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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J1/00
Photometry
Current Industry
G01J1/44
Electric circuits
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Patents Grants
last 30 patents
Information
Patent Grant
Light receiving element and ranging system
Patent number
11,965,970
Issue date
Apr 23, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image sensor with improved light conversion efficiency
Patent number
11,955,501
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Shih-Yu Liao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensing device
Patent number
11,953,372
Issue date
Apr 9, 2024
Innolux Corporation
Yu-Tsung Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electronic devices with ambient light sensor radio-frequency interf...
Patent number
11,953,374
Issue date
Apr 9, 2024
Apple Inc.
Michael D Eaton
G01 - MEASURING TESTING
Information
Patent Grant
Method for non-invasive monitoring of fluorescent tracer agent with...
Patent number
11,950,907
Issue date
Apr 9, 2024
MediBeacon, Inc.
Kimberly Shultz
G01 - MEASURING TESTING
Information
Patent Grant
Light sensor and ranging method
Patent number
11,953,629
Issue date
Apr 9, 2024
Guangzhou Tyrafos Semiconductor Technologies Co., LTD
Ping-Hung Yin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic shelf label with action triggering
Patent number
11,955,052
Issue date
Apr 9, 2024
SES-imagotag GmbH
Andreas Rößl
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Optical sensor synchronizing to ambient light flicker and operating...
Patent number
11,953,371
Issue date
Apr 9, 2024
PixArt Imaging Inc.
Zi-Hao Tan
G01 - MEASURING TESTING
Information
Patent Grant
Sensor device and sensing method
Patent number
11,953,373
Issue date
Apr 9, 2024
Japan Display Inc.
Naoki Takada
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor capable of recognizing light flicker frequency and s...
Patent number
11,946,800
Issue date
Apr 2, 2024
PixArt Imaging Inc.
Zi-Hao Tan
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic wave module and electromagnetic wave camera system...
Patent number
11,940,323
Issue date
Mar 26, 2024
Canon Kabushiki Kaisha
Takeaki Itsuji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light receiving element and ranging system
Patent number
11,940,536
Issue date
Mar 26, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Tatsuki Nishino
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Stray-light testing station
Patent number
11,933,666
Issue date
Mar 19, 2024
Waymo LLC
Chen David Lu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Handheld luminometer and front end platform assembly
Patent number
11,933,665
Issue date
Mar 19, 2024
Charm Sciences, Inc.
Paul E Graham
G01 - MEASURING TESTING
Information
Patent Grant
Sampling assembly and testing instrument
Patent number
11,933,668
Issue date
Mar 19, 2024
Rohde & Schwarz GmbH & Co. KG
Bernhard Sterzbach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical system for improved reliability and performance
Patent number
11,933,669
Issue date
Mar 19, 2024
ALLEGRO MICROSYSTEMS, LLC
Stephen A. Marshall
G02 - OPTICS
Information
Patent Grant
Smart contact lens with ratiometric light change detection
Patent number
11,927,479
Issue date
Mar 12, 2024
Imec VZW
Chris Van Liempd
G01 - MEASURING TESTING
Information
Patent Grant
Detecting high intensity light in photo sensor
Patent number
11,927,475
Issue date
Mar 12, 2024
Meta Platforms Technologies, LLC
Xinqiao Liu
G01 - MEASURING TESTING
Information
Patent Grant
Visible light sensor configured for glare detection and controlling...
Patent number
11,927,057
Issue date
Mar 12, 2024
Lutron Technology Company LLC
Craig A. Casey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light detection device
Patent number
11,927,478
Issue date
Mar 12, 2024
Hamamatsu Photonics K.K.
Hironori Sonobe
G01 - MEASURING TESTING
Information
Patent Grant
Systems and method for providing voltage compensation for single-ph...
Patent number
11,927,480
Issue date
Mar 12, 2024
SHANGHAI LINGFANG TECHNOLOGY CO., LTD.
Jun Wang
G01 - MEASURING TESTING
Information
Patent Grant
Limitation of noise on light detectors using an aperture
Patent number
11,921,206
Issue date
Mar 5, 2024
Waymo LLC
Pierre-Yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting pulsed radiation
Patent number
11,920,978
Issue date
Mar 5, 2024
The Secretary of State for Defence
Sean Michael Tsi-Ong Tipper
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for biasing light detectors
Patent number
11,921,237
Issue date
Mar 5, 2024
Waymo LLC
Pierre-yves Droz
G01 - MEASURING TESTING
Information
Patent Grant
Electric circuit arrangement to determine a level of an excess bias...
Patent number
11,921,150
Issue date
Mar 5, 2024
ams International AG
Nenad Lilic
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Image sensor with improved near-infrared (NIR) radiation phase-dete...
Patent number
11,923,386
Issue date
Mar 5, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Keng-Yu Chou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical sensor and method of operating an optical sensor
Patent number
11,913,831
Issue date
Feb 27, 2024
STMicroelectronics (Research & Development) Limited
Neale Dutton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser absorptivity measurement device
Patent number
11,913,830
Issue date
Feb 27, 2024
National Technology & Engineering Solutions of Sandia, LLC
Daniel Tung
G01 - MEASURING TESTING
Information
Patent Grant
Detection circuit, device and method for detecting light source fli...
Patent number
11,910,100
Issue date
Feb 20, 2024
Opple Lighting Co., Ltd
Zhixian Zhou
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Digital pixel with extended dynamic range
Patent number
11,906,353
Issue date
Feb 20, 2024
Meta Platforms Technologies, LLC
Xinqiao Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING METHOD AND CONTROLLER FOR CONTROLLING TESTING METHOD
Publication number
20240138044
Publication date
Apr 25, 2024
SCHREDER S.A.
Laurent Secretin
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TIME-DOMAIN FILTERING OF GAMMA EVENTS
Publication number
20240133738
Publication date
Apr 25, 2024
Avago Technologies International Sales Pte. Limited
Thomas FRACH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SINGLE-PHOTON DETECTOR, SINGLE-PHOTON DETECTOR ARRAY, AND METHOD FO...
Publication number
20240125646
Publication date
Apr 18, 2024
HERMES-EPITEK CORPORATION
Shang-Jr Gwo
G01 - MEASURING TESTING
Information
Patent Application
Wireless Battery-Powered Daylight Sensor
Publication number
20240125643
Publication date
Apr 18, 2024
Lutron Technology Company LLC
James P. Steiner
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE AND SENSING METHOD
Publication number
20240125647
Publication date
Apr 18, 2024
Japan Display Inc.
Naoki TAKADA
G01 - MEASURING TESTING
Information
Patent Application
SINGLE PHOTON DETECTION ELEMENT, ELECTRONIC DEVICE, AND LiDAR DEVICE
Publication number
20240120427
Publication date
Apr 11, 2024
Korea Institute of Science and Technology
Myung-Jae LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GEIGER-MODE FOCAL PLANE ARRAY WITH MONOLITHICALLY INTEGRATED RESISTORS
Publication number
20240120350
Publication date
Apr 11, 2024
LG Innotek Co., Ltd.
Mark Allen ITZLER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FREQUENCY SYNTHESIS SYSTEM AND FREQUENCY GENERATION METHOD OF MICRO...
Publication number
20240118136
Publication date
Apr 11, 2024
CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION NO. 44 RESEARCH INSTITUTE
HAO ZHANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING THE OPERATING STATE OF A LIGHT-EMITTING IMPLANT
Publication number
20240110828
Publication date
Apr 4, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Pierre BLEUET
G01 - MEASURING TESTING
Information
Patent Application
AMBIENT LIGHT SENSOR
Publication number
20240110826
Publication date
Apr 4, 2024
STMicroelectronics (Alps) SAS
Vratislav Michal
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Despeckling in Optical Measurement Systems
Publication number
20240102856
Publication date
Mar 28, 2024
Apple Inc.
Matthew A. Terrel
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT FOR HIGH-SENSITIVITY RADIATION SENSING
Publication number
20240102857
Publication date
Mar 28, 2024
Rajesh GUPTA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MODULE
Publication number
20240094052
Publication date
Mar 21, 2024
Advanced Semiconductor Engineering, Inc.
Kuo Sin HUANG
G01 - MEASURING TESTING
Information
Patent Application
PHOTON DETECTION SYSTEM AND METHOD
Publication number
20240085240
Publication date
Mar 14, 2024
Kabushiki Kaisha Toshiba
Mirko SANZARO
G01 - MEASURING TESTING
Information
Patent Application
Electronic Devices With Multi-Function Environmental Sensors
Publication number
20240085223
Publication date
Mar 14, 2024
Apple Inc.
Michael J Glickman
G01 - MEASURING TESTING
Information
Patent Application
Intelligent Illumination Intensity Measuring Sensor
Publication number
20240085239
Publication date
Mar 14, 2024
SAUDI ARABIAN OIL COMPANY
Abdulrahman Mukhtar
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE, ELECTROMAGNETIC WAVE DETECTI...
Publication number
20240081150
Publication date
Mar 7, 2024
Sony Semiconductor Solutions Corporation
Tetsuji YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Superconducting Field-Programmable Gate Array
Publication number
20240080029
Publication date
Mar 7, 2024
PsiQuantum Corp.
Faraz NAJAFI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SUPPRESSION OF EXCITATION FIELD FOR QUANTUM LIGHT EMITTERS USING OP...
Publication number
20240069261
Publication date
Feb 29, 2024
PHOTONIC INC.
Youn Seok Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOLID-STATE IMAGE SENSOR AND ELECTRONIC DEVICE
Publication number
20240073560
Publication date
Feb 29, 2024
Sony Semiconductor Solutions Corporation
Tatsuki Nishino
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS HAVING A SINGLE PHOTON AVALANCHE DIODE (SPAD) WITH IMPROV...
Publication number
20240063321
Publication date
Feb 22, 2024
Koninklijke Philips N.V.
Thomas Frach
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPAD PIXEL
Publication number
20240063235
Publication date
Feb 22, 2024
STMicroelectronics (Crolles 2) SAS
Francois GUYADER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS PROVIDING A PLURALITY OF LIGHT BEAMS
Publication number
20240061083
Publication date
Feb 22, 2024
STMicroelectronics (Research and Development) Limited
Christopher Townsend
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOELECTRIC CONVERSION DEVICE, IMAGING SYSTEM, LIGHT DETECTION SY...
Publication number
20240060819
Publication date
Feb 22, 2024
Canon Kabushiki Kaisha
SHOGO YAMASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL RECEIVER
Publication number
20240053196
Publication date
Feb 15, 2024
Sumitomo Electric Industries, Ltd.
Hiroshi HARA
G01 - MEASURING TESTING
Information
Patent Application
AN INTERFACE CIRCUIT FOR PHOTODETECTORS PROVIDING FULL-FRAME INTEGR...
Publication number
20240053204
Publication date
Feb 15, 2024
Nu-Trek, Inc.
Stephen Holden Black
G01 - MEASURING TESTING
Information
Patent Application
SOLID-STATE IMAGE PICKUP DEVICE, METHOD OF MANUFACTURING SOLID-STAT...
Publication number
20240047490
Publication date
Feb 8, 2024
SONY GROUP CORPORATION
Ryosuke NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH SEQUENTIALLY-COUPLED CHARGE STORAGE AND ASS...
Publication number
20240044703
Publication date
Feb 8, 2024
Quantum-Si Incorporated
Eric A.G. Webster
G01 - MEASURING TESTING
Information
Patent Application
LIGHT RECEIVER CIRCUIT AND LIGHT SENSOR ARRAY COMPRISING A LIGHT RE...
Publication number
20240035884
Publication date
Feb 1, 2024
Elmos Semiconductor SE
André SROWIG
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC CONVERSION APPARATUS
Publication number
20240035885
Publication date
Feb 1, 2024
Canon Kabushiki Kaisha
MAHITO SHINOHARA
G01 - MEASURING TESTING