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Directed, collimated illumination
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G01N2201/0633
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/0633
Directed, collimated illumination
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Patents Grants
last 30 patents
Information
Patent Grant
Foreign substance/defect inspection device, image generation device...
Patent number
12,209,971
Issue date
Jan 28, 2025
VIENEX CORPORATION
Osamu Iwasaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical interrogation system and method
Patent number
12,169,173
Issue date
Dec 17, 2024
Universite Laval
Maxime Joly
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable extended focus raman system
Patent number
12,158,425
Issue date
Dec 3, 2024
Thermo Scientific Portable Analytical Instruments Inc.
Malcolm C. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometry device
Patent number
12,158,417
Issue date
Dec 3, 2024
National University Corporation Kagawa University
Ichiro Ishimaru
G01 - MEASURING TESTING
Information
Patent Grant
Slope, p-component and s-component measurement
Patent number
12,146,830
Issue date
Nov 19, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Detection device and detection method
Patent number
12,140,531
Issue date
Nov 12, 2024
BEIJING BOE HEALTH TECHNOLOGY CO., LTD.
Hongquan Li
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Automatic display pixel inspection system and method
Patent number
12,112,469
Issue date
Oct 8, 2024
LG Electronics Inc.
Seunghwan Seok
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical measuring unit and optical measuring method for obtaining m...
Patent number
12,092,568
Issue date
Sep 17, 2024
MEON Medical Solutions GmbH & Co. KG
Herfried Huemer
G01 - MEASURING TESTING
Information
Patent Grant
Spectral confocal measurement device and measurement method thereof
Patent number
12,085,501
Issue date
Sep 10, 2024
ALEADER VISION TECHNOLOGY CO., LTD.
Jinfeng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Specimen processing apparatus, specimen measurement system and meth...
Patent number
12,076,724
Issue date
Sep 3, 2024
Sysmex Corporation
Kazuhiro Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging with a spatial heterodyne spectrometer
Patent number
12,072,290
Issue date
Aug 27, 2024
University of South Carolina
Stanley Michael Angel
G01 - MEASURING TESTING
Information
Patent Grant
Micro scale image capture system
Patent number
12,066,387
Issue date
Aug 20, 2024
SEDDI, INC.
Carlos Aliaga
G01 - MEASURING TESTING
Information
Patent Grant
Method, device and system for detecting raman scattered light
Patent number
12,061,151
Issue date
Aug 13, 2024
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
Ines Frese
G01 - MEASURING TESTING
Information
Patent Grant
Swept frequency fluorometer
Patent number
12,061,149
Issue date
Aug 13, 2024
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device
Patent number
12,055,481
Issue date
Aug 6, 2024
Viavi Solutions Inc.
Valton Smith
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for detecting phosphate and/or sulphate salts on the surface...
Patent number
12,050,174
Issue date
Jul 30, 2024
Omya International AG
Roger Bollström
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Non-invasive measurement of physiological parameters or substance c...
Patent number
12,050,177
Issue date
Jul 30, 2024
Opsolution GMBH
Bjoern Magnussen
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Assembly for collimating broadband radiation
Patent number
12,050,409
Issue date
Jul 30, 2024
ASML Netherlands B.V.
Yongfeng Ni
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Raman scattering from orbital and spin angular momentum in materials
Patent number
12,031,917
Issue date
Jul 9, 2024
Robert R. Alfano
G01 - MEASURING TESTING
Information
Patent Grant
Optical device, optical module and microscope for scanning large sa...
Patent number
12,019,227
Issue date
Jun 25, 2024
Leica Microsystems CMS GmbH
Florian Fahrbach
G02 - OPTICS
Information
Patent Grant
Region prober optical inspector
Patent number
11,988,615
Issue date
May 21, 2024
Lumina Instruments Inc.
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging method and apparatus
Patent number
11,965,827
Issue date
Apr 23, 2024
CHONGQING INSTITUTE OF EAST CHINA NORMAL UNIVERSITY
Heping Zeng
G01 - MEASURING TESTING
Information
Patent Grant
System and method of providing incoherent coupling of a laser into...
Patent number
11,892,399
Issue date
Feb 6, 2024
NIKIRA LABS INC.
Manish Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining a state of a sphere
Patent number
11,893,728
Issue date
Feb 6, 2024
FUJIFILM Corporation
Sohichiro Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Endotoxin testing assay and method of same
Patent number
11,892,397
Issue date
Feb 6, 2024
Board of Regents, The University of Texas System
Jing Yong Ye
G01 - MEASURING TESTING
Information
Patent Grant
Discrete light detection device
Patent number
11,892,409
Issue date
Feb 6, 2024
Taiwan RedEye Biomedical Inc.
Tsung-Jui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for determining a guest structure on a host str...
Patent number
11,885,809
Issue date
Jan 30, 2024
LUMICKS DSM HOLDING B.V.
Iddo Heller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Downhole laser system with an improved laser output production and...
Patent number
11,885,746
Issue date
Jan 30, 2024
United States Department of Energy
Dustin McIntyre
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Raman spectroscopy method and apparatus using broadband excitation...
Patent number
11,879,846
Issue date
Jan 23, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
In-situ detection device for detecting water and fertilizer content...
Patent number
11,874,219
Issue date
Jan 16, 2024
QINGDAO AGRICULTURAL UNIVERSITY
Bin Liang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...
Publication number
20250044219
Publication date
Feb 6, 2025
SCHLUMBERGER TECHNOLOGY CORPORATION
Sebastien Catheline
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD
Publication number
20250020587
Publication date
Jan 16, 2025
L'Oreal
Benjamin ASKENAZI
G01 - MEASURING TESTING
Information
Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
Publication number
20240426750
Publication date
Dec 26, 2024
Heraeus Quartz North America LLC
Maximilian SCHMITT
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM
Publication number
20240418643
Publication date
Dec 19, 2024
United States of America, as Represented by the Secretary of the Army (U.S. A...
Hajin Kim
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY DEVICE
Publication number
20240385107
Publication date
Nov 21, 2024
National University Corporation Kagawa University
Ichiro Ishimaru
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER
Publication number
20240377330
Publication date
Nov 14, 2024
University of South Carolina
STANLEY MICHAEL ANGEL
G01 - MEASURING TESTING
Information
Patent Application
SOLID-STATE QUASI-COLLIMATION STACK AND OPTICAL MEASUREMENT SYSTEM...
Publication number
20240361232
Publication date
Oct 31, 2024
Cerillo, Inc.
Andrew Homyk
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE OPTICAL SYSTEM FOR A SPECTROGRAPH
Publication number
20240361234
Publication date
Oct 31, 2024
Thermo Electron Scientific Instruments LLC
Julian Irwin
G01 - MEASURING TESTING
Information
Patent Application
Microspot Reflectometer
Publication number
20240344980
Publication date
Oct 17, 2024
The Boeing Company
Brian Gunther
G02 - OPTICS
Information
Patent Application
METHOD FOR INSPECTING FOR SURFACE DEFECTS ON A CAST PART MADE OF SI...
Publication number
20240310294
Publication date
Sep 19, 2024
SAFRAN
Franck MICHAUD
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE
Publication number
20240264075
Publication date
Aug 8, 2024
Drager Safety AG & Co. KGaA
Günter WAHLBRINK
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR GRADING CLARITY OF GEMSTONES
Publication number
20240255434
Publication date
Aug 1, 2024
SARINE TECHNOLOGIES LTD.
Ran SHEPS
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, Device and Method for Irradiating an in Particular Biolo...
Publication number
20240255426
Publication date
Aug 1, 2024
ROBERT BOSCH GmbH
Reinhold Fiess
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Surface Plasmon Resonance Sensor, Surface Plasmon Resonance Sensing...
Publication number
20240248033
Publication date
Jul 25, 2024
Academia Sinica
Chia-Fu CHOU
B82 - NANO-TECHNOLOGY
Information
Patent Application
GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM
Publication number
20240201078
Publication date
Jun 20, 2024
Horiba Stec, Co., Ltd.
Motonobu TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SCATTERING FROM ORBITAL AND SPIN ANGULAR MOMENTUM IN MATERIALS
Publication number
20240133814
Publication date
Apr 25, 2024
Robert R. Alfano
G01 - MEASURING TESTING
Information
Patent Application
ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF
Publication number
20240119577
Publication date
Apr 11, 2024
Casi Vision Technology (Luoyang) Co., Ltd.
Feng Lei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20240102936
Publication date
Mar 28, 2024
YOKOGAWA ELECTRIC CORPORATION
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HAND-HELD SCANNING PROBE AND OPTICAL SCANNING SYSTEM
Publication number
20240027331
Publication date
Jan 25, 2024
OPXION TECHNOLOGY INC.
MENG-TSAN TSAI
G01 - MEASURING TESTING
Information
Patent Application
Integrated cat's-eye tunable laser spectroscopy system and method
Publication number
20240019363
Publication date
Jan 18, 2024
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240011915
Publication date
Jan 11, 2024
SEMES CO., LTD.
Hark Ryong KIM
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME
Publication number
20230417681
Publication date
Dec 28, 2023
SAMSUNG DISPLAY CO., LTD.
SUNGWOO JUNG
G01 - MEASURING TESTING
Information
Patent Application
SINGLE SENSOR IMAGING SPECTROSCOPY FOR DETECTING NANOPARTICLES TO Q...
Publication number
20230408413
Publication date
Dec 21, 2023
Applied Materials, Inc.
Viswanath BAVIGADDA
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE APPARATUS FOR DETECTING EARLY CROP DISEASES BASED ON SPATI...
Publication number
20230326203
Publication date
Oct 12, 2023
JIANGSU UNIVERSITY
Aichen WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FOREIGN SUBSTANCE/DEFECT INSPECTION DEVICE, IMAGE GENERATION DEVICE...
Publication number
20230314334
Publication date
Oct 5, 2023
VIENEX CORPORATION
Osamu IWASAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LINE FIELD SWEPT SOURCE OCT SYSTEM AND SPECTROSCOPY SYSTEM
Publication number
20230296508
Publication date
Sep 21, 2023
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
MULTI-TRACK RAMAN WELL PLATE READER
Publication number
20230204515
Publication date
Jun 29, 2023
HORIBA INSTRUMENTS INCORPORATED
Nicolas VEZARD
G01 - MEASURING TESTING
Information
Patent Application
Hybrid Optical Parametrically-Oscillating Emitter
Publication number
20230194412
Publication date
Jun 22, 2023
Versitech Limited
Kenneth Kin Yip WONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOREIGN SUBSTANCE/DEFECT INSPECTION DEVICE, IMAGE GENERATION DEVICE...
Publication number
20230175973
Publication date
Jun 8, 2023
VIENEX CORPORATION
Yukihiro KAGAWA
G01 - MEASURING TESTING