Electrostatic deflection

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H01J49/22

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/22Electrostatic deflection

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multiplexing method for separators
- Patent number 11,733,206
- Issue date Aug 22, 2023
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer with high duty cycle
- Patent number 11,587,779
- Issue date Feb 21, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer and lead-i...
- Patent number 11,201,046
- Issue date Dec 14, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fields for multi-reflecting TOF MS
- Patent number 11,049,712
- Issue date Jun 29, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,804,087
- Issue date Oct 13, 2020
- Takashi Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatus and mass analysis method
- Patent number 10,763,093
- Issue date Sep 1, 2020
- Jeol Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,720,317
- Issue date Jul 21, 2020
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for collecting particles contained in an aerosol, comprising...
- Patent number 10,675,639
- Issue date Jun 9, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Simon Clavaguera
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,249,483
- Issue date Apr 2, 2019
- Takashi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Electrodynamic mass analysis
- Patent number 10,192,727
- Issue date Jan 29, 2019
- Varian Semiconductor Equipment Associates, Inc.
- Frank Sinclair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for mass analysis of analytes by simultaneous positive an...
- Patent number 10,153,150
- Issue date Dec 11, 2018
- MERIDION, LLC
- Nicholas Wilton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quasi-planar multi-reflecting time-of-flight mass spectrometer
- Patent number 10,141,175
- Issue date Nov 27, 2018
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mass separation using RF extraction
- Patent number 10,068,758
- Issue date Sep 4, 2018
- Varian Semiconductor Equipment Associates, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflectors for time-of-flight mass spectrometers having plates with...
- Patent number 10,026,601
- Issue date Jul 17, 2018
- Niels Goedecke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic mass spectrometer with encoded frequent pulses
- Patent number 9,984,862
- Issue date May 29, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight analysis of a continuous beam of ions by a detector...
- Patent number 9,978,576
- Issue date May 22, 2018
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight analysis of a continuous beam of ions by a detector...
- Patent number 9,812,313
- Issue date Nov 7, 2017
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion transport apparatus and mass spectrometer using the same
- Patent number 9,773,656
- Issue date Sep 26, 2017
- Shimadzu Corporation
- Masaru Nishiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral introduction of ions into RF ion guides
- Patent number 9,704,698
- Issue date Jul 11, 2017
- Bruker Daltonik GmbH
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instruments for measuring ion size distribution and concentration
- Patent number 9,666,423
- Issue date May 30, 2017
- W Henry Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact dual ion composition instrument
- Patent number 9,613,789
- Issue date Apr 4, 2017
- Southwest Research Institute
- Mihir I. Desai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electrode ion trap
- Patent number 9,437,412
- Issue date Sep 6, 2016
- Thermo Finnigan LLC.
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analyzer, combination device thereof, and ion mobility...
- Patent number 9,429,543
- Issue date Aug 30, 2016
- Shimadzu Corporation
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic mass spectrometer with encoded frequent pulses
- Patent number 9,406,493
- Issue date Aug 2, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Introduction of ions into ion cyclotron resonance cells
- Patent number 9,355,830
- Issue date May 31, 2016
- Gökhan Baykut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Periodic field differential mobility analyzer
- Patent number 9,324,552
- Issue date Apr 26, 2016
- Academia Sinica
- Kent J. Gillig
- G01 - MEASURING TESTING
Information Patent Grant
Ion guide for mass spectrometry
- Patent number 9,287,103
- Issue date Mar 15, 2016
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral introduction of ions into RF ion guides
- Patent number 9,245,724
- Issue date Jan 26, 2016
- Bruker Daltonik GmbH
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling charged particles with inhomogeneous electrostatic fields
- Patent number 9,245,726
- Issue date Jan 26, 2016
- The United States of America as represented by the administrator of the Natio...
- Federico A. Herrero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drift tube ion mobility spectrometer for aerosol measurement
- Patent number 9,207,207
- Issue date Dec 8, 2015
- Regents of The University of Minnesota
- Derek Robert Oberreit
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...
- Publication number 20240371620
- Publication date Nov 7, 2024
- AUTOBIO LABTEC INSTRUMENTS CO., LTD.
- Keya CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT
- Publication number 20240255466
- Publication date Aug 1, 2024
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SINGLE-ION MASS SPECTROMETRY WITH TEMPORAL...
- Publication number 20240203724
- Publication date Jun 20, 2024
- Brown University
- Derek M. Stein
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Bifurcated Mass Spectrometer
- Publication number 20240162029
- Publication date May 16, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-...
- Publication number 20240047190
- Publication date Feb 8, 2024
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTE OF NATURAL...
- Hiroyuki MATSUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PASS MASS SPECTROMETER WITH HIGH DUTY CYCLE
- Publication number 20210134581
- Publication date May 6, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELDS FOR MULTI-REFLECTING TOF MS
- Publication number 20200168448
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLEXING METHOD FOR SEPARATORS
- Publication number 20200080967
- Publication date Mar 12, 2020
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Apparatus and Mass Analysis Method
- Publication number 20190287783
- Publication date Sep 19, 2019
- JEOL Ltd.
- Junkei Kou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
- Publication number 20190198306
- Publication date Jun 27, 2019
- Takashi HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20190115201
- Publication date Apr 18, 2019
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BLIND-VENTED ELECTRODE
- Publication number 20180218800
- Publication date Aug 2, 2018
- PLANSEE JAPAN LTD
- NOBORU SHIROZU
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Ion Mass Separation Using RF Extraction
- Publication number 20180218894
- Publication date Aug 2, 2018
- Varian Semiconductor Equipment Associates, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...
- Publication number 20180068841
- Publication date Mar 8, 2018
- MERIDION, LLC
- Nicholas WILTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...
- Publication number 20180025898
- Publication date Jan 25, 2018
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
- Publication number 20170330739
- Publication date Nov 16, 2017
- Takashi HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRANSPORT APPARATUS AND MASS SPECTROMETER USING THE SAME
- Publication number 20170148620
- Publication date May 25, 2017
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRAHIGH RESOLUTION MASS SPECTROMETRY USING AN ELECTROSTATIC ION B...
- Publication number 20170047218
- Publication date Feb 16, 2017
- California Institute of Technology
- Ara Chutjian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR LENS FOR DIRECTING AN ION BEAM
- Publication number 20170047216
- Publication date Feb 16, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Johannes SCHWIETERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Quasi-Planar Multi-Reflecting Time-of-Flight Mass Spectrometer
- Publication number 20160358764
- Publication date Dec 8, 2016
- Leco Corporation
- Anatoli N. Verentchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic Mass Spectrometer With Encoded Frequent Pulses
- Publication number 20160343561
- Publication date Nov 24, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...
- Publication number 20160336161
- Publication date Nov 17, 2016
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA CLEANING FOR MASS SPECTROMETERS
- Publication number 20160035550
- Publication date Feb 4, 2016
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS
- Publication number 20160005583
- Publication date Jan 7, 2016
- Bruker Daltonik GmbH
- Niels GOEDECKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENTS FOR MEASURING ION SIZE DISTRIBUTION AND CONCENTRATION
- Publication number 20150340221
- Publication date Nov 26, 2015
- W. Henry Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE FOR MASS SPECTROMETRY
- Publication number 20150279647
- Publication date Oct 1, 2015
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYZER, COMBINATION DEVICE THEREOF, AND ION MOBILITY...
- Publication number 20150276676
- Publication date Oct 1, 2015
- Shimadzu Corporation
- Gongyu Jiang
- G01 - MEASURING TESTING
Information Patent Application
DRIFT TUBE ION MOBILITY SPECTROMETER FOR AEROSOL MEASUREMENT
- Publication number 20150115147
- Publication date Apr 30, 2015
- Regents of the University of Minnesota
- Derek Robert Oberreit
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC LENSES AND SYSTEMS INCLUDING THE SAME
- Publication number 20150069262
- Publication date Mar 12, 2015
- PerkinElmer Health Sciences, Inc.
- David G. Welkie
- H01 - BASIC ELECTRIC ELEMENTS

Electrostatic deflection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multiplexing method for separators

Multi-pass mass spectrometer with high duty cycle

Orthogonal acceleration time-of-flight mass spectrometer and lead-i...

Fields for multi-reflecting TOF MS

Ultra-compact mass analysis device and ultra-compact particle accel...

Mass analysis apparatus and mass analysis method

Apparatus for mass analysis of analytes by simultaneous positive an...

Device for collecting particles contained in an aerosol, comprising...

Ultra-compact mass analysis device and ultra-compact particle accel...

Electrodynamic mass analysis

Apparatus for mass analysis of analytes by simultaneous positive an...

Quasi-planar multi-reflecting time-of-flight mass spectrometer

Ion mass separation using RF extraction

Reflectors for time-of-flight mass spectrometers having plates with...

Electrostatic mass spectrometer with encoded frequent pulses

Time-of-flight analysis of a continuous beam of ions by a detector...

Time-of-flight analysis of a continuous beam of ions by a detector...

Ion transport apparatus and mass spectrometer using the same

Lateral introduction of ions into RF ion guides

Instruments for measuring ion size distribution and concentration

Compact dual ion composition instrument

Multi-electrode ion trap

Ion mobility analyzer, combination device thereof, and ion mobility...

Electrostatic mass spectrometer with encoded frequent pulses

Introduction of ions into ion cyclotron resonance cells

Periodic field differential mobility analyzer

Ion guide for mass spectrometry

Lateral introduction of ions into RF ion guides

Controlling charged particles with inhomogeneous electrostatic fields

Drift tube ion mobility spectrometer for aerosol measurement

Patents Applicationslast 30 patents

ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...

CHARGED PARTICLE SPECTROMETER

FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT

SYSTEMS AND METHODS FOR SINGLE-ION MASS SPECTROMETRY WITH TEMPORAL...

Bifurcated Mass Spectrometer

ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-...

MULTI-PASS MASS SPECTROMETER WITH HIGH DUTY CYCLE

FIELDS FOR MULTI-REFLECTING TOF MS

MULTIPLEXING METHOD FOR SEPARATORS

Mass Analysis Apparatus and Mass Analysis Method

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

BLIND-VENTED ELECTRODE

Ion Mass Separation Using RF Extraction

APPARATUS FOR MASS ANALYSIS OF ANALYTES BY SIMULTANEOUS POSITIVE AN...

Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...

ION TRANSPORT APPARATUS AND MASS SPECTROMETER USING THE SAME

ULTRAHIGH RESOLUTION MASS SPECTROMETRY USING AN ELECTROSTATIC ION B...

MIRROR LENS FOR DIRECTING AN ION BEAM

Quasi-Planar Multi-Reflecting Time-of-Flight Mass Spectrometer

Electrostatic Mass Spectrometer With Encoded Frequent Pulses

Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...

PLASMA CLEANING FOR MASS SPECTROMETERS

REFLECTORS FOR TIME-OF-FLIGHT MASS SPECTROMETERS

INSTRUMENTS FOR MEASURING ION SIZE DISTRIBUTION AND CONCENTRATION

ION GUIDE FOR MASS SPECTROMETRY

ION MOBILITY ANALYZER, COMBINATION DEVICE THEREOF, AND ION MOBILITY...

DRIFT TUBE ION MOBILITY SPECTROMETER FOR AEROSOL MEASUREMENT

ELECTROSTATIC LENSES AND SYSTEMS INCLUDING THE SAME