Elastic

Industry

CPC
G01R1/06716

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06716Elastic

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe pin and a probe card having same
- Patent number 12,169,211
- Issue date Dec 17, 2024
- TSE CO., LTD.
- G01 - MEASURING TESTING
Information Patent Grant
Probe and elastic structure thereof
- Patent number 12,163,980
- Issue date Dec 10, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for high-frequency applications with improved current...
- Patent number 12,044,703
- Issue date Jul 23, 2024
- Technoprobe S.p.A.
- Raffaele Vallauri
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 12,032,002
- Issue date Jul 9, 2024
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probe pin having gripping structure
- Patent number 12,000,863
- Issue date Jun 4, 2024
- TSE CO., LTD.
- Seung Bae An
- G01 - MEASURING TESTING
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,982,689
- Issue date May 14, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer probes having longitudinal axes and preferential probe...
- Patent number 11,768,227
- Issue date Sep 26, 2023
- Microfabrica Inc.
- Ming Ting Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and self-aligned probe
- Patent number 11,592,466
- Issue date Feb 28, 2023
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing device
- Patent number 11,567,103
- Issue date Jan 31, 2023
- QUANWISE MICROELECTRONICS (ZHUHAI) CO., LTD.
- Guangmin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Probing system
- Patent number 11,549,968
- Issue date Jan 10, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probe card device and dual-arm probe
- Patent number 11,536,744
- Issue date Dec 27, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Contact element system with at least two contact elements having di...
- Patent number 11,519,937
- Issue date Dec 6, 2022
- Feinmetall GmbH
- Gunther Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device and disposable adjustment film thereof
- Patent number 11,506,685
- Issue date Nov 22, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Kai-Chieh Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,896
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,897
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Metal probe structure and method for fabricating the same
- Patent number 11,474,128
- Issue date Oct 18, 2022
- Princo Corp.
- Yi-Lin Chu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
MEMS probe and test device using the same
- Patent number 11,408,914
- Issue date Aug 9, 2022
- LEENO INDUSTRIAL INC.
- Ung-gi Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-performance probe card in high-frequency
- Patent number 11,402,428
- Issue date Aug 2, 2022
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,372,022
- Issue date Jun 28, 2022
- Kabushiki Kaisha Nihon Micronics
- Yasutaka Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Interface element for a testing apparatus of electronic devices and...
- Patent number 11,293,941
- Issue date Apr 5, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 11,268,983
- Issue date Mar 8, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Probes having improved mechanical and/or electrical properties for...
- Patent number 11,262,383
- Issue date Mar 1, 2022
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Grant
Electro-conductive part protecting member for signal transmission c...
- Patent number 11,233,352
- Issue date Jan 25, 2022
- TSE CO., LTD.
- Chang Su Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card device
- Patent number 11,204,371
- Issue date Dec 21, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probes having decoupled electrical and mechanical d...
- Patent number 11,156,637
- Issue date Oct 26, 2021
- FormFactor, Inc.
- January Kister
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for testing head
- Patent number 11,131,690
- Issue date Sep 28, 2021
- Technoprobe S.p.A.
- Giuseppe Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flying probe electronic board tester, and test method thereof
- Patent number 11,105,841
- Issue date Aug 31, 2021
- SPEA S.p.A
- Luciano Bonaria
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor micro probe array having compliance
- Patent number 11,079,406
- Issue date Aug 3, 2021
- International Business Machines Corporation
- Eugene R. Atwood
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 11,022,643
- Issue date Jun 1, 2021
- ONE TEST SYSTEMS
- Chen-Lung Tsai
- G01 - MEASURING TESTING
Information Patent Grant
High speed probe card device and rectangular probe
- Patent number 11,009,524
- Issue date May 18, 2021
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wen-Tsung Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
TEST PIN STRUCTURE
- Publication number 20240393366
- Publication date Nov 28, 2024
- Cheong Kheng OOI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
- Publication number 20240377437
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
Probe Structure and Electronic Device with Probe Structure
- Publication number 20240353443
- Publication date Oct 24, 2024
- Xing LIU
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20240219447
- Publication date Jul 4, 2024
- CHROMA ATE INC.
- WEI-CHIH CHEN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20240175899
- Publication date May 30, 2024
- ENPLAS CORPORATION
- Ichikawa HIROYUKI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE
- Publication number 20240175898
- Publication date May 30, 2024
- ENPLAS CORPORATION
- Hiroyuki ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...
- Publication number 20240110943
- Publication date Apr 4, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PRODUCING A PROBE CARD
- Publication number 20240110948
- Publication date Apr 4, 2024
- Exaddon AG
- Kun-Hsien LIN
- G01 - MEASURING TESTING
Information Patent Application
Shielded Probes for Semiconductor Testing, Methods for Using, and M...
- Publication number 20240094252
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Jia Li
- G01 - MEASURING TESTING
Information Patent Application
Probes Having Improved Mechanical and/or Electrical Properties for...
- Publication number 20240094253
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Garret R. Smalley
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICALLY CONDUCTIVE CONTACT PIN
- Publication number 20240094248
- Publication date Mar 21, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
Methods of Reinforcing Plated Metal Structures and Independently Mo...
- Publication number 20240094247
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Onnik Yaglioglu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240069066
- Publication date Feb 29, 2024
- LEENO INDUSTRIAL INC.
- Woesuk YANG
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PIN AND SOCKET FOR INSPECTION
- Publication number 20240019461
- Publication date Jan 18, 2024
- Yamaichi Electronics Co., Ltd.
- Junichi MIYAAKI
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230411889
- Publication date Dec 21, 2023
- WITHMEMS CO., LTD.
- Hwang Sub KOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND ELASTIC STRUCTURE THEREOF
- Publication number 20230314473
- Publication date Oct 5, 2023
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20230314476
- Publication date Oct 5, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE
- Publication number 20230266361
- Publication date Aug 24, 2023
- TSE CO., LTD.
- Seung Bae AN
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE PIN AND PROBE CARD HAVING SAME
- Publication number 20230258691
- Publication date Aug 17, 2023
- TSE CO., LTD.
- Seok Ho SON
- G01 - MEASURING TESTING
Information Patent Application
PLUNGER AND METHOD OF MANUFACTURING PLUNGER
- Publication number 20230221349
- Publication date Jul 13, 2023
- Yokowo Co., Ltd.
- Tomohisa HOSHINO
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20230194571
- Publication date Jun 22, 2023
- HERMES TESTING SOLUTIONS INC.
- TZU-CHIEN WANG
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...
- Publication number 20230028352
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Raffaele VALLAURI
- G01 - MEASURING TESTING
Information Patent Application
ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
- Publication number 20220397587
- Publication date Dec 15, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF
- Publication number 20220365110
- Publication date Nov 17, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE
- Publication number 20220229089
- Publication date Jul 21, 2022
- Quanwise Microelectronics (Zhuhai) Co., Ltd.
- Guangmin HUANG
- G01 - MEASURING TESTING
Information Patent Application
PROBING SYSTEM
- Publication number 20220221492
- Publication date Jul 14, 2022
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
DETECTION MECHANISM, WIRE POSITIONING APPARATUS, AND WIRE PROCESSIN...
- Publication number 20220187339
- Publication date Jun 16, 2022
- Tyco Electronics (Shanghai) Co., Ltd.
- Zhen WANG
- G01 - MEASURING TESTING
Information Patent Application
CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING
- Publication number 20220178966
- Publication date Jun 9, 2022
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND DUAL-ARM PROBE
- Publication number 20220170960
- Publication date Jun 2, 2022
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- KAI-CHIEH HSIEH
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vertical probe pin and a probe card having same

Probe and elastic structure thereof

Contact probe for high-frequency applications with improved current...

Chevron interconnect for very fine pitch probing

Probe pin having gripping structure

Probes having improved mechanical and/or electrical properties for...

Multi-layer probes having longitudinal axes and preferential probe...

Probe card device and self-aligned probe

Testing device

Probing system

Probe card device and dual-arm probe

Contact element system with at least two contact elements having di...

Probe card device and disposable adjustment film thereof

Contact and test socket device for testing semiconductor device

Contact and test socket device for testing semiconductor device

Metal probe structure and method for fabricating the same

MEMS probe and test device using the same

High-performance probe card in high-frequency

Electrical contactor and electrical connecting apparatus

Interface element for a testing apparatus of electronic devices and...

Chevron interconnect for very fine pitch probing

Probes having improved mechanical and/or electrical properties for...

Electro-conductive part protecting member for signal transmission c...

Probe card device

Electrical test probes having decoupled electrical and mechanical d...

Contact probe for testing head

Flying probe electronic board tester, and test method thereof

Semiconductor micro probe array having compliance

Testing apparatus

High speed probe card device and rectangular probe

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

TEST PIN STRUCTURE

VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF

Probe Structure and Electronic Device with Probe Structure

WAFER INSPECTION SYSTEM

CONTACT PROBE

CONTACT PROBE

METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHA...

METHOD FOR PRODUCING A PROBE CARD

Shielded Probes for Semiconductor Testing, Methods for Using, and M...

Probes Having Improved Mechanical and/or Electrical Properties for...

ELECTRICALLY CONDUCTIVE CONTACT PIN

Methods of Reinforcing Plated Metal Structures and Independently Mo...

TEST SOCKET AND METHOD OF MANUFACTURING THE SAME

CONTACT PIN AND SOCKET FOR INSPECTION

FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME

PROBE AND ELASTIC STRUCTURE THEREOF

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

PROBE PIN HAVING IMPROVED GRIPPING STRUCTURE

VERTICAL PROBE PIN AND PROBE CARD HAVING SAME

PLUNGER AND METHOD OF MANUFACTURING PLUNGER

PROBE CARD

CONTACT PROBE FOR HIGH-FREQUENCY APPLICATIONS WITH IMPROVED CURRENT...

ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE

PROBE CARD DEVICE AND DISPOSABLE ADJUSTMENT FILM THEREOF

TESTING DEVICE

PROBING SYSTEM

DETECTION MECHANISM, WIRE POSITIONING APPARATUS, AND WIRE PROCESSIN...

CHEVRON INTERCONNECT FOR VERY FINE PITCH PROBING

PROBE CARD DEVICE AND DUAL-ARM PROBE