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G01N2223/418
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/418
electron microscope
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Patents Grants
last 30 patents
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Patent Grant
Grid coatings for capture of proteins and other compounds
Patent number
11,965,851
Issue date
Apr 23, 2024
Purdue Research Foundation
David H. Thompson
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method to determine relative thermal maturity from porosities measu...
Patent number
11,940,398
Issue date
Mar 26, 2024
Saudi Arabian Oil Company
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lateral recess measurement in a semiconductor specimen
Patent number
11,921,063
Issue date
Mar 5, 2024
Applied Materials Israel Ltd.
Michael Chemama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device, computer, and signal processing metho...
Patent number
11,898,974
Issue date
Feb 13, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Oinuma
G01 - MEASURING TESTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,885,757
Issue date
Jan 30, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Build material handling unit for a powder module for an apparatus f...
Patent number
11,878,463
Issue date
Jan 23, 2024
CONCEPT LASER GMBH
Dominik Eideloth
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Apparatus of plural charged-particle beams
Patent number
RE49784
Issue date
Jan 2, 2024
ASML Netherlands B.V.
Weiming Ren
Information
Patent Grant
Hyperdimensional scanning transmission electron microscopy and exam...
Patent number
11,852,598
Issue date
Dec 26, 2023
Battelle Energy Alliance, LLC
Jeffery A. Aguiar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
Patent number
11,854,763
Issue date
Dec 26, 2023
BORRIES PTE. LTD.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shape measuring method, shape measuring device, and program
Patent number
11,835,334
Issue date
Dec 5, 2023
Kioxia Corporation
Kazuki Hagihara
G01 - MEASURING TESTING
Information
Patent Grant
Method of investigating a specimen using a tomographic imaging appa...
Patent number
11,821,852
Issue date
Nov 21, 2023
FEI Company
Andrew M. Kingston
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical three-dimensional scanning for collision avoidance in micro...
Patent number
11,821,860
Issue date
Nov 21, 2023
Carl Zeiss X-ray Microscopy Inc.
Lars Omlor
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
Patent number
11,815,474
Issue date
Nov 14, 2023
Dalian University of Technology
Guoqing Chen
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,802,841
Issue date
Oct 31, 2023
HITACHI HIGH-TECH CORPORATION
Yuji Takagi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dislocation type and density discrimination in semiconductor materi...
Patent number
11,782,001
Issue date
Oct 10, 2023
ATTOLIGHT AG
Marc Fouchier
G01 - MEASURING TESTING
Information
Patent Grant
System for estimating the occurrence of defects, and computer-reada...
Patent number
11,747,291
Issue date
Sep 5, 2023
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,747,292
Issue date
Sep 5, 2023
HITACHI HIGH-TECH CORPORATION
Wei Chean Tan
G01 - MEASURING TESTING
Information
Patent Grant
Multidimensional printer
Patent number
11,738,312
Issue date
Aug 29, 2023
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Andrei A. Kolmakov
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Charged particle beam device and control method thereof
Patent number
11,742,172
Issue date
Aug 29, 2023
HITACHI HIGH-TECH CORPORATION
Takashi Dobashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electron beam detection apparatus for semiconductor device and elec...
Patent number
11,703,467
Issue date
Jul 18, 2023
ZHONGKE JINGYUAN ELECTRON LIMITED, BEIJING
Lei Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,694,873
Issue date
Jul 4, 2023
HITACHI HIGH-TECH CORPORATION
Yoshifumi Sekiguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Three-dimensional surface metrology of wafers
Patent number
11,662,324
Issue date
May 30, 2023
Applied Materials Israel Ltd.
Ido Almog
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for virtually executing an operation of an energy...
Patent number
11,639,906
Issue date
May 2, 2023
Samsung Electronics Co., Ltd.
Shashank Shrikant Agashe
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for Schottky TFE inspection
Patent number
11,640,896
Issue date
May 2, 2023
NUFLARE TECHNOLOGY, INC.
Victor Katsap
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Imaging system and method for specimen detection
Patent number
11,598,732
Issue date
Mar 7, 2023
Focus-eBeam Technology (Beijing) Co., Ltd.
Wei He
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for manufacturing sample for thin film property measurement...
Patent number
11,543,376
Issue date
Jan 3, 2023
Seoul National University R&DB Foundation
Ki-Bum Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,530,997
Issue date
Dec 20, 2022
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,515,120
Issue date
Nov 29, 2022
HITACHI HIGH-TECH CORPORATION
Yoshifumi Sekiguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for voltage contrast defect detection
Patent number
11,513,087
Issue date
Nov 29, 2022
ASML Netherlands B.V.
Weiming Ren
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEFECT DETECTION DEVICE AND METHOD THEREOF
Publication number
20240127425
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Sungwook HWANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dynamic Data Driven Detector Tuning for Improved Investigation of S...
Publication number
20240110880
Publication date
Apr 4, 2024
FEI Company
Maurice PEEMEN
G01 - MEASURING TESTING
Information
Patent Application
Systems And Methods For Detecting Beam Displacement
Publication number
20240110881
Publication date
Apr 4, 2024
FEI Company
James B. McGinn
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
Publication number
20240085357
Publication date
Mar 14, 2024
JEOL Ltd.
Hideyuki Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NOISE DIAGNOSTICS FOR AN ELECTRON BEAM INSPECTION SYSTEM WITH SWATHING
Publication number
20240068967
Publication date
Feb 29, 2024
KLA Corporation
Bo Xiong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD TO DETERMINE RELATIVE THERMAL MATURITY FROM POROSITIES MEASU...
Publication number
20240060915
Publication date
Feb 22, 2024
ARAMCO SERVICES COMPANY
Shannon Lee Eichmann
E21 - EARTH DRILLING MINING
Information
Patent Application
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
Publication number
20240044822
Publication date
Feb 8, 2024
JFE STEEL CORPORATION
Tomoharu ISHIDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EVALUATING PRIMARY OPTICAL SYSTEM OF ELECTRON BEAM OBSERV...
Publication number
20230393085
Publication date
Dec 7, 2023
EBARA CORPORATION
Kenji WATANABE
G01 - MEASURING TESTING
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20230366841
Publication date
Nov 16, 2023
HITACHI HIGH-TECH CORPORATION
Wei Chean TAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electron Microscope and Aberration Measurement Method
Publication number
20230349839
Publication date
Nov 2, 2023
JEOL Ltd.
Hidetaka Sawada
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE BLOCK AND SAMPLE BLOCK HOLDER
Publication number
20230333031
Publication date
Oct 19, 2023
ROCKTYPE LTD
Henrik Nilsen OMMA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...
Publication number
20230333033
Publication date
Oct 19, 2023
HITACHI HIGH-TECH CORPORATION
Hiroshi FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
Measurement System and Measurement Method
Publication number
20230314350
Publication date
Oct 5, 2023
HITACHI HIGH-TECH CORPORATION
Akiyuki SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
CRYOGENIC SAMPLE HANDLING AND STORAGE SYSTEM
Publication number
20230296639
Publication date
Sep 21, 2023
FEI Company
Vojtech DOLEZAL
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
Publication number
20230296540
Publication date
Sep 21, 2023
GATAN INC.
Johannes ÖSTERREICHER
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPY GRIDS AND HIGH-RESOLUTION STRUCTURAL DETERMINAT...
Publication number
20230288299
Publication date
Sep 14, 2023
Universiteit Gent
Wouter VAN PUTTE
G01 - MEASURING TESTING
Information
Patent Application
IMMUNOCHROMATOGRAPHY MEASUREMENT METHOD, AUXILIARY LIQUID FOR IMMUN...
Publication number
20230258632
Publication date
Aug 17, 2023
National University Corporation Hamamatsu University School of Medicine
Hideya KAWASAKI
G01 - MEASURING TESTING
Information
Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
Publication number
20230258587
Publication date
Aug 17, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Simon BURGESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for analyzing quality of thin surface layer of PCB
Publication number
20230251216
Publication date
Aug 10, 2023
GUANGZHOU TERMBRAY ELECTRONICS TECH CO., LTD.
Jian ZHENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
Publication number
20230253178
Publication date
Aug 10, 2023
NUFLARE TECHNOLOGY, INC.
Victor KATSAP
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
Publication number
20230229827
Publication date
Jul 20, 2023
Saudi Arabian Oil Company
Abrar Alabbad
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20230162943
Publication date
May 25, 2023
Hitachi High-Tech Corporation
U OH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Radiation Analysis System, Charged Particle Beam System, and Radiat...
Publication number
20230161053
Publication date
May 25, 2023
Hitachi High-Tech Corporation
Akira TAKANO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
Publication number
20230154723
Publication date
May 18, 2023
ASML NETHERLANDS B.V.
Yan REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESSING REFERENCE DATA FOR WAFER INSPECTION
Publication number
20230139085
Publication date
May 4, 2023
ASML NETHERLANDS B.V.
Shengcheng JIN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY METHOD AND SYSTEM
Publication number
20230074398
Publication date
Mar 9, 2023
NOVA LTD
VLADIMIR MACHAVARIANI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS
Publication number
20230057900
Publication date
Feb 23, 2023
The Regents of the University of California
Hosea M. Nelson
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS
Publication number
20230030651
Publication date
Feb 2, 2023
HITACHI HIGH-TECH CORPORATION
Yoshifumi SEKIGUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
Publication number
20230023363
Publication date
Jan 26, 2023
APPLIED MATERIALS ISRAEL LTD.
Michael CHEMAMA
G01 - MEASURING TESTING