Electron or ion microscopes Electron or ion diffraction tubes

Industry

CPC
H01J37/26

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/26Electron or ion microscopes Electron or ion diffraction tubes

Industries

Patents Grantslast 30 patents

Information Patent Grant
High framerate and high dynamic range electron microscopy
- Patent number 12,211,667
- Issue date Jan 28, 2025
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,205,790
- Issue date Jan 21, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method of setting parameter of charged parti...
- Patent number 12,198,894
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for defect inspection using voltage contrast in a...
- Patent number 12,191,112
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric coated plasmonic photoemitter
- Patent number 12,183,535
- Issue date Dec 31, 2024
- Board of Trustees of Michigan State University
- Peng Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and overlay misalignment measurement m...
- Patent number 12,183,541
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated operational control of micro-tooling devices
- Patent number 12,176,182
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Ramani Pichumani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing lamella, analysis system and method for analyz...
- Patent number 12,176,180
- Issue date Dec 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Atsushi Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning a sample using multi-beam inspection...
- Patent number 12,165,837
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Martinus Gerardus Maria Johannes Maassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stroboscopic illumination synchronized electron detection and imaging
- Patent number 12,165,835
- Issue date Dec 10, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of profiling charged-particle beams
- Patent number 12,165,836
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Maikel Robert Goosen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated ion-beam alignment for dual-beam instrument
- Patent number 12,154,757
- Issue date Nov 26, 2024
- FEI Company
- Jeremy Graham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual speed acquisition for drift corrected, fast, low dose, adaptiv...
- Patent number 12,136,532
- Issue date Nov 5, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for usable beam current and brightness in Scho...
- Patent number 12,131,883
- Issue date Oct 29, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas phase sample preparation for cryo-electron microscopy
- Patent number 12,130,217
- Issue date Oct 29, 2024
- Wisconsin Alumni Research Foundation
- Joshua Coon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscopy grid
- Patent number 12,125,668
- Issue date Oct 22, 2024
- Universiteit Antwerpen
- Wouter Van Putte
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
- Patent number 12,125,669
- Issue date Oct 22, 2024
- ASML Netherlands B.V.
- Ning Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vibration-free cryogenic cooling
- Patent number 12,123,816
- Issue date Oct 22, 2024
- FEI Company
- Ronald Lamers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and the use thereof for flexibly setting the c...
- Patent number 12,119,204
- Issue date Oct 15, 2024
- Carl Zeiss MultiSEM GmbH
- Stefan Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detector
- Patent number 12,106,932
- Issue date Oct 1, 2024
- DECTRIS AG
- Radosav Pantelic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy spectrometer with dynamic focus
- Patent number 12,100,585
- Issue date Sep 24, 2024
- FEI Company
- Arthur Reinout Hartong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen imaging systems and methods
- Patent number 12,094,701
- Issue date Sep 17, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image contrast enhancement in sample inspection
- Patent number 12,087,542
- Issue date Sep 10, 2024
- ASML Netherlands B.V.
- Yixiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for tilting characterization by microscopy
- Patent number 12,078,791
- Issue date Sep 3, 2024
- Yangtze Memory Technologies Co., Ltd.
- Jun Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE
- Publication number 20250022678
- Publication date Jan 16, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS
- Publication number 20250022681
- Publication date Jan 16, 2025
- INFINEON TECHNOLOGIES AG
- Maximilian Alexander MOSER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Correction Method and Correction Device
- Publication number 20250014858
- Publication date Jan 9, 2025
- Hitachi High-Tech Corporation
- Tomoaki YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250006454
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE ABERRATION CORRECTION
- Publication number 20250006457
- Publication date Jan 2, 2025
- FEI Company
- Maurits Diephuis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VIBRATION-FREE CRYOGENIC COOLING
- Publication number 20250003845
- Publication date Jan 2, 2025
- FEI Company
- Ronald Lamers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC VECTOR POTENTIAL-BASED LENS
- Publication number 20240429016
- Publication date Dec 26, 2024
- OKINAWA INSTITUTE OF SCIENCE AND TECHNOLOGY SCHOOL CORPORATION
- Makoto Tokoro SCHREIBER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ELEMENTAL MAPPING
- Publication number 20240429018
- Publication date Dec 26, 2024
- FEI Company
- Garrett BUDNIK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING IMMUNE COMPLEXES FOR EPITOPE MAPPING
- Publication number 20240428879
- Publication date Dec 26, 2024
- The Scripps Research Institute
- Lars Hangartner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240420915
- Publication date Dec 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Mihiro TAKASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGING A REGION OF A SAMPLE
- Publication number 20240420917
- Publication date Dec 19, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Roey Levy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240412943
- Publication date Dec 12, 2024
- Samsung Electronics Co., LTD
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lamella Mounting Method, and Analysis System
- Publication number 20240412941
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Wei Chean TAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20240412961
- Publication date Dec 12, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...
- Publication number 20240412938
- Publication date Dec 12, 2024
- ATTOLIGHT AG
- Nicolas Tappy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND ELECTRON MICROSCOPE
- Publication number 20240404781
- Publication date Dec 5, 2024
- Hitachi Ltd.
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automating cryo-electron microscopy data collection
- Publication number 20240395497
- Publication date Nov 28, 2024
- New York Structural Biology Center
- Paul T. Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
- Publication number 20240395499
- Publication date Nov 28, 2024
- RINKEN
- Takahiro SHIMOJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMINATE, ELECTRON SOURCE AND ELECTRONIC DEVICE CONTAINING LAMINATE...
- Publication number 20240395494
- Publication date Nov 28, 2024
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Katsumi NAGAOKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM SPOT SHAPE RECONSTRUCTION UNIT
- Publication number 20240386589
- Publication date Nov 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Mor Baram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM
- Publication number 20240379323
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING AN ELECTRON BEAM SYSTEM
- Publication number 20240379326
- Publication date Nov 14, 2024
- CARL ZEISS MICROSCOPY GMBH
- Bjoern Gamm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20240379325
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20240371601
- Publication date Nov 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Yusuke NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20240373591
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- Daesung Moon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILI...
- Publication number 20240355580
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Yeny YIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...
- Publication number 20240347312
- Publication date Oct 17, 2024
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ANALYSIS METHOD, COMPUTER-READABLE MEDIUM, AND MANUFACTURING METHOD...
- Publication number 20240347315
- Publication date Oct 17, 2024
- Fuji Electric Co., Ltd.
- Yusuke SHIMIZU
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion microscopes Electron or ion diffraction tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High framerate and high dynamic range electron microscopy

Charged particle beam device

Measurement system and method of setting parameter of charged parti...

System and method for defect inspection using voltage contrast in a...

Dielectric coated plasmonic photoemitter

Charged particle beam system and overlay misalignment measurement m...

Automated operational control of micro-tooling devices

Method for producing lamella, analysis system and method for analyz...

Transmission electron microscope and inspection method using transm...

System and method for scanning a sample using multi-beam inspection...

Stroboscopic illumination synchronized electron detection and imaging

Method and apparatus for Schottky TFE inspection

Systems and methods of profiling charged-particle beams

Electron gun and electron beam application apparatus

Automated ion-beam alignment for dual-beam instrument

Observation method by means of scanning transmission electron micro...

Self-differential confocal tilt sensor for measuring level variatio...

Dual speed acquisition for drift corrected, fast, low dose, adaptiv...

Method and apparatus for usable beam current and brightness in Scho...

Gas phase sample preparation for cryo-electron microscopy

Electron microscopy grid

Thermal-aided inspection by advanced charge controller module in a...

Vibration-free cryogenic cooling

Particle beam system and the use thereof for flexibly setting the c...

Electron detector

Energy spectrometer with dynamic focus

Specimen imaging systems and methods

Image contrast enhancement in sample inspection

Adaptive specimen image acquisition using an artificial neural network

Method for tilting characterization by microscopy

Patents Applicationslast 30 patents

ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPY-BASED SAMPLE ANALYSIS

Correction Method and Correction Device

CHARGED PARTICLE BEAM DEVICE

MICROSCOPE ABERRATION CORRECTION

VIBRATION-FREE CRYOGENIC COOLING

MAGNETIC VECTOR POTENTIAL-BASED LENS

METHODS AND SYSTEMS FOR ELEMENTAL MAPPING

METHODS OF FORMING IMMUNE COMPLEXES FOR EPITOPE MAPPING

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

CHARGED PARTICLE BEAM DEVICE

DISCHARGING A REGION OF A SAMPLE

SUBSTRATE INSPECTION METHOD

Lamella Mounting Method, and Analysis System

SPECIMEN IMAGING SYSTEMS AND METHODS

SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...

SAMPLE HOLDER AND ELECTRON MICROSCOPE

Automating cryo-electron microscopy data collection

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

LAMINATE, ELECTRON SOURCE AND ELECTRONIC DEVICE CONTAINING LAMINATE...

ELECTRON BEAM SPOT SHAPE RECONSTRUCTION UNIT

CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM

METHOD FOR OPERATING AN ELECTRON BEAM SYSTEM

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

Charged Particle Beam System

TRANSMISSION ELECTRON MICROSCOPE

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

TRANSMISSION ELECTRON MICROSCOPE IMAGE PROCESSING APPARATUS, FACILI...

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE TH...

ANALYSIS METHOD, COMPUTER-READABLE MEDIUM, AND MANUFACTURING METHOD...