Environmental, reliability or burn-in testing

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CPC
G01R31/2855

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2855Environmental, reliability or burn-in testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing an integrated circuit and testing system
- Patent number 11,879,933
- Issue date Jan 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ankita Patidar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
JTAG-based burning device
- Patent number 11,874,323
- Issue date Jan 16, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Peng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip, self-calibration circuit and method for chip parameter offset...
- Patent number 11,664,788
- Issue date May 30, 2023
- FREMONT MICRO DEVICES CORPORATION
- Jianfeng Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and methods for analyzing and estimating susceptibility of c...
- Patent number 11,624,773
- Issue date Apr 11, 2023
- Michel D Sika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pressure relief valve
- Patent number 11,592,465
- Issue date Feb 28, 2023
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and burn-in test method thereof
- Patent number 11,372,042
- Issue date Jun 28, 2022
- Renesas Electronics Corporation
- Koji Suzuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor chip burn-in test with mutli-channel
- Patent number 11,315,652
- Issue date Apr 26, 2022
- Winbond Electronics Corp.
- Chih-Chiang Lai
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,255,903
- Issue date Feb 22, 2022
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,169,200
- Issue date Nov 9, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Pressure relief valve
- Patent number 11,112,429
- Issue date Sep 7, 2021
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system energy management
- Patent number 11,105,863
- Issue date Aug 31, 2021
- International Business Machines Corporation
- Marc Coq
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 11,061,063
- Issue date Jul 13, 2021
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for analyzing and estimating susceptibility of c...
- Patent number 10,928,443
- Issue date Feb 23, 2021
- Lucid Circuit, Inc.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,852,347
- Issue date Dec 1, 2020
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for improved delamination characteristics in a...
- Patent number 10,763,130
- Issue date Sep 1, 2020
- Microchip Technology Incorporated
- Taweesak Laevohan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structures for burn-in testing and methods the...
- Patent number 10,712,382
- Issue date Jul 14, 2020
- Micron Technology, Inc.
- Mark E. Tuttle
- G01 - MEASURING TESTING
Information Patent Grant
Screening method for electrolytic capacitors
- Patent number 10,591,527
- Issue date Mar 17, 2020
- AVX Corporation
- William A. Millman
- G01 - MEASURING TESTING
Information Patent Grant
IC degradation management circuit, system and method
- Patent number 10,514,417
- Issue date Dec 24, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Zeng Kang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,429,433
- Issue date Oct 1, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Limiting translation for consistent substrate-to-substrate contact
- Patent number 10,401,385
- Issue date Sep 3, 2019
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Method for the characterization and monitoring of integrated circuits
- Patent number 10,379,152
- Issue date Aug 13, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Grant
Overheat protection circuit and method in an accelerated aging test...
- Patent number 10,371,745
- Issue date Aug 6, 2019
- Micron Technology, Inc.
- Ronny Schneider
- G01 - MEASURING TESTING
Information Patent Grant
Voltage regulator having an overheat detection circuit and test ter...
- Patent number 10,353,415
- Issue date Jul 16, 2019
- ABLIC INC.
- Kaoru Sakaguchi
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for analyzing and estimating susceptibility of c...
- Patent number 10,345,374
- Issue date Jul 9, 2019
- Lucid Circuit, Inc.
- Michel D Sika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device structures for burn-in testing and methods the...
- Patent number 10,261,123
- Issue date Apr 16, 2019
- Micron Technology, Inc.
- Mark E. Tuttle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Massively parallel wafer-level reliability system and process for m...
- Patent number 10,241,149
- Issue date Mar 26, 2019
- The United States of America, as represented by the Secretary of Commerce
- Kin P. Cheung
- G01 - MEASURING TESTING
Information Patent Grant
IC degradation management circuit, system and method
- Patent number 10,222,412
- Issue date Mar 5, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Zeng Kang
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20240094281
- Publication date Mar 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Wafer
- Publication number 20230228807
- Publication date Jul 20, 2023
- Nippon Telegraph and Telephone Corporation
- Shoko Tatsumi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...
- Publication number 20230168277
- Publication date Jun 1, 2023
- AEHR TEST SYSTEMS
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20230152367
- Publication date May 18, 2023
- Michel D. Sika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM
- Publication number 20230003790
- Publication date Jan 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ankita PATIDAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JTAG-Based Burning Device
- Publication number 20220317178
- Publication date Oct 6, 2022
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Peng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR CHIP BURN-IN TEST WITH MUTLI-CHANNEL
- Publication number 20220157397
- Publication date May 19, 2022
- WINBOND ELECTRONICS CORP.
- Chih-Chiang Lai
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRESSURE RELIEF VALVE
- Publication number 20210364549
- Publication date Nov 25, 2021
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20210148967
- Publication date May 20, 2021
- LUCID CIRCUIT, INC.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190353695
- Publication date Nov 21, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE RELIEF VALVE
- Publication number 20190339303
- Publication date Nov 7, 2019
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20190302177
- Publication date Oct 3, 2019
- LUCID CIRCUIT, INC.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS
- Publication number 20190285690
- Publication date Sep 19, 2019
- International Business Machines Corporation
- Raphael P. Robertazzi
- G01 - MEASURING TESTING
Information Patent Application
IC DEGRADATION MANAGEMENT CIRCUIT, SYSTEM AND METHOD
- Publication number 20190195943
- Publication date Jun 27, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Po-Zeng KANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURES FOR BURN-IN TESTING AND METHODS THE...
- Publication number 20190170811
- Publication date Jun 6, 2019
- Micron Technology, Inc.
- Mark E. Tuttle
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURES FOR BURN-IN TESTING AND METHODS THE...
- Publication number 20190064257
- Publication date Feb 28, 2019
- Micron Technology, Inc.
- Mark E. Tuttle
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20180372792
- Publication date Dec 27, 2018
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20180328983
- Publication date Nov 15, 2018
- LUCID CIRCUIT, INC.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY MANAGEMENT SYSTEM AND OPERATION THEREOF
- Publication number 20180224499
- Publication date Aug 9, 2018
- Semiconductor Manufacturing International (Beijing) Corporation
- Gang NIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD AND PROGRAM OF SEMICONDUCTOR DEVICE
- Publication number 20180217203
- Publication date Aug 2, 2018
- RENESAS ELECTRONICS CORPORATION
- Yoshiyuki NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT RELIABILITY ASSESSMENT APPARATUS AND METHOD
- Publication number 20180143242
- Publication date May 24, 2018
- Intel Corporation
- Christopher F. Connor
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20180080980
- Publication date Mar 22, 2018
- LUCID CIRCUIT, INC.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Application
DRIVING CIRCUIT OF DISPLAY PANEL AND THE QUALITY TEST METHOD THEREOF
- Publication number 20180068599
- Publication date Mar 8, 2018
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Mengmeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...
- Publication number 20170363679
- Publication date Dec 21, 2017
- LUCID CIRCUIT, INC.
- Michel D Sika
- G01 - MEASURING TESTING
Information Patent Application
TESTING ELECTRONIC DEVICES
- Publication number 20170108546
- Publication date Apr 20, 2017
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Diego Gutierrez
- G01 - MEASURING TESTING
Information Patent Application
Screening Method for Electrolytic Capacitors
- Publication number 20170082671
- Publication date Mar 23, 2017
- William A. Millman
- G01 - MEASURING TESTING

Environmental, reliability or burn-in testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for testing electronic devices

System for testing an integrated circuit of a device and its method...

Method of testing an integrated circuit and testing system

JTAG-based burning device

Apparatus for testing electronic devices

Chip, self-calibration circuit and method for chip parameter offset...

System and methods for analyzing and estimating susceptibility of c...

Pressure relief valve

Semiconductor device and burn-in test method thereof

Semiconductor chip burn-in test with mutli-channel

Apparatus for testing electronic devices

Method for the characterization and monitoring of integrated circuits

Pressure relief valve

Burn-in system energy management

Method for the characterization and monitoring of integrated circuits

System and methods for analyzing and estimating susceptibility of c...

Apparatus for testing electronic devices

Systems and methods for improved delamination characteristics in a...

Semiconductor device structures for burn-in testing and methods the...

Screening method for electrolytic capacitors

IC degradation management circuit, system and method

Method for the characterization and monitoring of integrated circuits

Limiting translation for consistent substrate-to-substrate contact

Method for the characterization and monitoring of integrated circuits

Overheat protection circuit and method in an accelerated aging test...

Voltage regulator having an overheat detection circuit and test ter...

System and methods for analyzing and estimating susceptibility of c...

Semiconductor device structures for burn-in testing and methods the...

Massively parallel wafer-level reliability system and process for m...

IC degradation management circuit, system and method

Patents Applicationslast 30 patents

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

Semiconductor Wafer

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHO...

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM

JTAG-Based Burning Device

SEMICONDUCTOR CHIP BURN-IN TEST WITH MUTLI-CHANNEL

APPARATUS FOR TESTING ELECTRONIC DEVICES

PRESSURE RELIEF VALVE

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

PRESSURE RELIEF VALVE

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

METHOD FOR THE CHARACTERIZATION AND MONITORING OF INTEGRATED CIRCUITS

IC DEGRADATION MANAGEMENT CIRCUIT, SYSTEM AND METHOD

SEMICONDUCTOR DEVICE STRUCTURES FOR BURN-IN TESTING AND METHODS THE...

SEMICONDUCTOR DEVICE STRUCTURES FOR BURN-IN TESTING AND METHODS THE...

APPARATUS FOR TESTING ELECTRONIC DEVICES

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

RELIABILITY MANAGEMENT SYSTEM AND OPERATION THEREOF

MANUFACTURING METHOD AND PROGRAM OF SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT RELIABILITY ASSESSMENT APPARATUS AND METHOD

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

DRIVING CIRCUIT OF DISPLAY PANEL AND THE QUALITY TEST METHOD THEREOF

SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF C...

TESTING ELECTRONIC DEVICES

Screening Method for Electrolytic Capacitors