Membership
Tour
Register
Log in
Directional selective optics
Follow
Industry
CPC
G01N2021/8905
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/8905
Directional selective optics
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Detection and characterization of defects in pharmaceutical cylindr...
Patent number
11,841,327
Issue date
Dec 12, 2023
SCHOTT Pharma Schweiz AG
Daniel Willmes
G01 - MEASURING TESTING
Information
Patent Grant
Optical testing apparatus
Patent number
11,635,374
Issue date
Apr 25, 2023
Advantest Corporation
Toshihiro Sugawara
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection system and method using multiple light sources a...
Patent number
11,169,095
Issue date
Nov 9, 2021
BOBST MEX SA
Matthieu Richard
G01 - MEASURING TESTING
Information
Patent Grant
Quality control station for a sheet element processing machine and...
Patent number
10,571,405
Issue date
Feb 25, 2020
BOBST MEX SA
Matthieu Richard
G01 - MEASURING TESTING
Information
Patent Grant
Sheet type detection device that determines thickness and surface r...
Patent number
8,068,237
Issue date
Nov 29, 2011
Canon Kabushiki Kaisha
Masahiro Kurahashi
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Apparatus for detection of the accuracy of format of a web of corru...
Patent number
7,952,714
Issue date
May 31, 2011
BHS Corrugated Machinen-und Anlagenbau
Helmut Kraus
B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information
Patent Grant
Optical sensor and method for optically inspecting surfaces
Patent number
7,538,866
Issue date
May 26, 2009
Siemens Aktiengesellschaft
Wolfgang Heine
G01 - MEASURING TESTING
Information
Patent Grant
Dual level out-of-focus light source for amplification of defects o...
Patent number
7,105,848
Issue date
Sep 12, 2006
Wintriss Engineering Corporation
Sujoy Guha
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for determining surface feature characteristics u...
Patent number
7,102,740
Issue date
Sep 5, 2006
Xyratex Technology Ltd.
Bryan Clark
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting semiconductor integrated circuit which can qui...
Patent number
6,954,274
Issue date
Oct 11, 2005
NEC Electronics Corporation
Yoshihiro Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel inspection and imaging system
Patent number
6,578,961
Issue date
Jun 17, 2003
KLA-Tencor Corporation
Mehdi Vaez-Iravani
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel inspection and imaging system
Patent number
6,208,411
Issue date
Mar 27, 2001
KLA-Tencor Corporation
Mehdi Vaez-Iravani
G01 - MEASURING TESTING
Information
Patent Grant
Inspecting device for inspecting printed state of cream solder
Patent number
5,450,204
Issue date
Sep 12, 1995
Sharp Kabushiki Kaisha
Yoshihide Shigeyama
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus and method
Patent number
5,225,890
Issue date
Jul 6, 1993
GenCorp Inc.
Ching-Chih Lee
G01 - MEASURING TESTING
Information
Patent Grant
Surface inspection apparatus
Patent number
5,074,668
Issue date
Dec 24, 1991
Kabushiki Kaisha Toshiba
Chiaki Fukazawa
G01 - MEASURING TESTING
Information
Patent Grant
Surface state inspecting device for inspecting the state of paralle...
Patent number
4,999,511
Issue date
Mar 12, 1991
Canon Kabushiki Kaisha
Michio Kohno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION AND CHARACTERIZATION OF DEFECTS IN PHARMACEUTICAL CYLINDR...
Publication number
20210231576
Publication date
Jul 29, 2021
Schott Schweiz AG
Daniel Willmes
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL TESTING APPARATUS
Publication number
20200355608
Publication date
Nov 12, 2020
Advantest Corporation
Toshihiro SUGAWARA
G01 - MEASURING TESTING
Information
Patent Application
MULTI-RESOLUTION SPECTROMETER
Publication number
20190360921
Publication date
Nov 28, 2019
Nuctech Company Limited
Haihui LIU
G01 - MEASURING TESTING
Information
Patent Application
SURFACE INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20190178812
Publication date
Jun 13, 2019
BOBST MEX SA
Matthieu RICHARD
G01 - MEASURING TESTING
Information
Patent Application
QUALITY CONTROL STATION FOR A SHEET ELEMENT PROCESSING MACHINE AND...
Publication number
20190154589
Publication date
May 23, 2019
BOBST MEX SA
Matthieu RICHARD
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR DETECTION OF THE ACCURACY OF FORMAT OF A WEB OF CORRU...
Publication number
20090091761
Publication date
Apr 9, 2009
BHS Corrugated Maschinen-und Anlagenbau GmbH
Helmut KRAUS
B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information
Patent Application
Optical sensor and method for optically inspecting surfaces
Publication number
20070252976
Publication date
Nov 1, 2007
Siemens Aktiengesellschaft
Wolfgang Heine
G01 - MEASURING TESTING
Information
Patent Application
Sheet-type detection device
Publication number
20050280687
Publication date
Dec 22, 2005
Canon Kabushiki Kaisha
Masahiro Kurahashi
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
Method and apparatus for detecting defects
Publication number
20050264797
Publication date
Dec 1, 2005
Hiroyuki Nakano
G01 - MEASURING TESTING
Information
Patent Application
Method and system for determining surface feature characteristics u...
Publication number
20050046829
Publication date
Mar 3, 2005
Bryan Clark
G01 - MEASURING TESTING
Information
Patent Application
Dual level out-of-focus light source for amplification of defects o...
Publication number
20040000652
Publication date
Jan 1, 2004
Sujoy Guha
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of inspecting semiconductor integrated circuit which can qui...
Publication number
20020140949
Publication date
Oct 3, 2002
NEC Corporation
Yoshihiro Sasaki
G01 - MEASURING TESTING
Information
Patent Application
Massively parallel inspection and imaging system
Publication number
20010048521
Publication date
Dec 6, 2001
KLA-Tencor Corporation
Mehdi Vaez-Iravani
G01 - MEASURING TESTING