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring temperature radiation using a pyrom...
- Patent number 5,271,084
- Issue date Dec 14, 1993
- Interuniversitair Micro Elektronica Centrum vzw
- Peter M. N. Vandenabeele
- G01 - MEASURING TESTING
Information Patent Grant
Light collection device for flame emission detectors
- Patent number 4,939,376
- Issue date Jul 3, 1990
- The United States of America as represented by the United States Department o...
- Stephen D. Woodruff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus for Direct Calibration
- Publication number 20240369717
- Publication date Nov 7, 2024
- Woods Hole Oceanographic Institution
- Paul Dominic FUCILE
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Direct Calibration
- Publication number 20240369716
- Publication date Nov 7, 2024
- Woods Hole Oceanographic Institution
- Paul Dominic FUCILE
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE FOR GENERATING A THERMAL IMAGE OF A SURFACE
- Publication number 20240319015
- Publication date Sep 26, 2024
- Honeywell International Inc.
- Prince Ashwin Kumar Anburaj JAYAKUMAR
- B60 - VEHICLES IN GENERAL
Information Patent Application
INFRARED DETECTING WITH MULTIPLE ABSORBERS IN A SENSING ELEMENT
- Publication number 20220163397
- Publication date May 26, 2022
- Raytheon Company
- David R. Rhiger
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTOR
- Publication number 20210025761
- Publication date Jan 28, 2021
- trinamiX GmbH
- Timo ALTENBECK
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THERMAL PROFILES OF SEMICONDUCTOR STRUCTURES
- Publication number 20150362373
- Publication date Dec 17, 2015
- International Business Machines Corporation
- Nicholas G. Clore
- G01 - MEASURING TESTING
Information Patent Application
Diffusing Measurement Window for Near and Mid IR Multichannel Sensor
- Publication number 20120305775
- Publication date Dec 6, 2012
- Honeywell ASCA Inc.
- Adam Krolak
- G02 - OPTICS
Information Patent Application
METHODS AND APPARATUS FOR THERMOGRAPHIC MEASUREMENTS
- Publication number 20120307046
- Publication date Dec 6, 2012
- AXIS AB
- Stefan LUNDBERG
- G01 - MEASURING TESTING
Information Patent Application
Method, Apparatus and Kit for Measuring Optical Properties of Mater...
- Publication number 20100213377
- Publication date Aug 26, 2010
- Dan Yakir
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods and apparatus for direct calibration

Optical detector

Determining thermal profiles of semiconductor structures

Systems and methods for dual-mode optical sensing

Diffusing measurement window for near and mid IR multichannel sensor

Transmissive diffuser with a layer of polytetrafluoroethylene on th...

System and process for calibrating pyrometers in thermal processing...

Methods and apparatus for performing scene based uniformity correct...

Method and apparatus for characterizing a combustion flame

Cosine corrected optical pathway of a spectral radiometer

Non-contact optical techniques for measuring surface conditions

Pyrometer including an emissivity meter

Semiconductor processing technique, including pyrometric measuremen...

Non-contact optical techniques for measuring surface conditions

Semiconductor processing technique, including pyrometric measuremen...

Reflectance probe

Method and device for measuring temperature radiation using a pyrom...

Light collection device for flame emission detectors

Patents Applicationslast 30 patents

Methods and Apparatus for Direct Calibration

Methods and Apparatus for Direct Calibration

IMAGING DEVICE FOR GENERATING A THERMAL IMAGE OF A SURFACE

INFRARED DETECTING WITH MULTIPLE ABSORBERS IN A SENSING ELEMENT

OPTICAL DETECTOR

DETERMINING THERMAL PROFILES OF SEMICONDUCTOR STRUCTURES

Diffusing Measurement Window for Near and Mid IR Multichannel Sensor

METHODS AND APPARATUS FOR THERMOGRAPHIC MEASUREMENTS

Method, Apparatus and Kit for Measuring Optical Properties of Mater...