Membership
Tour
Register
Log in
Displaying information to the operator
Follow
Industry
CPC
G01N2035/00891
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2035/00891
Displaying information to the operator
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Image-based deck verification
Patent number
12,259,398
Issue date
Mar 25, 2025
Beckman Coulter, Inc.
Timothy P. Sherrill
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic analyzer
Patent number
12,228,585
Issue date
Feb 18, 2025
HITACHI HIGH-TECH CORPORATION
Nozomi Sagae
G01 - MEASURING TESTING
Information
Patent Grant
System and method for the automated preparation of biological samples
Patent number
12,228,483
Issue date
Feb 18, 2025
BD KIESTRA B.V.
Martijn Xander Berntsen
G01 - MEASURING TESTING
Information
Patent Grant
Method for notifying sample analyzer status and sample analysis system
Patent number
12,196,683
Issue date
Jan 14, 2025
Sysmex Corporation
Koki Nakano
G01 - MEASURING TESTING
Information
Patent Grant
Flow cytometer having configured controller
Patent number
12,188,857
Issue date
Jan 7, 2025
Sysmex Corporation
Motoi Kinishi
G01 - MEASURING TESTING
Information
Patent Grant
Automated analysis device, and abnormality detecting method
Patent number
12,163,972
Issue date
Dec 10, 2024
HITACHI HIGH-TECH CORPORATION
Hirobumi Shiohata
G01 - MEASURING TESTING
Information
Patent Grant
Laboratory device having lateral surfaces with coupling interfaces,...
Patent number
12,130,299
Issue date
Oct 29, 2024
IKA-Werke GmbH & Co. KG
Christian Babel
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring the cleaning status of an automatic analyzer
Patent number
12,123,884
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis system
Patent number
12,123,886
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Kenta Imai
G01 - MEASURING TESTING
Information
Patent Grant
User interface for a fluorescence assay
Patent number
12,099,010
Issue date
Sep 24, 2024
Luminex Corporation
Alpar Erdei
G01 - MEASURING TESTING
Information
Patent Grant
Sample analysis apparatus and sample analysis method
Patent number
12,078,631
Issue date
Sep 3, 2024
Shenzhen Mindray Animal Medical Technology Co., Ltd.
Fangang Kong
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and maintenance support method
Patent number
12,038,449
Issue date
Jul 16, 2024
HITACHI HIGH-TECH CORPORATION
Marina Nakai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Laboratory system for automatically processing biological samples
Patent number
12,013,407
Issue date
Jun 18, 2024
Roche Molecular Systems, Inc.
Andreas Gisler
G01 - MEASURING TESTING
Information
Patent Grant
Analytical operation assisting device and non-transitory computer r...
Patent number
11,988,680
Issue date
May 21, 2024
Shimadzu Corporation
Tomonori Oshikawa
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,971,424
Issue date
Apr 30, 2024
HITACHI HIGH-TECH CORPORATION
Yuichi Hirabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and automatic analysis method
Patent number
11,946,941
Issue date
Apr 2, 2024
HITACHI HIGH-TECH CORPORATION
Chie Yabutani
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring apparatus for temperature-controlled sample collection a...
Patent number
11,944,089
Issue date
Apr 2, 2024
BLUECHIIP LIMITED
Ian Johnston
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information
Patent Grant
Calibration curve creation method, analyzer and non-transitory stor...
Patent number
11,933,797
Issue date
Mar 19, 2024
Sysmex Corporation
Kazuma Moriura
G01 - MEASURING TESTING
Information
Patent Grant
Chemical sensing system
Patent number
11,906,533
Issue date
Feb 20, 2024
Stratuscent Inc.
Mojtaba Khomami Abadi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Analysis instrument
Patent number
11,869,636
Issue date
Jan 9, 2024
Foss Analytical A/S
Rasmus Lundgaard Christensen
G01 - MEASURING TESTING
Information
Patent Grant
Distributed control system, automatic analysis device, and automati...
Patent number
11,863,374
Issue date
Jan 2, 2024
HITACHI HIGH-TECH CORPORATION
Takafumi Hasegawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reliability indicating method for an electrochemiluminescence metho...
Patent number
11,796,477
Issue date
Oct 24, 2023
Roche Diagnostics Operations, Inc.
Stefan Quint
G01 - MEASURING TESTING
Information
Patent Grant
Centralized terminal
Patent number
11,796,551
Issue date
Oct 24, 2023
STRATEC SE
Bernd Gröhbühl
G01 - MEASURING TESTING
Information
Patent Grant
Virtual pipetting
Patent number
11,747,357
Issue date
Sep 5, 2023
Tecan Trading AG
Ronan Leboudec
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
System and method for characterizing, monitoring, and detecting bio...
Patent number
11,733,252
Issue date
Aug 22, 2023
Poppy Health, Inc.
Sam D. Molyneux
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Cover slip sticking device
Patent number
11,698,379
Issue date
Jul 11, 2023
Sakura Seiki Co., Ltd.
Tomonori Kawai
G01 - MEASURING TESTING
Information
Patent Grant
System, method and apparatus for cancer detection
Patent number
11,697,118
Issue date
Jul 11, 2023
Adrianna Davies
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
11,680,951
Issue date
Jun 20, 2023
Sysmex Corporation
Kohei Oda
G01 - MEASURING TESTING
Information
Patent Grant
Urine sample testing apparatus and apparatus for processing measure...
Patent number
11,668,701
Issue date
Jun 6, 2023
Sysmex Corporation
Toru Mizumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated dissolution/permeation testing system
Patent number
11,668,723
Issue date
Jun 6, 2023
Logan Instruments Corporation
Luke Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYING METHOD
Publication number
20250085304
Publication date
Mar 13, 2025
HITACHI HIGH-TECH CORPORATION
Shotaro HOMMA
G01 - MEASURING TESTING
Information
Patent Application
FLOW CYTOMETER AND PARTICLE DETECTION METHOD
Publication number
20250085209
Publication date
Mar 13, 2025
SYSMEX CORPORATION
Motoi KINISHI
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR DETECTING AN ORIENTATION OF A CASSETTE
Publication number
20240426854
Publication date
Dec 26, 2024
Rapid Micro Biosystems, Inc.
Michael WILT
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS SYSTEM
Publication number
20240345109
Publication date
Oct 17, 2024
HITACHI HIGH-TECH CORPORATION
Miwa Takeuchi
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND REAGENT AMOUNT DISPLAY METHOD
Publication number
20240329068
Publication date
Oct 3, 2024
Sekisui Medical Co., Ltd.
Toshiki KAWABE
G01 - MEASURING TESTING
Information
Patent Application
A BLOOD GAS ANALYZER AND SYSTEM COMPRISING A BLOOD GAS ANALYZER, AN...
Publication number
20240241106
Publication date
Jul 18, 2024
Radiometer Medical ApS
Thea Ubbe EBBESEN
G01 - MEASURING TESTING
Information
Patent Application
SLIDE INFORMATION CAPTURING AND EVALUATION DEVICE AND METHOD OF OPE...
Publication number
20240230697
Publication date
Jul 11, 2024
SONG YI SYSTEM CO., LTD.
Chun-Chieh CHIANG
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20240192234
Publication date
Jun 13, 2024
HITACHI HIGH-TECH CORPORATION
Chie YABUTANI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYANCE METHOD
Publication number
20240103029
Publication date
Mar 28, 2024
HITACHI HIGH-TECH CORPORATION
Saori CHIDA
G01 - MEASURING TESTING
Information
Patent Application
Specific Gravity Measurement Device
Publication number
20240102905
Publication date
Mar 28, 2024
Alfa Mirage Co., Ltd.
Sadanori Kondo
G01 - MEASURING TESTING
Information
Patent Application
HIGH-THROUGHPUT AUTOMATED PREPROCESSING METHOD AND SYSTEM FOR NUCLE...
Publication number
20240093267
Publication date
Mar 21, 2024
Delta Electronics, Inc.
Wei-Te Hsieh
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED SAMPLE ANALYZER
Publication number
20240069047
Publication date
Feb 29, 2024
Beckman Coulter, Inc.
Atsushi Matsushita
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS, AN...
Publication number
20240060870
Publication date
Feb 22, 2024
SYSMEX CORPORATION
Takashi Karino
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analysis System and Information Takeover Method in Automa...
Publication number
20240003924
Publication date
Jan 4, 2024
Hitachi High-Tech Corporation
Satoshi Yokotsuka
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CHARACTERIZING, MONITORING, & DETECTING BIOAE...
Publication number
20230393161
Publication date
Dec 7, 2023
Poppy Health, Inc.
Sam D. Molyneux
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
TRANSPORT METHOD, CONTROL METHOD, AND ANALYSIS SYSTEM
Publication number
20230384336
Publication date
Nov 30, 2023
SYSMEX CORPORATION
Atsushi KUMAGAI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ACQUIRING AND ANALYZING BIOLOGICAL SAMPLES
Publication number
20230384335
Publication date
Nov 30, 2023
GOTTARDO ADVISORY LIMITED
David Lyle SCHNEIDER
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20230341426
Publication date
Oct 26, 2023
HITACHI HIGH-TECH CORPORATION
Yusuke MIZUKI
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Point-of-Care Sample Analysis
Publication number
20230341428
Publication date
Oct 26, 2023
Essenlix Corp.
Stephen Y. Chou
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Virtual Pipetting
Publication number
20230333134
Publication date
Oct 19, 2023
TECAN TRADING AG
Ronan Leboudec
G01 - MEASURING TESTING
Information
Patent Application
ELECTROLYTE ANALYZER
Publication number
20230288439
Publication date
Sep 14, 2023
HITACHI HIGH-TECH CORPORATION
Takushi MIYAKAWA
G01 - MEASURING TESTING
Information
Patent Application
COVER SLIP STICKING DEVICE
Publication number
20230288440
Publication date
Sep 14, 2023
Sakura Seiki Co., Ltd.
Tomonori KAWAI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
Publication number
20230280363
Publication date
Sep 7, 2023
SYSMEX CORPORATION
Kohei ODA
G01 - MEASURING TESTING
Information
Patent Application
SENSORY TEST AND ENTRUSTED ANALYSIS METHOD
Publication number
20230258670
Publication date
Aug 17, 2023
Shimadzu Corporation
Keiko Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING CONCENTRATION OF REAGENT, ELECT...
Publication number
20230258668
Publication date
Aug 17, 2023
LEICA BIOSYSTEMS NUSSLOCH GMBH
Li YIN
G01 - MEASURING TESTING
Information
Patent Application
LABORATORY AUTOMATION DEVICE WITH TRANSPARENT DISPLAY IN DOOR
Publication number
20230228776
Publication date
Jul 20, 2023
Tecan Trading AG
Ciro MINIACI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS, MEDIUMS, AND SYSTEMS FOR ANALYTICAL METHOD DEBUGGING
Publication number
20230213539
Publication date
Jul 6, 2023
WATERS TECHNOLOGIES IRELAND LIMITED
Fadi Shawish
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYSIS METHOD AND SPECIMEN ANALYZER
Publication number
20230204613
Publication date
Jun 29, 2023
SYSMEX CORPORATION
Naoya Kameyama
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND MAINTENANCE METHOD FOR AUTOMATIC ANALYZER
Publication number
20230194556
Publication date
Jun 22, 2023
HITACHI HIGH-TECH CORPORATION
Masahiro SHIROTANI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND ASSEMBLY SUPPORT SYSTEM THEREOF
Publication number
20230160917
Publication date
May 25, 2023
HITACHI HIGH-TECH CORPORATION
Shunsuke MIYAMOTO
G01 - MEASURING TESTING