electrostatic

Industry

CPC
H01J2237/053

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/053electrostatic

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electron gun and electron microscope
- Patent number 12,217,928
- Issue date Feb 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for controlling ion beam using electrostatic f...
- Patent number 10,937,624
- Issue date Mar 2, 2021
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic filter and ion implanter having asymmetric electrosta...
- Patent number 10,886,098
- Issue date Jan 5, 2021
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electostatic filter and method for controlling ion beam using elect...
- Patent number 10,790,116
- Issue date Sep 29, 2020
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and charged particle beam apparatus comprising the same
- Patent number 10,622,183
- Issue date Apr 14, 2020
- Korea Research Institute of Standards and Science
- Takashi Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post column filter with enhanced energy range
- Patent number 10,431,420
- Issue date Oct 1, 2019
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retarding potential type energy analyzer
- Patent number 10,319,578
- Issue date Jun 11, 2019
- Japan Synchrotron Radiation Research Institute
- Takayuki Muro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy discriminating electron detector and scanning electron micro...
- Patent number 10,121,633
- Issue date Nov 6, 2018
- National Institute for Materials Science
- Takashi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy loss spectrometer
- Patent number 9,966,219
- Issue date May 8, 2018
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deceleration apparatus for ribbon and spot beams
- Patent number 9,824,850
- Issue date Nov 21, 2017
- Advanced Ion Beam Technology, Inc.
- Nicholas White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,437,408
- Issue date Sep 6, 2016
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-energy ion implanter
- Patent number 9,368,327
- Issue date Jun 14, 2016
- Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Mitsuaki Kabasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-energy ion implanter
- Patent number 9,355,847
- Issue date May 31, 2016
- Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Mitsuaki Kabasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for improving the bioactivity characteristics of a surface...
- Patent number 9,144,627
- Issue date Sep 29, 2015
- Exogenesis Corporation
- Joseph Khoury
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Deceleration apparatus for ribbon and spot beams
- Patent number 8,941,077
- Issue date Jan 27, 2015
- Advanced Ion Beam Technology, Inc.
- Nicholas White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector
- Patent number 8,907,305
- Issue date Dec 9, 2014
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sequential radial mirror analyser
- Patent number 8,723,114
- Issue date May 13, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with integrated electrostatic energy filter
- Patent number 8,710,452
- Issue date Apr 29, 2014
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curved heated ion transfer optics
- Patent number 8,680,462
- Issue date Mar 25, 2014
- Bruker Daltonics, Inc.
- Stephen Zanon
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Imaging energy filter for electrically charged particles and spectr...
- Patent number 8,530,835
- Issue date Sep 10, 2013
- Dietmar Funnemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe
- Patent number 8,513,597
- Issue date Aug 20, 2013
- Cameca Instruments, Inc.
- Peter Panayi
- G01 - MEASURING TESTING
Information Patent Grant
Distributed potential charged particle detector
- Patent number 8,481,962
- Issue date Jul 9, 2013
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle energy analyzer
- Patent number 8,421,030
- Issue date Apr 16, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle analyser and method using electrostatic filter gri...
- Patent number 8,421,027
- Issue date Apr 16, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution energy-selecting electron beam apparatus
- Patent number 8,373,137
- Issue date Feb 12, 2013
- Nion Co.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror energy filter for electron beam apparatus
- Patent number 8,334,508
- Issue date Dec 18, 2012
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration-corrected wien ExB mass filter with removal of neutrals...
- Patent number 8,283,629
- Issue date Oct 9, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution gas field ion column
- Patent number 8,158,939
- Issue date Apr 17, 2012
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for controlling deflection of a charged particle...
- Patent number 8,129,695
- Issue date Mar 6, 2012
- Varian Semiconductor Equipment Associates, Inc.
- Peter L. Kellerman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
- Publication number 20240339287
- Publication date Oct 10, 2024
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM
- Publication number 20240339288
- Publication date Oct 10, 2024
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING ION BEAM USING ELECTOSTATIC FI...
- Publication number 20210159043
- Publication date May 27, 2021
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTOSTATIC FILTER AND METHOD FOR CONTROLLING ION BEAM USING ELECT...
- Publication number 20200161089
- Publication date May 21, 2020
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC FILTER AND ION IMPLANTER HAVING ASYMMETRIC ELECTROSTA...
- Publication number 20200161077
- Publication date May 21, 2020
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING ION BEAM USING ELECTOSTATIC FI...
- Publication number 20200161078
- Publication date May 21, 2020
- Applied Materials, Inc.
- Alexandre Likhanskii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20170207058
- Publication date Jul 20, 2017
- GATAN, INC.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE CONCENTRATION MECHANISM, PARTICLE MEASURING DEVICE, AND SU...
- Publication number 20170153172
- Publication date Jun 1, 2017
- TOKYO ELECTRON LIMITED
- Kyoko IKEDA
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Application
HIGH-ENERGY ION IMPLANTER
- Publication number 20140366801
- Publication date Dec 18, 2014
- Mitsuaki Kabasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
HIGH-ENERGY ION IMPLANTER
- Publication number 20140345522
- Publication date Nov 27, 2014
- SEN Corporation
- Mitsuaki Kabasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20130214156
- Publication date Aug 22, 2013
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEQUENTIAL RADIAL MIRROR ANALYSER
- Publication number 20130126730
- Publication date May 23, 2013
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVED HEATED ION TRANSFER OPTICS
- Publication number 20130015348
- Publication date Jan 17, 2013
- Bruker Daltonics, Inc.
- Stephen ZANON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...
- Publication number 20120261566
- Publication date Oct 18, 2012
- FEI Company
- David Tuggle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging energy filter for electrically charged particles and spectr...
- Publication number 20120261571
- Publication date Oct 18, 2012
- Dietmar Funnemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source with Integrated Electrostatic Energy Filter
- Publication number 20120112090
- Publication date May 10, 2012
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECELERATION APPARATUS FOR RIBBON AND SPOT BEAMS
- Publication number 20120097861
- Publication date Apr 26, 2012
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Nicholas White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High resolution energy-selecting electron beam apparatus
- Publication number 20120074315
- Publication date Mar 29, 2012
- Nion Co.
- Ondrej L. Krivanek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distributed Potential Charged Particle Detector
- Publication number 20120037802
- Publication date Feb 16, 2012
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR IMPROVING THE BIOACTIVITY CHARACTERISTICS OF A SURFACE...
- Publication number 20110300599
- Publication date Dec 8, 2011
- Exogenesis Corporation
- Joseph Khoury
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING DEFLECTION OF A CHARGED PARTICLE...
- Publication number 20110155921
- Publication date Jun 30, 2011
- Varian Semiconductor Equipment Associates, Inc.
- Peter L. Kellerman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM QUALITY IN FIB SYSTEMS
- Publication number 20100327180
- Publication date Dec 30, 2010
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION GAS FIELD ION COLUMN
- Publication number 20100187436
- Publication date Jul 29, 2010
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE
- Publication number 20100148060
- Publication date Jun 17, 2010
- Imago Scientific Instruments Corporation
- Peter Panayi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF BEAM ENERGY IDENTIFICATION FOR SINGLE WAFER IO...
- Publication number 20100038553
- Publication date Feb 18, 2010
- Axcelis Technologies, Inc.
- Shu Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENERGY ANALYZER AND METHODS OF MANUFACTURING AND OPERATING
- Publication number 20090242790
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-grid ion energy analyzer and methods of manufacturing and opera...
- Publication number 20090242791
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS

electrostatic

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron gun and electron microscope

Apparatus and method for controlling ion beam using electrostatic f...

Electrostatic filter and ion implanter having asymmetric electrosta...

Electostatic filter and method for controlling ion beam using elect...

Monochromator and charged particle beam apparatus comprising the same

Post column filter with enhanced energy range

Retarding potential type energy analyzer

Energy discriminating electron detector and scanning electron micro...

Analyser arrangement for particle spectrometer

Electron energy loss spectrometer

Deceleration apparatus for ribbon and spot beams

Analyser arrangement for particle spectrometer

High-energy ion implanter

High-energy ion implanter

Methods for improving the bioactivity characteristics of a surface...

Deceleration apparatus for ribbon and spot beams

Charged particle detector

Sequential radial mirror analyser

Charged particle source with integrated electrostatic energy filter

Curved heated ion transfer optics

Imaging energy filter for electrically charged particles and spectr...

Atom probe

Distributed potential charged particle detector

Charged-particle energy analyzer

Charged particle analyser and method using electrostatic filter gri...

High resolution energy-selecting electron beam apparatus

Mirror energy filter for electron beam apparatus

Aberration-corrected wien ExB mass filter with removal of neutrals...

High resolution gas field ion column

System and method for controlling deflection of a charged particle...

Patents Applicationslast 30 patents

APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

HYBRID APPARATUS, SYSTEM AND TECHNIQUES FOR MASS ANALYZED ION BEAM

APPARATUS AND METHOD FOR CONTROLLING ION BEAM USING ELECTOSTATIC FI...

ELECTOSTATIC FILTER AND METHOD FOR CONTROLLING ION BEAM USING ELECT...

ELECTROSTATIC FILTER AND ION IMPLANTER HAVING ASYMMETRIC ELECTROSTA...

APPARATUS AND METHOD FOR CONTROLLING ION BEAM USING ELECTOSTATIC FI...

ELECTRON ENERGY LOSS SPECTROMETER

PARTICLE CONCENTRATION MECHANISM, PARTICLE MEASURING DEVICE, AND SU...

HIGH-ENERGY ION IMPLANTER

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

HIGH-ENERGY ION IMPLANTER

CHARGED PARTICLE DETECTOR

SEQUENTIAL RADIAL MIRROR ANALYSER

CURVED HEATED ION TRANSFER OPTICS

ABERRATION-CORRECTED WIEN EXB MASS FILTER WITH REMOVAL OF NEUTRALS...

Imaging energy filter for electrically charged particles and spectr...

Charged Particle Source with Integrated Electrostatic Energy Filter

DECELERATION APPARATUS FOR RIBBON AND SPOT BEAMS

High resolution energy-selecting electron beam apparatus

Distributed Potential Charged Particle Detector

METHODS FOR IMPROVING THE BIOACTIVITY CHARACTERISTICS OF A SURFACE...

CHARGED-PARTICLE ENERGY ANALYZER

SYSTEM AND METHOD FOR CONTROLLING DEFLECTION OF A CHARGED PARTICLE...

BEAM QUALITY IN FIB SYSTEMS

HIGH RESOLUTION GAS FIELD ION COLUMN

CHARGED PARTICLE ANALYSER AND METHOD

ATOM PROBE

SYSTEM AND METHOD OF BEAM ENERGY IDENTIFICATION FOR SINGLE WAFER IO...

ION ENERGY ANALYZER AND METHODS OF MANUFACTURING AND OPERATING

Two-grid ion energy analyzer and methods of manufacturing and opera...