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PHYSICS
G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
G01Q30/00
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus
Current Industry
G01Q30/04
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Patents Grants
last 30 patents
Information
Patent Grant
Device and method for operating a bending beam in a closed control...
Patent number
11,965,910
Issue date
Apr 23, 2024
Carl Zeiss SMT GmbH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,940,461
Issue date
Mar 26, 2024
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for referencing a near-field measurement with drift and fluc...
Patent number
11,899,041
Issue date
Feb 13, 2024
ATTOCUBE SYSTEMS AG
Ivan Malovichko
G01 - MEASURING TESTING
Information
Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
Patent number
11,860,187
Issue date
Jan 2, 2024
Dalian University of Technology
Wei Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
Patent number
11,839,709
Issue date
Dec 12, 2023
Fresenius Medical Care Holdings, Inc.
Stephen Merchant
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Characterization of nanoindented and scratch induced accoustic events
Patent number
11,835,546
Issue date
Dec 5, 2023
Nanometronix LLC
Antanas Daugela
G01 - MEASURING TESTING
Information
Patent Grant
Atomic-force microscopy for identification of surfaces
Patent number
11,796,564
Issue date
Oct 24, 2023
Trustees of Tufts College
Igor Sokolov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
Patent number
11,733,186
Issue date
Aug 22, 2023
Carl Zeiss SMT GmbH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Computerized creation of measurement plans and plan-based control o...
Patent number
11,719,534
Issue date
Aug 8, 2023
Carl Zeiss Industrielle Messtechnik GmbH
Markus Ritter
G01 - MEASURING TESTING
Information
Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
Patent number
11,656,244
Issue date
May 23, 2023
Bruker Nano GmbH
Wolfgang Dobler
G01 - MEASURING TESTING
Information
Patent Grant
Battery electrode analysis method
Patent number
11,650,223
Issue date
May 16, 2023
LG Energy Solution, Ltd.
Byung Hee Choi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated optimization of AFM light source positioning
Patent number
11,644,478
Issue date
May 9, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,635,449
Issue date
Apr 25, 2023
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Device and method for operating a bending beam in a closed control...
Patent number
11,630,124
Issue date
Apr 18, 2023
Carl Zeiss SMT GmbH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
Patent number
11,562,289
Issue date
Jan 24, 2023
KLA Corporation
Song Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
Patent number
11,524,102
Issue date
Dec 13, 2022
Fresenius Medical Care Holdings, Inc.
Stephen Merchant
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for tailoring dialysis treatment based on sensed potassium c...
Patent number
11,491,267
Issue date
Nov 8, 2022
Fresenius Medical Care Holdings, Inc.
Stephen Merchant
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for providing a probe device for scanning probe microscopy
Patent number
11,480,588
Issue date
Oct 25, 2022
Nanotools GmbH
Bernd Irmer
G01 - MEASURING TESTING
Information
Patent Grant
Observation method and observation device
Patent number
11,422,110
Issue date
Aug 23, 2022
National University Corporation Kobe University
Kenjiro Kimura
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and setting method thereof
Patent number
11,391,755
Issue date
Jul 19, 2022
Hitachi High-Tech Science Corporation
Masatsugu Shigeno
G01 - MEASURING TESTING
Information
Patent Grant
Characterization of nanoindentation induced acoustic events
Patent number
11,346,857
Issue date
May 31, 2022
Nanometronix LLC
Antanas Daugela
G01 - MEASURING TESTING
Information
Patent Grant
Pan-sharpening for microscopy
Patent number
11,313,878
Issue date
Apr 26, 2022
UT-Battelle, LLC
Olga S. Ovchinnikova
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for analyzing spatial resolution of microwave nea...
Patent number
11,307,219
Issue date
Apr 19, 2022
Xidian University
Xiaolong Chen
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,307,220
Issue date
Apr 19, 2022
BRUKER NANO
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Automated detection of artifacts in scan image
Patent number
11,288,809
Issue date
Mar 29, 2022
Seagate Technology LLC
Zhiyu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
Patent number
11,226,285
Issue date
Jan 18, 2022
Bruker Nano, Inc.
Kevin Kjoller
G01 - MEASURING TESTING
Information
Patent Grant
Fly-height interaction simulation
Patent number
11,170,142
Issue date
Nov 9, 2021
International Business Machines Corporation
Ho-Yiu Lam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tuned oscillator atomic force microscopy methods and apparatus
Patent number
11,162,977
Issue date
Nov 2, 2021
Yale University
Udo Schwarz
G01 - MEASURING TESTING
Information
Patent Grant
Method for SEM-guided AFM scan with dynamically varied scan speed
Patent number
11,158,486
Issue date
Oct 26, 2021
JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
Yu Sun
G01 - MEASURING TESTING
Information
Patent Grant
Observation method and observation device
Patent number
11,041,826
Issue date
Jun 22, 2021
National University Corporation Kobe University
Kenjiro Kimura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...
Publication number
20240151742
Publication date
May 9, 2024
UTI Limited Partnership
Arindam PHANI
G01 - MEASURING TESTING
Information
Patent Application
Atomic-force Microscopy for Identification of Surfaces
Publication number
20240012022
Publication date
Jan 11, 2024
Trustees of Tufts College
Igor Sokolov
G01 - MEASURING TESTING
Information
Patent Application
Surface Analysis Device
Publication number
20230296644
Publication date
Sep 21, 2023
Hitachi High-Tech Corporation
Ritsuo FUKAYA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...
Publication number
20230280369
Publication date
Sep 7, 2023
attocube systems AG
Ivan MALOVICHKO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20230251284
Publication date
Aug 10, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
Publication number
20230251285
Publication date
Aug 10, 2023
Carl Zeiss SMT GMBH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20230243867
Publication date
Aug 3, 2023
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
Publication number
20230194566
Publication date
Jun 22, 2023
The Regents of the University of California
Shenkai Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BET...
Publication number
20230184807
Publication date
Jun 15, 2023
Nearfield Instruments B.V.
Paul ZABBAL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...
Publication number
20230143659
Publication date
May 11, 2023
Nearfield Instruments B.V.
Paul ZABBAL
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...
Publication number
20230003762
Publication date
Jan 5, 2023
Lua Optomekatronik ARGE A.S.
Tayfun Tatar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
Publication number
20220357359
Publication date
Nov 10, 2022
Shimadzu Corporation
Kazuma WATANABE
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20220252638
Publication date
Aug 11, 2022
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20220244289
Publication date
Aug 4, 2022
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
Publication number
20220146548
Publication date
May 12, 2022
Carl Zeiss SMT GMBH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED ATOMIC SCALE FABRICATION
Publication number
20220130033
Publication date
Apr 28, 2022
Quantum Silicon Inc.
Mohammad Rashidi
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
Publication number
20220082583
Publication date
Mar 17, 2022
Carl Zeiss SMT GMBH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Analyzing Spatial Resolution of Microwave Nea...
Publication number
20210333305
Publication date
Oct 28, 2021
Xidian University
Xiaolong Chen
G01 - MEASURING TESTING
Information
Patent Application
PAN-SHARPENING FOR MICROSCOPY
Publication number
20210325428
Publication date
Oct 21, 2021
UT-Battelle, LLC
Olga S. Ovchinnikova
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
Publication number
20210318351
Publication date
Oct 14, 2021
NANOTOOLS GMBH
Bernd Irmer
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF
Publication number
20210293849
Publication date
Sep 23, 2021
HITACHI HIGH-TECH SCIENCE CORPORATION
Masatsugu SHIGENO
G01 - MEASURING TESTING
Information
Patent Application
Computerized Creation of Measurement Plans and Plan-Based Control o...
Publication number
20210278206
Publication date
Sep 9, 2021
Carl Zeiss Industrielle Messtechnik GmbH
Markus RITTER
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
Publication number
20210247336
Publication date
Aug 12, 2021
Carl Zeiss SMT GMBH
Gabriel Baralia
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20210239732
Publication date
Aug 5, 2021
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
Battery Electrode Analysis Method
Publication number
20210231704
Publication date
Jul 29, 2021
LG CHEM, LTD.
Byung Hee Choi
G01 - MEASURING TESTING
Information
Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
Publication number
20210190818
Publication date
Jun 24, 2021
BRUKER NANO GMBH
Wolfgang Dobler
G01 - MEASURING TESTING
Information
Patent Application
OBSERVATION METHOD AND OBSERVATION DEVICE
Publication number
20210148860
Publication date
May 20, 2021
NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
Kenjiro KIMURA
G01 - MEASURING TESTING
Information
Patent Application
A METHOD FOR SEM-GUIDED AFM SCAN WITH DYNAMICALLY VARIED SCAN SPEED
Publication number
20210125809
Publication date
Apr 29, 2021
JIANGSU JITRI MICRO-NANO AUTOMATION INSTITUTE CO., LTD.
Yu SUN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CANTILEVER-FREE SCANNING PROBE MICROSCOPY
Publication number
20210123948
Publication date
Apr 29, 2021
Trustees of Boston University
Keith Andrew BROWN
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Scanning Probe Sample Property Measurement...
Publication number
20210080484
Publication date
Mar 18, 2021
The Regents of the University of Colorado, a Body Corporate
Rafael Piestun
G01 - MEASURING TESTING