Double exposure technique

Industry

CPC
G01B9/025

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/025Double exposure technique

Industries

Patents Grantslast 30 patents

Information Patent Grant
Shearographic imaging machine with archive memory for animation dat...
- Patent number 6,791,695
- Issue date Sep 14, 2004
- Bandag Licensing Corporation
- John Lindsay
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a separation in a deformable structure
- Patent number 6,092,414
- Issue date Jul 25, 2000
- Michelin North America, Inc.
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a separation in a deformable structure
- Patent number 6,089,085
- Issue date Jul 18, 2000
- Michelin North America, Inc.
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a separation in a deformable structure
- Patent number 6,088,101
- Issue date Jul 11, 2000
- Michelin North America, Inc.
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a separation in a deformable structure
- Patent number 5,948,976
- Issue date Sep 7, 1999
- Michelin North America, Inc.
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a separation in a deformable structure
- Patent number 5,786,533
- Issue date Jul 28, 1998
- Michelin North America, Inc.
- John W. Newman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for producing an intensity contrast image from...
- Patent number 5,760,902
- Issue date Jun 2, 1998
- The United States of America as represented by the Secretary of the Army
- Phillip S. Brody
- G01 - MEASURING TESTING
Information Patent Grant
Holomoire strain analyzer
- Patent number 5,671,042
- Issue date Sep 23, 1997
- Illinois Institute of Technology
- Cesar A. Sciammarella
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus utilizing an optical stage for topographic sur...
- Patent number 5,568,256
- Issue date Oct 22, 1996
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Klaus Korner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for viewing a shearographic image
- Patent number 5,414,512
- Issue date May 9, 1995
- Grant Engineering, Inc.
- Ralph M. Grant
- G01 - MEASURING TESTING
Information Patent Grant
Optical head for shearography
- Patent number 5,257,089
- Issue date Oct 26, 1993
- United Technologies Corporation
- Karl A. Stetson
- G01 - MEASURING TESTING
Information Patent Grant
Holographic collation
- Patent number 5,216,527
- Issue date Jun 1, 1993
- Mark Sharnoff
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical deformation measuring apparatus by double-writing speckle i...
- Patent number 5,166,742
- Issue date Nov 24, 1992
- Hamamatsu Photonics K.K.
- Yuji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Differential holography
- Patent number 4,725,142
- Issue date Feb 16, 1988
- University of Delaware
- Mark Sharnoff
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for the recording and readout of multiple expo...
- Patent number 4,707,135
- Issue date Nov 17, 1987
- Rockwell International Corporation
- David M. Swain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Shearographic imaging machine
- Publication number 20010040682
- Publication date Nov 15, 2001
- John Lindsay
- G01 - MEASURING TESTING

Double exposure technique

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Shearographic imaging machine with archive memory for animation dat...

Method for analyzing a separation in a deformable structure

Method for analyzing a separation in a deformable structure

Method for analyzing a separation in a deformable structure

Method for analyzing a separation in a deformable structure

Method for analyzing a separation in a deformable structure

Method and apparatus for producing an intensity contrast image from...

Holomoire strain analyzer

Method and apparatus utilizing an optical stage for topographic sur...

Method and apparatus for viewing a shearographic image

Optical head for shearography

Holographic collation

Optical deformation measuring apparatus by double-writing speckle i...

Differential holography

Apparatus and method for the recording and readout of multiple expo...

Patents Applicationslast 30 patents

Shearographic imaging machine