Environmental or reliability testing

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CPC
G01R31/2849

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2849Environmental or reliability testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Field collapse pulser
- Patent number 12,174,236
- Issue date Dec 24, 2024
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 12,146,913
- Issue date Nov 19, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing system and time certification method
- Patent number 12,135,350
- Issue date Nov 5, 2024
- CHROMA ATE INC.
- Tzu-Ching Yang
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator and test method
- Patent number 12,113,535
- Issue date Oct 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Fuse life expectancy prediction device for electric vehicle battery...
- Patent number 12,111,368
- Issue date Oct 8, 2024
- Hyundai Motor Company
- Bo Seon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Thermal runaway trigger method
- Patent number 12,095,049
- Issue date Sep 17, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Yujie Pu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Scalable tester for testing multiple devices under test
- Patent number 12,085,606
- Issue date Sep 10, 2024
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for estimating the ageing of an electronic component
- Patent number 12,055,583
- Issue date Aug 6, 2024
- VITESCO TECHNOLOGIES GMBH
- Nicolas Soulas
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, or components for electrolytic corrosion prot...
- Patent number 11,906,547
- Issue date Feb 20, 2024
- Intel Corporation
- Minh Nhat Dang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for monitoring the reliability of an electronic s...
- Patent number 11,879,937
- Issue date Jan 23, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for simulating a battery
- Patent number 11,874,322
- Issue date Jan 16, 2024
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,828,802
- Issue date Nov 28, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Lifetime estimating system and method for heating source, and inspe...
- Patent number 11,796,400
- Issue date Oct 24, 2023
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus including power supply for supplying power to...
- Patent number 11,774,488
- Issue date Oct 3, 2023
- Tokyo Electron Limited
- Shigeru Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Test card and test display adapter with shorter time for preliminar...
- Patent number 11,703,540
- Issue date Jul 18, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yidong Ji
- G01 - MEASURING TESTING
Information Patent Grant
Cryogenic wafer test system
- Patent number 11,693,047
- Issue date Jul 4, 2023
- Northrop Grumman Systems Corporation
- Tessandra Anne Sage
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor burn-in oven chamber sealing
- Patent number 11,680,980
- Issue date Jun 20, 2023
- Micro Control Company
- Tom Alan Tremmel
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device aging assessment and compensation
- Patent number 11,637,553
- Issue date Apr 25, 2023
- Qualcomm Incorpoated
- Patrick Isakanian
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and methods for analyzing and estimating susceptibility of c...
- Patent number 11,624,773
- Issue date Apr 11, 2023
- Michel D Sika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal management system for a test-and-measurement probe
- Patent number 11,578,925
- Issue date Feb 14, 2023
- Tektronix, Inc.
- Julie A. Campbell
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Integrated circuit burn-in board management system with effective b...
- Patent number 11,579,186
- Issue date Feb 14, 2023
- NANYA TECHNOLOGY CORPORATION
- Cheng-Sung Lai
- G01 - MEASURING TESTING
Information Patent Grant
Testing electrode quality
- Patent number 11,555,846
- Issue date Jan 17, 2023
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- G01 - MEASURING TESTING
Information Patent Grant
Testing device for burn-in test operations and control method thereof
- Patent number 11,531,059
- Issue date Dec 20, 2022
- Siliconware Precision Industries Co., Ltd.
- Chao-Ming Tu
- G01 - MEASURING TESTING
Information Patent Grant
Modular wireless communication device testing system
- Patent number 11,506,712
- Issue date Nov 22, 2022
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, signal validator, and method for signal validation
- Patent number 11,448,689
- Issue date Sep 20, 2022
- Pegatron Corporation
- Yi-Tso Chang
- G01 - MEASURING TESTING
Information Patent Grant
Screening method for electrolytic capacitors that maintains individ...
- Patent number 11,448,680
- Issue date Sep 20, 2022
- KYOCERA AVX Components Corporation
- Howard Bernier
- G01 - MEASURING TESTING
Information Patent Grant
Test board and test apparatus including a multi-type fluid supplier...
- Patent number 11,422,158
- Issue date Aug 23, 2022
- Samsung Electronics Co., Ltd.
- Hyeju Kim
- G01 - MEASURING TESTING
Information Patent Grant
High-pressure burn-in test apparatus
- Patent number 11,385,275
- Issue date Jul 12, 2022
- Yi-Ming Hung
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for initiating thermal runaway in a battery
- Patent number 11,387,507
- Issue date Jul 12, 2022
- National Research Council of Canada
- Steven Recoskie
- G01 - MEASURING TESTING
Information Patent Grant
Circuit device aging assessment and compensation
- Patent number 11,381,238
- Issue date Jul 5, 2022
- QUALCOMM Incorporated
- Patrick Isakanian
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
DETECTING FLUID INGRESS IN A CONDUCTED ELECTRICAL WEAPON
- Publication number 20240271914
- Publication date Aug 15, 2024
- Axon Enterprise, Inc.
- Gerzain Mata
- F41 - WEAPONS
Information Patent Application
INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERF...
- Publication number 20240264221
- Publication date Aug 8, 2024
- Advantest Corporation
- Justin Glasgow
- G01 - MEASURING TESTING
Information Patent Application
PROTECTION CIRCUIT FOR HIGH TEMPERATURE REVERSE BIAS TEST
- Publication number 20240235183
- Publication date Jul 11, 2024
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Yiming LIN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFE...
- Publication number 20240210466
- Publication date Jun 27, 2024
- Intel Corporation
- Andres MALDONADO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE
- Publication number 20240192267
- Publication date Jun 13, 2024
- Rolls-Royce plc
- Mohamed Sathik MOHAMED HALICK
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRI...
- Publication number 20240159844
- Publication date May 16, 2024
- TRIDONIC GMBH & CO. KG.
- Tobias Klein
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND TEMPERATURE CONTROL METHOD
- Publication number 20240125843
- Publication date Apr 18, 2024
- TOKYO ELECTRON LIMITED
- Hiroyuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20240044980
- Publication date Feb 8, 2024
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SIMULATING A BATTERY
- Publication number 20240003965
- Publication date Jan 4, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Bernhard STERZBACH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, APPARATUSES, OR COMPONENTS FOR ELECTROLYTIC CORROSION PROT...
- Publication number 20230358783
- Publication date Nov 9, 2023
- Intel Corporation
- Minh Nhat DANG
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATOR AND TEST METHOD
- Publication number 20230299752
- Publication date Sep 21, 2023
- Changxin Memory Technologies, Inc.
- Chan CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Field Collapse Pulser
- Publication number 20230236238
- Publication date Jul 27, 2023
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Application
FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY...
- Publication number 20230152392
- Publication date May 18, 2023
- Hyundai Motor Company
- Bo Seon Lee
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20230152367
- Publication date May 18, 2023
- Michel D. Sika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM
- Publication number 20230079002
- Publication date Mar 16, 2023
- T-Mobile USA, Inc.
- Syed Toaha Ahmad
- G01 - MEASURING TESTING
Information Patent Application
TEST CARD AND TEST DISPLAY ADAPTER
- Publication number 20230062716
- Publication date Mar 2, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Yidong JI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CRYOGENIC WAFER TEST SYSTEM
- Publication number 20230003788
- Publication date Jan 5, 2023
- Northrop Grumman Systems Corporation
- TESSANDRA ANNE SAGE
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT BURN-IN BOARD MANAGEMENT SYSTEM
- Publication number 20220404415
- Publication date Dec 22, 2022
- NANYA TECHNOLOGY CORPORATION
- Cheng-Sung LAI
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT DEVICE AGING ASSESSMENT AND COMPENSATION
- Publication number 20220393679
- Publication date Dec 8, 2022
- QUALCOMM Incorporated
- Patrick ISAKANIAN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Techniques For Reduction Of Degradation In Channels Caused By Bias...
- Publication number 20220268837
- Publication date Aug 25, 2022
- Intel Corporation
- Han Hua Leong
- G01 - MEASURING TESTING
Information Patent Application
Scalable Tester for Testing Multiple Devices Under Test
- Publication number 20220252662
- Publication date Aug 11, 2022
- Albert Gaoiran
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND CONTROL METHOD THEREOF
- Publication number 20220214395
- Publication date Jul 7, 2022
- Siliconware Precision Industries Co., Ltd.
- Chao-Ming Tu
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY AND INSPECTION APPARATUS
- Publication number 20220178988
- Publication date Jun 9, 2022
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND DEVICE FOR ESTIMATING THE AGEING OF AN ELECTRONIC COMPONENT
- Publication number 20220170980
- Publication date Jun 2, 2022
- VITESCO TECHNOLOGIES GMBH
- Nicolas SOULAS
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR BURN-IN OVEN CHAMBER SEALING
- Publication number 20220082611
- Publication date Mar 17, 2022
- Micro Control Company
- Tom Alan Tremmel
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Application
METHOD AND DEVICE FOR MONITORING THE RELIABILITY OF AN ELECTRONIC S...
- Publication number 20220043056
- Publication date Feb 10, 2022
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING ELECTRODE QUALITY
- Publication number 20210356513
- Publication date Nov 18, 2021
- BIOSENSE WEBSTER (ISRAEL) LTD.
- Michael Levin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
HIGH-PRESSURE BURN-IN TEST APPARATUS
- Publication number 20210356506
- Publication date Nov 18, 2021
- Yi-Ming Hung
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT TESTING SYSTEM AND TIME CERTIFICATION METHOD
- Publication number 20210349146
- Publication date Nov 11, 2021
- Tzu-Ching YANG
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY PANEL AND MANUFACTURING METHOD THEREOF
- Publication number 20210319734
- Publication date Oct 14, 2021
- Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Rui XIONG
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Environmental or reliability testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Field collapse pulser

Modular wireless communication device testing system

Electronic component testing system and time certification method

Ring oscillator and test method

Fuse life expectancy prediction device for electric vehicle battery...

Thermal runaway trigger method

Scalable tester for testing multiple devices under test

Method and device for estimating the ageing of an electronic component

Systems, apparatuses, or components for electrolytic corrosion prot...

Method and device for monitoring the reliability of an electronic s...

Device and method for simulating a battery

Modular wireless communication device testing system

Lifetime estimating system and method for heating source, and inspe...

Inspection apparatus including power supply for supplying power to...

Test card and test display adapter with shorter time for preliminar...

Cryogenic wafer test system

Semiconductor burn-in oven chamber sealing

Circuit device aging assessment and compensation

System and methods for analyzing and estimating susceptibility of c...

Thermal management system for a test-and-measurement probe

Integrated circuit burn-in board management system with effective b...

Testing electrode quality

Testing device for burn-in test operations and control method thereof

Modular wireless communication device testing system

Electronic device, signal validator, and method for signal validation

Screening method for electrolytic capacitors that maintains individ...

Test board and test apparatus including a multi-type fluid supplier...

High-pressure burn-in test apparatus

Apparatus and method for initiating thermal runaway in a battery

Circuit device aging assessment and compensation

Patents Applicationslast 30 patents

DETECTING FLUID INGRESS IN A CONDUCTED ELECTRICAL WEAPON

INDEPENDENT THERMAL CONTROLLER FOR MEMORY DEVICES AND DEVICE INTERF...

PROTECTION CIRCUIT FOR HIGH TEMPERATURE REVERSE BIAS TEST

ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFE...

METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE

METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRI...

TEST DEVICE AND TEMPERATURE CONTROL METHOD

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

DEVICE AND METHOD FOR SIMULATING A BATTERY

SYSTEMS, APPARATUSES, OR COMPONENTS FOR ELECTROLYTIC CORROSION PROT...

RING OSCILLATOR AND TEST METHOD

Field Collapse Pulser

FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY...

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM

TEST CARD AND TEST DISPLAY ADAPTER

CRYOGENIC WAFER TEST SYSTEM

INTEGRATED CIRCUIT BURN-IN BOARD MANAGEMENT SYSTEM

CIRCUIT DEVICE AGING ASSESSMENT AND COMPENSATION

Techniques For Reduction Of Degradation In Channels Caused By Bias...

Scalable Tester for Testing Multiple Devices Under Test

TESTING DEVICE AND CONTROL METHOD THEREOF

POWER SUPPLY AND INSPECTION APPARATUS

METHOD AND DEVICE FOR ESTIMATING THE AGEING OF AN ELECTRONIC COMPONENT

SEMICONDUCTOR BURN-IN OVEN CHAMBER SEALING

METHOD AND DEVICE FOR MONITORING THE RELIABILITY OF AN ELECTRONIC S...

TESTING ELECTRODE QUALITY

HIGH-PRESSURE BURN-IN TEST APPARATUS

ELECTRONIC COMPONENT TESTING SYSTEM AND TIME CERTIFICATION METHOD

DISPLAY PANEL AND MANUFACTURING METHOD THEREOF