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G01C19/5747
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
Current Industry
G01C19/5747
each sensing mass being connected to a driving mass
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Inertial navigation sensor with reduced footprint
Patent number
12,146,742
Issue date
Nov 19, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Giacomo Langfelder
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope for three-axis detection
Patent number
12,130,139
Issue date
Oct 29, 2024
AAC KAITAI TECHNOLOGIES (WUHAN) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, composite sensor, inertial measurement un...
Patent number
12,099,075
Issue date
Sep 24, 2024
Seiko Epson Corporation
Teruo Takizawa
G01 - MEASURING TESTING
Information
Patent Grant
Frequency modulation MEMS triaxial gyroscope
Patent number
12,038,283
Issue date
Jul 16, 2024
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical rate-of-rotation sensor set-up, rate-of-rotation se...
Patent number
11,953,323
Issue date
Apr 9, 2024
Robert Bosch GmbH
Reinhard Neul
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with mass pairs
Patent number
11,846,508
Issue date
Dec 19, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Drive and sense balanced, semi-coupled 3-axis gyroscope
Patent number
11,815,354
Issue date
Nov 14, 2023
Invensense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Grant
Micromechanical detection structure of a MEMS multi-axis gyroscope,...
Patent number
11,808,574
Issue date
Nov 7, 2023
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,774,244
Issue date
Oct 3, 2023
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope with peripheral detection
Patent number
11,698,256
Issue date
Jul 11, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Multiaxis gyroscope with supplementary masses
Patent number
11,561,097
Issue date
Jan 24, 2023
Murata Manufacturing Co., Ltd.
Anssi Blomqvist
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, inertia measurement device, vehicle posit...
Patent number
11,561,101
Issue date
Jan 24, 2023
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
Necrosis inhibitors
Patent number
11,478,438
Issue date
Oct 25, 2022
National Institute of Biological Sciences, Beijing
Zhiyuan Zhang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Rotation-rate sensor, method for producing a rotation-rate sensor
Patent number
11,466,985
Issue date
Oct 11, 2022
Robert Bosch GmbH
Jan-Timo Liewald
G01 - MEASURING TESTING
Information
Patent Grant
Angular rate sensor based on frequency modulation and drive strateg...
Patent number
11,460,301
Issue date
Oct 4, 2022
NXP USA, INC.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor, method for manufacturing inertial sensor, inertial...
Patent number
11,448,506
Issue date
Sep 20, 2022
Seiko Epson Corporation
Koichiro Komizo
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Frequency modulation MEMS triaxial gyroscope
Patent number
11,448,507
Issue date
Sep 20, 2022
STMicroelectronics S.r.l.
Alessandro Tocchio
G01 - MEASURING TESTING
Information
Patent Grant
Yaw-rate sensor with a substrate having a main extension plane, met...
Patent number
11,421,991
Issue date
Aug 23, 2022
Robert Bosch GmbH
Andreas Lassl
G01 - MEASURING TESTING
Information
Patent Grant
Out-of-plane sensing gyroscope robust to external acceleration and...
Patent number
11,415,418
Issue date
Aug 16, 2022
Invensense, Inc.
Jaakko Ruohio
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for bias suppression in a non-degenerate MEMS s...
Patent number
11,390,517
Issue date
Jul 19, 2022
Honeywell International Inc.
Daniel Endean
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration type angular velocity sensor with piezoelectric film
Patent number
11,365,970
Issue date
Jun 21, 2022
Denso Corporation
Tomoya Jomori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Micromechanical detection structure of a MEMS multi-axis gyroscope,...
Patent number
11,313,681
Issue date
Apr 26, 2022
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
Patent number
11,280,612
Issue date
Mar 22, 2022
Georgia Tech Research Corporation
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical gyroscope for sensing angular rate and metho...
Patent number
11,280,611
Issue date
Mar 22, 2022
STMicroelectronics S.r.l.
Daniele Prati
G01 - MEASURING TESTING
Information
Patent Grant
MEMS inertial measurement apparatus having slanted electrodes for q...
Patent number
11,280,613
Issue date
Mar 22, 2022
Georgia Tech Research Corporation
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Grant
Three-axis micromechanical rotation rate sensor system including li...
Patent number
11,226,202
Issue date
Jan 18, 2022
Robert Bosch GmbH
Odd-Axel Pruetz
G01 - MEASURING TESTING
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,193,771
Issue date
Dec 7, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Rotation rate sensor, method for manufacturing a rotation rate sensor
Patent number
11,187,528
Issue date
Nov 30, 2021
Robert Bosch GmbH
Jochen Reinmuth
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor, electronic device, and vehicle
Patent number
11,181,547
Issue date
Nov 23, 2021
Seiko Epson Corporation
Makoto Furuhata
G01 - MEASURING TESTING
Information
Patent Grant
Sensor
Patent number
11,150,092
Issue date
Oct 19, 2021
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Takashi Imanaka
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
PHYSICAL QUANTITY SENSOR, COMPOSITE SENSOR, INERTIAL MEASUREMENT UN...
Publication number
20240402214
Publication date
Dec 5, 2024
SEIKO EPSON CORPORATION
Teruo TAKIZAWA
G01 - MEASURING TESTING
Information
Patent Application
MICRO-MECHANICAL GYROSCOPE AND ELECTRONIC PRODUCT
Publication number
20240271934
Publication date
Aug 15, 2024
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
Angular Velocity Sensor
Publication number
20240219179
Publication date
Jul 4, 2024
SEIKO EPSON CORPORATION
Norifumi SHIMIZU
G01 - MEASURING TESTING
Information
Patent Application
MICRO-ELECTRO-MECHANICAL DEVICE
Publication number
20240118082
Publication date
Apr 11, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Loïc JOET
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CORRECTING THE MEASUREMENT FROM A VIBRATING ANGULAR INER...
Publication number
20240110790
Publication date
Apr 4, 2024
THALES
Nicolas Vercier
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20230324176
Publication date
Oct 12, 2023
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MEMS GYROSCOPE
Publication number
20230314139
Publication date
Oct 5, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MICROMACHINED GYROSCOPE AND ELECTRONIC PRODUCT
Publication number
20230280162
Publication date
Sep 7, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MEMS GYROSCOPE FOR THREE-AXIS DETECTION
Publication number
20230266125
Publication date
Aug 24, 2023
AAC Kaitai Technologies (Wuhan) CO., LTD
Zhao Ma
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL RATE-OF-ROTATION SENSOR SET-UP, RATE-OF-ROTATION SE...
Publication number
20230038004
Publication date
Feb 9, 2023
ROBERT BOSCH GmbH
Reinhard Neul
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MODULATION MEMS TRIAXIAL GYROSCOPE
Publication number
20220404150
Publication date
Dec 22, 2022
STMicroelectronics S.r.l.
Alessandro TOCCHIO
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR RATE SENSOR BASED ON FREQUENCY MODULATION AND DRIVE STRATEG...
Publication number
20220282972
Publication date
Sep 8, 2022
NXP USA, Inc.
Aaron A. Geisberger
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL DETECTION STRUCTURE OF A MEMS MULTI-AXIS GYROSCOPE,...
Publication number
20220205784
Publication date
Jun 30, 2022
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20220057210
Publication date
Feb 24, 2022
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20210381834
Publication date
Dec 9, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
MULTIAXIS GYROSCOPE WITH SUPPLEMENTARY MASSES
Publication number
20210364293
Publication date
Nov 25, 2021
Murata Manufacturing Co., Ltd.
Anssi BLOMQVIST
G01 - MEASURING TESTING
Information
Patent Application
Inertial Sensor, Method For Manufacturing Inertial Sensor, Inertial...
Publication number
20210164781
Publication date
Jun 3, 2021
SEIKO EPSON CORPORATION
Koichiro KOMIZO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR
Publication number
20210116243
Publication date
Apr 22, 2021
Panasonic Intellectual Property Management Co., Ltd.
KATSUYA MORINAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRIVE AND SENSE BALANCED, SEMI-COUPLED 3-AXIS GYROSCOPE
Publication number
20210116244
Publication date
Apr 22, 2021
InvenSense, Inc.
Doruk Senkal
G01 - MEASURING TESTING
Information
Patent Application
ROTATION-RATE SENSOR, METHOD FOR PRODUCING A ROTATION-RATE SENSOR
Publication number
20200378761
Publication date
Dec 3, 2020
ROBERT BOSCH GmbH
Jan-Timo Liewald
G01 - MEASURING TESTING
Information
Patent Application
ONE-AXIS AND TWO-AXIS ROTATION RATE SENSOR
Publication number
20200370888
Publication date
Nov 26, 2020
ROBERT BOSCH GmbH
Peter Degenfeld-Schonburg
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR BIAS SUPPRESSION IN A NON-DEGENERATE MEMS S...
Publication number
20200346920
Publication date
Nov 5, 2020
HONEYWELL INTERNATIONAL INC.
Daniel Endean
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VIBRATION TYPE ANGULAR VELOCITY SENSOR
Publication number
20200263991
Publication date
Aug 20, 2020
DENSO CORPORATION
Tomoya JOMORI
G01 - MEASURING TESTING
Information
Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
Publication number
20200225036
Publication date
Jul 16, 2020
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Application
MEMS INERTIAL MEASUREMENT APPARATUS HAVING SLANTED ELECTRODES FOR Q...
Publication number
20200225037
Publication date
Jul 16, 2020
Farrokh Ayazi
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURATION TO REDUCE NON-LINEAR MOTION
Publication number
20200225038
Publication date
Jul 16, 2020
InvenSense, Inc.
Ozan ANAC
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
YAW RATE GYROSCOPE ROBUST TO LINEAR AND ANGULAR ACCELERATION
Publication number
20200208975
Publication date
Jul 2, 2020
InvenSense, Inc.
Luca Coronato
G01 - MEASURING TESTING
Information
Patent Application
Necrosis Inhibitors
Publication number
20200182617
Publication date
Jun 11, 2020
NATIONAL INSTITUTE OF BIOLOGICAL SCIENCES, BEIJING
Zhiyuan Zhang
G01 - MEASURING TESTING
Information
Patent Application
MICROMECHANICAL COMPONENT
Publication number
20200156930
Publication date
May 21, 2020
ROBERT BOSCH GmbH
Johannes Classen
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROELECTROMECHANICAL GYROSCOPE FOR SENSING ANGULAR RATE AND METHO...
Publication number
20200109946
Publication date
Apr 9, 2020
STMicroelectronics S.r.l.
Daniele PRATI
G01 - MEASURING TESTING