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Defect Monitor
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Publication number 20250164547
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Publication date May 22, 2025
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Mei-Chen Chuang
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G01 - MEASURING TESTING
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THROUGH-SILICON VIA (TSV) TESTING
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Publication number 20250093404
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Publication date Mar 20, 2025
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TEXAS INSTRUMENTS INCORPORATED
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Lee D. Whetsel
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H01 - BASIC ELECTRIC ELEMENTS
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SCAN TESTABLE THROUGH SILICON VIAS
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Publication number 20250087539
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Publication date Mar 13, 2025
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TEXAS INSTRUMENTS INCORPORATED
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Lee D. Whetsel
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H01 - BASIC ELECTRIC ELEMENTS
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VIA ACCURACY MEASUREMENT
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Publication number 20250079242
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Publication date Mar 6, 2025
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Wei-Hsuen Lee
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H01 - BASIC ELECTRIC ELEMENTS
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Decoupling Cells Testability
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Publication number 20240369619
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Publication date Nov 7, 2024
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MELLANOX TECHNOLOGIES, LTD.
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Ido Bourstein
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G01 - MEASURING TESTING
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SEMICONDUCTOR DEVICE
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Publication number 20240094279
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Publication date Mar 21, 2024
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RENESAS ELECTRONICS CORPORATION
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Noboru INOMATA
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G01 - MEASURING TESTING
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TSV TESTING
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Publication number 20240094280
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Publication date Mar 21, 2024
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Lee D. Whetsel
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H01 - BASIC ELECTRIC ELEMENTS
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