Electron or ion microscopes Electron or ion diffraction tubes

Industry

CPC
H01J37/26

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/26Electron or ion microscopes Electron or ion diffraction tubes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 11,961,699
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 11,961,704
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoki Akimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...
- Patent number 11,961,702
- Issue date Apr 16, 2024
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vibration isolation system with one or more magnetic actuators
- Patent number 11,953,073
- Issue date Apr 9, 2024
- Integrated Dynamics Engineering GmbH
- Han Hartgers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with an electron energy lo...
- Patent number 11,955,310
- Issue date Apr 9, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for adjusting beam condition of charged par...
- Patent number 11,948,772
- Issue date Apr 2, 2024
- ASML Netherlands B.V.
- Xuedong Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analyzing method and sample preparing method
- Patent number 11,946,945
- Issue date Apr 2, 2024
- Materials Analysis Technology Inc.
- Keng-Chieh Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulsed charged-particle beam system
- Patent number 11,942,302
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Arno Jan Bleeker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for pre-detecting defective porous polymer substrate for sep...
- Patent number 11,940,368
- Issue date Mar 26, 2024
- LG ENERGY SOLUTION, LTD.
- Won-Sik Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning on wafer defect review
- Patent number 11,935,722
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Pin Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 11,935,721
- Issue date Mar 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 11,929,232
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector
- Patent number 11,918,394
- Issue date Mar 5, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope device and electron beam inspection ap...
- Patent number 11,908,657
- Issue date Feb 20, 2024
- Zhongke Jingyuan Electron Limited
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for determining 3-dimensional atomic level structure and...
- Patent number 11,907,812
- Issue date Feb 20, 2024
- Korea Advanced Institute of Science and Technology
- Yongsoo Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 11,908,655
- Issue date Feb 20, 2024
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stage apparatus suitable for a particle beam apparatus
- Patent number 11,908,656
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Han Willem Hendrik Severt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of aligning a charged particle beam apparatus
- Patent number 11,901,155
- Issue date Feb 13, 2024
- FEI Company
- Mykola Kaplenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing device, information processing method, and r...
- Patent number 11,900,655
- Issue date Feb 13, 2024
- Toyota Jidosha Kabushiki Kaisha
- Hirotaka Sakamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
- Patent number 11,887,809
- Issue date Jan 30, 2024
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspection
- Patent number 11,875,966
- Issue date Jan 16, 2024
- ASML Netherlands B.V.
- Bernardo Kastrup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring a sample and microscope implementing the method
- Patent number 11,848,172
- Issue date Dec 19, 2023
- Carl Zeiss SMT GmbH
- Dmitry Klochkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas delivery system for environmental transmission electron microscope
- Patent number 11,837,432
- Issue date Dec 5, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- John Joseph Nogan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Setting position of a particle beam device component
- Patent number 11,837,434
- Issue date Dec 5, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED...
- Publication number 20240153732
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Datong ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE ANALYSIS...
- Publication number 20240153734
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Yeoseon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD
- Publication number 20240153737
- Publication date May 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATI...
- Publication number 20240153736
- Publication date May 9, 2024
- Japan Science and Technology Agency
- Takumi SANNOMIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240151665
- Publication date May 9, 2024
- Hitachi High-Tech Corporation
- Yohei NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLO...
- Publication number 20240128048
- Publication date Apr 18, 2024
- Carl Zeiss MultiSEM GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...
- Publication number 20240128047
- Publication date Apr 18, 2024
- Hitachi High-Tech Corporation
- Masahiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20240128049
- Publication date Apr 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Katsura TAKAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Microscope and Stage
- Publication number 20240120169
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Kazuki ISHIZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROCHIPS FOR USE IN ELECTRON MICROSCOPES AND RELATED METHODS
- Publication number 20240120172
- Publication date Apr 11, 2024
- Northwestern University
- Vinayak P. Dravid
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...
- Publication number 20240105417
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Yeoseon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
- Publication number 20240105418
- Publication date Mar 28, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Ruth BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
- Publication number 20240094151
- Publication date Mar 21, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSMENT SYSTEM, METHOD OF ASSESSING
- Publication number 20240079205
- Publication date Mar 7, 2024
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES
- Publication number 20240071711
- Publication date Feb 29, 2024
- ASML NETHERLANDS B.V.
- Xuerang HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Application Management For Charged Particle Microscope Devices
- Publication number 20240071717
- Publication date Feb 29, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN SITU BIASING AND FREEZING OF CYROGENIC ELECTRON MICROSCOPY SAMPLES
- Publication number 20240060864
- Publication date Feb 22, 2024
- ALLIANCE FOR SUSTAINABLE ENERGY, LLC
- Nikita Susan Dutta FITZCHARLES
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20240055223
- Publication date Feb 15, 2024
- KIOXIA Corporation
- Chihiro IDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS
- Publication number 20240055222
- Publication date Feb 15, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...
- Publication number 20240047175
- Publication date Feb 8, 2024
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schmaunz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF
- Publication number 20240038487
- Publication date Feb 1, 2024
- DAEGU GYEONGBUK INSTITUTE OF SCIENCE & TECHNOLOGY
- Jiwoong YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...
- Publication number 20240038488
- Publication date Feb 1, 2024
- Health Technology Innovations, Inc.
- Narasimha KUMAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, METHOD OF OPERATING A CHARGED PARTICL...
- Publication number 20240038482
- Publication date Feb 1, 2024
- Carl Zeiss SMT GMBH
- Eugen Foca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...
- Publication number 20240035988
- Publication date Feb 1, 2024
- BEIJING UNIVERSITY OF TECHNOLOGY
- Lihua Wang
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON-OPTICAL SYSTEM AND METHOD OF OPERATING AN ELECTRON-OPTICAL...
- Publication number 20240029995
- Publication date Jan 25, 2024
- ASML NETHERLANDS B.V.
- Stijn Wilem Herman Karel STEENBRINK
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion microscopes Electron or ion diffraction tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle beam device

Charged particle beam system

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...

Vibration isolation system with one or more magnetic actuators

Transmission charged particle microscope with an electron energy lo...

Methods and apparatuses for adjusting beam condition of charged par...

Sample analyzing method and sample preparing method

Pulsed charged-particle beam system

Method for pre-detecting defective porous polymer substrate for sep...

Machine learning on wafer defect review

System comprising a multi-beam particle microscope and method for o...

Systems and methods for charged particle flooding to enhance voltag...

Radiation detector

Microscopy imaging method for 3D tomography with predictive drift t...

Non-contact angle measuring apparatus

Electron diffraction holography

Scanning electron microscope device and electron beam inspection ap...

Apparatus for determining 3-dimensional atomic level structure and...

Cryotransfer holder and workstation

Stage apparatus suitable for a particle beam apparatus

Method of aligning a charged particle beam apparatus

Information processing device, information processing method, and r...

Auto-tuning stage settling time with feedback in charged particle m...

Method and apparatus for inspection

Charged particle beam device

Charged particle beam device and charged particle beam device calib...

Method for measuring a sample and microscope implementing the method

Estimation model generation method and electron microscope

Gas delivery system for environmental transmission electron microscope

Setting position of a particle beam device component

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR INSPECTION BY DEFLECTOR CONTROL IN A CHARGED...

SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE ANALYSIS...

TILT-COLUMN MULTI-BEAM ELECTRON MICROSCOPY SYSTEM AND METHOD

ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATI...

INSPECTION SYSTEM

METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLO...

Sample Inspection Apparatus, Inspection System, Thin Piece Sample F...

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

ELECTRON MICROSCOPE

Charged Particle Microscope and Stage

MICROCHIPS FOR USE IN ELECTRON MICROSCOPES AND RELATED METHODS

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

Systems And Methods For Transferring A Sample

SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR...

HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY

ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

ASSESSMENT SYSTEM, METHOD OF ASSESSING

APPARATUS USING MULTIPLE BEAMS OF CHARGED PARTICLES

Application Management For Charged Particle Microscope Devices

IN SITU BIASING AND FREEZING OF CYROGENIC ELECTRON MICROSCOPY SAMPLES

INSPECTION DEVICE AND INSPECTION METHOD

SYSTEM FOR SENSOR PROTECTION IN ELECTRON IMAGING APPLICATIONS

METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND RELATED SYSTEM AND C...

LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF

CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGL...

CHARGED PARTICLE BEAM SYSTEM, METHOD OF OPERATING A CHARGED PARTICL...

DEVICE AND METHOD FOR MEASURING CORRELATION BETWEEN FATIGUE PERFORM...

ELECTRON-OPTICAL SYSTEM AND METHOD OF OPERATING AN ELECTRON-OPTICAL...