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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/04Display or data processing devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method of determining dimensions of features of a subsurface topogr...
- Patent number 12,123,895
- Issue date Oct 22, 2024
- Nearfield Instruments B.V.
- Paul Zabbal
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for referencing a near-field measurement with drift and fluc...
- Patent number 11,899,041
- Issue date Feb 13, 2024
- ATTOCUBE SYSTEMS AG
- Ivan Malovichko
- G01 - MEASURING TESTING
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,839,709
- Issue date Dec 12, 2023
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization of nanoindented and scratch induced accoustic events
- Patent number 11,835,546
- Issue date Dec 5, 2023
- Nanometronix LLC
- Antanas Daugela
- G01 - MEASURING TESTING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,796,564
- Issue date Oct 24, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for analyzing a defect of a photolithographic mas...
- Patent number 11,733,186
- Issue date Aug 22, 2023
- Carl Zeiss SMT GmbH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computerized creation of measurement plans and plan-based control o...
- Patent number 11,719,534
- Issue date Aug 8, 2023
- Carl Zeiss Industrielle Messtechnik GmbH
- Markus Ritter
- G01 - MEASURING TESTING
Information Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
- Patent number 11,656,244
- Issue date May 23, 2023
- Bruker Nano GmbH
- Wolfgang Dobler
- G01 - MEASURING TESTING
Information Patent Grant
Battery electrode analysis method
- Patent number 11,650,223
- Issue date May 16, 2023
- LG Energy Solution, Ltd.
- Byung Hee Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,630,124
- Issue date Apr 18, 2023
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
- Patent number 11,562,289
- Issue date Jan 24, 2023
- KLA Corporation
- Song Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,524,102
- Issue date Dec 13, 2022
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for tailoring dialysis treatment based on sensed potassium c...
- Patent number 11,491,267
- Issue date Nov 8, 2022
- Fresenius Medical Care Holdings, Inc.
- Stephen Merchant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for providing a probe device for scanning probe microscopy
- Patent number 11,480,588
- Issue date Oct 25, 2022
- Nanotools GmbH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Grant
Observation method and observation device
- Patent number 11,422,110
- Issue date Aug 23, 2022
- National University Corporation Kobe University
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and setting method thereof
- Patent number 11,391,755
- Issue date Jul 19, 2022
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of nanoindentation induced acoustic events
- Patent number 11,346,857
- Issue date May 31, 2022
- Nanometronix LLC
- Antanas Daugela
- G01 - MEASURING TESTING
Information Patent Grant
Pan-sharpening for microscopy
- Patent number 11,313,878
- Issue date Apr 26, 2022
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing spatial resolution of microwave nea...
- Patent number 11,307,219
- Issue date Apr 19, 2022
- Xidian University
- Xiaolong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,307,220
- Issue date Apr 19, 2022
- BRUKER NANO
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automated detection of artifacts in scan image
- Patent number 11,288,809
- Issue date Mar 29, 2022
- Seagate Technology LLC
- Zhiyu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Fly-height interaction simulation
- Patent number 11,170,142
- Issue date Nov 9, 2021
- International Business Machines Corporation
- Ho-Yiu Lam
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...
- Publication number 20240369594
- Publication date Nov 7, 2024
- United Microelectronics Corp.
- Po-Jen HSIAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECOUPLED OPTICAL FORCE NANOSCOPY
- Publication number 20240345129
- Publication date Oct 17, 2024
- THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
- Yang Zhao
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20240230709
- Publication date Jul 11, 2024
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING DEFECT OF MASK
- Publication number 20240219826
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Yoonki HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...
- Publication number 20240151742
- Publication date May 9, 2024
- UTI Limited Partnership
- Arindam PHANI
- G01 - MEASURING TESTING
Information Patent Application
Atomic-force Microscopy for Identification of Surfaces
- Publication number 20240012022
- Publication date Jan 11, 2024
- Trustees of Tufts College
- Igor Sokolov
- G01 - MEASURING TESTING
Information Patent Application
Surface Analysis Device
- Publication number 20230296644
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Ritsuo FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...
- Publication number 20230280369
- Publication date Sep 7, 2023
- attocube systems AG
- Ivan MALOVICHKO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20230251285
- Publication date Aug 10, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
- Publication number 20230194566
- Publication date Jun 22, 2023
- The Regents of the University of California
- Shenkai Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BET...
- Publication number 20230184807
- Publication date Jun 15, 2023
- Nearfield Instruments B.V.
- Paul ZABBAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...
- Publication number 20230143659
- Publication date May 11, 2023
- Nearfield Instruments B.V.
- Paul ZABBAL
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...
- Publication number 20230003762
- Publication date Jan 5, 2023
- Lua Optomekatronik ARGE A.S.
- Tayfun Tatar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20220252638
- Publication date Aug 11, 2022
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20220146548
- Publication date May 12, 2022
- Carl Zeiss SMT GMBH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ATOMIC SCALE FABRICATION
- Publication number 20220130033
- Publication date Apr 28, 2022
- Quantum Silicon Inc.
- Mohammad Rashidi
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20220082583
- Publication date Mar 17, 2022
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Analyzing Spatial Resolution of Microwave Nea...
- Publication number 20210333305
- Publication date Oct 28, 2021
- Xidian University
- Xiaolong Chen
- G01 - MEASURING TESTING
Information Patent Application
PAN-SHARPENING FOR MICROSCOPY
- Publication number 20210325428
- Publication date Oct 21, 2021
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY
- Publication number 20210318351
- Publication date Oct 14, 2021
- NANOTOOLS GMBH
- Bernd Irmer
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF
- Publication number 20210293849
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
Computerized Creation of Measurement Plans and Plan-Based Control o...
- Publication number 20210278206
- Publication date Sep 9, 2021
- Carl Zeiss Industrielle Messtechnik GmbH
- Markus RITTER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...
- Publication number 20210247336
- Publication date Aug 12, 2021
- Carl Zeiss SMT GMBH
- Gabriel Baralia
- H01 - BASIC ELECTRIC ELEMENTS

Display or data processing devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of determining dimensions of features of a subsurface topogr...

Automated optimization of AFM light source positioning

Methods and systems for scanning probe sample property measurement...

Device and method for operating a bending beam in a closed control...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Method for referencing a near-field measurement with drift and fluc...

Modified method to fit cell elastic modulus based on Sneddon model

System for tailoring dialysis treatment based on sensed potassium c...

Characterization of nanoindented and scratch induced accoustic events

Atomic-force microscopy for identification of surfaces

Device and method for analyzing a defect of a photolithographic mas...

Computerized creation of measurement plans and plan-based control o...

Compensating control signal for raster scan of a scanning probe mic...

Battery electrode analysis method

Automated optimization of AFM light source positioning

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Device and method for operating a bending beam in a closed control...

Loosely-coupled inspection and metrology system for high-volume pro...

System for tailoring dialysis treatment based on sensed potassium c...

Method for tailoring dialysis treatment based on sensed potassium c...

Method for providing a probe device for scanning probe microscopy

Observation method and observation device

Scanning probe microscope and setting method thereof

Characterization of nanoindentation induced acoustic events

Pan-sharpening for microscopy

Method and system for analyzing spatial resolution of microwave nea...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Automated detection of artifacts in scan image

Surface sensitive atomic force microscope based infrared spectroscopy

Fly-height interaction simulation

Patents Applicationslast 30 patents

MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCES...

DECOUPLED OPTICAL FORCE NANOSCOPY

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

METHOD OF REMOVING DEFECT OF MASK

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Scanning Probe Microscope, Sample Observation Processing System, an...

TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IM...

Atomic-force Microscopy for Identification of Surfaces

Surface Analysis Device

METHOD FOR REFERENCING A NEAR-FIELD MEASUREMENT WITH DRIFT AND FLUC...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...

METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BET...

METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGR...

DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE

AUTOMATED ATOMIC SCALE FABRICATION

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

Method and System for Analyzing Spatial Resolution of Microwave Nea...

PAN-SHARPENING FOR MICROSCOPY

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF

Computerized Creation of Measurement Plans and Plan-Based Control o...

DEVICE AND METHOD FOR ANALYSING A DEFECT OF A PHOTOLITHOGRAPHIC MAS...