Double pass; Multiple pass

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CPC
G01J2003/262

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/262Double pass; Multiple pass

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for measuring Raman spectrum and method thereof
- Patent number 11,965,779
- Issue date Apr 23, 2024
- TimeGate Instruments Oy
- Lauri Kurki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution multi-pass optical spectrum analyzer
- Patent number 11,639,873
- Issue date May 2, 2023
- Viavi Solutions Inc.
- Driss Touahri
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer
- Patent number 11,639,874
- Issue date May 2, 2023
- PerkinElmer Health Sciences, Inc.
- David M. Aikens
- G01 - MEASURING TESTING
Information Patent Grant
Spectral reflectometer
- Patent number 10,900,833
- Issue date Jan 26, 2021
- Seiko Epson Corporation
- Tsugio Gomi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for cavity-enhanced ultrafast two-dimensional...
- Patent number 10,620,048
- Issue date Apr 14, 2020
- The Research Foundation for the State University of New York
- Thomas K. Allison
- G01 - MEASURING TESTING
Information Patent Grant
Reflective triplet foreoptics for multi-channel double-pass dispers...
- Patent number 10,185,133
- Issue date Jan 22, 2019
- Raytheon Company
- Lacy G. Cook
- G02 - OPTICS
Information Patent Grant
Imaging spectrometer with reflective grating
- Patent number 10,184,833
- Issue date Jan 22, 2019
- European Space Agency
- Matteo Taccola
- G02 - OPTICS
Information Patent Grant
Optical device for improved wavelength resolution and wavelength ac...
- Patent number 9,863,810
- Issue date Jan 9, 2018
- Yokogawa Electric Corporation
- Tsutomu Kaneko
- G02 - OPTICS
Information Patent Grant
Method for spectroscopy using two Fabry-Perot interference filters
- Patent number 5,357,340
- Issue date Oct 18, 1994
- Hartmann & Braun
- Michael Zochbauer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GAS-SENSING APPARATUS
- Publication number 20240385104
- Publication date Nov 21, 2024
- UNIVERSITAET WIEN
- Stefan PUTZ
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING RAMAN SPECTRUM AND METHOD THEREOF
- Publication number 20220373392
- Publication date Nov 24, 2022
- TimeGate Instruments Oy
- Lauri Kurki
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CAVITY-ENHANCED ULTRAFAST TWO-DIMENSIONAL...
- Publication number 20190301933
- Publication date Oct 3, 2019
- The Research Foundation for the State University of New York
- Thomas K. ALLISON
- G01 - MEASURING TESTING
Information Patent Application
Spectral Reflectometer
- Publication number 20190162594
- Publication date May 30, 2019
- SEIKO EPSON CORPORATION
- Tsugio GOMI
- G02 - OPTICS
Information Patent Application
IMAGING SPECTROMETER WITH REFLECTIVE GRATING
- Publication number 20180094977
- Publication date Apr 5, 2018
- EUROPEAN SPACE AGENCY
- Matteo Taccola
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE
- Publication number 20160195433
- Publication date Jul 7, 2016
- YOKOGAWA ELECTRIC CORPORATION
- Tsutomu Kaneko
- G02 - OPTICS

Double pass; Multiple pass

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for measuring Raman spectrum and method thereof

High resolution multi-pass optical spectrum analyzer

Echelle spectrometer

Spectral reflectometer

Apparatus and method for cavity-enhanced ultrafast two-dimensional...

Reflective triplet foreoptics for multi-channel double-pass dispers...

Imaging spectrometer with reflective grating

Optical device for improved wavelength resolution and wavelength ac...

Method for spectroscopy using two Fabry-Perot interference filters

Patents Applicationslast 30 patents

GAS-SENSING APPARATUS

APPARATUS FOR MEASURING RAMAN SPECTRUM AND METHOD THEREOF

APPARATUS AND METHOD FOR CAVITY-ENHANCED ULTRAFAST TWO-DIMENSIONAL...

Spectral Reflectometer

IMAGING SPECTROMETER WITH REFLECTIVE GRATING

OPTICAL DEVICE