Electrical testing of internal connections or -isolation

Industry

CPC
G01R31/2853

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2853Electrical testing of internal connections or -isolation

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection apparatus and substrate inspection method
- Patent number 12,352,808
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sekye Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Decoupling cells testability
- Patent number 12,345,757
- Issue date Jul 1, 2025
- Mellanox Technologies, Ltd.
- Ido Bourstein
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 12,282,056
- Issue date Apr 22, 2025
- Renesas Electronics Corporation
- Noboru Inomata
- G01 - MEASURING TESTING
Information Patent Grant
Gallium nitride-based devices and methods of testing thereof
- Patent number 12,216,152
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Security circuitry for bonded structures
- Patent number 12,174,246
- Issue date Dec 24, 2024
- ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.
- Javier A. DeLaCruz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSV testing
- Patent number 12,163,998
- Issue date Dec 10, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan testable through silicon VIAs
- Patent number 12,154,835
- Issue date Nov 26, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device package with board level reliability
- Patent number 12,131,967
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Naweed Anjum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detection of counterfeit and cyber electronic...
- Patent number 12,105,857
- Issue date Oct 1, 2024
- CYBORD LTD
- Eyal Isachar Weiss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of testing circuit, and storage medium
- Patent number 12,078,671
- Issue date Sep 3, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng Gu
- G01 - MEASURING TESTING
Information Patent Grant
Output terminal fault detection circuit
- Patent number 12,072,373
- Issue date Aug 27, 2024
- Texas Instruments Incorporated
- Kemal Safak Demirci
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor component, system and method for checking a soldered...
- Patent number 12,044,722
- Issue date Jul 23, 2024
- Osram Opto Semiconductors GmbH
- Jens Richter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-line detection of electrical fails on integrated circuits
- Patent number 12,013,442
- Issue date Jun 18, 2024
- Intel Corporation
- Enlan Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced direct current (DC) built-in-self-test (BIST) coverage for...
- Patent number 12,007,432
- Issue date Jun 11, 2024
- Cisco Technology, Inc.
- Sanjay Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method
- Patent number 12,007,436
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 12,000,883
- Issue date Jun 4, 2024
- Mitsubishi Electric Corporation
- Yukihiko Wada
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit package with internal circuitry to detect extern...
- Patent number 11,959,962
- Issue date Apr 16, 2024
- QUALCOMM Incorporated
- Chengyue Yu
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying latch-up structure
- Patent number 11,899,057
- Issue date Feb 13, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and test method of semiconductor device
- Patent number 11,892,503
- Issue date Feb 6, 2024
- Toshiba Tec Kabushiki Kaisha
- Takuya Kusaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gallium nitride-based devices and methods of testing thereof
- Patent number 11,852,675
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TSV testing method and apparatus
- Patent number 11,835,573
- Issue date Dec 5, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and jumper thereof
- Patent number 11,828,789
- Issue date Nov 28, 2023
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Heterogenous voltage-based testing via on-chip voltage regulator ci...
- Patent number 11,808,805
- Issue date Nov 7, 2023
- NVIDIA Corporation
- Francisco Da Silva
- G01 - MEASURING TESTING
Information Patent Grant
Mixed high-resolution and low-resolution inspection for tamper dete...
- Patent number 11,789,069
- Issue date Oct 17, 2023
- International Business Machines Corporation
- Effendi Leobandung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Isolation circuit having test mechanism and test method thereof
- Patent number 11,774,497
- Issue date Oct 3, 2023
- Realtek Semiconductor Corporation
- Kuo-Kai Liu
- G01 - MEASURING TESTING
Information Patent Grant
Multi-member test probe structure
- Patent number 11,774,489
- Issue date Oct 3, 2023
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and method
- Patent number 11,768,235
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for monitoring health of probing u-bump clu...
- Patent number 11,740,282
- Issue date Aug 29, 2023
- Intel Corporation
- Jagat Shakya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SECURITY CIRCUITRY FOR BONDED STRUCTURES
- Publication number 20250199058
- Publication date Jun 19, 2025
- ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.
- Javier A. DeLaCruz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20250189576
- Publication date Jun 12, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shenggao Li
- G01 - MEASURING TESTING
Information Patent Application
Defect Monitor
- Publication number 20250164547
- Publication date May 22, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Mei-Chen Chuang
- G01 - MEASURING TESTING
Information Patent Application
Electronic Component and Method of Operating Such a Component
- Publication number 20250164551
- Publication date May 22, 2025
- TDK-Micronas GmbH
- Thilo Rubehn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF
- Publication number 20250138084
- Publication date May 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...
- Publication number 20250110172
- Publication date Apr 3, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ying-Chih Hsu
- G01 - MEASURING TESTING
Information Patent Application
THROUGH-SILICON VIA (TSV) TESTING
- Publication number 20250093404
- Publication date Mar 20, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCAN TESTABLE THROUGH SILICON VIAS
- Publication number 20250087539
- Publication date Mar 13, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIA ACCURACY MEASUREMENT
- Publication number 20250079242
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Hsuen Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...
- Publication number 20250020715
- Publication date Jan 16, 2025
- QUALCOMM Incorporated
- Chengyue YU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE PACKAGE WITH BOARD LEVEL RELIABILITY
- Publication number 20250022761
- Publication date Jan 16, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Naweed Anjum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF COUNTERFEIT AND CYBER ELECTRONIC...
- Publication number 20240370590
- Publication date Nov 7, 2024
- CYBORD LTD.
- Eyal Isachar WEISS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Decoupling Cells Testability
- Publication number 20240369619
- Publication date Nov 7, 2024
- MELLANOX TECHNOLOGIES, LTD.
- Ido Bourstein
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, PROGRAM AND PROBER
- Publication number 20240319263
- Publication date Sep 26, 2024
- TOKYO SEIMITSU CO., LTD.
- Eiji FUKANO
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR...
- Publication number 20240280630
- Publication date Aug 22, 2024
- Cisco Technology, Inc.
- Sanjay SUNDER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20240230751
- Publication date Jul 11, 2024
- RENESAS ELECTRONICS CORPORATION
- Yoshiaki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240175915
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- SEKYE JEON
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20240133944
- Publication date Apr 25, 2024
- RENESAS ELECTRONICS CORPORATION
- Yoshiaki TANAKA
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTION CIRCUIT FOR MONITORING AN EXTERNAL COMPONENT
- Publication number 20240125844
- Publication date Apr 18, 2024
- Melexis Technologies SA
- Lionel TOMBEZ
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240094279
- Publication date Mar 21, 2024
- RENESAS ELECTRONICS CORPORATION
- Noboru INOMATA
- G01 - MEASURING TESTING
Information Patent Application
TSV TESTING
- Publication number 20240094280
- Publication date Mar 21, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF
- Publication number 20240085472
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-An Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE TESTING METHOD
- Publication number 20240085473
- Publication date Mar 14, 2024
- LAPIS Technology Co., Ltd.
- Tomomi MIYANO
- G01 - MEASURING TESTING
Information Patent Application
TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
- Publication number 20240027516
- Publication date Jan 25, 2024
- Sreejit Chakravarty
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR...
- Publication number 20240019485
- Publication date Jan 18, 2024
- Cisco Technology, Inc.
- Sanjay SUNDER
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...
- Publication number 20230417828
- Publication date Dec 28, 2023
- QUALCOMM Incorporated
- Chengyue YU
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING OF THROUGH SILICON VIAS
- Publication number 20230417825
- Publication date Dec 28, 2023
- Shanghai United Imaging Microelectronics Technology Co., Ltd.
- Changzhi SHI
- G01 - MEASURING TESTING

Electrical testing of internal connections or -isolation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substrate inspection apparatus and substrate inspection method

Decoupling cells testability

Semiconductor device

Gallium nitride-based devices and methods of testing thereof

Security circuitry for bonded structures

TSV testing

Scan testable through silicon VIAs

Electronic device package with board level reliability

System and method for detection of counterfeit and cyber electronic...

Integrated circuit workload, temperature, and/or sub-threshold leak...

Method and apparatus of testing circuit, and storage medium

Output terminal fault detection circuit

Semiconductor component, system and method for checking a soldered...

In-line detection of electrical fails on integrated circuits

Enhanced direct current (DC) built-in-self-test (BIST) coverage for...

Test circuit and method

Semiconductor device and power conversion device

Integrated circuit package with internal circuitry to detect extern...

Method for identifying latch-up structure

Semiconductor device and test method of semiconductor device

Gallium nitride-based devices and methods of testing thereof

TSV testing method and apparatus

Test apparatus and jumper thereof

Heterogenous voltage-based testing via on-chip voltage regulator ci...

Mixed high-resolution and low-resolution inspection for tamper dete...

Isolation circuit having test mechanism and test method thereof

Multi-member test probe structure

Test circuit and method

Integrated circuit degradation estimation and time-of-failure predi...

Apparatuses and methods for monitoring health of probing u-bump clu...

Patents Applicationslast 30 patents

SECURITY CIRCUITRY FOR BONDED STRUCTURES

SYSTEMS AND METHODS FOR TESTING SEMICONDUCTOR DEVICE

Defect Monitor

Electronic Component and Method of Operating Such a Component

GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF

SEMICONDUCTOR PACKAGES WITH THROUGH VIA STRUCTURES AND METHODS FOR...

THROUGH-SILICON VIA (TSV) TESTING

SCAN TESTABLE THROUGH SILICON VIAS

VIA ACCURACY MEASUREMENT

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...

ELECTRONIC DEVICE PACKAGE WITH BOARD LEVEL RELIABILITY

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

SYSTEM AND METHOD FOR DETECTION OF COUNTERFEIT AND CYBER ELECTRONIC...

Decoupling Cells Testability

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

DRIVE CONTROL DEVICE, DRIVE CONTROL METHOD, PROGRAM AND PROBER

ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR...

SEMICONDUCTOR DEVICE AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

SEMICONDUCTOR DEVICE AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE

ERROR DETECTION CIRCUIT FOR MONITORING AN EXTERNAL COMPONENT

SEMICONDUCTOR DEVICE

TSV TESTING

GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE TESTING METHOD

TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS

ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR...

INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERN...

DEVICES AND METHODS FOR TESTING OF THROUGH SILICON VIAS