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Directed, collimated illumination
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G01N2201/0633
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/0633
Directed, collimated illumination
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Hyperspectral imaging method and apparatus
Patent number
11,965,827
Issue date
Apr 23, 2024
CHONGQING INSTITUTE OF EAST CHINA NORMAL UNIVERSITY
Heping Zeng
G01 - MEASURING TESTING
Information
Patent Grant
System and method of providing incoherent coupling of a laser into...
Patent number
11,892,399
Issue date
Feb 6, 2024
NIKIRA LABS INC.
Manish Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Endotoxin testing assay and method of same
Patent number
11,892,397
Issue date
Feb 6, 2024
Board of Regents, The University of Texas System
Jing Yong Ye
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining a state of a sphere
Patent number
11,893,728
Issue date
Feb 6, 2024
FUJIFILM Corporation
Sohichiro Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Discrete light detection device
Patent number
11,892,409
Issue date
Feb 6, 2024
Taiwan RedEye Biomedical Inc.
Tsung-Jui Lin
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for determining a guest structure on a host str...
Patent number
11,885,809
Issue date
Jan 30, 2024
LUMICKS DSM HOLDING B.V.
Iddo Heller
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Downhole laser system with an improved laser output production and...
Patent number
11,885,746
Issue date
Jan 30, 2024
United States Department of Energy
Dustin McIntyre
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Raman spectroscopy method and apparatus using broadband excitation...
Patent number
11,879,846
Issue date
Jan 23, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
In-situ detection device for detecting water and fertilizer content...
Patent number
11,874,219
Issue date
Jan 16, 2024
QINGDAO AGRICULTURAL UNIVERSITY
Bin Liang
G01 - MEASURING TESTING
Information
Patent Grant
Portable apparatus for detecting early crop diseases based on spati...
Patent number
11,861,897
Issue date
Jan 2, 2024
JIANGSU UNIVERSITY
Aichen Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Extended solid angle turbidity sensor
Patent number
11,860,096
Issue date
Jan 2, 2024
YSI, Inc.
Kevin Flanagan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Systems and methods for in-operating-theatre imaging of fresh tissu...
Patent number
11,828,710
Issue date
Nov 28, 2023
SamanTree Medical SA
Bastien Rachet
G01 - MEASURING TESTING
Information
Patent Grant
Broadband Raman excitation spectroscopy with structured excitation...
Patent number
11,815,462
Issue date
Nov 14, 2023
Paul Finnie
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,802,841
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Yuji Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method of non-contact glucose sensing
Patent number
11,796,466
Issue date
Oct 24, 2023
The Board of Regents for the Oklahoma Agricultural and Mechanical Colleges
Sabit Ekin
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for carrying out Raman spectroscopy
Patent number
11,788,967
Issue date
Oct 17, 2023
Danmarks Tekniske Universitet
Oleksii Ilchenko
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for analyzing gaseous samples
Patent number
11,774,350
Issue date
Oct 3, 2023
Teknologian tutkimuskeskus VTT Oy
Teemu Kääriäinen
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
11,768,154
Issue date
Sep 26, 2023
Shimadzu Corporation
Hideaki Katsu
G01 - MEASURING TESTING
Information
Patent Grant
Three-photon light sheet imaging
Patent number
11,762,180
Issue date
Sep 19, 2023
University Court of the University of St Andrews
Kishan Dholakia
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device and method of measuring wavefront aberration
Patent number
11,733,176
Issue date
Aug 22, 2023
Samsung Electronics Co., Ltd.
Akihiro Komatsu
G01 - MEASURING TESTING
Information
Patent Grant
Lighting systems and methods of using lighting systems for in vitro...
Patent number
11,726,079
Issue date
Aug 15, 2023
Concordia Laboratories, Inc.
Michael Scot Roberts
F21 - LIGHTING
Information
Patent Grant
Device and method for determining a concentration in a sample
Patent number
11,662,309
Issue date
May 30, 2023
Opsolution GMBH
Bjoern Magnussen
G01 - MEASURING TESTING
Information
Patent Grant
Far-infrared light source and far-infrared spectrometer
Patent number
11,644,418
Issue date
May 9, 2023
HITACHI HIGH-TECH CORPORATION
Kei Shimura
G01 - MEASURING TESTING
Information
Patent Grant
Method of phase contrasting
Patent number
11,619,581
Issue date
Apr 4, 2023
Purdue Research Foundation
Garth Jason Simpson
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for in-operating-theatre imaging of fresh tissu...
Patent number
11,609,186
Issue date
Mar 21, 2023
SamanTree Medical SA
Bastien Rachet
G01 - MEASURING TESTING
Information
Patent Grant
Spatial gradient-based fluorometer
Patent number
11,604,143
Issue date
Mar 14, 2023
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
System and method of providing incoherent coupling of a laser into...
Patent number
11,592,389
Issue date
Feb 28, 2023
NIKIRA LABS INC.
Manish Gupta
G02 - OPTICS
Information
Patent Grant
Optical gas concentration measurement apparatus
Patent number
11,573,174
Issue date
Feb 7, 2023
Advanced Energy Industries, Inc.
Alex S. Nikittin
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection device and method
Patent number
11,536,648
Issue date
Dec 27, 2022
Nederlandse Organisatie voortoegepast-natuurwetenschappelijk onderzoek TNO
Bertram Adriaan Van Der Zwan
G01 - MEASURING TESTING
Information
Patent Grant
Electronic speckle pattern interferometer (ESPI) for long-range mea...
Patent number
11,525,667
Issue date
Dec 13, 2022
United States of America as represented by the Secretary of the Air Force
Jennie Burns
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RAMAN SCATTERING FROM ORBITAL AND SPIN ANGULAR MOMENTUM IN MATERIALS
Publication number
20240133814
Publication date
Apr 25, 2024
Robert R. Alfano
G01 - MEASURING TESTING
Information
Patent Application
ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF
Publication number
20240119577
Publication date
Apr 11, 2024
Casi Vision Technology (Luoyang) Co., Ltd.
Feng Lei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20240102936
Publication date
Mar 28, 2024
YOKOGAWA ELECTRIC CORPORATION
Kodai Murayama
G01 - MEASURING TESTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HAND-HELD SCANNING PROBE AND OPTICAL SCANNING SYSTEM
Publication number
20240027331
Publication date
Jan 25, 2024
OPXION TECHNOLOGY INC.
MENG-TSAN TSAI
G01 - MEASURING TESTING
Information
Patent Application
Integrated cat's-eye tunable laser spectroscopy system and method
Publication number
20240019363
Publication date
Jan 18, 2024
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240011915
Publication date
Jan 11, 2024
SEMES CO., LTD.
Hark Ryong KIM
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME
Publication number
20230417681
Publication date
Dec 28, 2023
SAMSUNG DISPLAY CO., LTD.
SUNGWOO JUNG
G01 - MEASURING TESTING
Information
Patent Application
SINGLE SENSOR IMAGING SPECTROSCOPY FOR DETECTING NANOPARTICLES TO Q...
Publication number
20230408413
Publication date
Dec 21, 2023
Applied Materials, Inc.
Viswanath BAVIGADDA
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE APPARATUS FOR DETECTING EARLY CROP DISEASES BASED ON SPATI...
Publication number
20230326203
Publication date
Oct 12, 2023
JIANGSU UNIVERSITY
Aichen WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FOREIGN SUBSTANCE/DEFECT INSPECTION DEVICE, IMAGE GENERATION DEVICE...
Publication number
20230314334
Publication date
Oct 5, 2023
VIENEX CORPORATION
Osamu IWASAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
LINE FIELD SWEPT SOURCE OCT SYSTEM AND SPECTROSCOPY SYSTEM
Publication number
20230296508
Publication date
Sep 21, 2023
KineoLabs
Walid A. Atia
G01 - MEASURING TESTING
Information
Patent Application
MULTI-TRACK RAMAN WELL PLATE READER
Publication number
20230204515
Publication date
Jun 29, 2023
HORIBA INSTRUMENTS INCORPORATED
Nicolas VEZARD
G01 - MEASURING TESTING
Information
Patent Application
Hybrid Optical Parametrically-Oscillating Emitter
Publication number
20230194412
Publication date
Jun 22, 2023
Versitech Limited
Kenneth Kin Yip WONG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOREIGN SUBSTANCE/DEFECT INSPECTION DEVICE, IMAGE GENERATION DEVICE...
Publication number
20230175973
Publication date
Jun 8, 2023
VIENEX CORPORATION
Yukihiro KAGAWA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF PROVIDING INCOHERENT COUPLING OF A LASER INTO...
Publication number
20230168187
Publication date
Jun 1, 2023
Nikira Labs Inc.
Manish Gupta
G01 - MEASURING TESTING
Information
Patent Application
ELLIPSOMETER AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE INCL...
Publication number
20230152213
Publication date
May 18, 2023
Samsung Electronics Co., LTD
Yasuhiro HIDAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HYPERSPECTRAL IMAGING METHOD AND APPARATUS
Publication number
20230099128
Publication date
Mar 30, 2023
Chongqing Institute of East China Normal University
Heping ZENG
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL CONFOCAL MEASUREMENT DEVICE AND MEASUREMENT METHOD THEREOF
Publication number
20230087237
Publication date
Mar 23, 2023
ALEADER VISION TECHNOLOGY CO., LTD.
Jinfeng Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL
Publication number
20230087046
Publication date
Mar 23, 2023
SCHOTT AG
Thomas Korb
G01 - MEASURING TESTING
Information
Patent Application
DOWNHOLE LASER SYSTEM WITH AN IMPROVED LASER OUTPUT PRODUCTION AND...
Publication number
20220407283
Publication date
Dec 22, 2022
UNITED STATES DEPARTMENT OF ENERGY
Dustin McIntyre
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER
Publication number
20220397531
Publication date
Dec 15, 2022
University of South Carolina
STANLEY MICHAEL ANGEL
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ILLUMINATING A SUBSTRATE USING MULTIPLE ACOUTSO OPTICAL...
Publication number
20220373858
Publication date
Nov 24, 2022
APPLIED MATERIALS ISRAEL LTD.
Menachem Lapid
G02 - OPTICS
Information
Patent Application
DIFFRACTIVE IMAGING MAGNETO-OPTICAL SYSTEM
Publication number
20220373452
Publication date
Nov 24, 2022
Rensselaer Polytechnic Institute
Edwin Fohtung
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ANALYZING GASEOUS SAMPLES
Publication number
20220364984
Publication date
Nov 17, 2022
Teknologian Tutkimuskeskus VTT Oy
Teemu KÄÄRIÄINEN
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC DISPLAY PIXEL INSPECTION SYSTEM AND METHOD
Publication number
20220284559
Publication date
Sep 8, 2022
LG ELECTRONICS INC.
Seunghwan SEOK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE AND METHOD OF MEASURING WAVEFRONT ABERRATION
Publication number
20220268709
Publication date
Aug 25, 2022
Samsung Electronics Co., Ltd.
AKIHIRO KOMATSU
G01 - MEASURING TESTING
Information
Patent Application
Fourier Transform Infrared Spectrophotometer
Publication number
20220260485
Publication date
Aug 18, 2022
Shimadzu Corporation
Hideaki KATSU
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF PROVIDING INCOHERENT COUPLING OF A LASER INTO...
Publication number
20220244172
Publication date
Aug 4, 2022
Nikira Labs Inc.
Manish Gupta
G02 - OPTICS
Information
Patent Application
OPTICAL GAS CONCENTRATION MEASUREMENT APPARATUS
Publication number
20220236173
Publication date
Jul 28, 2022
Advanced Energy Industries, Inc.
Alex S. Nikittin
G01 - MEASURING TESTING