electron microscope

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CPC
G01N2223/418

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/418electron microscope

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for voltage contrast defect detection
- Patent number 12,196,692
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Weiming Ren
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for correlative microscopy
- Patent number 12,123,047
- Issue date Oct 22, 2024
- Leica Mikrosysteme GmbH
- Julia König
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
System for estimating the occurrence of defects, and computer-reada...
- Patent number 12,111,272
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Fukuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices and methods for high angle liquid electron tomography
- Patent number 12,099,022
- Issue date Sep 24, 2024
- UNIVERSIDAD REY JUAN CARLOS
- Jesus Gonzalez Casablanca
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation analysis system, charged particle beam system, and radiat...
- Patent number 12,078,763
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira Takano
- G01 - MEASURING TESTING
Information Patent Grant
Defect characterization method and apparatus
- Patent number 12,067,704
- Issue date Aug 20, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ning Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimating heights of defects in a wafer by scaling a 3D model usin...
- Patent number 12,057,336
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Shashank Shrikant Agashe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method, inspection system, and semiconductor fabrication...
- Patent number 12,055,861
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Kihyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition
- Patent number 11,982,634
- Issue date May 14, 2024
- FEI Company
- Pavel Potocek
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,982,635
- Issue date May 14, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining variability of cryo-EM protein...
- Patent number 11,977,039
- Issue date May 7, 2024
- Ali Punjani
- G01 - MEASURING TESTING
Information Patent Grant
Grid coatings for capture of proteins and other compounds
- Patent number 11,965,851
- Issue date Apr 23, 2024
- Purdue Research Foundation
- David H. Thompson
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method to determine relative thermal maturity from porosities measu...
- Patent number 11,940,398
- Issue date Mar 26, 2024
- Saudi Arabian Oil Company
- Shannon Lee Eichmann
- E21 - EARTH DRILLING MINING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, computer, and signal processing metho...
- Patent number 11,898,974
- Issue date Feb 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Grant
Material properties from two-dimensional image
- Patent number 11,885,757
- Issue date Jan 30, 2024
- BP Corporation North America Inc.
- Glen L. Gettemy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Build material handling unit for a powder module for an apparatus f...
- Patent number 11,878,463
- Issue date Jan 23, 2024
- CONCEPT LASER GMBH
- Dominik Eideloth
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Apparatus of plural charged-particle beams
- Patent number RE49784
- Issue date Jan 2, 2024
- ASML Netherlands B.V.
- Weiming Ren
Information Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
- Patent number 11,852,598
- Issue date Dec 26, 2023
- Battelle Energy Alliance, LLC
- Jeffery A. Aguiar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...
- Publication number 20240361260
- Publication date Oct 31, 2024
- TOHOKU UNIVERSITY
- Hiroshi JINNAI
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...
- Publication number 20240337610
- Publication date Oct 10, 2024
- FEI Company
- Wouter René J. Van den Broek
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...
- Publication number 20240280521
- Publication date Aug 22, 2024
- Ori Lieberman
- G01 - MEASURING TESTING
Information Patent Application
TEM Orientation Mapping via Dark-Field Vector Images
- Publication number 20240272097
- Publication date Aug 15, 2024
- Virginia Commonwealth University
- Carl R. Mayer
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM-BASED ASSEMBLY
- Publication number 20240272042
- Publication date Aug 15, 2024
- VITROTEM B.V.
- Pauline Martha Gerardina VAN DEURSEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...
- Publication number 20240219326
- Publication date Jul 4, 2024
- Intel Corporation
- Oliver Patterson
- G01 - MEASURING TESTING
Information Patent Application
QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...
- Publication number 20240183805
- Publication date Jun 6, 2024
- The Aerospace Corporation
- Rafael J. ZALDIVAR
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
- Publication number 20240127425
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Sungwook HWANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
- Publication number 20240110880
- Publication date Apr 4, 2024
- FEI Company
- Maurice PEEMEN
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Detecting Beam Displacement
- Publication number 20240110881
- Publication date Apr 4, 2024
- FEI Company
- James B. McGinn
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20240094151
- Publication date Mar 21, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
- Publication number 20240085357
- Publication date Mar 14, 2024
- JEOL Ltd.
- Hideyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
- Publication number 20240068967
- Publication date Feb 29, 2024
- KLA Corporation
- Bo Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO DETERMINE RELATIVE THERMAL MATURITY FROM POROSITIES MEASU...
- Publication number 20240060915
- Publication date Feb 22, 2024
- ARAMCO SERVICES COMPANY
- Shannon Lee Eichmann
- E21 - EARTH DRILLING MINING
Information Patent Application
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
- Publication number 20240044822
- Publication date Feb 8, 2024
- JFE STEEL CORPORATION
- Tomoharu ISHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERV...
- Publication number 20230393085
- Publication date Dec 7, 2023
- EBARA CORPORATION
- Kenji WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20230366841
- Publication date Nov 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Wei Chean TAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope and Aberration Measurement Method
- Publication number 20230349839
- Publication date Nov 2, 2023
- JEOL Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE BLOCK AND SAMPLE BLOCK HOLDER
- Publication number 20230333031
- Publication date Oct 19, 2023
- ROCKTYPE LTD
- Henrik Nilsen OMMA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...
- Publication number 20230333033
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
Measurement System and Measurement Method
- Publication number 20230314350
- Publication date Oct 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Akiyuki SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM
- Publication number 20230296639
- Publication date Sep 21, 2023
- FEI Company
- Vojtech DOLEZAL
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING

electron microscope

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for voltage contrast defect detection

Utilize machine learning in selecting high quality averaged SEM ima...

Charged particle beam apparatus

Transmission electron microscope and inspection method using transm...

Method and apparatus for Schottky TFE inspection

Methods for correlative microscopy

Serial arrangement having multiple plies of asymmetric filter media...

System for estimating the occurrence of defects, and computer-reada...

Method and apparatus for monitoring beam profile and power

Devices and methods for high angle liquid electron tomography

Adaptive specimen image acquisition using an artificial neural network

Cross-talk cancellation in multiple charged-particle beam inspection

Radiation analysis system, charged particle beam system, and radiat...

Defect characterization method and apparatus

Estimating heights of defects in a wafer by scaling a 3D model usin...

Inspection method, inspection system, and semiconductor fabrication...

Crystal defect observation method for compound semiconductor

Adaptive specimen image acquisition

Material properties from two-dimensional image

Methods and systems for determining variability of cryo-EM protein...

Grid coatings for capture of proteins and other compounds

Method to determine relative thermal maturity from porosities measu...

Systems and methods for real time stereo imaging using multiple ele...

Lateral recess measurement in a semiconductor specimen

Charged particle beam device, computer, and signal processing metho...

Material properties from two-dimensional image

Build material handling unit for a powder module for an apparatus f...

Apparatus of plural charged-particle beams

Hyperdimensional scanning transmission electron microscopy and exam...

Backscattered electron detector, apparatus of charged-particle beam...

Patents Applicationslast 30 patents

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...

METHOD OF ANALYZING CRYSTAL STRUCTURE, CRYSTAL MORPHOLOGY, OR CRYST...

AUGMENTATION OF ELECTRON ENERGY LOSS SPECTROSCOPY IN CHARGED PARTIC...

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

CRYSTALLINE RESIN CONTAINING MICROSCOPIC SURFACE RELIEFS AND METHOD...

TEM Orientation Mapping via Dark-Field Vector Images

THIN-FILM-BASED ASSEMBLY

SYSTEMS, APPARATUS, ARTICLES OF MANUFACTURE, AND METHODS TO INSPECT...

QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MAT...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

DEFECT DETECTION DEVICE AND METHOD THEREOF

Dynamic Data Driven Detector Tuning for Improved Investigation of S...

Systems And Methods For Detecting Beam Displacement

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

Scanning Electron Microscope and Map Display Method for Absorption...

NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING

METHOD TO DETERMINE RELATIVE THERMAL MATURITY FROM POROSITIES MEASU...

METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL

METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERV...

Charged Particle Beam Apparatus

Electron Microscope and Aberration Measurement Method

SAMPLE BLOCK AND SAMPLE BLOCK HOLDER

SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...

Measurement System and Measurement Method

CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...