Dispersive element for generating dispersion

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G01B2290/20

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GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02

Current Industry

G01B2290/20Dispersive element for generating dispersion

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Broadband interferometry and method for measurement range extension...
- Patent number 12,196,551
- Issue date Jan 14, 2025
- Automated Precision Inc.
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for detecting light
- Patent number 12,072,188
- Issue date Aug 27, 2024
- PANTECH CORPORATION
- Xin Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and optical instrument with integrated optical compo...
- Patent number 11,933,609
- Issue date Mar 19, 2024
- Yokogawa Electric Corporation
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 11,680,787
- Issue date Jun 20, 2023
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 11,320,253
- Issue date May 3, 2022
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed wide field autocollimator
- Patent number 11,204,234
- Issue date Dec 21, 2021
- Raytheon Company
- Kyle Heideman
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne laser interferometer based on integrated secondary beam...
- Patent number 11,150,077
- Issue date Oct 19, 2021
- Harbin Institute of Technology
- Pengcheng Hu
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 10,809,050
- Issue date Oct 20, 2020
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grating measurement apparatus
- Patent number 10,571,245
- Issue date Feb 25, 2020
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Ping Wu
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measuring apparatus using diffraction grating
- Patent number 10,533,844
- Issue date Jan 14, 2020
- Koh Young Technology Inc.
- Jang Il Ser
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry with pulse broadened diode laser
- Patent number 10,495,439
- Issue date Dec 3, 2019
- Carl Zeiss Meditec, Inc.
- Alexandre R. Tumlinson
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device with controlled heat generation
- Patent number 10,451,401
- Issue date Oct 22, 2019
- DMG MORI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Optical imaging device and method for imaging a sample
- Patent number 10,398,306
- Issue date Sep 3, 2019
- Nanyang Technological University
- Linbo Liu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric apparatus and sample characteristic determining app...
- Patent number 9,945,655
- Issue date Apr 17, 2018
- University of Huddersfield
- Jiang Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for optical amplified imaging using a two-dimensional spect...
- Patent number 9,835,840
- Issue date Dec 5, 2017
- The Regents of the University of California
- Bahram Jalali
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography technique
- Patent number 9,562,759
- Issue date Feb 7, 2017
- Wavelight GmbH
- Klaus Vogler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometry employing refractive index dispersion broadening of...
- Patent number 9,377,292
- Issue date Jun 28, 2016
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative phase microscopy for high-contrast cell imaging using...
- Patent number 9,097,900
- Issue date Aug 4, 2015
- General Electric Company
- Evgenia Mikhailovna Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of adjusting a field of view of an interferometri...
- Patent number 8,804,133
- Issue date Aug 12, 2014
- Technion Research & Development Foundation Limited
- Dvir Yelin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical frequency domain tomography with adjusting sy...
- Patent number 8,570,525
- Issue date Oct 29, 2013
- Optopol Technology S.A.
- Pawel Wojdas
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multiple measuring point configuration for a chromatic point sensor
- Patent number 8,456,637
- Issue date Jun 4, 2013
- Mitutoyo Corporation
- Casey Edward Emtman
- G01 - MEASURING TESTING
Information Patent Grant
Methods for optical amplified imaging using a two-dimensional spect...
- Patent number 8,440,952
- Issue date May 14, 2013
- The Regents of the University of California
- Bahram Jalali
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measuring instrument using both reflectometry and white-lig...
- Patent number 8,416,399
- Issue date Apr 9, 2013
- Robert Bosch GmbH
- Jochen Straehle
- G01 - MEASURING TESTING
Information Patent Grant
Cross-chirped interferometry system and method for light detection...
- Patent number 8,094,292
- Issue date Jan 10, 2012
- Institut National de la Recherche Scientifique
- Yongwoo Park
- G01 - MEASURING TESTING
Information Patent Grant
Surface characteristic determining apparatus
- Patent number 8,077,324
- Issue date Dec 13, 2011
- University of Huddersfield of Queensgate
- Jiang Xiangqian
- G01 - MEASURING TESTING
Information Patent Grant
Even frequency spacing spectrometer and optical coherence tomograph...
- Patent number 7,929,134
- Issue date Apr 19, 2011
- Case Western Reserve University
- Zhilin Hu
- G01 - MEASURING TESTING
Information Patent Grant
Tracking algorithm for linear array signal processor for Fabry-Pero...
- Patent number 7,639,368
- Issue date Dec 29, 2009
- Halliburton Energy Services, Inc.
- David B. Needham
- G01 - MEASURING TESTING
Information Patent Grant
Methods of testing and manufacturing optical elements
- Patent number 7,602,502
- Issue date Oct 13, 2009
- Carl Zeiss SMT AG
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric measuring device
- Patent number 7,518,729
- Issue date Apr 14, 2009
- Robert Bosch GmbH
- Pawel Drabarek
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive scanning delay line for optical coherence tomography
- Patent number 7,417,741
- Issue date Aug 26, 2008
- OTI Ophthalmic Technologies Inc.
- Adrian Gh. Podoleanu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...
- Publication number 20230324165
- Publication date Oct 12, 2023
- Automated Precision Inc.
- Yongwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20220268565
- Publication date Aug 25, 2022
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETER AND OPTICAL INSTRUMENT
- Publication number 20220196381
- Publication date Jun 23, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Nobuhide Yamada
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20210018311
- Publication date Jan 21, 2021
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Heterodyne Laser Interferometer Based on Integrated Secondary Beam...
- Publication number 20200386533
- Publication date Dec 10, 2020
- HARBIN INSTITUTE OF TECHNOLOGY
- Pengcheng HU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20200064117
- Publication date Feb 27, 2020
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- G01 - MEASURING TESTING
Information Patent Application
GRATING MEASUREMENT APPARATUS
- Publication number 20190310072
- Publication date Oct 10, 2019
- SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Ping WU
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY WITH PULSE BROADENED DIODE LASER
- Publication number 20180259316
- Publication date Sep 13, 2018
- Carl Zeiss Meditec, Inc.
- Alexandre R. TUMLINSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFEROMETRIC APPARATUS AND SAMPLE CHARACTERISTIC DETERMINING APP...
- Publication number 20150338202
- Publication date Nov 26, 2015
- University of Huddersfield
- Jiang Xiang
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR OPTICAL AMPLIFIED IMAGING USING A TWO-DIMENSIONAL SPECT...
- Publication number 20140313310
- Publication date Oct 23, 2014
- Bahram Jalali
- G02 - OPTICS
Information Patent Application
QUANTITATIVE PHASE MICROSCOPY FOR HIGH-CONTRAST CELL IMAGING USING...
- Publication number 20130335548
- Publication date Dec 19, 2013
- GENERAL ELECTRIC COMPANY
- Evgenia Mikhailovna Kim
- G02 - OPTICS
Information Patent Application
MULTIPLE MEASURING POINT CONFIGURATION FOR A CHROMATIC POINT SENSOR
- Publication number 20120050722
- Publication date Mar 1, 2012
- Mitutoyo Corporation
- Casey Edward Emtman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF ADJUSTING A FIELD OF VIEW OF AN INTERFEROMETRI...
- Publication number 20100315652
- Publication date Dec 16, 2010
- Technion Research & Development Foundation Ltd.
- Dvir YELIN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20100183188
- Publication date Jul 22, 2010
- Jochen STRAEHLE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR OPTICALLY AMPLIFIED IMAGING
- Publication number 20100141829
- Publication date Jun 10, 2010
- The Regents of the University of California
- Bahram Jalali
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CROSS-CHIRPED INTERFEROMETRY SYSTEM AND METHOD FOR LIGHT DETECTION...
- Publication number 20100118292
- Publication date May 13, 2010
- Yongwoo PARK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR OPTICAL FREQUENCY DOMAIN TOMOGRAPHY WITH ADJUSTING SY...
- Publication number 20090262359
- Publication date Oct 22, 2009
- OPTOPOL TECHNOLOGY S.A.
- Tomasz Bajraszewski
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SURFACE CHARACTERISTIC DETERMINING APPARATUS
- Publication number 20090207416
- Publication date Aug 20, 2009
- Jiang Xiangqian
- G01 - MEASURING TESTING
Information Patent Application
Even frequency spacing spectrometer and optical coherence tomograph...
- Publication number 20090040521
- Publication date Feb 12, 2009
- Zhilin Hu
- G01 - MEASURING TESTING
Information Patent Application
Methods of testing and manufacturing optical elements
- Publication number 20080316500
- Publication date Dec 25, 2008
- Carl Zeiss SMT AG
- Stefan Schulte
- G01 - MEASURING TESTING
Information Patent Application
Interferometric measuring device
- Publication number 20070229840
- Publication date Oct 4, 2007
- Pawel Drabarek
- G01 - MEASURING TESTING
Information Patent Application
Tracking algorithm for linear array signal processor for fabry-pero...
- Publication number 20070064241
- Publication date Mar 22, 2007
- David B. Needham
- G01 - MEASURING TESTING
Information Patent Application
Transmissive scanning delay line
- Publication number 20060055938
- Publication date Mar 16, 2006
- OTI Ophthalmic Technologies Inc.
- Adrian Gh. Podoleanu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Low-coherence inferometric device for light-optical scanning of an...
- Publication number 20050190371
- Publication date Sep 1, 2005
- Alexander Knuttel
- G01 - MEASURING TESTING
Information Patent Application
Heterodyne lateral grating interferometric encoder
- Publication number 20040184037
- Publication date Sep 23, 2004
- Steven E. Muenter
- G01 - MEASURING TESTING
Information Patent Application
Rapid depth scanning optical imaging device
- Publication number 20040109164
- Publication date Jun 10, 2004
- Olympus Optical Co., Ltd.
- Akihiro Horii
- G01 - MEASURING TESTING
Information Patent Application
Grating based phase control optical delay line
- Publication number 20010036002
- Publication date Nov 1, 2001
- Guillermo Tearney
- B82 - NANO-TECHNOLOGY

Dispersive element for generating dispersion

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Broadband interferometry and method for measurement range extension...

Apparatus, systems and methods for detecting light

Interferometer and optical instrument with integrated optical compo...

Interferometry with pulse broadened diode laser

Interferometry with pulse broadened diode laser

High speed wide field autocollimator

Heterodyne laser interferometer based on integrated secondary beam...

Interferometry with pulse broadened diode laser

Grating measurement apparatus

Three-dimensional shape measuring apparatus using diffraction grating

Interferometry with pulse broadened diode laser

Displacement detecting device with controlled heat generation

Optical imaging device and method for imaging a sample

Interferometric apparatus and sample characteristic determining app...

Methods for optical amplified imaging using a two-dimensional spect...

Optical coherence tomography technique

Interferometry employing refractive index dispersion broadening of...

Quantitative phase microscopy for high-contrast cell imaging using...

Method and system of adjusting a field of view of an interferometri...

Apparatus for optical frequency domain tomography with adjusting sy...

Multiple measuring point configuration for a chromatic point sensor

Methods for optical amplified imaging using a two-dimensional spect...

Optical measuring instrument using both reflectometry and white-lig...

Cross-chirped interferometry system and method for light detection...

Surface characteristic determining apparatus

Even frequency spacing spectrometer and optical coherence tomograph...

Tracking algorithm for linear array signal processor for Fabry-Pero...

Methods of testing and manufacturing optical elements

Interferometric measuring device

Transmissive scanning delay line for optical coherence tomography

Patents Applicationslast 30 patents

BROADBAND INTERFEROMETRY AND METHOD FOR MEASUREMENT RANGE EXTENSION...

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

INTERFEROMETER AND OPTICAL INSTRUMENT

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

Heterodyne Laser Interferometer Based on Integrated Secondary Beam...

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

GRATING MEASUREMENT APPARATUS

INTERFEROMETRY WITH PULSE BROADENED DIODE LASER

INTERFEROMETRIC APPARATUS AND SAMPLE CHARACTERISTIC DETERMINING APP...

METHODS FOR OPTICAL AMPLIFIED IMAGING USING A TWO-DIMENSIONAL SPECT...

QUANTITATIVE PHASE MICROSCOPY FOR HIGH-CONTRAST CELL IMAGING USING...

MULTIPLE MEASURING POINT CONFIGURATION FOR A CHROMATIC POINT SENSOR

METHOD AND SYSTEM OF ADJUSTING A FIELD OF VIEW OF AN INTERFEROMETRI...

OPTICAL MEASURING DEVICE

APPARATUS AND METHOD FOR OPTICALLY AMPLIFIED IMAGING

CROSS-CHIRPED INTERFEROMETRY SYSTEM AND METHOD FOR LIGHT DETECTION...

APPARATUS FOR OPTICAL FREQUENCY DOMAIN TOMOGRAPHY WITH ADJUSTING SY...

SURFACE CHARACTERISTIC DETERMINING APPARATUS

Even frequency spacing spectrometer and optical coherence tomograph...

Methods of testing and manufacturing optical elements

Interferometric measuring device

Tracking algorithm for linear array signal processor for fabry-pero...

Transmissive scanning delay line

Low-coherence inferometric device for light-optical scanning of an...

Heterodyne lateral grating interferometric encoder

Rapid depth scanning optical imaging device

Grating based phase control optical delay line