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Patents Grantslast 30 patents

Information Patent Grant
Redundancy analysis method and redundancy analysis apparatus
- Patent number 11,631,474
- Issue date Apr 18, 2023
- UIF (University Industry Foundation), Yonsei University
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analyzing apparatus and failure analyzing method
- Patent number 11,162,995
- Issue date Nov 2, 2021
- TOSHIBA MEMORY CORPORATION
- Yukinobu Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Artificial intelligence based monitoring of solid state drives and...
- Patent number 10,930,365
- Issue date Feb 23, 2021
- Intel Corporation
- Pavel Poliakov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Receiver equalization and stressed eye testing system
- Patent number 10,859,626
- Issue date Dec 8, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, image sensing apparatus, electronic equipment...
- Patent number 10,650,905
- Issue date May 12, 2020
- Canon Kabushiki Kaisha
- Koichi Iwao
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Arithmetic processing device storing diagnostic results in parallel...
- Patent number 10,248,479
- Issue date Apr 2, 2019
- Fujitsu Limited
- Makoto Suga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory repairing method and memory device applying the same
- Patent number 9,870,835
- Issue date Jan 16, 2018
- Macronix International Co., Ltd.
- Shih-Hung Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test system and method of testing memory device
- Patent number 9,859,023
- Issue date Jan 2, 2018
- Samsung Electronics Co., Ltd.
- Dong-Wook Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module status indication
- Patent number 9,514,846
- Issue date Dec 6, 2016
- Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
- Tsung-Hsuan Hsieh
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and devices for determining logical to physical mapping on...
- Patent number 9,378,848
- Issue date Jun 28, 2016
- Texas Instruments Incorporated
- Stanton Petree Ashburn
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair categorization tracking
- Patent number 9,305,664
- Issue date Apr 5, 2016
- Texas Instruments Incorporated
- Beena Pious
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device failure analysis system and semiconductor memo...
- Patent number 9,128,143
- Issue date Sep 8, 2015
- Kabushiki Kaisha Toshiba
- Mami Kodama
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for diagnosing a fault of a memory using inter...
- Patent number 8,762,926
- Issue date Jun 24, 2014
- Kabushiki Kaisha Toshiba
- Hiroshi Nakatani
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for verifying memory testing software
- Patent number 8,595,557
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Eric Jasinski
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analysis method, failure analysis apparatus, and computer p...
- Patent number 8,316,264
- Issue date Nov 20, 2012
- Kabushiki Kaisha Toshiba
- Yoshikazu Iizuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 8,190,952
- Issue date May 29, 2012
- Rudolph Technologies, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for performing a double pass NTH fail bitmap of a...
- Patent number 7,930,602
- Issue date Apr 19, 2011
- GLOBALFOUNDRIES Inc.
- Debaleena Das
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and method of repairing SDRAM by generating slicing table...
- Patent number 7,925,938
- Issue date Apr 12, 2011
- Geneticware Co. Ltd.
- Chien-Tzu Hou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing device and method of testing semiconductor me...
- Patent number 7,733,721
- Issue date Jun 8, 2010
- Advantest Corporation
- Makoto Tabata
- G11 - INFORMATION STORAGE
Information Patent Grant
Operating voltage tuning method for static random access memory
- Patent number 7,715,260
- Issue date May 11, 2010
- United Microelectronics Corp.
- Chien-Li Kuo
- G11 - INFORMATION STORAGE
Information Patent Grant
Bitmap cluster analysis of defects in integrated circuits
- Patent number 7,685,481
- Issue date Mar 23, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G11 - INFORMATION STORAGE
Information Patent Grant
Test data reporting and analyzing using data array and related data...
- Patent number 7,543,198
- Issue date Jun 2, 2009
- International Business Machines Corporation
- William J. Ferrante
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage of descriptive information in user defined fields of failur...
- Patent number 7,529,988
- Issue date May 5, 2009
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory error ranking
- Patent number 7,493,534
- Issue date Feb 17, 2009
- Hewlett-Packard Development Company, L.P.
- Ken Gary Pomaranski
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic memory which compares compressed fault maps
- Patent number 7,472,330
- Issue date Dec 30, 2008
- Samsung Electronics Co., Ltd.
- Jonathan Jedwab
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic bit fail mapping for embedded memories with clock multipl...
- Patent number 7,444,564
- Issue date Oct 28, 2008
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible memory built-in-self-test (MBIST) method and apparatus
- Patent number 7,434,131
- Issue date Oct 7, 2008
- Nilanjan Mukherjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable memory built-in-self-test (MBIST) method and apparatus
- Patent number 7,428,680
- Issue date Sep 23, 2008
- Nilanjan Mukherjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing memory built-in-self-test (MBIST)
- Patent number 7,426,668
- Issue date Sep 16, 2008
- Nilanjan Mukherjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test apparatus
- Patent number 7,388,393
- Issue date Jun 17, 2008
- Advantest Corporation
- Kazuhiro Yamamoto
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE
- Publication number 20240212783
- Publication date Jun 27, 2024
- KINGTIGER Testing Technology (SZ) Ltd.
- Bosco Chun Sang LAI
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY
- Publication number 20240185944
- Publication date Jun 6, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Chingching Shih
- G11 - INFORMATION STORAGE
Information Patent Application
REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS
- Publication number 20220130486
- Publication date Apr 28, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sung Ho Kang
- G11 - INFORMATION STORAGE
Information Patent Application
RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM
- Publication number 20200025824
- Publication date Jan 23, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYZING APPARATUS AND FAILURE ANALYZING METHOD
- Publication number 20190285686
- Publication date Sep 19, 2019
- Toshiba Memory Corporation
- Yukinobu HAYASHIDA
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER BASED MEMORY EVALUATION
- Publication number 20150026530
- Publication date Jan 22, 2015
- SANDISK TECHNOLOGIES INC.
- Manuel A. d'Abreu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE STATUS INDICATION
- Publication number 20140223032
- Publication date Aug 7, 2014
- International Business Machines Corporation
- Tsung-Hsuan Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DIAGNOSING A FAULT OF A MEMORY USING INTER...
- Publication number 20140095949
- Publication date Apr 3, 2014
- Kabushiki Kaisha Toshiba
- Hiroshi NAKATANI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...
- Publication number 20140043360
- Publication date Feb 13, 2014
- Kabushiki Kaisha Toshiba
- Mami KODAMA
- G01 - MEASURING TESTING
Information Patent Application
Methods And Devices For Determining Logical To Physical Mapping On...
- Publication number 20130329508
- Publication date Dec 12, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Stanton Petree Ashburn
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL FAIL ADDRESS GENERATION SYSTEM, REDUNDANCY ANALYSIS SIMULAT...
- Publication number 20130311831
- Publication date Nov 21, 2013
- Samsung Electronics Co., Ltd.
- Yoonna Oh
- G01 - MEASURING TESTING
Information Patent Application
FAILURE ANALYSIS METHOD, FAILURE ANALYSIS APPARATUS, AND COMPUTER P...
- Publication number 20110154138
- Publication date Jun 23, 2011
- Yoshikazu Iizuka
- G11 - INFORMATION STORAGE
Information Patent Application
BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20100235690
- Publication date Sep 16, 2010
- MKS Instruments, Inc.
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING A DOUBLE PASS NTH FAIL BITMAP OF A...
- Publication number 20100218056
- Publication date Aug 26, 2010
- Debaleena Das
- G11 - INFORMATION STORAGE
Information Patent Application
Single event upset (SEU) testing system and method
- Publication number 20100163756
- Publication date Jul 1, 2010
- Custom Test Systems, LLC.
- Richard McPeak
- G01 - MEASURING TESTING
Information Patent Application
OPERATING VOLTAGE TUNING METHOD FOR STATIC RANDOM ACCESS MEMORY
- Publication number 20100135093
- Publication date Jun 3, 2010
- United Microelectronics Corp.
- Chien-Li Kuo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor testing device and method of testing semiconductor me...
- Publication number 20100034037
- Publication date Feb 11, 2010
- Makota Tabata
- G11 - INFORMATION STORAGE
Information Patent Application
Methods of memory bitmap verification for finished product
- Publication number 20070124628
- Publication date May 31, 2007
- LSI Logic Corporation
- David T. Price
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DATA REPORTING AND ANALYZING USING DATA ARRAY AND RELATED DATA...
- Publication number 20070113134
- Publication date May 17, 2007
- International Business Machines Corporation
- William J. Ferrante
- G01 - MEASURING TESTING
Information Patent Application
Process for conducting high-speed bitmapping of memory cells during...
- Publication number 20070061637
- Publication date Mar 15, 2007
- LSI Logic Corporation
- Mark A. Ward
- G11 - INFORMATION STORAGE
Information Patent Application
Bitmap cluster analysis of defects in integrated circuits
- Publication number 20070011509
- Publication date Jan 11, 2007
- Tom T. Ho
- G01 - MEASURING TESTING
Information Patent Application
System and method for analyzing electrical failure data
- Publication number 20060265156
- Publication date Nov 23, 2006
- Micron Technology, Inc.
- Xueqing Sun
- G01 - MEASURING TESTING
Information Patent Application
Method and system for BitMap Analysis System for high speed testing...
- Publication number 20060248414
- Publication date Nov 2, 2006
- Prashant Dubey
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR VERIFYING MEMORY TESTING SOFTWARE
- Publication number 20060190788
- Publication date Aug 24, 2006
- International Business Machines Corporation
- Eric Jasinski
- G11 - INFORMATION STORAGE
Information Patent Application
Flexible memory built-in-self-test (MBIST) method and apparatus
- Publication number 20060156133
- Publication date Jul 13, 2006
- Nilanjan Mukherjee
- G01 - MEASURING TESTING
Information Patent Application
Programmable memory built-in-self-test (MBIST) method and apparatus
- Publication number 20060156134
- Publication date Jul 13, 2006
- Nilanjan Mukherjee
- G01 - MEASURING TESTING
Information Patent Application
Performing memory built-in-self-test (MBIST)
- Publication number 20060146622
- Publication date Jul 6, 2006
- Nilanjan Mukherjee
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device and method for testing same
- Publication number 20060067135
- Publication date Mar 30, 2006
- Matsushita Electric Industrial Co., Ltd.
- Kenji Motomochi
- G11 - INFORMATION STORAGE
Information Patent Application
Method of and system for analyzing cells of a memory device
- Publication number 20050149285
- Publication date Jul 7, 2005
- Joerg Wohlfahrt
- G11 - INFORMATION STORAGE

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Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Redundancy analysis method and redundancy analysis apparatus

Failure analyzing apparatus and failure analyzing method

Artificial intelligence based monitoring of solid state drives and...

Receiver equalization and stressed eye testing system

Inspection apparatus, image sensing apparatus, electronic equipment...

Arithmetic processing device storing diagnostic results in parallel...

Memory repairing method and memory device applying the same

Memory test system and method of testing memory device

Memory module status indication

Methods and devices for determining logical to physical mapping on...

Memory repair categorization tracking

Semiconductor device failure analysis system and semiconductor memo...

Method and apparatus for diagnosing a fault of a memory using inter...

Method and apparatus for verifying memory testing software

Failure analysis method, failure analysis apparatus, and computer p...

Bitmap cluster analysis of defects in integrated circuits

Method and system for performing a double pass NTH fail bitmap of a...

Structure and method of repairing SDRAM by generating slicing table...

Semiconductor testing device and method of testing semiconductor me...

Operating voltage tuning method for static random access memory

Bitmap cluster analysis of defects in integrated circuits

Test data reporting and analyzing using data array and related data...

Storage of descriptive information in user defined fields of failur...

Memory error ranking

Magnetic memory which compares compressed fault maps

Automatic bit fail mapping for embedded memories with clock multipl...

Flexible memory built-in-self-test (MBIST) method and apparatus

Programmable memory built-in-self-test (MBIST) method and apparatus

Performing memory built-in-self-test (MBIST)

Semiconductor test apparatus

Patents Applicationslast 30 patents

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE

FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY

REDUDANCY ANALYSIS METHOD AND REDUDANCY ANALYSIS APPARATUS

RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM

FAILURE ANALYZING APPARATUS AND FAILURE ANALYZING METHOD

CONTROLLER BASED MEMORY EVALUATION

MEMORY MODULE STATUS INDICATION

METHOD AND APPARATUS FOR DIAGNOSING A FAULT OF A MEMORY USING INTER...

SEMICONDUCTOR DEVICE FAILURE ANALYSIS SYSTEM AND SEMICONDUCTOR MEMO...

Methods And Devices For Determining Logical To Physical Mapping On...

VIRTUAL FAIL ADDRESS GENERATION SYSTEM, REDUNDANCY ANALYSIS SIMULAT...

FAILURE ANALYSIS METHOD, FAILURE ANALYSIS APPARATUS, AND COMPUTER P...

BITMAP CLUSTER ANALYSIS OF DEFECTS IN INTEGRATED CIRCUITS

METHOD AND SYSTEM FOR PERFORMING A DOUBLE PASS NTH FAIL BITMAP OF A...

Single event upset (SEU) testing system and method

OPERATING VOLTAGE TUNING METHOD FOR STATIC RANDOM ACCESS MEMORY

Semiconductor testing device and method of testing semiconductor me...

Methods of memory bitmap verification for finished product

TEST DATA REPORTING AND ANALYZING USING DATA ARRAY AND RELATED DATA...

Process for conducting high-speed bitmapping of memory cells during...

Bitmap cluster analysis of defects in integrated circuits

System and method for analyzing electrical failure data

Method and system for BitMap Analysis System for high speed testing...

METHOD AND APPARATUS FOR VERIFYING MEMORY TESTING SOFTWARE

Flexible memory built-in-self-test (MBIST) method and apparatus

Programmable memory built-in-self-test (MBIST) method and apparatus

Performing memory built-in-self-test (MBIST)

Semiconductor memory device and method for testing same

Method of and system for analyzing cells of a memory device